JP2009540346A5 - - Google Patents

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Publication number
JP2009540346A5
JP2009540346A5 JP2009513725A JP2009513725A JP2009540346A5 JP 2009540346 A5 JP2009540346 A5 JP 2009540346A5 JP 2009513725 A JP2009513725 A JP 2009513725A JP 2009513725 A JP2009513725 A JP 2009513725A JP 2009540346 A5 JP2009540346 A5 JP 2009540346A5
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JP
Japan
Prior art keywords
image
interference
light source
confocal microscope
generating
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Application number
JP2009513725A
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English (en)
Japanese (ja)
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JP2009540346A (ja
JP5592108B2 (ja
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Publication date
Priority claimed from FR0605087A external-priority patent/FR2902202B1/fr
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Publication of JP2009540346A publication Critical patent/JP2009540346A/ja
Publication of JP2009540346A5 publication Critical patent/JP2009540346A5/ja
Application granted granted Critical
Publication of JP5592108B2 publication Critical patent/JP5592108B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2009513725A 2006-06-08 2007-05-30 干渉共焦点顕微鏡および光源撮像方法 Expired - Fee Related JP5592108B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
FR0605087A FR2902202B1 (fr) 2006-06-08 2006-06-08 Microscope confocal interferometrique
FR06/05087 2006-06-08
PCT/FR2007/000898 WO2007141409A1 (fr) 2006-06-08 2007-05-30 Microscope confocal interférométrique

Publications (3)

Publication Number Publication Date
JP2009540346A JP2009540346A (ja) 2009-11-19
JP2009540346A5 true JP2009540346A5 (enExample) 2012-12-20
JP5592108B2 JP5592108B2 (ja) 2014-09-17

Family

ID=37671973

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2009513725A Expired - Fee Related JP5592108B2 (ja) 2006-06-08 2007-05-30 干渉共焦点顕微鏡および光源撮像方法

Country Status (7)

Country Link
US (1) US8223343B2 (enExample)
EP (1) EP2024771B1 (enExample)
JP (1) JP5592108B2 (enExample)
AT (1) ATE463756T1 (enExample)
DE (1) DE602007005795D1 (enExample)
FR (1) FR2902202B1 (enExample)
WO (1) WO2007141409A1 (enExample)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8405059B2 (en) 2007-02-02 2013-03-26 King's College London Method and apparatus for improving the resolution and/or sectioning ability of an imaging system
FR2930031A1 (fr) * 2008-04-14 2009-10-16 Centre Nat Rech Scient Dispositif et procede d'analyse exaltee d'un echantillon de particules.
US8319971B2 (en) * 2008-05-06 2012-11-27 Industrial Technology Research Institute Scatterfield microscopical measuring method and apparatus
JP5686684B2 (ja) * 2011-07-19 2015-03-18 株式会社日立製作所 光学装置
CN104568884B (zh) * 2014-12-31 2017-03-29 深圳先进技术研究院 基于焦点调制的荧光显微系统及方法
CN113137926B (zh) * 2021-05-06 2023-04-07 王勇 一种可用于特种工况下的平面测量系统
CN116430565A (zh) * 2023-04-25 2023-07-14 西安工业大学 一种显微成像装置及成像方法
CN117491285B (zh) * 2023-11-03 2024-08-27 魅杰光电科技(上海)有限公司 基于图像清晰度聚焦的方法及装置

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2734786B2 (ja) * 1991-02-25 1998-04-02 株式会社ニコン 光エコー顕微鏡
US5257089A (en) * 1992-06-15 1993-10-26 United Technologies Corporation Optical head for shearography
DE19733193B4 (de) * 1997-08-01 2005-09-08 Carl Zeiss Jena Gmbh Mikroskop mit adaptiver Optik
JP3350442B2 (ja) * 1998-04-09 2002-11-25 科学技術振興事業団 顕微鏡システム
JPH11305133A (ja) * 1998-04-23 1999-11-05 Olympus Optical Co Ltd 高解像顕微鏡
US6721094B1 (en) * 2001-03-05 2004-04-13 Sandia Corporation Long working distance interference microscope
DE10227120A1 (de) * 2002-06-15 2004-03-04 Carl Zeiss Jena Gmbh Mikroskop, insbesondere Laserscanningmikroskop mit adaptiver optischer Einrichtung
EP1524491A1 (en) * 2003-10-16 2005-04-20 Universite Libre De Bruxelles Apparatus coupling an interferometer and a microscope

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