JP2017078855A - 定在波干渉顕微鏡 - Google Patents

定在波干渉顕微鏡 Download PDF

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Publication number
JP2017078855A
JP2017078855A JP2016204524A JP2016204524A JP2017078855A JP 2017078855 A JP2017078855 A JP 2017078855A JP 2016204524 A JP2016204524 A JP 2016204524A JP 2016204524 A JP2016204524 A JP 2016204524A JP 2017078855 A JP2017078855 A JP 2017078855A
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pair
specimen
illuminator
standing wave
wide
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Japanese (ja)
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JP2017078855A5 (enExample
Inventor
ダウム，ライナー
Daum Rainer
フォーゲル，クサーヴァー
Voegele Xaver
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FEI Co
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N21/6456—Spatial resolved fluorescence measurements; Imaging
    • G01N21/6458—Fluorescence microscopy
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/45—Refractivity; Phase-affecting properties, e.g. optical path length using interferometric methods; using Schlieren methods
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0032—Optical details of illumination, e.g. light-sources, pinholes, beam splitters, slits, fibers
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0076—Optical details of the image generation arrangements using fluorescence or luminescence
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • G02B21/08—Condensers
    • G02B21/088—Condensers for both incident illumination and transillumination
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • G02B21/08—Condensers
    • G02B21/14—Condensers affording illumination for phase-contrast observation
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/16—Microscopes adapted for ultraviolet illumination ; Fluorescence microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/18—Arrangements with more than one light path, e.g. for comparing two specimens
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/361—Optical details, e.g. image relay to the camera or image sensor
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/364—Projection microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/58—Optics for apodization or superresolution; Optical synthetic aperture systems
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0056—Optical details of the image generation based on optical coherence, e.g. phase-contrast arrangements, interference arrangements
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/008—Details of detection or image processing, including general computer control

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Microscoopes, Condenser (AREA)
JP2016204524A 2015-10-21 2016-10-18 定在波干渉顕微鏡 Pending JP2017078855A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP15190749.0 2015-10-21
EP15190749.0A EP3159728A1 (en) 2015-10-21 2015-10-21 Standing wave interferometric microscope

Publications (2)

Publication Number Publication Date
JP2017078855A true JP2017078855A (ja) 2017-04-27
JP2017078855A5 JP2017078855A5 (enExample) 2019-11-28

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Family Applications (1)

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JP2016204524A Pending JP2017078855A (ja) 2015-10-21 2016-10-18 定在波干渉顕微鏡

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US (2) US9885660B2 (enExample)
EP (2) EP3159728A1 (enExample)
JP (1) JP2017078855A (enExample)
CN (1) CN107014786A (enExample)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2021529991A (ja) * 2018-07-03 2021-11-04 ザ ユナイテッド ステイツ オブ アメリカ， アズ リプレゼンテッド バイ ザ セクレタリー， デパートメント オブ ヘルス アンド ヒューマン サービシーズ フォトスイッチング及び定在波照明技術を用いた顕微鏡における改善された軸分解能のためのシステム及び方法
WO2025052872A1 (ja) * 2023-09-05 2025-03-13 ソニーグループ株式会社 生体試料観察用光学システム、測定装置、測定方法および解析プログラム

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3159728A1 (en) * 2015-10-21 2017-04-26 FEI Company Standing wave interferometric microscope
CN108181282B (zh) 2018-01-03 2019-03-15 宁波纳美致生物科技有限公司 一种三通道荧光定位超分辨率生物显微系统及方法

Citations (4)

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JPH09229861A (ja) * 1996-02-21 1997-09-05 Bunshi Bio Photonics Kenkyusho:Kk 蛍光顕微鏡
JP2005037388A (ja) * 2003-07-11 2005-02-10 Carl Zeiss Jena Gmbh 試料内で励起された、および／または後方散乱した光放射を、対物レンズ二重配置により光学的に捕捉するための配置およびその方法
JP2010515084A (ja) * 2006-12-21 2010-05-06 ハワード ヒューズ メディカル インスティチュート 三次元干渉顕微鏡観察のためのシステムおよび方法
JP2014521093A (ja) * 2011-07-21 2014-08-25 イマジン・オプチック 粒子を超解像位置特定するための方法および光学デバイス

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US5671085A (en) * 1995-02-03 1997-09-23 The Regents Of The University Of California Method and apparatus for three-dimensional microscopy with enhanced depth resolution
DE10100247A1 (de) * 2001-01-05 2002-07-11 Leica Microsystems Interferenzmikroskop und Verfahren zum Betrieb eines Interferenzmikroskops
DE10250247B4 (de) * 2002-10-28 2006-06-01 Leica Microsystems Cms Gmbh Probenträger für die Mikroskopie und Verfahren zum Anfertigen eines Probenträgers
FR2859024B1 (fr) 2003-08-22 2005-12-09 Centre Nat Rech Scient Dispositif et procede de detection et de mesure non invasives d'un champ electrique
NL1027462C2 (nl) 2004-11-09 2006-05-10 Koninkl Philips Electronics Nv Werkwijze voor het lokaliseren van fluorescente markers.
US7599069B2 (en) * 2005-05-06 2009-10-06 The University Of Chicago Vector beam generator using a passively phase stable optical interferometer
JP4760564B2 (ja) * 2006-06-20 2011-08-31 日本電気株式会社 パターン形状の欠陥検出方法及び検出装置
US7924432B2 (en) 2006-12-21 2011-04-12 Howard Hughes Medical Institute Three-dimensional interferometric microscopy
US8155409B2 (en) * 2008-04-17 2012-04-10 Ruprecht-Karls-Universitat Wave field microscope with sub-wavelength resolution and methods for processing microscopic images to detect objects with sub-wavelength dimensions
US9213176B2 (en) * 2008-12-02 2015-12-15 The Regents Of The University Of California Imaging arrangement and microscope
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WO2012102887A2 (en) * 2011-01-24 2012-08-02 The Board Of Trustees Of The University Of Illinois Computational adaptive optics for interferometric synthetic aperture microscopy and other interferometric imaging
US8319181B2 (en) 2011-01-30 2012-11-27 Fei Company System and method for localization of large numbers of fluorescent markers in biological samples
JP5609729B2 (ja) * 2011-03-18 2014-10-22 横河電機株式会社 顕微鏡装置、観察方法および試料搭載機構
DE102011017046A1 (de) 2011-04-14 2012-10-18 Till Photonics Gmbh Umschaltbare Mikroskopanordnung mit mehreren Detektoren
US8237835B1 (en) * 2011-05-19 2012-08-07 Aeon Imaging, LLC Confocal imaging device using spatially modulated illumination with electronic rolling shutter detection
CN103874917B (zh) * 2011-10-12 2017-05-24 文塔纳医疗系统公司 多焦点干涉图像获取
US20140333750A1 (en) * 2011-12-15 2014-11-13 President And Fellows Of Harvard College High resolution dual-objective microscopy
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JPWO2013146365A1 (ja) * 2012-03-29 2015-12-10 パナソニックＩｐマネジメント株式会社 蛍光検出装置
DE102012214568A1 (de) * 2012-08-16 2014-02-20 Leica Microsystems Cms Gmbh Optische Anordnung und ein Mikroskop
US8872105B2 (en) 2013-02-19 2014-10-28 Fei Company In situ reactivation of fluorescence marker
WO2014152739A2 (en) * 2013-03-14 2014-09-25 The Regents Of The University Of California Interferometric focusing of guide-stars for direct wavefront sensing
US9615735B2 (en) * 2014-01-31 2017-04-11 University Of Rochester Measurement of the lipid and aqueous layers of a tear film
EP3159728A1 (en) * 2015-10-21 2017-04-26 FEI Company Standing wave interferometric microscope

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09229861A (ja) * 1996-02-21 1997-09-05 Bunshi Bio Photonics Kenkyusho:Kk 蛍光顕微鏡
JP2005037388A (ja) * 2003-07-11 2005-02-10 Carl Zeiss Jena Gmbh 試料内で励起された、および／または後方散乱した光放射を、対物レンズ二重配置により光学的に捕捉するための配置およびその方法
JP2010515084A (ja) * 2006-12-21 2010-05-06 ハワード ヒューズ メディカル インスティチュート 三次元干渉顕微鏡観察のためのシステムおよび方法
JP2014521093A (ja) * 2011-07-21 2014-08-25 イマジン・オプチック 粒子を超解像位置特定するための方法および光学デバイス

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2021529991A (ja) * 2018-07-03 2021-11-04 ザ ユナイテッド ステイツ オブ アメリカ， アズ リプレゼンテッド バイ ザ セクレタリー， デパートメント オブ ヘルス アンド ヒューマン サービシーズ フォトスイッチング及び定在波照明技術を用いた顕微鏡における改善された軸分解能のためのシステム及び方法
JP7534226B2 (ja) 2018-07-03 2024-08-14 ザ ユナイテッド ステイツ オブ アメリカ， アズ リプレゼンテッド バイ ザ セクレタリー， デパートメント オブ ヘルス アンド ヒューマン サービシーズ フォトスイッチング及び定在波照明技術を用いた顕微鏡における改善された軸分解能のためのシステム及び方法
WO2025052872A1 (ja) * 2023-09-05 2025-03-13 ソニーグループ株式会社 生体試料観察用光学システム、測定装置、測定方法および解析プログラム

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Publication number Publication date
US10401291B2 (en) 2019-09-03
EP3159728A1 (en) 2017-04-26
CN107014786A (zh) 2017-08-04
EP3159729A1 (en) 2017-04-26
EP3159729B1 (en) 2023-08-23
US20170115224A1 (en) 2017-04-27
US9885660B2 (en) 2018-02-06
US20180195962A1 (en) 2018-07-12

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