CN104604131A - 环形振荡器的测试方案 - Google Patents
环形振荡器的测试方案 Download PDFInfo
- Publication number
- CN104604131A CN104604131A CN201380046554.9A CN201380046554A CN104604131A CN 104604131 A CN104604131 A CN 104604131A CN 201380046554 A CN201380046554 A CN 201380046554A CN 104604131 A CN104604131 A CN 104604131A
- Authority
- CN
- China
- Prior art keywords
- test
- ring oscillator
- chain
- input
- feedback
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000012085 test solution Substances 0.000 title 1
- 238000012360 testing method Methods 0.000 claims abstract description 301
- 238000011990 functional testing Methods 0.000 claims description 23
- 230000010355 oscillation Effects 0.000 claims description 5
- 230000004913 activation Effects 0.000 claims description 3
- 230000033228 biological regulation Effects 0.000 claims description 3
- 230000004044 response Effects 0.000 claims description 2
- 230000008878 coupling Effects 0.000 claims 1
- 238000010168 coupling process Methods 0.000 claims 1
- 238000005859 coupling reaction Methods 0.000 claims 1
- 238000000034 method Methods 0.000 abstract description 10
- 230000003534 oscillatory effect Effects 0.000 abstract 2
- 230000006870 function Effects 0.000 description 15
- 230000006399 behavior Effects 0.000 description 11
- 230000009466 transformation Effects 0.000 description 11
- 230000008859 change Effects 0.000 description 10
- 230000014759 maintenance of location Effects 0.000 description 5
- 230000008569 process Effects 0.000 description 5
- 238000010998 test method Methods 0.000 description 5
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 4
- 230000007547 defect Effects 0.000 description 4
- 229910052710 silicon Inorganic materials 0.000 description 4
- 239000010703 silicon Substances 0.000 description 4
- 238000003860 storage Methods 0.000 description 4
- 230000008901 benefit Effects 0.000 description 3
- 238000010276 construction Methods 0.000 description 3
- 238000001514 detection method Methods 0.000 description 3
- 230000007246 mechanism Effects 0.000 description 3
- 230000003287 optical effect Effects 0.000 description 3
- 230000000295 complement effect Effects 0.000 description 2
- 238000004590 computer program Methods 0.000 description 2
- 238000003745 diagnosis Methods 0.000 description 2
- 230000014509 gene expression Effects 0.000 description 2
- GOLXNESZZPUPJE-UHFFFAOYSA-N spiromesifen Chemical compound CC1=CC(C)=CC(C)=C1C(C(O1)=O)=C(OC(=O)CC(C)(C)C)C11CCCC1 GOLXNESZZPUPJE-UHFFFAOYSA-N 0.000 description 2
- 230000003068 static effect Effects 0.000 description 2
- 238000012546 transfer Methods 0.000 description 2
- 238000009825 accumulation Methods 0.000 description 1
- 230000009471 action Effects 0.000 description 1
- 229910002056 binary alloy Inorganic materials 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 238000005070 sampling Methods 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 230000002123 temporal effect Effects 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
- H03K3/02—Generators characterised by the type of circuit or by the means used for producing pulses
- H03K3/027—Generators characterised by the type of circuit or by the means used for producing pulses by the use of logic circuits, with internal or external positive feedback
- H03K3/03—Astable circuits
- H03K3/0315—Ring oscillators
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318502—Test of Combinational circuits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31708—Analysis of signal quality
- G01R31/31709—Jitter measurements; Jitter generators
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Tests Of Electronic Circuits (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US13/605,708 | 2012-09-06 | ||
| US13/605,708 US8841974B2 (en) | 2012-09-06 | 2012-09-06 | Test solution for ring oscillators |
| PCT/US2013/055176 WO2014039226A1 (en) | 2012-09-06 | 2013-08-15 | Test solution for ring oscillators |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN104604131A true CN104604131A (zh) | 2015-05-06 |
Family
ID=50186712
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201380046554.9A Pending CN104604131A (zh) | 2012-09-06 | 2013-08-15 | 环形振荡器的测试方案 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US8841974B2 (enExample) |
| EP (1) | EP2893639A4 (enExample) |
| JP (1) | JP2015534673A (enExample) |
| KR (1) | KR20150054899A (enExample) |
| CN (1) | CN104604131A (enExample) |
| TW (1) | TWI593234B (enExample) |
| WO (1) | WO2014039226A1 (enExample) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106656460A (zh) * | 2016-11-22 | 2017-05-10 | 浙江大学 | 一种针对密码芯片电磁脉冲故障分析的防御装置 |
| CN106874177A (zh) * | 2015-12-14 | 2017-06-20 | 中国航空工业第六八研究所 | 一种基于场景的锁存器测试方法 |
| WO2020029141A1 (zh) * | 2018-08-08 | 2020-02-13 | 深圳市汇顶科技股份有限公司 | 随机数发生器的建模方法、装置、介质及随机数发生器 |
Families Citing this family (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP6423277B2 (ja) * | 2015-01-09 | 2018-11-14 | 株式会社メガチップス | 乱数生成装置及び乱数生成方法 |
| US9891276B2 (en) | 2015-07-28 | 2018-02-13 | International Business Machines Corporation | Performance-screen ring oscillator (PSRO) using an integrated circuit test signal distribution network |
| US10078114B2 (en) * | 2015-09-24 | 2018-09-18 | Renesas Electronics Corporation | Test point circuit, scan flip-flop for sequential test, semiconductor device and design device |
| US11316687B2 (en) * | 2019-03-04 | 2022-04-26 | Cypress Semiconductor Corporation | Encrypted gang programming |
| US10761809B1 (en) * | 2020-03-12 | 2020-09-01 | Katholieke Universiteit Leuven | Random number generator |
| TWI719917B (zh) * | 2020-07-14 | 2021-02-21 | 金麗科技股份有限公司 | 將類比動態電路運用於數位測試工具的處理方法 |
| CN112504519B (zh) * | 2020-11-23 | 2022-05-20 | 深圳市绘王动漫科技有限公司 | 一种压力检测电路、装置及压力输入装置 |
| KR20220168916A (ko) | 2021-06-17 | 2022-12-26 | 삼성전자주식회사 | 오실레이터 클럭 신호의 주기를 조정하는 클럭 생성 회로 및 그 방법 |
| US12032460B2 (en) * | 2022-02-11 | 2024-07-09 | Stmicroelectronics S.R.L. | Systems and methods to test an asynchronous finite machine |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101373203A (zh) * | 2007-08-21 | 2009-02-25 | 中芯国际集成电路制造(上海)有限公司 | 环形振荡器速度测试结构 |
| JP2009117894A (ja) * | 2007-11-01 | 2009-05-28 | Univ Of Tokyo | 注入同期型発振器 |
| CN101819515A (zh) * | 2010-02-08 | 2010-09-01 | 清华大学 | 基于环型振荡器的真随机数发生电路及真随机数发生器 |
| US20110163818A1 (en) * | 2008-09-22 | 2011-07-07 | Markus Dichtl | Apparatus and method for generating a random bit sequence |
Family Cites Families (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0770573B2 (ja) * | 1989-07-11 | 1995-07-31 | 富士通株式会社 | 半導体集積回路装置 |
| US5963104A (en) * | 1996-04-15 | 1999-10-05 | Vlsi Technology, Inc. | Standard cell ring oscillator of a non-deterministic randomizer circuit |
| US6069849A (en) * | 1996-09-17 | 2000-05-30 | Xilinx, Inc. | Method and system for measuring signal propagation delays using the duty cycle of a ring oscillator |
| JP2000183694A (ja) * | 1998-12-18 | 2000-06-30 | Mitsumi Electric Co Ltd | 発振回路 |
| JP2002311091A (ja) * | 2001-04-10 | 2002-10-23 | Mitsubishi Electric Corp | 半導体装置 |
| JP2004096237A (ja) * | 2002-08-29 | 2004-03-25 | Nec Electronics Corp | 発振回路及び半導体集積回路 |
| US6798230B1 (en) * | 2003-01-15 | 2004-09-28 | Advanced Micro Devices, Inc. | Structure and method for increasing accuracy in predicting hot carrier injection (HCI) degradation in semiconductor devices |
| US7205854B2 (en) * | 2003-12-23 | 2007-04-17 | Intel Corporation | On-chip transistor degradation monitoring |
| US7233212B2 (en) * | 2005-03-31 | 2007-06-19 | International Business Machines Corporation | Oscillator array with row and column control |
| US7675372B2 (en) * | 2006-08-09 | 2010-03-09 | Qualcomm Incorporated | Circuit simulator parameter extraction using a configurable ring oscillator |
| US7532078B2 (en) * | 2007-02-09 | 2009-05-12 | International Business Machines Corporation | Scannable virtual rail method and ring oscillator circuit for measuring variations in device characteristics |
| US8676870B2 (en) * | 2007-09-18 | 2014-03-18 | Seagate Technology Llc | Active test and alteration of sample times for a ring based random number generator |
| JP4427581B2 (ja) * | 2008-01-08 | 2010-03-10 | 株式会社東芝 | 乱数生成回路 |
| US8081037B2 (en) * | 2008-06-11 | 2011-12-20 | Qualcomm Incorporated | Ring oscillator using analog parallelism |
| JP2010087275A (ja) * | 2008-09-30 | 2010-04-15 | Panasonic Corp | 半導体集積回路および電子機器 |
| US8381144B2 (en) * | 2010-03-03 | 2013-02-19 | Qualcomm Incorporated | System and method of test mode gate operation |
-
2012
- 2012-09-06 US US13/605,708 patent/US8841974B2/en active Active
-
2013
- 2013-08-15 KR KR1020157008839A patent/KR20150054899A/ko not_active Withdrawn
- 2013-08-15 WO PCT/US2013/055176 patent/WO2014039226A1/en not_active Ceased
- 2013-08-15 EP EP13835091.3A patent/EP2893639A4/en not_active Withdrawn
- 2013-08-15 JP JP2015531099A patent/JP2015534673A/ja active Pending
- 2013-08-15 CN CN201380046554.9A patent/CN104604131A/zh active Pending
- 2013-08-27 TW TW102130640A patent/TWI593234B/zh not_active IP Right Cessation
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101373203A (zh) * | 2007-08-21 | 2009-02-25 | 中芯国际集成电路制造(上海)有限公司 | 环形振荡器速度测试结构 |
| JP2009117894A (ja) * | 2007-11-01 | 2009-05-28 | Univ Of Tokyo | 注入同期型発振器 |
| US20110163818A1 (en) * | 2008-09-22 | 2011-07-07 | Markus Dichtl | Apparatus and method for generating a random bit sequence |
| CN101819515A (zh) * | 2010-02-08 | 2010-09-01 | 清华大学 | 基于环型振荡器的真随机数发生电路及真随机数发生器 |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106874177A (zh) * | 2015-12-14 | 2017-06-20 | 中国航空工业第六八研究所 | 一种基于场景的锁存器测试方法 |
| CN106656460A (zh) * | 2016-11-22 | 2017-05-10 | 浙江大学 | 一种针对密码芯片电磁脉冲故障分析的防御装置 |
| WO2020029141A1 (zh) * | 2018-08-08 | 2020-02-13 | 深圳市汇顶科技股份有限公司 | 随机数发生器的建模方法、装置、介质及随机数发生器 |
| CN111010880A (zh) * | 2018-08-08 | 2020-04-14 | 深圳市汇顶科技股份有限公司 | 随机数发生器的建模方法、装置、介质及随机数发生器 |
Also Published As
| Publication number | Publication date |
|---|---|
| KR20150054899A (ko) | 2015-05-20 |
| TW201419758A (zh) | 2014-05-16 |
| US8841974B2 (en) | 2014-09-23 |
| EP2893639A1 (en) | 2015-07-15 |
| US20140062606A1 (en) | 2014-03-06 |
| JP2015534673A (ja) | 2015-12-03 |
| EP2893639A4 (en) | 2016-06-22 |
| WO2014039226A1 (en) | 2014-03-13 |
| TWI593234B (zh) | 2017-07-21 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C41 | Transfer of patent application or patent right or utility model | ||
| TA01 | Transfer of patent application right |
Effective date of registration: 20151030 Address after: oregon Applicant after: LATTICE SEMICONDUCTOR CORPORATION Address before: American California Applicant before: Silicon Image Inc. A. Delaware C. |
|
| C02 | Deemed withdrawal of patent application after publication (patent law 2001) | ||
| WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20150506 |