JP2017045900A - 半導体装置の製造方法および半導体装置 - Google Patents
半導体装置の製造方法および半導体装置 Download PDFInfo
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- JP2017045900A JP2017045900A JP2015168248A JP2015168248A JP2017045900A JP 2017045900 A JP2017045900 A JP 2017045900A JP 2015168248 A JP2015168248 A JP 2015168248A JP 2015168248 A JP2015168248 A JP 2015168248A JP 2017045900 A JP2017045900 A JP 2017045900A
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Abstract
Description
図1は実施の形態の半導体装置の主要部の構造の一例を内部を透過して示す部分平面図、図2は図1に示すA−A線に沿って切断した構造を示す断面図、図3は図1に示す半導体装置の主要部の内部の構造の一例を示す拡大部分断面図、図4は図1に示す半導体装置の主要部のパッドの構造の一例を示す拡大部分平面図である。また、図5は図1に示す半導体装置の主要部のパッド配列と再配線の一例を示す平面図、図6は図5のA部の構造の一例を示す拡大部分平面図と拡大部分断面図、図7は図5のB部の構造の一例を示す拡大部分平面図と拡大部分断面図である。
次に、本実施の形態の半導体装置の製造方法について説明する。図8〜図12は、それぞれ図1の半導体装置の製造方法の一部を示すフロー図と断面図である。
図14は実施の形態の変形例の構造を示す拡大部分平面図、図15は図14に示すA−A線に沿って切断した構造を示す部分断面図、図16は実施の形態の変形例を適用した半導体装置の構造を示す断面図である。
2aa 第1パッド電極
2ab 第2パッド電極
2ac バンプランド
2d ポリイミド層(第1絶縁膜)
2e 再配置配線(配線)
2f ポリイミド層(第2絶縁膜)
2ha Cr膜(導体層)
2hb Cu膜(シード層)
2ja 第1開口
2jb 第2開口
2ma 第3開口
2mb 第4開口
2r 第1キャップ膜(第1金属膜)
2t 第2キャップ膜(第2金属膜)
3 半田バンプ(バンプ)
4 プローブ針
5 ウエハプロセスパッケージ(半導体装置)
Claims (14)
- (a)複数の配線層の最上層に形成され、かつ表面に第1金属膜が形成された第1パッド電極と、前記第1パッド電極と電気的に接続されるとともに前記複数の配線層の最上層に形成され、かつ表面に第2金属膜が形成された第2パッド電極と、を有する半導体基板を準備する工程、
(b)前記第1パッド電極における前記第1金属膜を露出させる第1開口と、前記第2パッド電極における前記第2金属膜を露出させる第2開口と、を有する第1絶縁膜を形成する工程、
(c)前記第1絶縁膜上に、前記第1開口を覆いかつ前記第2開口を露出させるマスク層を形成する工程、
(d)前記第2開口を介して、前記第2パッド電極に電気的に接続する配線を形成する工程、
(e)前記第1パッド電極上および前記配線上に第2絶縁膜を形成する工程、
(f)前記第1パッド電極および前記配線のそれぞれの表面に有機反応層を残して前記第2絶縁膜の前記第1パッド電極上に第3開口を形成し、かつ前記第2絶縁膜の前記配線上に第4開口を形成する工程、
(g)前記(f)工程の後に前記半導体基板に熱処理を施す工程、
(h)前記第4開口の前記配線上にバンプを形成する工程、
を有する、半導体装置の製造方法。 - 請求項1に記載の半導体装置の製造方法において、
前記(d)工程の後、前記マスク層を除去して前記第1開口を露出させ、さらに前記第1パッド電極の前記第1金属膜を残して前記第1金属膜上の導体層をエッチングによって除去する、半導体装置の製造方法。 - 請求項2に記載の半導体装置の製造方法において、
前記導体層は、前記第1金属膜とは異なる材料からなる、半導体装置の製造方法。 - 請求項1に記載の半導体装置の製造方法において、
前記(g)工程の前記熱処理の温度は、前記バンプの融点より高い、半導体装置の製造方法。 - 請求項1に記載の半導体装置の製造方法において、
前記(f)工程と前記(g)工程との間に、前記第1パッド電極にプローブ針を接触させて第1プローブ検査を行う、半導体装置の製造方法。 - 請求項1に記載の半導体装置の製造方法において、
前記(g)工程の後、前記第1パッド電極にプローブ針を接触させて第2プローブ検査を行う、半導体装置の製造方法。 - 請求項1に記載の半導体装置の製造方法において、
前記(g)工程の後で、かつ前記(h)工程の前に、前記配線の表面の前記有機反応層を除去する、半導体装置の製造方法。 - 請求項1に記載の半導体装置の製造方法において、
前記(g)工程の前記熱処理は、前記半導体基板の半導体チップの領域に形成された不揮発性メモリのベークテストである、半導体装置の製造方法。 - 請求項1に記載の半導体装置の製造方法において、
前記第1開口の平面視の大きさは、前記第2開口の平面視の大きさより大きい、半導体装置の製造方法。 - 主面を備え、半導体回路が形成された半導体チップと、
前記半導体回路と電気的に接続され、前記主面に露出する複数の第1パッド電極と、
前記複数の第1パッド電極のそれぞれと電気的に接続され、前記複数の第1パッド電極のそれぞれと同一層に形成された複数の第2パッド電極と、
前記複数の第2パッド電極のそれぞれを覆い、前記複数の第2パッド電極のそれぞれと電気的に接続された複数の配線と、
前記複数の配線上に形成された絶縁膜と、
前記複数の配線のそれぞれにおける前記絶縁膜の開口部に設けられた複数のバンプと、
を有し、
前記複数の第1パッド電極のそれぞれの表面は、露出している、半導体装置。 - 請求項10に記載の半導体装置において、
前記複数の第1パッド電極のそれぞれの表面には金属膜が形成されており、前記金属膜は、前記複数の第2パッド電極のそれぞれの上に延在している、半導体装置。 - 請求項10に記載の半導体装置において、
前記複数の第1パッド電極のそれぞれは、前記半導体チップの端部側に配置され、かつ前記複数の第2パッド電極のそれぞれは、前記複数の第1パッド電極のそれぞれより内側に配置されており、
前記内側に配置された前記複数の第2パッド電極のそれぞれから前記配線が引き出されている、半導体装置。 - 請求項10に記載の半導体装置において、
前記半導体回路は、不揮発性メモリ回路を含む、半導体装置。 - 請求項10に記載の半導体装置において、
前記複数の第1パッド電極に金属ワイヤが接続されている、半導体装置。
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TW105123648A TW201719759A (zh) | 2015-08-27 | 2016-07-27 | 半導體裝置之製造方法及半導體裝置 |
EP16183620.0A EP3139404A1 (en) | 2015-08-27 | 2016-08-10 | Method of manufacturing semiconductor device and semiconductor device |
KR1020160104167A KR20170026138A (ko) | 2015-08-27 | 2016-08-17 | 반도체 장치의 제조 방법 및 반도체 장치 |
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CN201610730801.2A CN106486446A (zh) | 2015-08-27 | 2016-08-26 | 半导体装置的制造方法及半导体装置 |
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