JP2016502117A5 - - Google Patents

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JP2016502117A5
JP2016502117A5 JP2015550807A JP2015550807A JP2016502117A5 JP 2016502117 A5 JP2016502117 A5 JP 2016502117A5 JP 2015550807 A JP2015550807 A JP 2015550807A JP 2015550807 A JP2015550807 A JP 2015550807A JP 2016502117 A5 JP2016502117 A5 JP 2016502117A5
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Japan
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feature
unit
antenna
event
esd
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JP2015550807A
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JP6538566B2 (ja
JP2016502117A (ja
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Priority claimed from US14/140,860 external-priority patent/US9671448B2/en
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JP2015550807A 2012-12-28 2013-12-27 ツール内ｅｓｄ事象監視方法および装置 Active JP6538566B2 (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US201261747199P 2012-12-28 2012-12-28
US61/747,199 2012-12-28
US14/140,860 2013-12-26
US14/140,860 US9671448B2 (en) 2012-12-28 2013-12-26 In-tool ESD events monitoring method and apparatus
PCT/US2013/078038 WO2014106075A1 (en) 2012-12-28 2013-12-27 In-tool esd events monitoring method and apparatus

Publications (3)

Publication Number Publication Date
JP2016502117A JP2016502117A (ja) 2016-01-21
JP2016502117A5 true JP2016502117A5 (enExample) 2017-02-16
JP6538566B2 JP6538566B2 (ja) 2019-07-03

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JP2015550807A Active JP6538566B2 (ja) 2012-12-28 2013-12-27 ツール内ｅｓｄ事象監視方法および装置

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US (1) US9671448B2 (enExample)
EP (1) EP2939036B1 (enExample)
JP (1) JP6538566B2 (enExample)
KR (1) KR102054541B1 (enExample)
CN (2) CN105074481A (enExample)
SG (1) SG11201505153VA (enExample)
TW (1) TWI615618B (enExample)
WO (1) WO2014106075A1 (enExample)

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CN112698114B (zh) * 2020-12-10 2023-04-14 北京无线电测量研究所 一种天线近场数据采集方法和系统
CN113158441B (zh) * 2021-03-31 2024-12-17 胜达克半导体科技(上海)股份有限公司 一种芯片测试机内提高抓取信号精度的方法
CN113904736B (zh) * 2021-09-18 2023-05-23 中国电子科技集团公司第二十九研究所 一种多通道射频信号路由装置
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TWI792820B (zh) * 2021-12-30 2023-02-11 趙文煌 1kV以下的電源迴路絕緣劣化偵測預警裝置
TWI806647B (zh) * 2022-06-08 2023-06-21 英業達股份有限公司 射頻及電磁干擾的自動測試系統及其方法
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