JP2017512017A - パルス振幅変調（ｐａｍ）ビット・エラーの試験及び測定 - Google Patents

パルス振幅変調（ｐａｍ）ビット・エラーの試験及び測定 Download PDF

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JP2017512017A
JP2017512017A JP2016553604A JP2016553604A JP2017512017A JP 2017512017 A JP2017512017 A JP 2017512017A JP 2016553604 A JP2016553604 A JP 2016553604A JP 2016553604 A JP2016553604 A JP 2016553604A JP 2017512017 A JP2017512017 A JP 2017512017A
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threshold
error
amplitude
symbol
channel
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Japanese (ja)
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JP2017512017A5 (cg-RX-API-DMAC7.html
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キップ・ジェイ・スコーエン
ジョセフ・エヌ・アレン
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Tektronix Inc
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Tektronix Inc
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Publication of JP2017512017A publication Critical patent/JP2017512017A/ja
Publication of JP2017512017A5 publication Critical patent/JP2017512017A5/ja
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    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L1/00—Arrangements for detecting or preventing errors in the information received
    • H04L1/24—Testing correct operation
    • H04L1/242—Testing correct operation by comparing a transmitted test signal with a locally generated replica
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B17/00—Monitoring; Testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31708—Analysis of signal quality
    • G01R31/3171—BER [Bit Error Rate] test
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L27/00—Modulated-carrier systems
    • H04L27/02—Amplitude-modulated carrier systems, e.g. using on-off keying; Single sideband or vestigial sideband modulation
    • H04L27/06—Demodulator circuits; Receiver circuits
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L1/00—Arrangements for detecting or preventing errors in the information received
    • H04L1/20—Arrangements for detecting or preventing errors in the information received using signal quality detector
    • H04L1/203—Details of error rate determination, e.g. BER, FER or WER

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • Nonlinear Science (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Dc Digital Transmission (AREA)
  • Detection And Prevention Of Errors In Transmission (AREA)
JP2016553604A 2014-01-17 2015-01-16 パルス振幅変調（ｐａｍ）ビット・エラーの試験及び測定 Pending JP2017512017A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US14/158,768 US9136952B2 (en) 2014-01-17 2014-01-17 Pulse amplitude modulation (PAM) bit error test and measurement
US14/158,768 2014-01-17
PCT/US2015/011807 WO2015109222A1 (en) 2014-01-17 2015-01-16 Pulse amplitude modulation (pam) bit error test and measurement

Publications (2)

Publication Number Publication Date
JP2017512017A true JP2017512017A (ja) 2017-04-27
JP2017512017A5 JP2017512017A5 (cg-RX-API-DMAC7.html) 2018-03-01

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JP2016553604A Pending JP2017512017A (ja) 2014-01-17 2015-01-16 パルス振幅変調（ｐａｍ）ビット・エラーの試験及び測定

Country Status (5)

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US (1) US9136952B2 (cg-RX-API-DMAC7.html)
EP (1) EP2949067A1 (cg-RX-API-DMAC7.html)
JP (1) JP2017512017A (cg-RX-API-DMAC7.html)
CN (1) CN105103483A (cg-RX-API-DMAC7.html)
WO (1) WO2015109222A1 (cg-RX-API-DMAC7.html)

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2017220756A (ja) * 2016-06-06 2017-12-14 アンリツ株式会社 誤り率測定装置及び誤り率測定方法
JP2017220757A (ja) * 2016-06-06 2017-12-14 アンリツ株式会社 誤り率測定装置及び誤り率測定方法
JP2020113872A (ja) * 2019-01-10 2020-07-27 アンリツ株式会社 誤り検出装置および誤り検出方法
JP2020120147A (ja) * 2019-01-18 2020-08-06 アンリツ株式会社 誤り率測定装置及び誤り率測定方法
JP2020120148A (ja) * 2019-01-18 2020-08-06 アンリツ株式会社 誤り率測定装置及び誤り率測定方法
JP2020136872A (ja) * 2019-02-18 2020-08-31 アンリツ株式会社 誤り率測定装置および誤り率測定方法
JP2020136707A (ja) * 2019-02-13 2020-08-31 アンリツ株式会社 誤り率測定装置及び誤り率測定方法
JP2024506293A (ja) * 2021-02-03 2024-02-13 テクトロニクス・インコーポレイテッド 人間と機械学習のためのオーバーレイ、コンポジット、ダイナミック・アイ・トリガを備えたアイのクラス・セパレータ
US12431209B2 (en) 2022-05-19 2025-09-30 Samsung Electronics Co., Ltd. Memory devices, operating methods of the memory devices, and test systems including the memory devices

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CN107534628B (zh) * 2015-10-14 2020-06-02 华为技术有限公司 一种获取pam4的解码阈值的电路、方法和光网络单元
EP3388844B1 (en) * 2017-04-14 2019-12-25 Tektronix, Inc. Analog transitional storage
CN107919997A (zh) * 2017-10-12 2018-04-17 北京遥感设备研究所 一种基于dsp的丢帧检测方法及系统
US10594523B2 (en) * 2017-12-22 2020-03-17 Tetra Semiconductor Ag Decoder circuit for a broadband pulse amplitude modulation signal
CN108989000A (zh) * 2018-08-13 2018-12-11 苏州联讯仪器有限公司 一种新型的手持式pam4误码仪
JP7739341B2 (ja) 2020-06-11 2025-09-16 テクトロニクス・インコーポレイテッド 画像データ生成システム及び波形分類方法
US11121850B1 (en) 2020-07-02 2021-09-14 Rohde & Schwarz Gmbh & Co. Kg Signal analysis method and signal analysis module
JP7250751B2 (ja) * 2020-12-23 2023-04-03 アンリツ株式会社 誤り率測定装置及びコードワード位置表示方法
US11907090B2 (en) 2021-08-12 2024-02-20 Tektronix, Inc. Machine learning for taps to accelerate TDECQ and other measurements
US12442852B2 (en) 2022-03-30 2025-10-14 Tektronix, Inc. Tuning a device under test using parallel pipeline machine learning assistance
US11940889B2 (en) 2021-08-12 2024-03-26 Tektronix, Inc. Combined TDECQ measurement and transmitter tuning using machine learning
US11923896B2 (en) 2021-03-24 2024-03-05 Tektronix, Inc. Optical transceiver tuning using machine learning
US11923895B2 (en) 2021-03-24 2024-03-05 Tektronix, Inc. Optical transmitter tuning using machine learning and reference parameters
US12146914B2 (en) 2021-05-18 2024-11-19 Tektronix, Inc. Bit error ratio estimation using machine learning
US12571841B2 (en) 2021-06-04 2026-03-10 Tektronix, Inc. General digital signal processing waveform machine learning control application
US12416662B2 (en) 2022-01-14 2025-09-16 Tektronix, Inc. Machine learning model training using de-noised data and model prediction with noise correction
US12596145B2 (en) 2022-03-30 2026-04-07 Tektronix, Inc. Optical tuning test system using parallel oven pipelines with parallel instrument channels and machine learning assistance
US12093124B2 (en) * 2022-09-29 2024-09-17 Advanced Micro Devices, Inc. Multi-level signal reception
US20240283549A1 (en) * 2023-02-17 2024-08-22 Tektronix, Inc. Methods and systems of phase aligning a replica carrier signal for use in demodulating a subcarrier signal

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JPS5879171A (ja) * 1981-11-05 1983-05-12 Nec Corp 論理機能試験装置
JP2001144734A (ja) * 1999-09-18 2001-05-25 Marconi Communications Ltd 通信受信器アレンジメント
JP2003098230A (ja) * 2001-09-26 2003-04-03 Toshiba Microelectronics Corp 半導体試験装置
US20040268190A1 (en) * 2003-05-19 2004-12-30 International Business Machines Corporation Adjusting parameters of a serial link
JP2006053140A (ja) * 2004-07-23 2006-02-23 Agilent Technol Inc ２値サンプリング計測値からのアナログ波形情報
JP2006345262A (ja) * 2005-06-09 2006-12-21 Nippon Telegr & Teleph Corp <Ntt> 無線通信システム及び方法

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CA2442922A1 (en) * 2001-04-04 2002-10-17 Quellan, Inc. Method and system for decoding multilevel signals
US7606297B2 (en) 2002-03-15 2009-10-20 Synthesys Research, Inc. Method and system for creating an eye diagram using a binary data bit decision mechanism
US7154944B2 (en) 2002-10-31 2006-12-26 Agilent Technologies, Inc. Mask compliance testing using bit error ratio measurements
US7890847B2 (en) * 2007-03-09 2011-02-15 Mediatek Inc. Apparatus and method for calculating error metrics in a digital communication system
EP1863214A1 (en) * 2007-01-25 2007-12-05 Agilent Technologies, Inc. Digital signal analysis with evaluation of selected signal bits
CN101989887B (zh) * 2009-07-31 2013-06-12 清华大学 一种编码调制方法、解调解码方法及系统
WO2011062823A2 (en) * 2009-11-19 2011-05-26 Rambus Inc. Receiver with time-varying threshold voltage

Patent Citations (6)

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Publication number Priority date Publication date Assignee Title
JPS5879171A (ja) * 1981-11-05 1983-05-12 Nec Corp 論理機能試験装置
JP2001144734A (ja) * 1999-09-18 2001-05-25 Marconi Communications Ltd 通信受信器アレンジメント
JP2003098230A (ja) * 2001-09-26 2003-04-03 Toshiba Microelectronics Corp 半導体試験装置
US20040268190A1 (en) * 2003-05-19 2004-12-30 International Business Machines Corporation Adjusting parameters of a serial link
JP2006053140A (ja) * 2004-07-23 2006-02-23 Agilent Technol Inc ２値サンプリング計測値からのアナログ波形情報
JP2006345262A (ja) * 2005-06-09 2006-12-21 Nippon Telegr & Teleph Corp <Ntt> 無線通信システム及び方法

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2017220756A (ja) * 2016-06-06 2017-12-14 アンリツ株式会社 誤り率測定装置及び誤り率測定方法
JP2017220757A (ja) * 2016-06-06 2017-12-14 アンリツ株式会社 誤り率測定装置及び誤り率測定方法
JP2020113872A (ja) * 2019-01-10 2020-07-27 アンリツ株式会社 誤り検出装置および誤り検出方法
JP2020120147A (ja) * 2019-01-18 2020-08-06 アンリツ株式会社 誤り率測定装置及び誤り率測定方法
JP2020120148A (ja) * 2019-01-18 2020-08-06 アンリツ株式会社 誤り率測定装置及び誤り率測定方法
JP2020136707A (ja) * 2019-02-13 2020-08-31 アンリツ株式会社 誤り率測定装置及び誤り率測定方法
JP2020136872A (ja) * 2019-02-18 2020-08-31 アンリツ株式会社 誤り率測定装置および誤り率測定方法
JP2024506293A (ja) * 2021-02-03 2024-02-13 テクトロニクス・インコーポレイテッド 人間と機械学習のためのオーバーレイ、コンポジット、ダイナミック・アイ・トリガを備えたアイのクラス・セパレータ
US12431209B2 (en) 2022-05-19 2025-09-30 Samsung Electronics Co., Ltd. Memory devices, operating methods of the memory devices, and test systems including the memory devices

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Publication number Publication date
WO2015109222A1 (en) 2015-07-23
EP2949067A1 (en) 2015-12-02
US20150207574A1 (en) 2015-07-23
CN105103483A (zh) 2015-11-25
US9136952B2 (en) 2015-09-15

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