KR20150054899A - 링 발진기들에 대한 테스트 솔루션 - Google Patents

링 발진기들에 대한 테스트 솔루션 Download PDF

Info

Publication number
KR20150054899A
KR20150054899A KR1020157008839A KR20157008839A KR20150054899A KR 20150054899 A KR20150054899 A KR 20150054899A KR 1020157008839 A KR1020157008839 A KR 1020157008839A KR 20157008839 A KR20157008839 A KR 20157008839A KR 20150054899 A KR20150054899 A KR 20150054899A
Authority
KR
South Korea
Prior art keywords
test
ring oscillator
ring
oscillators
chain
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
KR1020157008839A
Other languages
English (en)
Korean (ko)
Inventor
진송 설
혁영 권
앤디 엔지
Original Assignee
실리콘 이미지, 인크.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 실리콘 이미지, 인크. filed Critical 실리콘 이미지, 인크.
Publication of KR20150054899A publication Critical patent/KR20150054899A/ko
Withdrawn legal-status Critical Current

Links

Images

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/02—Generators characterised by the type of circuit or by the means used for producing pulses
    • H03K3/027—Generators characterised by the type of circuit or by the means used for producing pulses by the use of logic circuits, with internal or external positive feedback
    • H03K3/03—Astable circuits
    • H03K3/0315—Ring oscillators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318502—Test of Combinational circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31708—Analysis of signal quality
    • G01R31/31709—Jitter measurements; Jitter generators

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Tests Of Electronic Circuits (AREA)
KR1020157008839A 2012-09-06 2013-08-15 링 발진기들에 대한 테스트 솔루션 Withdrawn KR20150054899A (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US13/605,708 US8841974B2 (en) 2012-09-06 2012-09-06 Test solution for ring oscillators
US13/605,708 2012-09-06
PCT/US2013/055176 WO2014039226A1 (en) 2012-09-06 2013-08-15 Test solution for ring oscillators

Publications (1)

Publication Number Publication Date
KR20150054899A true KR20150054899A (ko) 2015-05-20

Family

ID=50186712

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020157008839A Withdrawn KR20150054899A (ko) 2012-09-06 2013-08-15 링 발진기들에 대한 테스트 솔루션

Country Status (7)

Country Link
US (1) US8841974B2 (enExample)
EP (1) EP2893639A4 (enExample)
JP (1) JP2015534673A (enExample)
KR (1) KR20150054899A (enExample)
CN (1) CN104604131A (enExample)
TW (1) TWI593234B (enExample)
WO (1) WO2014039226A1 (enExample)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6423277B2 (ja) * 2015-01-09 2018-11-14 株式会社メガチップス 乱数生成装置及び乱数生成方法
US9891276B2 (en) 2015-07-28 2018-02-13 International Business Machines Corporation Performance-screen ring oscillator (PSRO) using an integrated circuit test signal distribution network
US10078114B2 (en) * 2015-09-24 2018-09-18 Renesas Electronics Corporation Test point circuit, scan flip-flop for sequential test, semiconductor device and design device
CN106874177A (zh) * 2015-12-14 2017-06-20 中国航空工业第六八研究所 一种基于场景的锁存器测试方法
CN106656460A (zh) * 2016-11-22 2017-05-10 浙江大学 一种针对密码芯片电磁脉冲故障分析的防御装置
CN111010880A (zh) * 2018-08-08 2020-04-14 深圳市汇顶科技股份有限公司 随机数发生器的建模方法、装置、介质及随机数发生器
US11316687B2 (en) * 2019-03-04 2022-04-26 Cypress Semiconductor Corporation Encrypted gang programming
US10761809B1 (en) * 2020-03-12 2020-09-01 Katholieke Universiteit Leuven Random number generator
TWI719917B (zh) * 2020-07-14 2021-02-21 金麗科技股份有限公司 將類比動態電路運用於數位測試工具的處理方法
CN112504519B (zh) * 2020-11-23 2022-05-20 深圳市绘王动漫科技有限公司 一种压力检测电路、装置及压力输入装置
KR20220168916A (ko) 2021-06-17 2022-12-26 삼성전자주식회사 오실레이터 클럭 신호의 주기를 조정하는 클럭 생성 회로 및 그 방법
US12032460B2 (en) * 2022-02-11 2024-07-09 Stmicroelectronics S.R.L. Systems and methods to test an asynchronous finite machine

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0770573B2 (ja) * 1989-07-11 1995-07-31 富士通株式会社 半導体集積回路装置
US5963104A (en) * 1996-04-15 1999-10-05 Vlsi Technology, Inc. Standard cell ring oscillator of a non-deterministic randomizer circuit
US6069849A (en) * 1996-09-17 2000-05-30 Xilinx, Inc. Method and system for measuring signal propagation delays using the duty cycle of a ring oscillator
JP2000183694A (ja) * 1998-12-18 2000-06-30 Mitsumi Electric Co Ltd 発振回路
JP2002311091A (ja) * 2001-04-10 2002-10-23 Mitsubishi Electric Corp 半導体装置
JP2004096237A (ja) * 2002-08-29 2004-03-25 Nec Electronics Corp 発振回路及び半導体集積回路
US6798230B1 (en) * 2003-01-15 2004-09-28 Advanced Micro Devices, Inc. Structure and method for increasing accuracy in predicting hot carrier injection (HCI) degradation in semiconductor devices
US7205854B2 (en) * 2003-12-23 2007-04-17 Intel Corporation On-chip transistor degradation monitoring
US7233212B2 (en) * 2005-03-31 2007-06-19 International Business Machines Corporation Oscillator array with row and column control
US7675372B2 (en) * 2006-08-09 2010-03-09 Qualcomm Incorporated Circuit simulator parameter extraction using a configurable ring oscillator
US7532078B2 (en) * 2007-02-09 2009-05-12 International Business Machines Corporation Scannable virtual rail method and ring oscillator circuit for measuring variations in device characteristics
CN101373203A (zh) * 2007-08-21 2009-02-25 中芯国际集成电路制造(上海)有限公司 环形振荡器速度测试结构
US8676870B2 (en) * 2007-09-18 2014-03-18 Seagate Technology Llc Active test and alteration of sample times for a ring based random number generator
JP2009117894A (ja) * 2007-11-01 2009-05-28 Univ Of Tokyo 注入同期型発振器
JP4427581B2 (ja) * 2008-01-08 2010-03-10 株式会社東芝 乱数生成回路
US8081037B2 (en) * 2008-06-11 2011-12-20 Qualcomm Incorporated Ring oscillator using analog parallelism
DE102008048292B4 (de) * 2008-09-22 2012-07-12 Siemens Aktiengesellschaft Vorrichtung und Verfahren zum Erzeugen einer Zufallsbitfolge
JP2010087275A (ja) * 2008-09-30 2010-04-15 Panasonic Corp 半導体集積回路および電子機器
CN101819515B (zh) * 2010-02-08 2012-06-20 清华大学 基于环型振荡器的真随机数发生电路及真随机数发生器
US8381144B2 (en) * 2010-03-03 2013-02-19 Qualcomm Incorporated System and method of test mode gate operation

Also Published As

Publication number Publication date
JP2015534673A (ja) 2015-12-03
WO2014039226A1 (en) 2014-03-13
TW201419758A (zh) 2014-05-16
EP2893639A1 (en) 2015-07-15
CN104604131A (zh) 2015-05-06
TWI593234B (zh) 2017-07-21
EP2893639A4 (en) 2016-06-22
US8841974B2 (en) 2014-09-23
US20140062606A1 (en) 2014-03-06

Similar Documents

Publication Publication Date Title
US8841974B2 (en) Test solution for ring oscillators
US9231567B2 (en) Test solution for a random number generator
US8479068B2 (en) Decoded register outputs enabling test clock to selected asynchronous domains
US6961886B2 (en) Diagnostic method for structural scan chain designs
US9666302B1 (en) System and method for memory scan design-for-test
US10386413B2 (en) Circuit and method for testing flip flop state retention
US8819508B2 (en) Scan test circuitry configured to prevent violation of multiplexer select signal constraints during scan testing
US9983262B1 (en) Built-in self test controller for a random number generator core
Da Rolt et al. A smart test controller for scan chains in secure circuits
JP2004233084A (ja) 半導体集積回路およびスキャンテスト法
US20160349318A1 (en) Dynamic Clock Chain Bypass
US10996271B1 (en) Fast IJTAG
US9234938B2 (en) Monitoring on-chip clock control during integrated circuit testing
CN107703442A (zh) 基于抗差分扫描攻击的数据置乱安全扫描装置
US9568551B1 (en) Scan wrapper circuit for integrated circuit
EP1890234B1 (en) Microcomputer and method for testing the same
Vo et al. Design for board and system level structural test and diagnosis
US10520550B2 (en) Reconfigurable scan network defect diagnosis
Karmakar et al. On securing scan obfuscation strategies against ScanSAT attack
US10459029B2 (en) On-chip clock control monitoring
US20060195738A1 (en) Merged MISR and output register without performance impact for circuits under test
US9506983B2 (en) Chip authentication using scan chains
US7962766B2 (en) Method and system for encryption-based design obfuscation for an integrated circuit
Kumar et al. PUF-based secure test wrapper for SoC testing
JP2005339675A (ja) 半導体集積回路装置

Legal Events

Date Code Title Description
PA0105 International application

Patent event date: 20150406

Patent event code: PA01051R01D

Comment text: International Patent Application

PG1501 Laying open of application
N231 Notification of change of applicant
PN2301 Change of applicant

Patent event date: 20160205

Comment text: Notification of Change of Applicant

Patent event code: PN23011R01D

PC1203 Withdrawal of no request for examination
WITN Application deemed withdrawn, e.g. because no request for examination was filed or no examination fee was paid