JP2015505970A5 - - Google Patents

Download PDF

Info

Publication number
JP2015505970A5
JP2015505970A5 JP2014547432A JP2014547432A JP2015505970A5 JP 2015505970 A5 JP2015505970 A5 JP 2015505970A5 JP 2014547432 A JP2014547432 A JP 2014547432A JP 2014547432 A JP2014547432 A JP 2014547432A JP 2015505970 A5 JP2015505970 A5 JP 2015505970A5
Authority
JP
Japan
Prior art keywords
channel
wall
ionization
electric field
channels
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2014547432A
Other languages
English (en)
Japanese (ja)
Other versions
JP2015505970A (ja
JP6278895B2 (ja
Filing date
Publication date
Application filed filed Critical
Priority claimed from PCT/US2012/069520 external-priority patent/WO2013090583A1/en
Publication of JP2015505970A publication Critical patent/JP2015505970A/ja
Publication of JP2015505970A5 publication Critical patent/JP2015505970A5/ja
Application granted granted Critical
Publication of JP6278895B2 publication Critical patent/JP6278895B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JP2014547432A 2011-12-15 2012-12-13 周期場微分型電気移動度分析装置 Active JP6278895B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201161576165P 2011-12-15 2011-12-15
US61/576,165 2011-12-15
PCT/US2012/069520 WO2013090583A1 (en) 2011-12-15 2012-12-13 Periodic field differential mobility analyzer

Publications (3)

Publication Number Publication Date
JP2015505970A JP2015505970A (ja) 2015-02-26
JP2015505970A5 true JP2015505970A5 (enExample) 2016-10-06
JP6278895B2 JP6278895B2 (ja) 2018-02-14

Family

ID=48613176

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2014547432A Active JP6278895B2 (ja) 2011-12-15 2012-12-13 周期場微分型電気移動度分析装置

Country Status (4)

Country Link
US (1) US9324552B2 (enExample)
EP (1) EP2791963A4 (enExample)
JP (1) JP6278895B2 (enExample)
WO (1) WO2013090583A1 (enExample)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9239279B1 (en) * 2011-06-03 2016-01-19 Arkansas State University—Jonesboro Sequential differential mobility analyzer and method of using same
US9677984B2 (en) * 2014-01-31 2017-06-13 University Of Maryland Pulsed-field differential mobility analyzer system and method for separating particles and measuring shape parameters for non-spherical particles
JP2018038988A (ja) * 2016-09-09 2018-03-15 株式会社島津製作所 粒子濃縮装置
CN109003877B (zh) 2017-06-06 2020-10-16 岛津分析技术研发(上海)有限公司 离子迁移率分析装置及所应用的分析方法

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56112058A (en) 1980-02-08 1981-09-04 Hitachi Ltd High brightness ion source
FR2720506B1 (fr) * 1994-05-24 1996-07-05 Commissariat Energie Atomique Spectromètre de particules submicroniques.
US6815669B1 (en) * 1999-07-21 2004-11-09 The Charles Stark Draper Laboratory, Inc. Longitudinal field driven ion mobility filter and detection system
US6512224B1 (en) * 1999-07-21 2003-01-28 The Charles Stark Draper Laboratory, Inc. Longitudinal field driven field asymmetric ion mobility filter and detection system
US7714284B2 (en) * 2001-06-30 2010-05-11 Sionex Corporation Methods and apparatus for enhanced sample identification based on combined analytical techniques
AU2002348333B2 (en) * 2001-11-02 2007-02-01 Michael J. Labowsky Method and apparatus to increase the resolution and widen the range of differential mobility analyzers (DMAS)
DE102005004325A1 (de) * 2005-01-31 2006-08-10 Bruker Daltonik Gmbh Ionenmobilitätsspektrometer und Verfahren zu seinem Betrieb
US7521673B2 (en) * 2005-08-24 2009-04-21 Rahem, S.A. Wide range, very high resolution differential mobility analyzer (DMA)
US7812305B2 (en) * 2006-06-29 2010-10-12 Sionex Corporation Tandem differential mobility spectrometers and mass spectrometer for enhanced analysis
US7723677B2 (en) * 2006-07-18 2010-05-25 Ramen, S.A. Wide range, very high resolution differential mobility analyzer (DMA)
JP5362586B2 (ja) * 2007-02-01 2013-12-11 サイオネックス コーポレイション 質量分光計のための微分移動度分光計プレフィルタ
JP5477295B2 (ja) * 2007-12-13 2014-04-23 アカデミア シニカ 電荷監視質量分析を行うためのシステムおよび方法
WO2011071182A1 (ja) * 2009-12-08 2011-06-16 国立大学法人山梨大学 エレクトロスプレーによるイオン化方法および装置,ならびに分析方法および装置
JP5652851B2 (ja) * 2010-02-02 2015-01-14 独立行政法人理化学研究所 微分型電気移動度分級装置、粒子計測システム、及び粒子選別システム
US9207207B2 (en) * 2012-05-17 2015-12-08 Regents Of The University Of Minnesota Drift tube ion mobility spectrometer for aerosol measurement

Similar Documents

Publication Publication Date Title
US11532471B2 (en) Instrument for separating ions including an interface for transporting generated ions thereto
JP6817201B2 (ja) 不要イオンを抑制するシステム及び方法
CA2539899A1 (en) Improved high performance ion mobility spectrometry using hourglass electrodynamic funnel and internal ion funnel
JP2012525672A5 (enExample)
JP6432688B2 (ja) イオン移動度分析装置
JP6458128B2 (ja) イオンガイド及びそれを用いた質量分析装置
CN110660639B (zh) 用于离子分离的系统和方法
US9177775B2 (en) Mass spectrometer
JP2015505970A5 (enExample)
JP7261243B2 (ja) 性能及び耐用年数が改善された粒子検出器
CN101999156B (zh) 用于测量气体的方法及相应的离子迁移谱仪
CN103460330B (zh) 离子门和离子改变器的结合
KR102036259B1 (ko) 질량분석기용 이온가이드 및 이를 이용한 이온소스
JP6278895B2 (ja) 周期場微分型電気移動度分析装置
JP2005353340A (ja) 質量分析装置
CN115116818A (zh) 双频率rf离子限制装置
US11525803B2 (en) Ionization for tandem ion mobility spectrometry
US20200051805A1 (en) Quantitation Throughput Enhancement by Differential Mobility Based Pre-Separation
JP6128235B2 (ja) イオン移動度分析装置及び質量分析装置
WO2017046849A1 (ja) 質量分析装置
JP2023145373A (ja) イオン源及び質量分析装置