JP2015502022A5 - - Google Patents

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Publication number
JP2015502022A5
JP2015502022A5 JP2014546497A JP2014546497A JP2015502022A5 JP 2015502022 A5 JP2015502022 A5 JP 2015502022A5 JP 2014546497 A JP2014546497 A JP 2014546497A JP 2014546497 A JP2014546497 A JP 2014546497A JP 2015502022 A5 JP2015502022 A5 JP 2015502022A5
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JP
Japan
Prior art keywords
skimmer
plasma
channel member
channels
skimmer device
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JP2014546497A
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English (en)
Japanese (ja)
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JP2015502022A (ja
JP6046740B2 (ja
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Priority claimed from GB1121290.9A external-priority patent/GB2498173C/en
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Publication of JP2015502022A5 publication Critical patent/JP2015502022A5/ja
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JP2014546497A 2011-12-12 2012-12-12 質量分光計の真空インターフェース方法および真空インターフェース装置 Active JP6046740B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GB1121290.9 2011-12-12
GB1121290.9A GB2498173C (en) 2011-12-12 2011-12-12 Mass spectrometer vacuum interface method and apparatus
PCT/EP2012/075301 WO2013087731A1 (en) 2011-12-12 2012-12-12 Mass spectrometer vacuum interface method and apparatus

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2016223987A Division JP6279057B2 (ja) 2011-12-12 2016-11-17 質量分光計の真空インターフェースを動作させる方法およびスキマー装置

Publications (3)

Publication Number Publication Date
JP2015502022A JP2015502022A (ja) 2015-01-19
JP2015502022A5 true JP2015502022A5 (enExample) 2015-04-23
JP6046740B2 JP6046740B2 (ja) 2016-12-21

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ID=45560285

Family Applications (2)

Application Number Title Priority Date Filing Date
JP2014546497A Active JP6046740B2 (ja) 2011-12-12 2012-12-12 質量分光計の真空インターフェース方法および真空インターフェース装置
JP2016223987A Active JP6279057B2 (ja) 2011-12-12 2016-11-17 質量分光計の真空インターフェースを動作させる方法およびスキマー装置

Family Applications After (1)

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JP2016223987A Active JP6279057B2 (ja) 2011-12-12 2016-11-17 質量分光計の真空インターフェースを動作させる方法およびスキマー装置

Country Status (8)

Country Link
US (6) US9012839B2 (enExample)
JP (2) JP6046740B2 (enExample)
CN (2) CN103999187B (enExample)
AU (1) AU2012351700C1 (enExample)
CA (1) CA2858457C (enExample)
DE (1) DE112012005173B4 (enExample)
GB (1) GB2498173C (enExample)
WO (1) WO2013087731A1 (enExample)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9818593B2 (en) * 2012-09-13 2017-11-14 University Of Maine System Board Of Trustees Radio-frequency ionization of chemicals
CN104637773B (zh) * 2015-02-16 2017-03-01 江苏天瑞仪器股份有限公司 质谱仪一级真空结构
US10692692B2 (en) * 2015-05-27 2020-06-23 Kla-Tencor Corporation System and method for providing a clean environment in an electron-optical system
GB2544959B (en) * 2015-09-17 2019-06-05 Thermo Fisher Scient Bremen Gmbh Mass spectrometer
DE102016113771B4 (de) 2016-07-26 2019-11-07 Bundesrepublik Deutschland, Vertreten Durch Den Bundesminister Für Wirtschaft Und Energie, Dieser Vertreten Durch Den Präsidenten Der Bundesanstalt Für Materialforschung Und -Prüfung (Bam) Analysevorrichtung für gasförmige Proben und Verfahren zum Nachweis von Analyten in einem Gas
GB2560160B (en) * 2017-02-23 2021-08-18 Thermo Fisher Scient Bremen Gmbh Methods in mass spectrometry using collision gas as ion source
CN107910241B (zh) * 2017-11-14 2019-12-13 大连民族大学 一种激光焊接中等离子体羽辉微粒子成分的质谱分析装置
GB2572819B (en) * 2018-04-13 2021-05-19 Thermo Fisher Scient Bremen Gmbh Method and apparatus for operating a vacuum interface of a mass spectrometer
CN111902907A (zh) * 2018-04-20 2020-11-06 株式会社岛津制作所 截取锥以及电感耦合等离子体质量分析装置
CN110690100B (zh) * 2019-10-31 2025-01-28 杭州谱育科技发展有限公司 一种电感耦合等离子质谱接口装置
US11145501B2 (en) * 2020-02-20 2021-10-12 Perkinelmer, Inc. Thermal management for instruments including a plasma source
CN112557488A (zh) * 2020-12-09 2021-03-26 上海交通大学 一种一体式分子束取样接口
CN116635976A (zh) 2020-12-23 2023-08-22 万机仪器公司 使用质谱测定法监测自由基粒子浓度
CN112924525A (zh) * 2021-01-29 2021-06-08 厦门大学 一种富勒烯形成机理研究的原位质谱分析装置及方法
WO2023117760A1 (en) 2021-12-21 2023-06-29 Thermo Fisher Scientific (Bremen) Gmbh Skimmers for plasma interfaces
CN115421180A (zh) * 2022-10-09 2022-12-02 中国科学院国家空间科学中心 一种降低进入定标载荷离子通量的系统及方法
WO2025072067A1 (en) * 2023-09-26 2025-04-03 Inficon, Inc. Method and assembly for creating a molecular beam

Family Cites Families (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4863491A (en) * 1988-05-27 1989-09-05 Hewlett-Packard Interface for liquid chromatography-mass spectrometry systems
JPH0340748U (enExample) * 1989-08-31 1991-04-18
US6002130A (en) * 1991-09-12 1999-12-14 Hitachi, Ltd. Mass spectrometry and mass spectrometer
CA2116821C (en) * 1993-03-05 2003-12-23 Stephen Esler Anderson Improvements in plasma mass spectrometry
JPH07240169A (ja) * 1994-02-28 1995-09-12 Jeol Ltd 誘導結合プラズマ質量分析装置
DE4433807A1 (de) * 1994-09-22 1996-03-28 Finnigan Mat Gmbh Massenspektrometer, insbesondere ICP-MS
GB9525507D0 (en) 1995-12-14 1996-02-14 Fisons Plc Electrospray and atmospheric pressure chemical ionization mass spectrometer and ion source
JP3492081B2 (ja) * 1996-05-15 2004-02-03 セイコーインスツルメンツ株式会社 プラズマイオン源質量分析装置
JPH10283984A (ja) * 1997-04-01 1998-10-23 Yokogawa Analytical Syst Kk 飛行時間型質量分析装置
JP3521218B2 (ja) * 1997-07-04 2004-04-19 独立行政法人産業技術総合研究所 金属−絶縁性セラミック複合サンプラー及びスキマー
GB9820210D0 (en) * 1998-09-16 1998-11-11 Vg Elemental Limited Means for removing unwanted ions from an ion transport system and mass spectrometer
JP4585069B2 (ja) * 1999-12-27 2010-11-24 アジレント・テクノロジーズ・インク 誘導結合プラズマ質量分析装置及び方法
CA2460204A1 (en) * 2001-09-10 2003-03-20 Varian Australia Pty Ltd Apparatus and method for elemental mass spectrometry
JP4178110B2 (ja) * 2001-11-07 2008-11-12 株式会社日立ハイテクノロジーズ 質量分析装置
WO2003077280A1 (en) 2002-03-08 2003-09-18 Varian Australia Pty Ltd A plasma mass spectrometer
AU2002950505A0 (en) * 2002-07-31 2002-09-12 Varian Australia Pty Ltd Mass spectrometry apparatus and method
US6872940B1 (en) * 2002-05-31 2005-03-29 Thermo Finnigan Llc Focusing ions using gas dynamics
US7009176B2 (en) * 2004-03-08 2006-03-07 Thermo Finnigan Llc Titanium ion transfer components for use in mass spectrometry
US7259371B2 (en) * 2005-01-10 2007-08-21 Applera Corporation Method and apparatus for improved sensitivity in a mass spectrometer
EP1865533B1 (en) * 2006-06-08 2014-09-17 Microsaic Systems PLC Microengineerd vacuum interface for an ionization system
WO2008147846A1 (en) * 2007-05-22 2008-12-04 Semequip, Inc. Method and system for extracting ion beams composed of molecular ions (cluster ion beam extraction system)
JP5308641B2 (ja) * 2007-08-09 2013-10-09 アジレント・テクノロジーズ・インク プラズマ質量分析装置
WO2009147894A1 (ja) * 2008-06-05 2009-12-10 株式会社日立ハイテクノロジーズ イオンビーム装置
US7915580B2 (en) 2008-10-15 2011-03-29 Thermo Finnigan Llc Electro-dynamic or electro-static lens coupled to a stacked ring ion guide
US9105457B2 (en) * 2010-02-24 2015-08-11 Perkinelmer Health Sciences, Inc. Cone-shaped orifice arrangement for inductively coupled plasma sample introduction system
GB2498174B (en) * 2011-12-12 2016-06-29 Thermo Fisher Scient (Bremen) Gmbh Mass spectrometer vacuum interface method and apparatus
WO2013100218A1 (ko) 2011-12-28 2013-07-04 볼보 컨스트럭션 이큅먼트 에이비 건설기계의 엔진 제어방법

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