SG11201505153VA - In-tool esd events monitoring method and apparatus - Google Patents

In-tool esd events monitoring method and apparatus

Info

Publication number
SG11201505153VA
SG11201505153VA SG11201505153VA SG11201505153VA SG11201505153VA SG 11201505153V A SG11201505153V A SG 11201505153VA SG 11201505153V A SG11201505153V A SG 11201505153VA SG 11201505153V A SG11201505153V A SG 11201505153VA SG 11201505153V A SG11201505153V A SG 11201505153VA
Authority
SG
Singapore
Prior art keywords
monitoring method
esd events
events monitoring
tool
tool esd
Prior art date
Application number
SG11201505153VA
Other languages
English (en)
Inventor
Lyle D Nelsen
Steven B Heymann
Mark E Hogsett
Original Assignee
Illinois Tool Works
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Illinois Tool Works filed Critical Illinois Tool Works
Publication of SG11201505153VA publication Critical patent/SG11201505153VA/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing
    • G01R31/002—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing where the device under test is an electronic circuit
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Relating To Insulation (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Elimination Of Static Electricity (AREA)
SG11201505153VA 2012-12-28 2013-12-27 In-tool esd events monitoring method and apparatus SG11201505153VA (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201261747199P 2012-12-28 2012-12-28
US14/140,860 US9671448B2 (en) 2012-12-28 2013-12-26 In-tool ESD events monitoring method and apparatus
PCT/US2013/078038 WO2014106075A1 (en) 2012-12-28 2013-12-27 In-tool esd events monitoring method and apparatus

Publications (1)

Publication Number Publication Date
SG11201505153VA true SG11201505153VA (en) 2015-08-28

Family

ID=51016477

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11201505153VA SG11201505153VA (en) 2012-12-28 2013-12-27 In-tool esd events monitoring method and apparatus

Country Status (8)

Country Link
US (1) US9671448B2 (enExample)
EP (1) EP2939036B1 (enExample)
JP (1) JP6538566B2 (enExample)
KR (1) KR102054541B1 (enExample)
CN (2) CN105074481A (enExample)
SG (1) SG11201505153VA (enExample)
TW (1) TWI615618B (enExample)
WO (1) WO2014106075A1 (enExample)

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CN108020698A (zh) * 2017-12-29 2018-05-11 江苏林洋能源股份有限公司 一种用于电能表防窃电的esd高压检测电路和方法
CN113039443A (zh) * 2018-09-11 2021-06-25 迈吉克汽车运动公司 用于在电气和/或电子电路上进行测试的工具和组件
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CN109669084A (zh) * 2018-12-13 2019-04-23 歌尔科技有限公司 设备esd测试方法和系统
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CN110646695B (zh) * 2019-09-29 2021-07-23 潍坊歌尔微电子有限公司 一种静电测试工装
DE102019217083A1 (de) * 2019-11-06 2021-05-06 Robert Bosch Gmbh Überwachungsanordnung zur Erkennung von Zuleitungsfehlern für ein Steuergerät
TWI772713B (zh) 2019-11-18 2022-08-01 和碩聯合科技股份有限公司 天線裝置及其靜電防護方法
KR102769072B1 (ko) * 2020-09-22 2025-02-18 삼성전자주식회사 Esd 테스트 방법 및 이를 수행하는 esd 테스트 시스템
CN112698114B (zh) * 2020-12-10 2023-04-14 北京无线电测量研究所 一种天线近场数据采集方法和系统
CN113158441B (zh) * 2021-03-31 2024-12-17 胜达克半导体科技(上海)股份有限公司 一种芯片测试机内提高抓取信号精度的方法
CN113904736B (zh) * 2021-09-18 2023-05-23 中国电子科技集团公司第二十九研究所 一种多通道射频信号路由装置
KR20230064052A (ko) 2021-11-02 2023-05-10 삼성전자주식회사 반도체 장치
TWI792820B (zh) * 2021-12-30 2023-02-11 趙文煌 1kV以下的電源迴路絕緣劣化偵測預警裝置
TWI806647B (zh) * 2022-06-08 2023-06-21 英業達股份有限公司 射頻及電磁干擾的自動測試系統及其方法
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CN116298648B (zh) * 2023-05-12 2023-09-19 合肥联宝信息技术有限公司 一种静电路径的检测方法、装置及电子设备
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Also Published As

Publication number Publication date
EP2939036B1 (en) 2017-05-24
KR20150103088A (ko) 2015-09-09
TWI615618B (zh) 2018-02-21
WO2014106075A1 (en) 2014-07-03
KR102054541B1 (ko) 2019-12-10
EP2939036A1 (en) 2015-11-04
US20140184253A1 (en) 2014-07-03
US9671448B2 (en) 2017-06-06
CN112327069A (zh) 2021-02-05
JP6538566B2 (ja) 2019-07-03
TW201432271A (zh) 2014-08-16
CN105074481A (zh) 2015-11-18
JP2016502117A (ja) 2016-01-21

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