JP2015534673A - リングオシレータのテストソリューション - Google Patents

リングオシレータのテストソリューション Download PDF

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Publication number
JP2015534673A
JP2015534673A JP2015531099A JP2015531099A JP2015534673A JP 2015534673 A JP2015534673 A JP 2015534673A JP 2015531099 A JP2015531099 A JP 2015531099A JP 2015531099 A JP2015531099 A JP 2015531099A JP 2015534673 A JP2015534673 A JP 2015534673A
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Japan
Prior art keywords
test
ring oscillator
ring
chain
output
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Pending
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JP2015531099A
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English (en)
Japanese (ja)
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JP2015534673A5 (enExample
Inventor
チンソン スル
チンソン スル
ヒュキョン クウォン
ヒュキョン クウォン
アンディ ンー
アンディ ンー
Original Assignee
シリコン イメージ，インコーポレイテッド
シリコン イメージ，インコーポレイテッド
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Application filed by シリコン イメージ，インコーポレイテッド, シリコン イメージ，インコーポレイテッド filed Critical シリコン イメージ，インコーポレイテッド
Publication of JP2015534673A publication Critical patent/JP2015534673A/ja
Publication of JP2015534673A5 publication Critical patent/JP2015534673A5/ja
Pending legal-status Critical Current

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    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/02—Generators characterised by the type of circuit or by the means used for producing pulses
    • H03K3/027—Generators characterised by the type of circuit or by the means used for producing pulses by the use of logic circuits, with internal or external positive feedback
    • H03K3/03—Astable circuits
    • H03K3/0315—Ring oscillators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318502—Test of Combinational circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31708—Analysis of signal quality
    • G01R31/31709—Jitter measurements; Jitter generators

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Tests Of Electronic Circuits (AREA)
JP2015531099A 2012-09-06 2013-08-15 リングオシレータのテストソリューション Pending JP2015534673A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US13/605,708 US8841974B2 (en) 2012-09-06 2012-09-06 Test solution for ring oscillators
US13/605,708 2012-09-06
PCT/US2013/055176 WO2014039226A1 (en) 2012-09-06 2013-08-15 Test solution for ring oscillators

Publications (2)

Publication Number Publication Date
JP2015534673A true JP2015534673A (ja) 2015-12-03
JP2015534673A5 JP2015534673A5 (enExample) 2016-09-29

Family

ID=50186712

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2015531099A Pending JP2015534673A (ja) 2012-09-06 2013-08-15 リングオシレータのテストソリューション

Country Status (7)

Country Link
US (1) US8841974B2 (enExample)
EP (1) EP2893639A4 (enExample)
JP (1) JP2015534673A (enExample)
KR (1) KR20150054899A (enExample)
CN (1) CN104604131A (enExample)
TW (1) TWI593234B (enExample)
WO (1) WO2014039226A1 (enExample)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2021144672A (ja) * 2020-03-12 2021-09-24 カトリーケ・ユニフェルシテイト・ルーヴァンKatholieke Universiteit Leuven 乱数発生器
JP2022523558A (ja) * 2019-03-04 2022-04-25 サイプレス セミコンダクター コーポレーション 暗号化ギャングプログラミング

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Publication number Priority date Publication date Assignee Title
JP6423277B2 (ja) * 2015-01-09 2018-11-14 株式会社メガチップス 乱数生成装置及び乱数生成方法
US9891276B2 (en) 2015-07-28 2018-02-13 International Business Machines Corporation Performance-screen ring oscillator (PSRO) using an integrated circuit test signal distribution network
US10078114B2 (en) * 2015-09-24 2018-09-18 Renesas Electronics Corporation Test point circuit, scan flip-flop for sequential test, semiconductor device and design device
CN106874177A (zh) * 2015-12-14 2017-06-20 中国航空工业第六八研究所 一种基于场景的锁存器测试方法
CN106656460A (zh) * 2016-11-22 2017-05-10 浙江大学 一种针对密码芯片电磁脉冲故障分析的防御装置
CN111010880A (zh) * 2018-08-08 2020-04-14 深圳市汇顶科技股份有限公司 随机数发生器的建模方法、装置、介质及随机数发生器
TWI719917B (zh) * 2020-07-14 2021-02-21 金麗科技股份有限公司 將類比動態電路運用於數位測試工具的處理方法
CN112504519B (zh) * 2020-11-23 2022-05-20 深圳市绘王动漫科技有限公司 一种压力检测电路、装置及压力输入装置
KR20220168916A (ko) 2021-06-17 2022-12-26 삼성전자주식회사 오실레이터 클럭 신호의 주기를 조정하는 클럭 생성 회로 및 그 방법
US12032460B2 (en) * 2022-02-11 2024-07-09 Stmicroelectronics S.R.L. Systems and methods to test an asynchronous finite machine

Citations (5)

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US5341096A (en) * 1989-07-11 1994-08-23 Fujitsu Limited Semiconductor integrated circuit having a scan circuit provided with a self-contained signal generator circuit
JP2000183694A (ja) * 1998-12-18 2000-06-30 Mitsumi Electric Co Ltd 発振回路
JP2002311091A (ja) * 2001-04-10 2002-10-23 Mitsubishi Electric Corp 半導体装置
US6798230B1 (en) * 2003-01-15 2004-09-28 Advanced Micro Devices, Inc. Structure and method for increasing accuracy in predicting hot carrier injection (HCI) degradation in semiconductor devices
US7532078B2 (en) * 2007-02-09 2009-05-12 International Business Machines Corporation Scannable virtual rail method and ring oscillator circuit for measuring variations in device characteristics

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US5963104A (en) * 1996-04-15 1999-10-05 Vlsi Technology, Inc. Standard cell ring oscillator of a non-deterministic randomizer circuit
US6069849A (en) * 1996-09-17 2000-05-30 Xilinx, Inc. Method and system for measuring signal propagation delays using the duty cycle of a ring oscillator
JP2004096237A (ja) * 2002-08-29 2004-03-25 Nec Electronics Corp 発振回路及び半導体集積回路
US7205854B2 (en) * 2003-12-23 2007-04-17 Intel Corporation On-chip transistor degradation monitoring
US7233212B2 (en) * 2005-03-31 2007-06-19 International Business Machines Corporation Oscillator array with row and column control
US7675372B2 (en) * 2006-08-09 2010-03-09 Qualcomm Incorporated Circuit simulator parameter extraction using a configurable ring oscillator
CN101373203A (zh) * 2007-08-21 2009-02-25 中芯国际集成电路制造(上海)有限公司 环形振荡器速度测试结构
US8676870B2 (en) * 2007-09-18 2014-03-18 Seagate Technology Llc Active test and alteration of sample times for a ring based random number generator
JP2009117894A (ja) * 2007-11-01 2009-05-28 Univ Of Tokyo 注入同期型発振器
JP4427581B2 (ja) * 2008-01-08 2010-03-10 株式会社東芝 乱数生成回路
US8081037B2 (en) * 2008-06-11 2011-12-20 Qualcomm Incorporated Ring oscillator using analog parallelism
DE102008048292B4 (de) * 2008-09-22 2012-07-12 Siemens Aktiengesellschaft Vorrichtung und Verfahren zum Erzeugen einer Zufallsbitfolge
JP2010087275A (ja) * 2008-09-30 2010-04-15 Panasonic Corp 半導体集積回路および電子機器
CN101819515B (zh) * 2010-02-08 2012-06-20 清华大学 基于环型振荡器的真随机数发生电路及真随机数发生器
US8381144B2 (en) * 2010-03-03 2013-02-19 Qualcomm Incorporated System and method of test mode gate operation

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5341096A (en) * 1989-07-11 1994-08-23 Fujitsu Limited Semiconductor integrated circuit having a scan circuit provided with a self-contained signal generator circuit
JP2000183694A (ja) * 1998-12-18 2000-06-30 Mitsumi Electric Co Ltd 発振回路
JP2002311091A (ja) * 2001-04-10 2002-10-23 Mitsubishi Electric Corp 半導体装置
US6798230B1 (en) * 2003-01-15 2004-09-28 Advanced Micro Devices, Inc. Structure and method for increasing accuracy in predicting hot carrier injection (HCI) degradation in semiconductor devices
US7532078B2 (en) * 2007-02-09 2009-05-12 International Business Machines Corporation Scannable virtual rail method and ring oscillator circuit for measuring variations in device characteristics

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2022523558A (ja) * 2019-03-04 2022-04-25 サイプレス セミコンダクター コーポレーション 暗号化ギャングプログラミング
JP7309893B2 (ja) 2019-03-04 2023-07-18 サイプレス セミコンダクター コーポレーション 暗号化ギャングプログラミング
JP2021144672A (ja) * 2020-03-12 2021-09-24 カトリーケ・ユニフェルシテイト・ルーヴァンKatholieke Universiteit Leuven 乱数発生器

Also Published As

Publication number Publication date
WO2014039226A1 (en) 2014-03-13
KR20150054899A (ko) 2015-05-20
TW201419758A (zh) 2014-05-16
EP2893639A1 (en) 2015-07-15
CN104604131A (zh) 2015-05-06
TWI593234B (zh) 2017-07-21
EP2893639A4 (en) 2016-06-22
US8841974B2 (en) 2014-09-23
US20140062606A1 (en) 2014-03-06

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