JP2015511708A5 - - Google Patents

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Publication number
JP2015511708A5
JP2015511708A5 JP2015500553A JP2015500553A JP2015511708A5 JP 2015511708 A5 JP2015511708 A5 JP 2015511708A5 JP 2015500553 A JP2015500553 A JP 2015500553A JP 2015500553 A JP2015500553 A JP 2015500553A JP 2015511708 A5 JP2015511708 A5 JP 2015511708A5
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JP
Japan
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specific
species
gas species
ion
specific gas
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JP2015500553A
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English (en)
Japanese (ja)
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JP6570998B2 (ja
JP2015511708A (ja
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Priority claimed from PCT/US2013/030801 external-priority patent/WO2013138446A1/en
Publication of JP2015511708A publication Critical patent/JP2015511708A/ja
Publication of JP2015511708A5 publication Critical patent/JP2015511708A5/ja
Application granted granted Critical
Publication of JP6570998B2 publication Critical patent/JP6570998B2/ja
Expired - Fee Related legal-status Critical Current
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JP2015500553A 2012-03-13 2013-03-13 Art・msトラップにおける微量ガス濃度 Expired - Fee Related JP6570998B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201261610092P 2012-03-13 2012-03-13
US61/610,092 2012-03-13
PCT/US2013/030801 WO2013138446A1 (en) 2012-03-13 2013-03-13 Trace gas concentration in art ms traps

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2018076592A Division JP6667571B2 (ja) 2012-03-13 2018-04-12 Art・msトラップにおける微量ガス濃度

Publications (3)

Publication Number Publication Date
JP2015511708A JP2015511708A (ja) 2015-04-20
JP2015511708A5 true JP2015511708A5 (enExample) 2016-04-07
JP6570998B2 JP6570998B2 (ja) 2019-09-04

Family

ID=49161755

Family Applications (2)

Application Number Title Priority Date Filing Date
JP2015500553A Expired - Fee Related JP6570998B2 (ja) 2012-03-13 2013-03-13 Art・msトラップにおける微量ガス濃度
JP2018076592A Expired - Fee Related JP6667571B2 (ja) 2012-03-13 2018-04-12 Art・msトラップにおける微量ガス濃度

Family Applications After (1)

Application Number Title Priority Date Filing Date
JP2018076592A Expired - Fee Related JP6667571B2 (ja) 2012-03-13 2018-04-12 Art・msトラップにおける微量ガス濃度

Country Status (7)

Country Link
US (1) US9714919B2 (enExample)
EP (1) EP2825875B1 (enExample)
JP (2) JP6570998B2 (enExample)
KR (2) KR20140143403A (enExample)
CN (1) CN104380099B (enExample)
SG (1) SG11201405610PA (enExample)
WO (1) WO2013138446A1 (enExample)

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GB2527867B (en) * 2014-12-01 2016-06-29 Ion Science Ltd Detection of organics in water
WO2017047041A1 (ja) * 2015-09-18 2017-03-23 パナソニック株式会社 化学物質濃縮器および化学物質検出装置
WO2019147748A2 (en) * 2018-01-24 2019-08-01 Rapiscan Systems, Inc. Surface layer disruption and ionization utilizing an extreme ultraviolet radiation source
GB201802917D0 (en) 2018-02-22 2018-04-11 Micromass Ltd Charge detection mass spectrometry
CN108479394B (zh) * 2018-03-14 2021-01-08 中国科学院近代物理研究所 痕量气体同位素富集系统和方法
JP2020088300A (ja) 2018-11-30 2020-06-04 株式会社リコー 酸化物形成用塗布液、酸化物膜の製造方法、及び電界効果型トランジスタの製造方法
GB2592653B (en) * 2020-03-05 2022-12-28 Edwards Vacuum Llc Vacuum module and vacuum apparatus and method for regeneration of a volume getter vacuum pump
WO2021207494A1 (en) 2020-04-09 2021-10-14 Waters Technologies Corporation Ion detector
CN118402037A (zh) 2021-12-15 2024-07-26 水技术公司 具有集成放大器的感应式检测器

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IT1183682B (it) * 1985-05-24 1987-10-22 Getters Spa Compressore chimico e purificatore per isotopi di idrogeno
US4785666A (en) 1986-12-19 1988-11-22 Martin Marietta Corporation Method of increasing the sensitivity of a leak detector in the probe mode
US5142143A (en) 1990-10-31 1992-08-25 Extrel Corporation Method and apparatus for preconcentration for analysis purposes of trace constitutes in gases
US5426300A (en) 1993-09-17 1995-06-20 Leybold Inficon, Inc. Portable GCMS system using getter pump
US6211516B1 (en) 1999-02-09 2001-04-03 Syagen Technology Photoionization mass spectrometer
US6326615B1 (en) * 1999-08-30 2001-12-04 Syagen Technology Rapid response mass spectrometer system
US6545268B1 (en) 2000-04-10 2003-04-08 Perseptive Biosystems Preparation of ion pulse for time-of-flight and for tandem time-of-flight mass analysis
CA2381070C (en) * 2000-06-14 2005-04-05 Mitsubishi Heavy Industries, Ltd. Detector of chemical substances and concentration-measuring method of chemical substances
WO2002049067A2 (en) * 2000-12-14 2002-06-20 Mks Instruments, Inc. Ion storage system
JP3572256B2 (ja) 2000-12-19 2004-09-29 三菱重工業株式会社 化学物質検出装置
US7034292B1 (en) 2002-05-31 2006-04-25 Analytica Of Branford, Inc. Mass spectrometry with segmented RF multiple ion guides in various pressure regions
GB0404285D0 (en) * 2004-02-26 2004-03-31 Shimadzu Res Lab Europe Ltd A tandem ion-trap time-of flight mass spectrometer
CN1811408B (zh) * 2005-01-28 2010-04-28 方向 内部光电离离子阱质量分析装置及其方法
US7476852B2 (en) 2005-05-17 2009-01-13 Honeywell International Inc. Ionization-based detection
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TWI484529B (zh) 2006-11-13 2015-05-11 Mks Instr Inc 離子阱質譜儀、利用其得到質譜之方法、離子阱、捕捉離子阱內之離子之方法和設備
CN101320016A (zh) 2008-01-29 2008-12-10 复旦大学 一种用多个离子阱进行串级质谱分析的方法
JP5449701B2 (ja) 2008-05-28 2014-03-19 株式会社日立ハイテクノロジーズ 質量分析計
US20100163724A1 (en) * 2008-12-30 2010-07-01 University Of North Texas Applications of hydrogen gas getters in mass spectrometry
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US8481926B2 (en) 2009-09-04 2013-07-09 Dh Technologies Development Pte. Ltd. Method, system and apparatus for filtering ions in a mass spectrometer

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