JP2015035554A - 半導体装置 - Google Patents

半導体装置 Download PDF

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Publication number
JP2015035554A
JP2015035554A JP2013166808A JP2013166808A JP2015035554A JP 2015035554 A JP2015035554 A JP 2015035554A JP 2013166808 A JP2013166808 A JP 2013166808A JP 2013166808 A JP2013166808 A JP 2013166808A JP 2015035554 A JP2015035554 A JP 2015035554A
Authority
JP
Japan
Prior art keywords
wiring
chip
terminal
resin sealing
semiconductor device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2013166808A
Other languages
English (en)
Japanese (ja)
Other versions
JP2015035554A5 (enExample
Inventor
真吾 井上
Shingo Inoue
真吾 井上
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sumitomo Electric Device Innovations Inc
Original Assignee
Sumitomo Electric Device Innovations Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Electric Device Innovations Inc filed Critical Sumitomo Electric Device Innovations Inc
Priority to JP2013166808A priority Critical patent/JP2015035554A/ja
Publication of JP2015035554A publication Critical patent/JP2015035554A/ja
Publication of JP2015035554A5 publication Critical patent/JP2015035554A5/ja
Pending legal-status Critical Current

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Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L2224/31—Structure, shape, material or disposition of the layer connectors after the connecting process
    • H01L2224/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
    • H01L2224/321—Disposition
    • H01L2224/32151—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/32221—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/32245—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42—Wire connectors; Manufacturing methods related thereto
    • H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805—Shape
    • H01L2224/4809—Loop shape
    • H01L2224/48091—Arched
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42—Wire connectors; Manufacturing methods related thereto
    • H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481—Disposition
    • H01L2224/48135—Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip
    • H01L2224/48137—Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip the bodies being arranged next to each other, e.g. on a common substrate
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42—Wire connectors; Manufacturing methods related thereto
    • H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481—Disposition
    • H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48245—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • H01L2224/48247—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732—Location after the connecting process
    • H01L2224/73251—Location after the connecting process on different surfaces
    • H01L2224/73265—Layer and wire connectors

Landscapes

  • Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
  • Lead Frames For Integrated Circuits (AREA)
JP2013166808A 2013-08-09 2013-08-09 半導体装置 Pending JP2015035554A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2013166808A JP2015035554A (ja) 2013-08-09 2013-08-09 半導体装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2013166808A JP2015035554A (ja) 2013-08-09 2013-08-09 半導体装置

Publications (2)

Publication Number Publication Date
JP2015035554A true JP2015035554A (ja) 2015-02-19
JP2015035554A5 JP2015035554A5 (enExample) 2016-09-23

Family

ID=52543869

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2013166808A Pending JP2015035554A (ja) 2013-08-09 2013-08-09 半導体装置

Country Status (1)

Country Link
JP (1) JP2015035554A (enExample)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2018170331A (ja) * 2017-03-29 2018-11-01 旭化成エレクトロニクス株式会社 半導体装置
CN108831871A (zh) * 2018-06-08 2018-11-16 郑州云海信息技术有限公司 一种提升qfn封装零件焊接质量的设计方法
KR20200087200A (ko) * 2017-12-27 2020-07-20 미쓰비시덴키 가부시키가이샤 반도체 장치
CN112635411A (zh) * 2019-09-24 2021-04-09 英飞凌科技股份有限公司 具有顶侧或底侧冷却的半导体封装
JP2022118411A (ja) * 2021-02-02 2022-08-15 ローム株式会社 半導体装置および検査方法

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11307675A (ja) * 1998-04-20 1999-11-05 Matsushita Electron Corp 樹脂封止型半導体装置及びその製造方法
JP2001177007A (ja) * 1999-12-21 2001-06-29 Hitachi Ltd 半導体装置及びその製造方法
JP2003289128A (ja) * 2002-01-23 2003-10-10 Matsushita Electric Ind Co Ltd 回路部品内蔵モジュールおよびその製造方法
JP2007503721A (ja) * 2003-08-26 2007-02-22 アドバンスド インターコネクト テクノロジーズ リミテッド リバーシブル・リードレス・パッケージとその製造および使用方法

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11307675A (ja) * 1998-04-20 1999-11-05 Matsushita Electron Corp 樹脂封止型半導体装置及びその製造方法
JP2001177007A (ja) * 1999-12-21 2001-06-29 Hitachi Ltd 半導体装置及びその製造方法
JP2003289128A (ja) * 2002-01-23 2003-10-10 Matsushita Electric Ind Co Ltd 回路部品内蔵モジュールおよびその製造方法
JP2007503721A (ja) * 2003-08-26 2007-02-22 アドバンスド インターコネクト テクノロジーズ リミテッド リバーシブル・リードレス・パッケージとその製造および使用方法

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2018170331A (ja) * 2017-03-29 2018-11-01 旭化成エレクトロニクス株式会社 半導体装置
KR20200087200A (ko) * 2017-12-27 2020-07-20 미쓰비시덴키 가부시키가이샤 반도체 장치
KR102351764B1 (ko) * 2017-12-27 2022-01-14 미쓰비시덴키 가부시키가이샤 반도체 장치
US11335619B2 (en) 2017-12-27 2022-05-17 Mitsubishi Electric Corporation Semiconductor device
CN108831871A (zh) * 2018-06-08 2018-11-16 郑州云海信息技术有限公司 一种提升qfn封装零件焊接质量的设计方法
CN112635411A (zh) * 2019-09-24 2021-04-09 英飞凌科技股份有限公司 具有顶侧或底侧冷却的半导体封装
JP2022118411A (ja) * 2021-02-02 2022-08-15 ローム株式会社 半導体装置および検査方法
JP7636186B2 (ja) 2021-02-02 2025-02-26 ローム株式会社 半導体装置および検査方法

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