|
WO2010109390A1
(en)
|
2009-03-27 |
2010-09-30 |
Koninklijke Philips Electronics N. V. |
Achromatic phase-contrast imaging
|
|
WO2012000694A1
(en)
*
|
2010-06-28 |
2012-01-05 |
Paul Scherrer Institut |
A method for x-ray phase contrast and dark-field imaging using an arrangement of gratings in planar geometry
|
|
IN2014CN01546A
(https=)
*
|
2011-08-31 |
2015-05-08 |
Koninkl Philips Nv |
|
|
US20150117599A1
(en)
*
|
2013-10-31 |
2015-04-30 |
Sigray, Inc. |
X-ray interferometric imaging system
|
|
KR101378757B1
(ko)
*
|
2012-08-30 |
2014-03-27 |
한국원자력연구원 |
물질 원소 정보 획득 및 영상 차원의 선택이 가능한 방사선 영상화 장치
|
|
US9724063B2
(en)
|
2012-12-21 |
2017-08-08 |
Carestream Health, Inc. |
Surrogate phantom for differential phase contrast imaging
|
|
US10578563B2
(en)
|
2012-12-21 |
2020-03-03 |
Carestream Health, Inc. |
Phase contrast imaging computed tomography scanner
|
|
US10096098B2
(en)
|
2013-12-30 |
2018-10-09 |
Carestream Health, Inc. |
Phase retrieval from differential phase contrast imaging
|
|
US9357975B2
(en)
|
2013-12-30 |
2016-06-07 |
Carestream Health, Inc. |
Large FOV phase contrast imaging based on detuned configuration including acquisition and reconstruction techniques
|
|
US9494534B2
(en)
|
2012-12-21 |
2016-11-15 |
Carestream Health, Inc. |
Material differentiation with phase contrast imaging
|
|
US9700267B2
(en)
|
2012-12-21 |
2017-07-11 |
Carestream Health, Inc. |
Method and apparatus for fabrication and tuning of grating-based differential phase contrast imaging system
|
|
US9907524B2
(en)
|
2012-12-21 |
2018-03-06 |
Carestream Health, Inc. |
Material decomposition technique using x-ray phase contrast imaging system
|
|
US9001967B2
(en)
*
|
2012-12-28 |
2015-04-07 |
Carestream Health, Inc. |
Spectral grating-based differential phase contrast system for medical radiographic imaging
|
|
US9439613B2
(en)
*
|
2013-02-12 |
2016-09-13 |
The Johns Hopkins University |
System and method for phase-contrast X-ray imaging
|
|
CN104095646B
(zh)
*
|
2013-04-03 |
2017-03-08 |
中国科学院高能物理研究所 |
高分辨率和高信噪比的双旋ct成像系统和成像方法
|
|
CN104095645A
(zh)
*
|
2013-04-03 |
2014-10-15 |
中国科学院高能物理研究所 |
高分辨率和高信噪比的x射线成像系统和成像方法
|
|
WO2015015851A1
(ja)
*
|
2013-07-30 |
2015-02-05 |
コニカミノルタ株式会社 |
医用画像システム及び関節軟骨状態のスコア判定方法
|
|
US9939392B2
(en)
|
2013-09-12 |
2018-04-10 |
The United States Of America, As Represented By The Secretary, Department Of Health And Human Services |
Demodulation of intensity modulation in X-ray imaging
|
|
US10416099B2
(en)
|
2013-09-19 |
2019-09-17 |
Sigray, Inc. |
Method of performing X-ray spectroscopy and X-ray absorption spectrometer system
|
|
US10269528B2
(en)
|
2013-09-19 |
2019-04-23 |
Sigray, Inc. |
Diverging X-ray sources using linear accumulation
|
|
US10295485B2
(en)
|
2013-12-05 |
2019-05-21 |
Sigray, Inc. |
X-ray transmission spectrometer system
|
|
US10297359B2
(en)
|
2013-09-19 |
2019-05-21 |
Sigray, Inc. |
X-ray illumination system with multiple target microstructures
|
|
USRE48612E1
(en)
|
2013-10-31 |
2021-06-29 |
Sigray, Inc. |
X-ray interferometric imaging system
|
|
US10304580B2
(en)
|
2013-10-31 |
2019-05-28 |
Sigray, Inc. |
Talbot X-ray microscope
|
|
WO2015067461A1
(en)
*
|
2013-11-05 |
2015-05-14 |
Koninklijke Philips N.V. |
X-ray imaging device with fast spatial modulation of photon flux
|
|
CN104622492A
(zh)
*
|
2013-11-11 |
2015-05-20 |
中国科学技术大学 |
一种x射线光栅相位衬度成像装置和方法
|
|
EP2951837B1
(en)
|
2013-11-28 |
2016-08-03 |
Koninklijke Philips N.V. |
Talbot effect based nearfield diffraction for spectral filtering
|
|
JP2016509872A
(ja)
*
|
2014-02-10 |
2016-04-04 |
ザ ジョンズ ホプキンス ユニバーシティー |
高エネルギにおけるｘ線位相コントラストイメージング及びｃｔのための大視野格子干渉計
|
|
EP2942619A1
(en)
*
|
2014-05-07 |
2015-11-11 |
Paul Scherrer Institut |
Tilted-grating approach for scanning-mode X-ray grating interferometry
|
|
CA2951639C
(en)
|
2014-05-08 |
2021-01-26 |
Lawrence Livermore National Security, Llc |
Methods for 2-color radiography with laser-compton x-ray sources
|
|
KR102179410B1
(ko)
|
2014-05-08 |
2020-11-16 |
로렌스 리버모어 내쇼날 시큐리티, 엘엘시 |
레이저-콤프턴 엑스-레이 및 레이저-콤프턴 감마-레이 소스로써 초저 조사량으로 피드백 이미징하는 방법
|
|
JP6495943B2
(ja)
*
|
2014-05-09 |
2019-04-03 |
ザ・ジョンズ・ホプキンス・ユニバーシティー |
位相コントラストｘ線イメージングのためのシステム及び方法
|
|
US10401309B2
(en)
|
2014-05-15 |
2019-09-03 |
Sigray, Inc. |
X-ray techniques using structured illumination
|
|
US9801600B2
(en)
*
|
2014-11-17 |
2017-10-31 |
Rensselaer Polytechnic Institute |
X-ray phase-contrast imaging
|
|
JP6451400B2
(ja)
*
|
2015-02-26 |
2019-01-16 |
コニカミノルタ株式会社 |
画像処理システム及び画像処理装置
|
|
US10352880B2
(en)
|
2015-04-29 |
2019-07-16 |
Sigray, Inc. |
Method and apparatus for x-ray microscopy
|
|
US10295486B2
(en)
|
2015-08-18 |
2019-05-21 |
Sigray, Inc. |
Detector for X-rays with high spatial and high spectral resolution
|
|
JP6430636B2
(ja)
*
|
2015-08-26 |
2018-11-28 |
コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． |
デュアルエネルギー微分位相コントラスト撮像
|
|
JP6632852B2
(ja)
*
|
2015-10-06 |
2020-01-22 |
浜松ホトニクス株式会社 |
Ｘ線撮像装置及びｘ線撮像方法
|
|
US10247683B2
(en)
|
2016-12-03 |
2019-04-02 |
Sigray, Inc. |
Material measurement techniques using multiple X-ray micro-beams
|
|
JP6753342B2
(ja)
*
|
2017-03-15 |
2020-09-09 |
株式会社島津製作所 |
放射線格子検出器およびｘ線検査装置
|
|
US11162908B2
(en)
*
|
2017-04-07 |
2021-11-02 |
Konica Minolta, Inc. |
Quality inspection method
|
|
JP6844461B2
(ja)
*
|
2017-07-20 |
2021-03-17 |
株式会社島津製作所 |
Ｘ線位相イメージング装置および情報取得手法
|
|
CN107527670A
(zh)
*
|
2017-08-01 |
2017-12-29 |
中国工程物理研究院激光聚变研究中心 |
一种透过率多级调制的x射线选能器件
|
|
EP3494885A1
(en)
*
|
2017-12-07 |
2019-06-12 |
Koninklijke Philips N.V. |
Apparatus for presentation of dark field x-ray image information
|
|
US10578566B2
(en)
|
2018-04-03 |
2020-03-03 |
Sigray, Inc. |
X-ray emission spectrometer system
|
|
CN108469443A
(zh)
*
|
2018-04-18 |
2018-08-31 |
北京航空航天大学 |
基于二维错位吸收光栅的x射线光栅差分相位衬度成像方法及装置
|
|
US10845491B2
(en)
|
2018-06-04 |
2020-11-24 |
Sigray, Inc. |
Energy-resolving x-ray detection system
|
|
GB2591630B
(en)
|
2018-07-26 |
2023-05-24 |
Sigray Inc |
High brightness x-ray reflection source
|
|
US10656105B2
(en)
|
2018-08-06 |
2020-05-19 |
Sigray, Inc. |
Talbot-lau x-ray source and interferometric system
|
|
WO2020051061A1
(en)
|
2018-09-04 |
2020-03-12 |
Sigray, Inc. |
System and method for x-ray fluorescence with filtering
|
|
WO2020051221A2
(en)
|
2018-09-07 |
2020-03-12 |
Sigray, Inc. |
System and method for depth-selectable x-ray analysis
|
|
WO2020252056A1
(en)
*
|
2019-06-11 |
2020-12-17 |
Prc-Desoto International, Inc. |
Method and system of inspecting pre-molded sealant parts
|
|
JP7226171B2
(ja)
*
|
2019-07-26 |
2023-02-21 |
株式会社島津製作所 |
Ｘ線位相イメージング装置
|
|
DE112020004169T5
(de)
|
2019-09-03 |
2022-05-25 |
Sigray, Inc. |
System und verfahren zur computergestützten laminografieröntgenfluoreszenz-bildgebung
|
|
US11150559B2
(en)
|
2019-12-30 |
2021-10-19 |
Taiwan Semiconductor Manufacturing Co., Ltd. |
Laser interference fringe control for higher EUV light source and EUV throughput
|
|
CN111190217B
(zh)
*
|
2020-01-23 |
2022-08-02 |
中国工程物理研究院激光聚变研究中心 |
一种透射带通型辐射流探测器
|
|
US11175243B1
(en)
|
2020-02-06 |
2021-11-16 |
Sigray, Inc. |
X-ray dark-field in-line inspection for semiconductor samples
|
|
JP7395775B2
(ja)
|
2020-05-18 |
2023-12-11 |
シグレイ、インコーポレイテッド |
結晶解析装置及び複数の検出器素子を使用するｘ線吸収分光法のためのシステム及び方法
|
|
US11348703B2
(en)
*
|
2020-09-16 |
2022-05-31 |
Uchicago Argonne, Llc |
Tunable side-bounce x-ray monochromator
|
|
WO2022061347A1
(en)
|
2020-09-17 |
2022-03-24 |
Sigray, Inc. |
System and method using x-rays for depth-resolving metrology and analysis
|
|
US12480892B2
(en)
|
2020-12-07 |
2025-11-25 |
Sigray, Inc. |
High throughput 3D x-ray imaging system using a transmission x-ray source
|
|
KR20260030946A
(ko)
|
2020-12-07 |
2026-03-06 |
시그레이, 아이엔씨. |
투과 x-선 소스를 이용한 고처리량 3D x-선 이미징 시스템
|
|
WO2023117611A1
(en)
*
|
2021-12-23 |
2023-06-29 |
Asml Netherlands B.V. |
Systems and methods for generating multiple illumination spots from a single illumination source
|
|
WO2023168204A1
(en)
|
2022-03-02 |
2023-09-07 |
Sigray, Inc. |
X-ray fluorescence system and x-ray source with electrically insulative target material
|
|
WO2023177981A1
(en)
|
2022-03-15 |
2023-09-21 |
Sigray, Inc. |
System and method for compact laminography utilizing microfocus transmission x-ray source and variable magnification x-ray detector
|
|
CN119173759A
(zh)
|
2022-05-02 |
2024-12-20 |
斯格瑞公司 |
X射线顺序阵列波长色散光谱仪
|
|
CN121013975A
(zh)
|
2023-02-16 |
2025-11-25 |
斯格瑞公司 |
具有至少两个堆叠的平面布拉格衍射器的x射线探测器系统
|
|
US12181423B1
(en)
|
2023-09-07 |
2024-12-31 |
Sigray, Inc. |
Secondary image removal using high resolution x-ray transmission sources
|
|
US12429437B2
(en)
|
2023-11-07 |
2025-09-30 |
Sigray, Inc. |
System and method for x-ray absorption spectroscopy using spectral information from two orthogonal planes
|
|
US12429436B2
(en)
|
2024-01-08 |
2025-09-30 |
Sigray, Inc. |
X-ray analysis system with focused x-ray beam and non-x-ray microscope
|
|
WO2025155719A1
(en)
|
2024-01-18 |
2025-07-24 |
Sigray, Inc. |
Sequential array of x-ray imaging detectors
|
|
WO2025174966A1
(en)
|
2024-02-15 |
2025-08-21 |
Sigray, Inc. |
System and method for generating a focused x‑ray beam
|