|
DE4040441A1
(de)
*
|
1990-12-18 |
1992-07-02 |
Hell Stefan |
Doppelkonfokales rastermikroskop
|
|
US5671085A
(en)
*
|
1995-02-03 |
1997-09-23 |
The Regents Of The University Of California |
Method and apparatus for three-dimensional microscopy with enhanced depth resolution
|
|
JPH09229861A
(ja)
*
|
1996-02-21 |
1997-09-05 |
Bunshi Bio Photonics Kenkyusho:Kk |
蛍光顕微鏡
|
|
DE10100247A1
(de)
*
|
2001-01-05 |
2002-07-11 |
Leica Microsystems |
Interferenzmikroskop und Verfahren zum Betrieb eines Interferenzmikroskops
|
|
DE10250247B4
(de)
*
|
2002-10-28 |
2006-06-01 |
Leica Microsystems Cms Gmbh |
Probenträger für die Mikroskopie und Verfahren zum Anfertigen eines Probenträgers
|
|
DE10332073A1
(de)
*
|
2003-07-11 |
2005-02-10 |
Carl Zeiss Jena Gmbh |
Anordnung zur optischen Erfassung von in einer Probe angeregter und / oder rückgestreuter Lichtstrahlung mit Doppelobjektivanordnung
|
|
FR2859024B1
(fr)
|
2003-08-22 |
2005-12-09 |
Centre Nat Rech Scient |
Dispositif et procede de detection et de mesure non invasives d'un champ electrique
|
|
NL1027462C2
(nl)
|
2004-11-09 |
2006-05-10 |
Koninkl Philips Electronics Nv |
Werkwijze voor het lokaliseren van fluorescente markers.
|
|
US7599069B2
(en)
*
|
2005-05-06 |
2009-10-06 |
The University Of Chicago |
Vector beam generator using a passively phase stable optical interferometer
|
|
JP4760564B2
(ja)
*
|
2006-06-20 |
2011-08-31 |
日本電気株式会社 |
パターン形状の欠陥検出方法及び検出装置
|
|
US7924432B2
(en)
|
2006-12-21 |
2011-04-12 |
Howard Hughes Medical Institute |
Three-dimensional interferometric microscopy
|
|
US7916304B2
(en)
*
|
2006-12-21 |
2011-03-29 |
Howard Hughes Medical Institute |
Systems and methods for 3-dimensional interferometric microscopy
|
|
US8155409B2
(en)
*
|
2008-04-17 |
2012-04-10 |
Ruprecht-Karls-Universitat |
Wave field microscope with sub-wavelength resolution and methods for processing microscopic images to detect objects with sub-wavelength dimensions
|
|
US9213176B2
(en)
*
|
2008-12-02 |
2015-12-15 |
The Regents Of The University Of California |
Imaging arrangement and microscope
|
|
WO2012049831A1
(ja)
*
|
2010-10-14 |
2012-04-19 |
株式会社ニコン |
構造化照明装置、構造化照明顕微鏡装置、及び面形状測定装置
|
|
WO2012102887A2
(en)
*
|
2011-01-24 |
2012-08-02 |
The Board Of Trustees Of The University Of Illinois |
Computational adaptive optics for interferometric synthetic aperture microscopy and other interferometric imaging
|
|
US8319181B2
(en)
|
2011-01-30 |
2012-11-27 |
Fei Company |
System and method for localization of large numbers of fluorescent markers in biological samples
|
|
JP5609729B2
(ja)
*
|
2011-03-18 |
2014-10-22 |
横河電機株式会社 |
顕微鏡装置、観察方法および試料搭載機構
|
|
DE102011017046A1
(de)
|
2011-04-14 |
2012-10-18 |
Till Photonics Gmbh |
Umschaltbare Mikroskopanordnung mit mehreren Detektoren
|
|
US8237835B1
(en)
*
|
2011-05-19 |
2012-08-07 |
Aeon Imaging, LLC |
Confocal imaging device using spatially modulated illumination with electronic rolling shutter detection
|
|
FR2978254B1
(fr)
*
|
2011-07-21 |
2014-01-24 |
Imagine Optic |
Methode et dispositif optique pour la localisation d'une particule en super resolution
|
|
CN103874917B
(zh)
*
|
2011-10-12 |
2017-05-24 |
文塔纳医疗系统公司 |
多焦点干涉图像获取
|
|
US20140333750A1
(en)
*
|
2011-12-15 |
2014-11-13 |
President And Fellows Of Harvard College |
High resolution dual-objective microscopy
|
|
DE102012200344A1
(de)
*
|
2012-01-11 |
2013-07-11 |
Carl Zeiss Microscopy Gmbh |
Mikroskopsystem und Verfahren für die 3-D hochauflösende Mikroskopie
|
|
JPWO2013146365A1
(ja)
*
|
2012-03-29 |
2015-12-10 |
パナソニックIpマネジメント株式会社 |
蛍光検出装置
|
|
DE102012214568A1
(de)
*
|
2012-08-16 |
2014-02-20 |
Leica Microsystems Cms Gmbh |
Optische Anordnung und ein Mikroskop
|
|
US8872105B2
(en)
|
2013-02-19 |
2014-10-28 |
Fei Company |
In situ reactivation of fluorescence marker
|
|
WO2014152739A2
(en)
*
|
2013-03-14 |
2014-09-25 |
The Regents Of The University Of California |
Interferometric focusing of guide-stars for direct wavefront sensing
|
|
US9615735B2
(en)
*
|
2014-01-31 |
2017-04-11 |
University Of Rochester |
Measurement of the lipid and aqueous layers of a tear film
|
|
EP3159728A1
(en)
*
|
2015-10-21 |
2017-04-26 |
FEI Company |
Standing wave interferometric microscope
|