JP2013539865A5 - - Google Patents

Download PDF

Info

Publication number
JP2013539865A5
JP2013539865A5 JP2013533855A JP2013533855A JP2013539865A5 JP 2013539865 A5 JP2013539865 A5 JP 2013539865A5 JP 2013533855 A JP2013533855 A JP 2013533855A JP 2013533855 A JP2013533855 A JP 2013533855A JP 2013539865 A5 JP2013539865 A5 JP 2013539865A5
Authority
JP
Japan
Prior art keywords
infrared
array
processor
laser
surface chemistry
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2013533855A
Other languages
English (en)
Japanese (ja)
Other versions
JP6037340B2 (ja
JP2013539865A (ja
Filing date
Publication date
Priority claimed from US12/903,548 external-priority patent/US8536529B2/en
Application filed filed Critical
Publication of JP2013539865A publication Critical patent/JP2013539865A/ja
Publication of JP2013539865A5 publication Critical patent/JP2013539865A5/ja
Application granted granted Critical
Publication of JP6037340B2 publication Critical patent/JP6037340B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JP2013533855A 2010-10-13 2011-08-26 表面の化学的性質の非接触測定装置および方法 Active JP6037340B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US12/903,548 2010-10-13
US12/903,548 US8536529B2 (en) 2010-10-13 2010-10-13 Non-contact surface chemistry measurement apparatus and method
PCT/US2011/049331 WO2012050669A1 (en) 2010-10-13 2011-08-26 Non-contact surface chemistry measurement apparatus and method

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2016160335A Division JP6309583B2 (ja) 2010-10-13 2016-08-18 表面の化学的性質の非接触測定装置および方法

Publications (3)

Publication Number Publication Date
JP2013539865A JP2013539865A (ja) 2013-10-28
JP2013539865A5 true JP2013539865A5 (enExample) 2014-07-17
JP6037340B2 JP6037340B2 (ja) 2016-12-07

Family

ID=44681417

Family Applications (2)

Application Number Title Priority Date Filing Date
JP2013533855A Active JP6037340B2 (ja) 2010-10-13 2011-08-26 表面の化学的性質の非接触測定装置および方法
JP2016160335A Active JP6309583B2 (ja) 2010-10-13 2016-08-18 表面の化学的性質の非接触測定装置および方法

Family Applications After (1)

Application Number Title Priority Date Filing Date
JP2016160335A Active JP6309583B2 (ja) 2010-10-13 2016-08-18 表面の化学的性質の非接触測定装置および方法

Country Status (5)

Country Link
US (1) US8536529B2 (enExample)
EP (1) EP2627989B1 (enExample)
JP (2) JP6037340B2 (enExample)
CN (1) CN103180715A (enExample)
WO (1) WO2012050669A1 (enExample)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5736325B2 (ja) 2012-02-21 2015-06-17 株式会社日立製作所 光学装置
US8686364B1 (en) * 2012-09-17 2014-04-01 Jp3 Measurement, Llc Method and system for determining energy content and detecting contaminants in a fluid stream
FR3013118B1 (fr) * 2013-11-12 2015-11-06 Centre Nat Detudes Spatiales Cnes Spectrophotometre hyperspectral large bande pour analyser un objet dans le domaine fluorescent
DE102015106635A1 (de) 2015-04-29 2016-11-03 Osram Opto Semiconductors Gmbh Optoelektronische Anordnung
USD796979S1 (en) * 2015-09-02 2017-09-12 Mettler-Toledo Gmbh Spectrophotometer
USD797587S1 (en) * 2015-09-02 2017-09-19 Mettler-Toledo Gmbh Spectrophotometer
JP6692651B2 (ja) * 2016-02-05 2020-05-13 株式会社ミツトヨ クロマティック共焦点センサ
USD796359S1 (en) * 2016-02-24 2017-09-05 Ocean Optics, Inc. Miniature spectrometer case
US9897484B1 (en) * 2016-09-29 2018-02-20 Intel Corporation Measuring wideband spectrum information in mobile devices via an integrated optical system that uses multiple spectral sensors, multiple light sources and MEMS actuation
JP7358985B2 (ja) * 2017-06-01 2023-10-11 コニカミノルタ株式会社 分光測色計

Family Cites Families (31)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07117499B2 (ja) * 1987-10-31 1995-12-18 石川島播磨重工業株式会社 レーザ光線による塗膜劣化診断方法
JP3124047B2 (ja) * 1991-02-04 2001-01-15 日本たばこ産業株式会社 携帯型赤外線水分測定装置
WO1997008537A1 (en) * 1995-08-31 1997-03-06 Infrared Fiber Systems, Inc. Handheld infrared spectrometer
US6031233A (en) * 1995-08-31 2000-02-29 Infrared Fiber Systems, Inc. Handheld infrared spectrometer
US6157033A (en) * 1998-05-18 2000-12-05 Power Distribution Services, Inc. Leak detection system
US6836325B2 (en) * 1999-07-16 2004-12-28 Textron Systems Corporation Optical probes and methods for spectral analysis
JP4498564B2 (ja) * 2000-08-10 2010-07-07 日本分光株式会社 試料識別方法およびその装置
JP3930334B2 (ja) * 2001-03-21 2007-06-13 株式会社資生堂 分光反射率測定装置
JP2003254856A (ja) 2002-02-28 2003-09-10 Tokyo Gas Co Ltd 光学式ガス漏洩検知器及びガス漏洩検知車両
US6697155B2 (en) * 2002-04-09 2004-02-24 Itt Manufacturing Enterprises, Inc. Multispectral active remote sensing without narrowband optical filters
US6794651B2 (en) 2002-06-13 2004-09-21 The Boeing Company Method of measuring chromated conversion coating amount using infrared absorbance
US6784431B2 (en) 2002-06-13 2004-08-31 The Boeing Company Method of measuring anodize coating amount using infrared absorbance
US6903339B2 (en) 2002-11-26 2005-06-07 The Boeing Company Method of measuring thickness of an opaque coating using infrared absorbance
US6906327B2 (en) 2002-11-26 2005-06-14 The Boeing Company Method of measuring amount of chemical cure and amount of surface contamination using infrared absorbance
US7174198B2 (en) 2002-12-27 2007-02-06 Igor Trofimov Non-invasive detection of analytes in a complex matrix
US20060263252A1 (en) 2003-02-25 2006-11-23 Jorge Sanchez-Olea Apparatus and method for chemical and biological agent sensing
US7115869B2 (en) 2003-09-30 2006-10-03 The Boeing Company Method for measurement of composite heat damage with infrared spectroscopy
JP2007509319A (ja) 2003-10-17 2007-04-12 アクサン・テクノロジーズ・インコーポレーテッド 多チャネルラマン分光システムおよび方法
US7236243B2 (en) * 2004-04-12 2007-06-26 Michael Thomas Beecroft Hand-held spectrometer
US20050264804A1 (en) * 2004-05-27 2005-12-01 Eastman Kodak Company Bi-modal control material for particle size analyzers
US20070194239A1 (en) * 2006-01-31 2007-08-23 Mcallister Abraham Apparatus and method providing a hand-held spectrometer
US7796251B2 (en) * 2006-03-22 2010-09-14 Itt Manufacturing Enterprises, Inc. Method, apparatus and system for rapid and sensitive standoff detection of surface contaminants
US8180419B2 (en) 2006-09-27 2012-05-15 Nellcor Puritan Bennett Llc Tissue hydration estimation by spectral absorption bandwidth measurement
US7826509B2 (en) 2006-12-15 2010-11-02 President And Fellows Of Harvard College Broadly tunable single-mode quantum cascade laser sources and sensors
JP4766697B2 (ja) * 2007-03-22 2011-09-07 アンリツ株式会社 小型ガス検知装置
US8402819B2 (en) 2007-05-15 2013-03-26 Anasys Instruments, Inc. High frequency deflection measurement of IR absorption
US20100208261A1 (en) * 2007-10-11 2010-08-19 Basf Se Spectrometer with led array
JP2009282007A (ja) * 2008-05-26 2009-12-03 Ritsuo Hasumi 携帯型スペクトル分析機のデータ処理方法
JP2010117272A (ja) * 2008-11-13 2010-05-27 Mitsubishi Rayon Co Ltd シリコーン異物の判別方法
CN201331382Y (zh) * 2009-01-19 2009-10-21 杭州电子科技大学 一种阵列式微型光谱仪
CN101819063B (zh) * 2009-12-29 2011-10-05 南京邮电大学 相位调制凹槽阵列微型光谱仪

Similar Documents

Publication Publication Date Title
JP2013539865A5 (enExample)
JP6309583B2 (ja) 表面の化学的性質の非接触測定装置および方法
CN107003243B (zh) 分光测定装置及分光测定方法
TWI664401B (zh) 分光測定裝置及分光測定方法
CA2878354C (en) Dual spectrometer
JP2011196735A5 (enExample)
CN107076613A (zh) 光谱测定方法及光谱测定装置
WO2012173999A3 (en) Wafer level spectrometer
WO2012012258A3 (en) Temperature-adjusted spectrometer
US9857221B2 (en) Spectral image acquisition apparatus and light reception wavelength acquisition method
JP2013183988A5 (enExample)
WO2014108683A3 (en) Optical chemical analyser and liquid depth sensor
IL273791A (en) Spectroscopic system and method for it
JP2015515011A (ja) 内蔵ａｔｒ及び付属品区画を有する分光計
CN108801937B (zh) 仪器的校准
WO2021208349A1 (zh) 一种积分球光度计光谱响应测量方法和系统
TWI610379B (zh) 用於臨場薄膜厚度監控之厚度改變監控晶圓
JP2013046063A5 (enExample)
Rathmell et al. Portable Raman spectroscopy: instrumentation and technology
JP2017535779A (ja) 遠隔対象を感知するためのシステム及び方法
EP3175221B1 (en) Raster optic device for optical hyper spectral scanning
Price et al. Effects of ambient temperature on the performance of CCD array spectroradiometers and practical implications for field measurements
RU2013145400A (ru) Способ определения степени черноты поверхности материалов
US10267684B1 (en) Device, system, and technique for characterizing a focal plane array modulation transfer function
Trontelj et al. Novel THz sensor introduction, manufacturing description and examples of use