JP2015527211A5 - - Google Patents

Download PDF

Info

Publication number
JP2015527211A5
JP2015527211A5 JP2015528561A JP2015528561A JP2015527211A5 JP 2015527211 A5 JP2015527211 A5 JP 2015527211A5 JP 2015528561 A JP2015528561 A JP 2015528561A JP 2015528561 A JP2015528561 A JP 2015528561A JP 2015527211 A5 JP2015527211 A5 JP 2015527211A5
Authority
JP
Japan
Prior art keywords
wafer
layer
electrode
doped region
contact
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2015528561A
Other languages
English (en)
Japanese (ja)
Other versions
JP6272329B2 (ja
JP2015527211A (ja
Filing date
Publication date
Application filed filed Critical
Priority claimed from PCT/US2013/055668 external-priority patent/WO2014031570A1/en
Publication of JP2015527211A publication Critical patent/JP2015527211A/ja
Publication of JP2015527211A5 publication Critical patent/JP2015527211A5/ja
Application granted granted Critical
Publication of JP6272329B2 publication Critical patent/JP6272329B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JP2015528561A 2012-08-21 2013-08-20 密閉されたmemsデバイスと関連した埋め込み下部電極を形成するためのシステムおよび方法 Active JP6272329B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201261691662P 2012-08-21 2012-08-21
US61/691,662 2012-08-21
PCT/US2013/055668 WO2014031570A1 (en) 2012-08-21 2013-08-20 System and method for forming a buried lower electrode in conjunction with an encapsulated mems device

Publications (3)

Publication Number Publication Date
JP2015527211A JP2015527211A (ja) 2015-09-17
JP2015527211A5 true JP2015527211A5 (https=) 2017-09-21
JP6272329B2 JP6272329B2 (ja) 2018-01-31

Family

ID=49085201

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2015528561A Active JP6272329B2 (ja) 2012-08-21 2013-08-20 密閉されたmemsデバイスと関連した埋め込み下部電極を形成するためのシステムおよび方法

Country Status (6)

Country Link
US (1) US10160632B2 (https=)
JP (1) JP6272329B2 (https=)
CN (1) CN104736469B (https=)
DE (1) DE112013004119B4 (https=)
TW (1) TWI623027B (https=)
WO (1) WO2014031570A1 (https=)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102012210049A1 (de) * 2012-06-14 2013-12-19 Robert Bosch Gmbh Hybrid integriertes Bauteil und Verfahren zu dessen Herstellung
WO2014123922A1 (en) 2013-02-05 2014-08-14 Butterfly Network, Inc. Cmos ultrasonic transducers and related apparatus and methods
CN105174203B (zh) * 2014-05-28 2016-09-28 无锡华润上华半导体有限公司 基于mems的传感器的制作方法
US9067779B1 (en) 2014-07-14 2015-06-30 Butterfly Network, Inc. Microfabricated ultrasonic transducers and related apparatus and methods
DE102015203393A1 (de) * 2015-02-25 2016-08-25 Infineon Technologies Ag Halbleiterelement und Verfahren zu Herstellen von diesem
CN105540528A (zh) * 2015-12-14 2016-05-04 中国科学院半导体研究所 Mems电容式超声波传感器及其制备方法
EP3397587B1 (en) * 2015-12-30 2019-11-20 Robert Bosch GmbH System and method for maintaining a smoothed surface on a mems device
US10513429B2 (en) * 2016-07-27 2019-12-24 Taiwan Semiconductor Manufacturing Co., Ltd. Integration scheme for microelectromechanical systems (MEMS) devices and complementary metal-oxide-semiconductor (CMOS) devices
US10196261B2 (en) 2017-03-08 2019-02-05 Butterfly Network, Inc. Microfabricated ultrasonic transducers and related apparatus and methods
EP3642611B1 (en) 2017-06-21 2024-02-14 Butterfly Network, Inc. Microfabricated ultrasonic transducer having individual cells with electrically isolated electrode sections
US10466126B2 (en) * 2018-02-27 2019-11-05 Globalfoundries Inc. MEMS capacitive pressure sensors in fully depleted semiconductor on insulator (FDSOI)
DE102018210815A1 (de) * 2018-06-30 2020-01-02 Robert Bosch Gmbh Elektrische Kontaktierung, Verfahren zur Herstellung einer elektrischen Kontaktierung, System
EP3885042A1 (en) 2020-03-24 2021-09-29 Imec VZW Method for fabricating a microfluidic device
IT202000011755A1 (it) * 2020-05-20 2021-11-20 St Microelectronics Srl Procedimento di fabbricazione di un dispositivo micro-elettro-meccanico, in particolare sensore di movimento con comando/rilevazione di tipo capacitivo, e relativo dispositivo mems
DE102022208515A1 (de) * 2022-08-17 2024-02-22 Robert Bosch Gesellschaft mit beschränkter Haftung Verfahren zur Herstellung eines Siliziumschichtsystems mit elektrischen Verbindungen
DE102022208514A1 (de) * 2022-08-17 2024-02-22 Robert Bosch Gesellschaft mit beschränkter Haftung Verfahren zur Herstellung von mikroelektromechanischen Strukturen

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3399336B2 (ja) 1997-12-22 2003-04-21 株式会社豊田中央研究所 検出器
US6664126B1 (en) 1999-09-03 2003-12-16 University Of Maryland, College Park Process for fabrication of 3-dimensional micromechanisms
EP1151962B1 (en) 2000-04-28 2007-06-13 STMicroelectronics S.r.l. Structure for electrically connecting a first body of semiconductor material overlaid by a second body of semiconductor material, composite structure using the electric connection structure, and manufacturing process thereof
US6913941B2 (en) 2002-09-09 2005-07-05 Freescale Semiconductor, Inc. SOI polysilicon trench refill perimeter oxide anchor scheme
US6940705B2 (en) 2003-07-25 2005-09-06 Taiwan Semiconductor Manufacturing Company, Ltd. Capacitor with enhanced performance and method of manufacture
US7056757B2 (en) 2003-11-25 2006-06-06 Georgia Tech Research Corporation Methods of forming oxide masks with submicron openings and microstructures formed thereby
TWI253436B (en) 2004-02-27 2006-04-21 Opus Microsystems Corp Micromechanical actuator with multiple-plane comb electrodes and methods of making
CN100339738C (zh) 2004-03-12 2007-09-26 先进微系统科技股份有限公司 具有多组梳状电极的微机电致动器及其制造方法
US7825484B2 (en) 2005-04-25 2010-11-02 Analog Devices, Inc. Micromachined microphone and multisensor and method for producing same
CN100452397C (zh) 2005-11-11 2009-01-14 台湾积体电路制造股份有限公司 半导体结构与隔绝一第一电路和一第二电路的方法
US8085964B2 (en) 2006-05-22 2011-12-27 Audio Pixels Ltd. Apparatus and methods for generating pressure waves
JP4737140B2 (ja) 2006-10-20 2011-07-27 セイコーエプソン株式会社 Memsデバイスおよびその製造方法
CN101953174B (zh) 2007-11-21 2014-12-10 奥迪欧彼塞尔斯有限公司 数字扬声器装置
US8125046B2 (en) 2008-06-04 2012-02-28 Infineon Technologies Ag Micro-electromechanical system devices
US8148790B2 (en) 2008-07-08 2012-04-03 Wispry, Inc. Thin-film lid MEMS devices and methods
ES2342872B1 (es) 2009-05-20 2011-05-30 Baolab Microsystems S.L. Chip que comprende un mems dispuesto en un circuito integrado y procedimiento de fabricacion correspondiente.
US8563345B2 (en) * 2009-10-02 2013-10-22 National Semiconductor Corporated Integration of structurally-stable isolated capacitive micromachined ultrasonic transducer (CMUT) array cells and array elements
JP5218497B2 (ja) 2009-12-04 2013-06-26 株式会社デンソー 半導体装置およびその製造方法
IT1400096B1 (it) * 2010-05-12 2013-05-17 St Microelectronics Srl Processo di fabbricazione di circuiti elettronici integrati e circuiti cosi' ottenuti
DE102010062555B4 (de) 2010-12-08 2019-05-23 Robert Bosch Gmbh Mikromechanische Membranvorrichtung und entsprechendes Herstellungsverfahren sowie Membrananordnung
US8673756B2 (en) 2011-04-14 2014-03-18 Robert Bosch Gmbh Out-of-plane spacer defined electrode

Similar Documents

Publication Publication Date Title
JP2015527211A5 (https=)
JP6272329B2 (ja) 密閉されたmemsデバイスと関連した埋め込み下部電極を形成するためのシステムおよび方法
US9145292B2 (en) Cavity structures for MEMS devices
US8643096B2 (en) Semiconductor device with buried bit line and method for fabricating the same
US9219129B2 (en) Inverted thin channel mosfet with self-aligned expanded source/drain
KR101134819B1 (ko) 반도체 메모리 장치의 제조 방법
JP5649474B2 (ja) 静電容量型圧力センサおよび静電容量型圧力センサの製造方法
US9484246B2 (en) Buried signal transmission line
US8878314B2 (en) MEMS package or sensor package with intra-cap electrical via and method thereof
US11402288B2 (en) Membrane-based sensor having a plurality of spacers extending from a cap layer
JP2015510594A (ja) ドープ電極を有する圧力センサ
TWI652728B (zh) 用於面外間隔體界定電極的磊晶式多晶矽蝕刻停止
JP4835082B2 (ja) 半導体装置及びその製造方法
US8963281B1 (en) Simultaneous isolation trench and handle wafer contact formation
TWI632358B (zh) 電容式壓力感測器及方法
US10053360B1 (en) Pseudo SOI process
KR102084133B1 (ko) Mems 센서 그리고 센서 장치를 형성하는 방법
US7485926B2 (en) SOI contact structures
CN112408312A (zh) Mems器件的制造方法及mems器件
JPH08148504A (ja) 半導体装置及びその製造方法
JP2009194245A (ja) 半導体装置及びその製造方法
Karlin et al. Park et a1.
JP2009071211A (ja) 半導体装置の製造方法及び半導体装置