JP2008519410A5 - - Google Patents
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- Publication number
- JP2008519410A5 JP2008519410A5 JP2007539630A JP2007539630A JP2008519410A5 JP 2008519410 A5 JP2008519410 A5 JP 2008519410A5 JP 2007539630 A JP2007539630 A JP 2007539630A JP 2007539630 A JP2007539630 A JP 2007539630A JP 2008519410 A5 JP2008519410 A5 JP 2008519410A5
- Authority
- JP
- Japan
- Prior art keywords
- ions
- ion
- ion guide
- separator
- mass
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- 150000002500 ions Chemical class 0.000 claims 96
- 238000013467 fragmentation Methods 0.000 claims 8
- 238000006062 fragmentation reaction Methods 0.000 claims 8
- 230000004323 axial length Effects 0.000 claims 7
- 230000005405 multipole Effects 0.000 claims 6
- 230000001052 transient effect Effects 0.000 claims 6
- 238000004949 mass spectrometry Methods 0.000 claims 4
- 238000005040 ion trap Methods 0.000 claims 3
- 238000000034 method Methods 0.000 claims 3
- 238000011144 upstream manufacturing Methods 0.000 claims 3
- 238000004252 FT/ICR mass spectrometry Methods 0.000 claims 2
- 230000001133 acceleration Effects 0.000 claims 1
- 238000004150 penning trap Methods 0.000 claims 1
Applications Claiming Priority (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GBGB0424426.5A GB0424426D0 (en) | 2004-11-04 | 2004-11-04 | Mass spectrometer |
| GB0424426.5 | 2004-11-04 | ||
| US62821504P | 2004-11-16 | 2004-11-16 | |
| US60/628,215 | 2004-11-16 | ||
| PCT/GB2005/004238 WO2006048642A2 (en) | 2004-11-04 | 2005-11-03 | Mass spectrometer |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2008519410A JP2008519410A (ja) | 2008-06-05 |
| JP2008519410A5 true JP2008519410A5 (enExample) | 2008-12-04 |
| JP4913066B2 JP4913066B2 (ja) | 2012-04-11 |
Family
ID=33523199
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2007539630A Expired - Lifetime JP4913066B2 (ja) | 2004-11-04 | 2005-11-03 | 質量分析計 |
Country Status (6)
| Country | Link |
|---|---|
| US (8) | US7829841B2 (enExample) |
| EP (3) | EP3855474A1 (enExample) |
| JP (1) | JP4913066B2 (enExample) |
| CA (2) | CA2861514C (enExample) |
| GB (2) | GB0424426D0 (enExample) |
| WO (1) | WO2006048642A2 (enExample) |
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2005
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- 2005-11-03 JP JP2007539630A patent/JP4913066B2/ja not_active Expired - Lifetime
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- 2005-11-03 EP EP05800123.1A patent/EP1810314B1/en not_active Expired - Lifetime
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2010
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2012
- 2012-10-29 US US13/663,191 patent/US8569687B2/en not_active Expired - Fee Related
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2013
- 2013-10-28 US US14/064,616 patent/US8735805B2/en not_active Expired - Lifetime
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2014
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