JP2015144181A - 窒化ガリウム系結晶の成長方法及び熱処理装置 - Google Patents
窒化ガリウム系結晶の成長方法及び熱処理装置 Download PDFInfo
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- JMASRVWKEDWRBT-UHFFFAOYSA-N Gallium nitride Chemical compound [Ga]#N JMASRVWKEDWRBT-UHFFFAOYSA-N 0.000 title claims abstract description 72
- 229910002601 GaN Inorganic materials 0.000 title claims abstract description 71
- 238000000034 method Methods 0.000 title claims abstract description 33
- 239000013078 crystal Substances 0.000 claims abstract description 100
- 239000000758 substrate Substances 0.000 claims abstract description 77
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims abstract description 72
- 229910052710 silicon Inorganic materials 0.000 claims abstract description 72
- 239000010703 silicon Substances 0.000 claims abstract description 72
- 238000010438 heat treatment Methods 0.000 claims abstract description 40
- PMHQVHHXPFUNSP-UHFFFAOYSA-M copper(1+);methylsulfanylmethane;bromide Chemical compound Br[Cu].CSC PMHQVHHXPFUNSP-UHFFFAOYSA-M 0.000 claims abstract description 23
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 claims abstract description 18
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims abstract description 14
- 239000001301 oxygen Substances 0.000 claims abstract description 14
- 229910052760 oxygen Inorganic materials 0.000 claims abstract description 14
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 claims abstract description 11
- 229910021529 ammonia Inorganic materials 0.000 claims abstract description 9
- 239000007789 gas Substances 0.000 claims description 95
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims description 11
- 229910052757 nitrogen Inorganic materials 0.000 claims description 5
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 claims description 4
- 229910052733 gallium Inorganic materials 0.000 claims description 4
- 229910052782 aluminium Inorganic materials 0.000 claims description 3
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 3
- 238000005530 etching Methods 0.000 abstract description 9
- 239000004065 semiconductor Substances 0.000 abstract description 5
- 230000015572 biosynthetic process Effects 0.000 abstract description 4
- 238000004519 manufacturing process Methods 0.000 abstract description 4
- 235000012431 wafers Nutrition 0.000 description 18
- QJGQUHMNIGDVPM-UHFFFAOYSA-N nitrogen group Chemical group [N] QJGQUHMNIGDVPM-UHFFFAOYSA-N 0.000 description 6
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 5
- 238000009792 diffusion process Methods 0.000 description 5
- 229910052581 Si3N4 Inorganic materials 0.000 description 4
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 4
- JLTRXTDYQLMHGR-UHFFFAOYSA-N trimethylaluminium Chemical compound C[Al](C)C JLTRXTDYQLMHGR-UHFFFAOYSA-N 0.000 description 4
- XCZXGTMEAKBVPV-UHFFFAOYSA-N trimethylgallium Chemical compound C[Ga](C)C XCZXGTMEAKBVPV-UHFFFAOYSA-N 0.000 description 4
- XOYLJNJLGBYDTH-UHFFFAOYSA-M chlorogallium Chemical compound [Ga]Cl XOYLJNJLGBYDTH-UHFFFAOYSA-M 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 230000002093 peripheral effect Effects 0.000 description 3
- 229910052594 sapphire Inorganic materials 0.000 description 3
- 239000010980 sapphire Substances 0.000 description 3
- 239000000460 chlorine Substances 0.000 description 2
- 229910052814 silicon oxide Inorganic materials 0.000 description 2
- 238000003860 storage Methods 0.000 description 2
- RGGPNXQUMRMPRA-UHFFFAOYSA-N triethylgallium Chemical compound CC[Ga](CC)CC RGGPNXQUMRMPRA-UHFFFAOYSA-N 0.000 description 2
- 229910002704 AlGaN Inorganic materials 0.000 description 1
- PIGFYZPCRLYGLF-UHFFFAOYSA-N Aluminum nitride Chemical compound [Al]#N PIGFYZPCRLYGLF-UHFFFAOYSA-N 0.000 description 1
- ZAMOUSCENKQFHK-UHFFFAOYSA-N Chlorine atom Chemical compound [Cl] ZAMOUSCENKQFHK-UHFFFAOYSA-N 0.000 description 1
- CBENFWSGALASAD-UHFFFAOYSA-N Ozone Chemical compound [O-][O+]=O CBENFWSGALASAD-UHFFFAOYSA-N 0.000 description 1
- 229910052801 chlorine Inorganic materials 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 238000002109 crystal growth method Methods 0.000 description 1
- 238000002425 crystallisation Methods 0.000 description 1
- 230000008025 crystallization Effects 0.000 description 1
- 238000011038 discontinuous diafiltration by volume reduction Methods 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 238000002060 fluorescence correlation spectroscopy Methods 0.000 description 1
- UPWPDUACHOATKO-UHFFFAOYSA-K gallium trichloride Chemical compound Cl[Ga](Cl)Cl UPWPDUACHOATKO-UHFFFAOYSA-K 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229910021421 monocrystalline silicon Inorganic materials 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 238000002407 reforming Methods 0.000 description 1
- LIVNPJMFVYWSIS-UHFFFAOYSA-N silicon monoxide Chemical compound [Si-]#[O+] LIVNPJMFVYWSIS-UHFFFAOYSA-N 0.000 description 1
- 238000001947 vapour-phase growth Methods 0.000 description 1
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Abstract
Description
Claims (4)
- シリコン基板上に350℃以上700℃以下の成膜温度で窒化アルミニウム又は酸化アルミニウムを含む中間層を成膜する工程と、
アンモニア又は酸素を含む雰囲気中で前記シリコン基板及び前記中間層を加熱して、該シリコン基板上に前記中間層に含まれる窒化アルミニウム又は酸化アルミニウムの結晶核を分布させる工程と、
前記シリコン基板上に分布した前記結晶核を起点として前記シリコン基板上に窒化ガリウム系結晶を成長させる工程と、
を含む、窒化ガリウム系結晶の成長方法。 - 前記結晶核を分布させる工程においては、900℃以上1000℃以下の温度で前記シリコン基板及び前記中間層を加熱する、請求項1に記載の窒化ガリウム系結晶の成長方法。
- 前記結晶核を分布させる工程においては、1Torr以上400Torr以下の圧力下で前記シリコン基板及び前記中間層を加熱する、請求項1又は2に記載の窒化ガリウム系結晶の成長方法。
- 処理容器と、
前記処理容器内にガスを供給するガス供給部と、
前記処理容器内に収容された被処理体を加熱するための加熱部と、
前記ガス供給部及び前記加熱部を制御する制御部と、
を備え、
前記制御部は、
前記処理容器内にアルミニウムを含有するガスと、窒素又は酸素を含有するガスとを供給し、前記被処理体を350℃以上700℃以下の温度に加熱し、
次いで、前記処理容器内にアンモニア又は酸素を含有するガスを供給し、前記被処理体を加熱し、
次いで、前記処理容器内にガリウムを含有するガス及び窒素を含有するガスを供給し、前記被処理体を加熱する
ように前記ガス供給部及び前記加熱部を制御する、
熱処理装置。
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TW104102619A TWI592526B (zh) | 2014-01-31 | 2015-01-27 | 氮化鎵系結晶之成長方法及熱處理裝置 |
KR1020150013287A KR101840089B1 (ko) | 2014-01-31 | 2015-01-28 | 질화갈륨계 결정의 성장 방법 및 열처리 장치 |
US14/607,591 US9966258B2 (en) | 2014-01-31 | 2015-01-28 | Method of growing gallium nitride-based crystal and heat treatment apparatus |
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US9966258B2 (en) | 2018-05-08 |
CN104821348A (zh) | 2015-08-05 |
TWI592526B (zh) | 2017-07-21 |
TW201542892A (zh) | 2015-11-16 |
KR101840089B1 (ko) | 2018-03-19 |
KR20150091237A (ko) | 2015-08-10 |
CN104821348B (zh) | 2018-07-31 |
JP6185398B2 (ja) | 2017-08-23 |
US20150221512A1 (en) | 2015-08-06 |
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