JP2012525672A5 - - Google Patents

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JP2012525672A5
JP2012525672A5 JP2012507814A JP2012507814A JP2012525672A5 JP 2012525672 A5 JP2012525672 A5 JP 2012525672A5 JP 2012507814 A JP2012507814 A JP 2012507814A JP 2012507814 A JP2012507814 A JP 2012507814A JP 2012525672 A5 JP2012525672 A5 JP 2012525672A5
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ion
vacuum region
ions
differential
waveform
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JP2012507814A
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JP2012525672A (ja
JP5652473B2 (ja
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JP2012507814A 2009-05-01 2010-04-30 イオン分析装置及びその使用方法 Active JP5652473B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GB0907619.1 2009-05-01
GBGB0907619.1A GB0907619D0 (en) 2009-05-01 2009-05-01 Ion analysis apparatus and method of use
PCT/GB2010/000873 WO2010125357A2 (en) 2009-05-01 2010-04-30 Ion analysis apparatus and method of use

Publications (3)

Publication Number Publication Date
JP2012525672A JP2012525672A (ja) 2012-10-22
JP2012525672A5 true JP2012525672A5 (enExample) 2013-05-30
JP5652473B2 JP5652473B2 (ja) 2015-01-14

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JP2012507814A Active JP5652473B2 (ja) 2009-05-01 2010-04-30 イオン分析装置及びその使用方法

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US (1) US8610054B2 (enExample)
EP (1) EP2425446B1 (enExample)
JP (1) JP5652473B2 (enExample)
CN (2) CN102449727B (enExample)
GB (1) GB0907619D0 (enExample)
WO (1) WO2010125357A2 (enExample)

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CN107271575B (zh) * 2016-04-08 2020-01-14 株式会社岛津制作所 离子迁移谱和质谱并行分析的方法及装置
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