JP2016176843A5 - - Google Patents

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JP2016176843A5
JP2016176843A5 JP2015058012A JP2015058012A JP2016176843A5 JP 2016176843 A5 JP2016176843 A5 JP 2016176843A5 JP 2015058012 A JP2015058012 A JP 2015058012A JP 2015058012 A JP2015058012 A JP 2015058012A JP 2016176843 A5 JP2016176843 A5 JP 2016176843A5
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semiconductor device
scan
circuit
self
memory
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JP2015058012A
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Japanese (ja)
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JP6491507B2 (ja
JP2016176843A (ja
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Priority to JP2015058012A priority Critical patent/JP6491507B2/ja
Priority claimed from JP2015058012A external-priority patent/JP6491507B2/ja
Priority to US15/007,246 priority patent/US9797950B2/en
Priority to CN201610128485.1A priority patent/CN105988464A/zh
Publication of JP2016176843A publication Critical patent/JP2016176843A/ja
Priority to US15/707,532 priority patent/US10317466B2/en
Publication of JP2016176843A5 publication Critical patent/JP2016176843A5/ja
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Publication of JP6491507B2 publication Critical patent/JP6491507B2/ja
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JP2015058012A 2015-03-20 2015-03-20 半導体装置、電子装置および半導体装置の自己診断方法 Expired - Fee Related JP6491507B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2015058012A JP6491507B2 (ja) 2015-03-20 2015-03-20 半導体装置、電子装置および半導体装置の自己診断方法
US15/007,246 US9797950B2 (en) 2015-03-20 2016-01-27 Semiconductor device, electronic device, and self-diagnosis method for semiconductor device
CN201610128485.1A CN105988464A (zh) 2015-03-20 2016-03-08 半导体装置、电子装置以及用于半导体装置的自诊断方法
US15/707,532 US10317466B2 (en) 2015-03-20 2017-09-18 Semiconductor device, electronic device, and self-diagnosis method for semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2015058012A JP6491507B2 (ja) 2015-03-20 2015-03-20 半導体装置、電子装置および半導体装置の自己診断方法

Publications (3)

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JP2016176843A JP2016176843A (ja) 2016-10-06
JP2016176843A5 true JP2016176843A5 (enExample) 2017-12-28
JP6491507B2 JP6491507B2 (ja) 2019-03-27

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US (2) US9797950B2 (enExample)
JP (1) JP6491507B2 (enExample)
CN (1) CN105988464A (enExample)

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