JP2015534673A5 - - Google Patents

Download PDF

Info

Publication number
JP2015534673A5
JP2015534673A5 JP2015531099A JP2015531099A JP2015534673A5 JP 2015534673 A5 JP2015534673 A5 JP 2015534673A5 JP 2015531099 A JP2015531099 A JP 2015531099A JP 2015531099 A JP2015531099 A JP 2015531099A JP 2015534673 A5 JP2015534673 A5 JP 2015534673A5
Authority
JP
Japan
Prior art keywords
ring oscillator
test
input
signal
chain
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2015531099A
Other languages
English (en)
Japanese (ja)
Other versions
JP2015534673A (ja
Filing date
Publication date
Priority claimed from US13/605,708 external-priority patent/US8841974B2/en
Application filed filed Critical
Publication of JP2015534673A publication Critical patent/JP2015534673A/ja
Publication of JP2015534673A5 publication Critical patent/JP2015534673A5/ja
Pending legal-status Critical Current

Links

JP2015531099A 2012-09-06 2013-08-15 リングオシレータのテストソリューション Pending JP2015534673A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US13/605,708 US8841974B2 (en) 2012-09-06 2012-09-06 Test solution for ring oscillators
US13/605,708 2012-09-06
PCT/US2013/055176 WO2014039226A1 (en) 2012-09-06 2013-08-15 Test solution for ring oscillators

Publications (2)

Publication Number Publication Date
JP2015534673A JP2015534673A (ja) 2015-12-03
JP2015534673A5 true JP2015534673A5 (enExample) 2016-09-29

Family

ID=50186712

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2015531099A Pending JP2015534673A (ja) 2012-09-06 2013-08-15 リングオシレータのテストソリューション

Country Status (7)

Country Link
US (1) US8841974B2 (enExample)
EP (1) EP2893639A4 (enExample)
JP (1) JP2015534673A (enExample)
KR (1) KR20150054899A (enExample)
CN (1) CN104604131A (enExample)
TW (1) TWI593234B (enExample)
WO (1) WO2014039226A1 (enExample)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6423277B2 (ja) * 2015-01-09 2018-11-14 株式会社メガチップス 乱数生成装置及び乱数生成方法
US9891276B2 (en) 2015-07-28 2018-02-13 International Business Machines Corporation Performance-screen ring oscillator (PSRO) using an integrated circuit test signal distribution network
US10078114B2 (en) * 2015-09-24 2018-09-18 Renesas Electronics Corporation Test point circuit, scan flip-flop for sequential test, semiconductor device and design device
CN106874177A (zh) * 2015-12-14 2017-06-20 中国航空工业第六八研究所 一种基于场景的锁存器测试方法
CN106656460A (zh) * 2016-11-22 2017-05-10 浙江大学 一种针对密码芯片电磁脉冲故障分析的防御装置
CN111010880A (zh) * 2018-08-08 2020-04-14 深圳市汇顶科技股份有限公司 随机数发生器的建模方法、装置、介质及随机数发生器
US11316687B2 (en) * 2019-03-04 2022-04-26 Cypress Semiconductor Corporation Encrypted gang programming
US10761809B1 (en) * 2020-03-12 2020-09-01 Katholieke Universiteit Leuven Random number generator
TWI719917B (zh) * 2020-07-14 2021-02-21 金麗科技股份有限公司 將類比動態電路運用於數位測試工具的處理方法
CN112504519B (zh) * 2020-11-23 2022-05-20 深圳市绘王动漫科技有限公司 一种压力检测电路、装置及压力输入装置
KR20220168916A (ko) 2021-06-17 2022-12-26 삼성전자주식회사 오실레이터 클럭 신호의 주기를 조정하는 클럭 생성 회로 및 그 방법
US12032460B2 (en) * 2022-02-11 2024-07-09 Stmicroelectronics S.R.L. Systems and methods to test an asynchronous finite machine

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0770573B2 (ja) * 1989-07-11 1995-07-31 富士通株式会社 半導体集積回路装置
US5963104A (en) * 1996-04-15 1999-10-05 Vlsi Technology, Inc. Standard cell ring oscillator of a non-deterministic randomizer circuit
US6069849A (en) * 1996-09-17 2000-05-30 Xilinx, Inc. Method and system for measuring signal propagation delays using the duty cycle of a ring oscillator
JP2000183694A (ja) * 1998-12-18 2000-06-30 Mitsumi Electric Co Ltd 発振回路
JP2002311091A (ja) * 2001-04-10 2002-10-23 Mitsubishi Electric Corp 半導体装置
JP2004096237A (ja) * 2002-08-29 2004-03-25 Nec Electronics Corp 発振回路及び半導体集積回路
US6798230B1 (en) * 2003-01-15 2004-09-28 Advanced Micro Devices, Inc. Structure and method for increasing accuracy in predicting hot carrier injection (HCI) degradation in semiconductor devices
US7205854B2 (en) * 2003-12-23 2007-04-17 Intel Corporation On-chip transistor degradation monitoring
US7233212B2 (en) * 2005-03-31 2007-06-19 International Business Machines Corporation Oscillator array with row and column control
US7675372B2 (en) * 2006-08-09 2010-03-09 Qualcomm Incorporated Circuit simulator parameter extraction using a configurable ring oscillator
US7532078B2 (en) * 2007-02-09 2009-05-12 International Business Machines Corporation Scannable virtual rail method and ring oscillator circuit for measuring variations in device characteristics
CN101373203A (zh) * 2007-08-21 2009-02-25 中芯国际集成电路制造(上海)有限公司 环形振荡器速度测试结构
US8676870B2 (en) * 2007-09-18 2014-03-18 Seagate Technology Llc Active test and alteration of sample times for a ring based random number generator
JP2009117894A (ja) * 2007-11-01 2009-05-28 Univ Of Tokyo 注入同期型発振器
JP4427581B2 (ja) * 2008-01-08 2010-03-10 株式会社東芝 乱数生成回路
US8081037B2 (en) * 2008-06-11 2011-12-20 Qualcomm Incorporated Ring oscillator using analog parallelism
DE102008048292B4 (de) * 2008-09-22 2012-07-12 Siemens Aktiengesellschaft Vorrichtung und Verfahren zum Erzeugen einer Zufallsbitfolge
JP2010087275A (ja) * 2008-09-30 2010-04-15 Panasonic Corp 半導体集積回路および電子機器
CN101819515B (zh) * 2010-02-08 2012-06-20 清华大学 基于环型振荡器的真随机数发生电路及真随机数发生器
US8381144B2 (en) * 2010-03-03 2013-02-19 Qualcomm Incorporated System and method of test mode gate operation

Similar Documents

Publication Publication Date Title
JP2015534673A5 (enExample)
Ameri et al. Mutual information as an order parameter for quantum synchronization
KR101987141B1 (ko) 난수 발생기
KR20140108362A (ko) 난수 발생기
US9933485B2 (en) Deterministic built-in self-test based on compressed test patterns stored on chip and their derivatives
US20110163818A1 (en) Apparatus and method for generating a random bit sequence
JP2020530599A (ja) 検出および補正機能を備えた真の乱数の発生方法および装置
Mureddu et al. Experimental study of locking phenomena on oscillating rings implemented in logic devices
JP6718096B1 (ja) ２入力ｘｏｒゲートに基づく低消費電力乱数発生装置
JP2016508003A5 (enExample)
JP2017507323A5 (enExample)
US9465585B2 (en) Method for detecting a correlation
US9983262B1 (en) Built-in self test controller for a random number generator core
US9195434B2 (en) Power supply for ring-oscillator based true random number generator and method of generating true random numbers
KR20150054899A (ko) 링 발진기들에 대한 테스트 솔루션
US9231567B2 (en) Test solution for a random number generator
Dolev et al. Synchronous counting and computational algorithm design
Kitsos et al. FPGA Trojan detection using length-optimized ring oscillators
EP3102957A1 (en) Remote test management of digital logic circuits
Canham et al. Evolved fault tolerance in evolvable hardware
US20150193206A1 (en) Method for generating an output of a random source of a random generator
Della Sala et al. The DD-cell: A double side entropic source exploitable as PUF and TRNG
Addabbo et al. Digital nonlinear oscillators in PLDs: Pitfalls and open perspectives for a novel class of true random number generators
JP6220642B2 (ja) 乱数生成モードを備える記憶回路
US20150193208A1 (en) Random Number Generator Using Ring Oscillators With Initial Delay