JP2015528590A5 - - Google Patents

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Publication number
JP2015528590A5
JP2015528590A5 JP2015530045A JP2015530045A JP2015528590A5 JP 2015528590 A5 JP2015528590 A5 JP 2015528590A5 JP 2015530045 A JP2015530045 A JP 2015530045A JP 2015530045 A JP2015530045 A JP 2015530045A JP 2015528590 A5 JP2015528590 A5 JP 2015528590A5
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JP
Japan
Prior art keywords
sample
focal plane
objective lens
focus
stop
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JP2015530045A
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English (en)
Japanese (ja)
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JP2015528590A (ja
JP6310460B2 (ja
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Priority claimed from US13/600,962 external-priority patent/US9488819B2/en
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Publication of JP2015528590A5 publication Critical patent/JP2015528590A5/ja
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Publication of JP6310460B2 publication Critical patent/JP6310460B2/ja
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JP2015530045A 2012-08-31 2013-08-29 透明な又は低コントラストの試料の分析のための自動顕微鏡焦点システム及び方法 Active JP6310460B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US13/600,962 US9488819B2 (en) 2012-08-31 2012-08-31 Automatic microscopic focus system and method for analysis of transparent or low contrast specimens
US13/600,962 2012-08-31
PCT/US2013/057311 WO2014036276A2 (en) 2012-08-31 2013-08-29 Automatic microscopic focus system and method for analysis of transparent or low contrast specimens

Publications (3)

Publication Number Publication Date
JP2015528590A JP2015528590A (ja) 2015-09-28
JP2015528590A5 true JP2015528590A5 (enExample) 2016-08-25
JP6310460B2 JP6310460B2 (ja) 2018-04-11

Family

ID=50184636

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2015530045A Active JP6310460B2 (ja) 2012-08-31 2013-08-29 透明な又は低コントラストの試料の分析のための自動顕微鏡焦点システム及び方法

Country Status (6)

Country Link
US (1) US9488819B2 (enExample)
EP (1) EP2891005A4 (enExample)
JP (1) JP6310460B2 (enExample)
KR (1) KR101755651B1 (enExample)
CN (1) CN105209955B (enExample)
WO (1) WO2014036276A2 (enExample)

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CN108254853B (zh) * 2018-01-17 2023-08-11 宁波舜宇仪器有限公司 一种显微成像系统及其实时对焦方法
US10247910B1 (en) 2018-03-14 2019-04-02 Nanotronics Imaging, Inc. Systems, devices and methods for automatic microscopic focus
US10146041B1 (en) 2018-05-01 2018-12-04 Nanotronics Imaging, Inc. Systems, devices and methods for automatic microscope focus
US10545096B1 (en) * 2018-10-11 2020-01-28 Nanotronics Imaging, Inc. Marco inspection systems, apparatus and methods
US10812701B2 (en) * 2018-12-13 2020-10-20 Mitutoyo Corporation High-speed tag lens assisted 3D metrology and extended depth-of-field imaging
US10901327B2 (en) 2018-12-20 2021-01-26 Canon Kabushiki Kaisha Automatic defect analyzer for nanoimprint lithography using image analysis
US10915992B1 (en) 2019-08-07 2021-02-09 Nanotronics Imaging, Inc. System, method and apparatus for macroscopic inspection of reflective specimens
US11593919B2 (en) 2019-08-07 2023-02-28 Nanotronics Imaging, Inc. System, method and apparatus for macroscopic inspection of reflective specimens
JP7623360B2 (ja) * 2019-08-30 2025-01-28 株式会社ミツトヨ 高速計測撮像のための高速高パワーパルス光源システム
US12301990B2 (en) 2020-08-07 2025-05-13 Nanotronics Imaging, Inc. Deep learning model for auto-focusing microscope systems
CN115342918B (zh) * 2021-05-14 2024-12-06 刘承贤 可携式观察微流道用环型萤光光路系统及其运作方法

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JPH05236315A (ja) * 1992-02-20 1993-09-10 Tdk Corp コントラスト検出による自動焦点合せ方法
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JP3431300B2 (ja) * 1994-09-02 2003-07-28 オリンパス光学工業株式会社 顕微鏡用自動焦点検出装置
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US6396039B1 (en) * 1999-03-11 2002-05-28 Corning Incorporated Focusing filament for autofocus system
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