JP6310460B2 - 透明な又は低コントラストの試料の分析のための自動顕微鏡焦点システム及び方法 - Google Patents

透明な又は低コントラストの試料の分析のための自動顕微鏡焦点システム及び方法 Download PDF

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JP6310460B2
JP6310460B2 JP2015530045A JP2015530045A JP6310460B2 JP 6310460 B2 JP6310460 B2 JP 6310460B2 JP 2015530045 A JP2015530045 A JP 2015530045A JP 2015530045 A JP2015530045 A JP 2015530045A JP 6310460 B2 JP6310460 B2 JP 6310460B2
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objective lens
focusing plane
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sample
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JP2015528590A (ja
JP2015528590A5 (enExample
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マシュー シー プットマン
マシュー シー プットマン
ジョン ビー プットマン
ジョン ビー プットマン
ジェフリー エス アーチャー
ジェフリー エス アーチャー
ジュリー エー オーランド
ジュリー エー オーランド
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Nanotronics Imaging Inc
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Nanotronics Imaging Inc
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    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/24—Base structure
    • G02B21/241—Devices for focusing
    • G02B21/244—Devices for focusing using image analysis techniques
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N7/00—Television systems
    • H04N7/18—Closed-circuit television [CCTV] systems, i.e. systems in which the video signal is not broadcast

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Microscoopes, Condenser (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Automatic Focus Adjustment (AREA)
JP2015530045A 2012-08-31 2013-08-29 透明な又は低コントラストの試料の分析のための自動顕微鏡焦点システム及び方法 Active JP6310460B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US13/600,962 US9488819B2 (en) 2012-08-31 2012-08-31 Automatic microscopic focus system and method for analysis of transparent or low contrast specimens
US13/600,962 2012-08-31
PCT/US2013/057311 WO2014036276A2 (en) 2012-08-31 2013-08-29 Automatic microscopic focus system and method for analysis of transparent or low contrast specimens

Publications (3)

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JP2015528590A JP2015528590A (ja) 2015-09-28
JP2015528590A5 JP2015528590A5 (enExample) 2016-08-25
JP6310460B2 true JP6310460B2 (ja) 2018-04-11

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JP2015530045A Active JP6310460B2 (ja) 2012-08-31 2013-08-29 透明な又は低コントラストの試料の分析のための自動顕微鏡焦点システム及び方法

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US (1) US9488819B2 (enExample)
EP (1) EP2891005A4 (enExample)
JP (1) JP6310460B2 (enExample)
KR (1) KR101755651B1 (enExample)
CN (1) CN105209955B (enExample)
WO (1) WO2014036276A2 (enExample)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108254853B (zh) * 2018-01-17 2023-08-11 宁波舜宇仪器有限公司 一种显微成像系统及其实时对焦方法
US10247910B1 (en) 2018-03-14 2019-04-02 Nanotronics Imaging, Inc. Systems, devices and methods for automatic microscopic focus
US10146041B1 (en) 2018-05-01 2018-12-04 Nanotronics Imaging, Inc. Systems, devices and methods for automatic microscope focus
US10545096B1 (en) * 2018-10-11 2020-01-28 Nanotronics Imaging, Inc. Marco inspection systems, apparatus and methods
US10812701B2 (en) * 2018-12-13 2020-10-20 Mitutoyo Corporation High-speed tag lens assisted 3D metrology and extended depth-of-field imaging
US10901327B2 (en) 2018-12-20 2021-01-26 Canon Kabushiki Kaisha Automatic defect analyzer for nanoimprint lithography using image analysis
US10915992B1 (en) 2019-08-07 2021-02-09 Nanotronics Imaging, Inc. System, method and apparatus for macroscopic inspection of reflective specimens
US11593919B2 (en) 2019-08-07 2023-02-28 Nanotronics Imaging, Inc. System, method and apparatus for macroscopic inspection of reflective specimens
JP7623360B2 (ja) * 2019-08-30 2025-01-28 株式会社ミツトヨ 高速計測撮像のための高速高パワーパルス光源システム
US12301990B2 (en) 2020-08-07 2025-05-13 Nanotronics Imaging, Inc. Deep learning model for auto-focusing microscope systems
CN115342918B (zh) * 2021-05-14 2024-12-06 刘承贤 可携式观察微流道用环型萤光光路系统及其运作方法

Family Cites Families (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0124241B1 (en) * 1983-03-29 1988-11-02 Olympus Optical Co., Ltd. Microscope provided with automatic focusing device
US4945220A (en) 1988-11-16 1990-07-31 Prometrix Corporation Autofocusing system for microscope having contrast detection means
JPH05236315A (ja) * 1992-02-20 1993-09-10 Tdk Corp コントラスト検出による自動焦点合せ方法
US5594235A (en) 1993-06-17 1997-01-14 Ultrapointe Corporation Automated surface acquisition for a confocal microscope
JP3431300B2 (ja) * 1994-09-02 2003-07-28 オリンパス光学工業株式会社 顕微鏡用自動焦点検出装置
IL111229A (en) * 1994-10-10 1998-06-15 Nova Measuring Instr Ltd Autofocusing microscope
US6043475A (en) * 1996-04-16 2000-03-28 Olympus Optical Co., Ltd. Focal point adjustment apparatus and method applied to microscopes
JPH1068888A (ja) * 1996-08-29 1998-03-10 Olympus Optical Co Ltd 顕微鏡装置
JP3226861B2 (ja) * 1996-12-18 2001-11-05 株式会社不二越 自動焦点合わせ方法
US6396039B1 (en) * 1999-03-11 2002-05-28 Corning Incorporated Focusing filament for autofocus system
US6847480B2 (en) * 2000-04-03 2005-01-25 Pocketscope.Com Llc Lenses and uses, including microscopes
US6518554B1 (en) * 2000-05-24 2003-02-11 Chromavision Medical Systems, Inc. Reverse focusing methods and systems
DE10112639A1 (de) 2001-03-16 2002-09-19 Zeiss Carl Jena Gmbh Mikroskop mit Autofokussiereinrichtung
IL148664A0 (en) * 2002-03-13 2002-09-12 Yeda Res & Dev Auto-focusing method and device
US20030184856A1 (en) 2002-04-02 2003-10-02 Nikon Corporation Focus point detection device and microscope using the same
JP3480730B2 (ja) * 2002-05-20 2003-12-22 沖電気工業株式会社 フォーカス深度決定方法
US7345814B2 (en) 2003-09-29 2008-03-18 Olympus Corporation Microscope system and microscope focus maintaining device for the same
JP4712334B2 (ja) * 2004-09-03 2011-06-29 オリンパス株式会社 顕微鏡装置、顕微鏡ユニット、プログラム
US7417213B2 (en) * 2005-06-22 2008-08-26 Tripath Imaging, Inc. Apparatus and method for rapid microscopic image focusing having a movable objective
US7297910B2 (en) 2005-12-30 2007-11-20 General Electric Company System and method for utilizing an autofocus feature in an automated microscope
EP1840623B1 (en) * 2006-03-31 2013-05-08 Yokogawa Electric Corporation Microscope comprising a focus error detecting optical system
DE102006027836B4 (de) * 2006-06-16 2020-02-20 Carl Zeiss Microscopy Gmbh Mikroskop mit Autofokuseinrichtung
US7729049B2 (en) * 2007-05-26 2010-06-01 Zeta Instruments, Inc. 3-d optical microscope
US8154647B2 (en) * 2008-03-05 2012-04-10 Applied Minds, Llc Automated extended depth of field imaging apparatus and method
JP5189509B2 (ja) * 2009-01-21 2013-04-24 オリンパス株式会社 顕微鏡用照明光学系、及び顕微鏡
JP5272823B2 (ja) * 2009-03-17 2013-08-28 ソニー株式会社 焦点情報生成装置及び焦点情報生成方法

Also Published As

Publication number Publication date
KR101755651B1 (ko) 2017-07-10
WO2014036276A2 (en) 2014-03-06
WO2014036276A3 (en) 2015-07-16
JP2015528590A (ja) 2015-09-28
US20140063222A1 (en) 2014-03-06
CN105209955A (zh) 2015-12-30
EP2891005A2 (en) 2015-07-08
EP2891005A4 (en) 2016-08-17
CN105209955B (zh) 2017-11-28
KR20150034757A (ko) 2015-04-03
US9488819B2 (en) 2016-11-08

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