JP2012510742A5 - - Google Patents

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Publication number
JP2012510742A5
JP2012510742A5 JP2011537892A JP2011537892A JP2012510742A5 JP 2012510742 A5 JP2012510742 A5 JP 2012510742A5 JP 2011537892 A JP2011537892 A JP 2011537892A JP 2011537892 A JP2011537892 A JP 2011537892A JP 2012510742 A5 JP2012510742 A5 JP 2012510742A5
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JP
Japan
Prior art keywords
integrated circuit
duty cycle
operating speed
operating
clock signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2011537892A
Other languages
English (en)
Japanese (ja)
Other versions
JP2012510742A (ja
Filing date
Publication date
Priority claimed from DE102008059502A external-priority patent/DE102008059502A1/de
Application filed filed Critical
Publication of JP2012510742A publication Critical patent/JP2012510742A/ja
Publication of JP2012510742A5 publication Critical patent/JP2012510742A5/ja
Pending legal-status Critical Current

Links

JP2011537892A 2008-11-28 2009-11-27 クロックデューティサイクル適合による半導体デバイスの性能の低下の補償 Pending JP2012510742A (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
DE102008059502.0 2008-11-28
DE102008059502A DE102008059502A1 (de) 2008-11-28 2008-11-28 Kompensation der Leistungsbeeinträchtigung von Halbleiterbauelementen durch Anpassung des Tastgrades des Taktsignals
US12/604,532 2009-10-23
US12/604,532 US8018260B2 (en) 2008-11-28 2009-10-23 Compensation of degradation of performance of semiconductor devices by clock duty cycle adaptation
PCT/EP2009/008470 WO2010060638A1 (en) 2008-11-28 2009-11-27 Compensation of degradation of performance of semiconductor devices by clock duty cycle adaptation

Publications (2)

Publication Number Publication Date
JP2012510742A JP2012510742A (ja) 2012-05-10
JP2012510742A5 true JP2012510742A5 (enExample) 2013-01-17

Family

ID=42145369

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2011537892A Pending JP2012510742A (ja) 2008-11-28 2009-11-27 クロックデューティサイクル適合による半導体デバイスの性能の低下の補償

Country Status (6)

Country Link
US (1) US8018260B2 (enExample)
JP (1) JP2012510742A (enExample)
KR (1) KR20110138209A (enExample)
CN (1) CN102308283A (enExample)
DE (1) DE102008059502A1 (enExample)
WO (1) WO2010060638A1 (enExample)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8984305B2 (en) * 2010-12-21 2015-03-17 Intel Corporation Method and apparatus to configure thermal design power in a microprocessor
US8578143B2 (en) * 2011-05-17 2013-11-05 Apple Inc. Modifying operating parameters based on device use
JP2015002452A (ja) * 2013-06-17 2015-01-05 ピーエスフォー ルクスコ エスエイアールエルＰＳ４ Ｌｕｘｃｏ Ｓ．ａ．ｒ．ｌ． 半導体装置
US9465373B2 (en) 2013-09-17 2016-10-11 International Business Machines Corporation Dynamic adjustment of operational parameters to compensate for sensor based measurements of circuit degradation
KR102197943B1 (ko) 2014-04-04 2021-01-05 삼성전자주식회사 메모리 컨트롤러와 이를 포함하는 시스템
US9251890B1 (en) 2014-12-19 2016-02-02 Globalfoundries Inc. Bias temperature instability state detection and correction
US9704598B2 (en) * 2014-12-27 2017-07-11 Intel Corporation Use of in-field programmable fuses in the PCH dye
KR102235521B1 (ko) 2015-02-13 2021-04-05 삼성전자주식회사 특정 패턴을 갖는 저장 장치 및 그것의 동작 방법
US11605416B1 (en) * 2021-11-10 2023-03-14 Micron Technology, Inc. Reducing duty cycle degradation for a signal path
CN119231931B (zh) * 2024-12-03 2025-04-01 浙江绿力智能科技有限公司 一种转换器智能调控方法及系统

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04274100A (ja) * 1991-03-01 1992-09-30 Nec Corp テスト回路内蔵のメモリーｌｓｉ
JP2000012639A (ja) * 1998-06-24 2000-01-14 Toshiba Corp モニターｔｅｇのテスト回路
JP2002006003A (ja) * 2000-04-20 2002-01-09 Texas Instr Inc <Ti> 位相ロック・ループ用全ディジタル内蔵自己検査回路および検査方法
US6903564B1 (en) * 2003-11-12 2005-06-07 Transmeta Corporation Device aging determination circuit
JP4360825B2 (ja) * 2002-04-24 2009-11-11 株式会社半導体エネルギー研究所 半導体装置の寿命予測方法
US7475320B2 (en) * 2003-08-19 2009-01-06 International Business Machines Corporation Frequency modification techniques that adjust an operating frequency to compensate for aging electronic components
US7322001B2 (en) * 2005-10-04 2008-01-22 International Business Machines Corporation Apparatus and method for automatically self-calibrating a duty cycle circuit for maximum chip performance
US7333905B2 (en) * 2006-05-01 2008-02-19 International Business Machines Corporation Method and apparatus for measuring the duty cycle of a digital signal
US7330061B2 (en) * 2006-05-01 2008-02-12 International Business Machines Corporation Method and apparatus for correcting the duty cycle of a digital signal
US7495519B2 (en) * 2007-04-30 2009-02-24 International Business Machines Corporation System and method for monitoring reliability of a digital system

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