CN103180715A - 非接触表面化学测量装置和方法 - Google Patents

非接触表面化学测量装置和方法 Download PDF

Info

Publication number
CN103180715A
CN103180715A CN2011800491455A CN201180049145A CN103180715A CN 103180715 A CN103180715 A CN 103180715A CN 2011800491455 A CN2011800491455 A CN 2011800491455A CN 201180049145 A CN201180049145 A CN 201180049145A CN 103180715 A CN103180715 A CN 103180715A
Authority
CN
China
Prior art keywords
infrared
beam aperture
tunable
array
processor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN2011800491455A
Other languages
English (en)
Chinese (zh)
Inventor
P·G·瓦伊
G·J·沃纳
P·H·谢莉
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Boeing Co
Original Assignee
Boeing Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Boeing Co filed Critical Boeing Co
Publication of CN103180715A publication Critical patent/CN103180715A/zh
Pending legal-status Critical Current

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3563—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing solids; Preparation of samples therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0289—Field-of-view determination; Aiming or pointing of a spectrometer; Adjusting alignment; Encoding angular position; Size of measurement area; Position tracking
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/10—Arrangements of light sources specially adapted for spectrometry or colorimetry
    • G01J3/108—Arrangements of light sources specially adapted for spectrometry or colorimetry for measurement in the infrared range
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274—Calibration, base line adjustment, drift correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/93—Detection standards; Calibrating baseline adjustment, drift correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/94—Investigating contamination, e.g. dust
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/8422—Investigating thin films, e.g. matrix isolation method
    • G01N2021/8427—Coatings
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N2021/8472—Investigation of composite materials
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/39—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
    • G01N21/474—Details of optical heads therefor, e.g. using optical fibres
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/02—Mechanical
    • G01N2201/022—Casings
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/12—Circuits of general importance; Signal processing
    • G01N2201/129—Using chemometrical methods

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
CN2011800491455A 2010-10-13 2011-08-26 非接触表面化学测量装置和方法 Pending CN103180715A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US12/903,548 US8536529B2 (en) 2010-10-13 2010-10-13 Non-contact surface chemistry measurement apparatus and method
US12/903,548 2010-10-13
PCT/US2011/049331 WO2012050669A1 (en) 2010-10-13 2011-08-26 Non-contact surface chemistry measurement apparatus and method

Publications (1)

Publication Number Publication Date
CN103180715A true CN103180715A (zh) 2013-06-26

Family

ID=44681417

Family Applications (1)

Application Number Title Priority Date Filing Date
CN2011800491455A Pending CN103180715A (zh) 2010-10-13 2011-08-26 非接触表面化学测量装置和方法

Country Status (5)

Country Link
US (1) US8536529B2 (enExample)
EP (1) EP2627989B1 (enExample)
JP (2) JP6037340B2 (enExample)
CN (1) CN103180715A (enExample)
WO (1) WO2012050669A1 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107044822A (zh) * 2016-02-05 2017-08-15 株式会社三丰 光谱共焦传感器和测量方法

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5736325B2 (ja) 2012-02-21 2015-06-17 株式会社日立製作所 光学装置
US8686364B1 (en) 2012-09-17 2014-04-01 Jp3 Measurement, Llc Method and system for determining energy content and detecting contaminants in a fluid stream
FR3013118B1 (fr) * 2013-11-12 2015-11-06 Centre Nat Detudes Spatiales Cnes Spectrophotometre hyperspectral large bande pour analyser un objet dans le domaine fluorescent
DE102015106635A1 (de) 2015-04-29 2016-11-03 Osram Opto Semiconductors Gmbh Optoelektronische Anordnung
USD797587S1 (en) * 2015-09-02 2017-09-19 Mettler-Toledo Gmbh Spectrophotometer
USD796979S1 (en) * 2015-09-02 2017-09-12 Mettler-Toledo Gmbh Spectrophotometer
USD796359S1 (en) * 2016-02-24 2017-09-05 Ocean Optics, Inc. Miniature spectrometer case
US9897484B1 (en) * 2016-09-29 2018-02-20 Intel Corporation Measuring wideband spectrum information in mobile devices via an integrated optical system that uses multiple spectral sensors, multiple light sources and MEMS actuation
CN110678722A (zh) * 2017-06-01 2020-01-10 柯尼卡美能达株式会社 分光光度计
US12503611B2 (en) 2022-05-12 2025-12-23 University Of Rhode Island Board Of Trustees Glass-ceramic thermal paint system and method using UV:VIS spectroscopy

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6697155B2 (en) * 2002-04-09 2004-02-24 Itt Manufacturing Enterprises, Inc. Multispectral active remote sensing without narrowband optical filters
US20050264808A1 (en) * 2003-10-17 2005-12-01 Axsun Technologies, Inc. Multi channel Raman spectroscopy system and method
US7236243B2 (en) * 2004-04-12 2007-06-26 Michael Thomas Beecroft Hand-held spectrometer
US20070194239A1 (en) * 2006-01-31 2007-08-23 Mcallister Abraham Apparatus and method providing a hand-held spectrometer
US20080144677A1 (en) * 2006-12-15 2008-06-19 Belkin Mikhail A Broadly tunable single-mode quantum cascade laser sources and sensors
CN201331382Y (zh) * 2009-01-19 2009-10-21 杭州电子科技大学 一种阵列式微型光谱仪
CN101819063A (zh) * 2009-12-29 2010-09-01 南京邮电大学 相位调制凹槽阵列微型光谱仪

Family Cites Families (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07117499B2 (ja) * 1987-10-31 1995-12-18 石川島播磨重工業株式会社 レーザ光線による塗膜劣化診断方法
JP3124047B2 (ja) * 1991-02-04 2001-01-15 日本たばこ産業株式会社 携帯型赤外線水分測定装置
US6031233A (en) * 1995-08-31 2000-02-29 Infrared Fiber Systems, Inc. Handheld infrared spectrometer
JP3181596B2 (ja) * 1995-08-31 2001-07-03 インフラレッド ファイバー システムス，インク． ハンドヘルド赤外線分光装置
US6157033A (en) * 1998-05-18 2000-12-05 Power Distribution Services, Inc. Leak detection system
US6836325B2 (en) * 1999-07-16 2004-12-28 Textron Systems Corporation Optical probes and methods for spectral analysis
JP4498564B2 (ja) * 2000-08-10 2010-07-07 日本分光株式会社 試料識別方法およびその装置
JP3930334B2 (ja) * 2001-03-21 2007-06-13 株式会社資生堂 分光反射率測定装置
JP2003254856A (ja) 2002-02-28 2003-09-10 Tokyo Gas Co Ltd 光学式ガス漏洩検知器及びガス漏洩検知車両
US6784431B2 (en) 2002-06-13 2004-08-31 The Boeing Company Method of measuring anodize coating amount using infrared absorbance
US6794651B2 (en) 2002-06-13 2004-09-21 The Boeing Company Method of measuring chromated conversion coating amount using infrared absorbance
US6903339B2 (en) 2002-11-26 2005-06-07 The Boeing Company Method of measuring thickness of an opaque coating using infrared absorbance
US6906327B2 (en) 2002-11-26 2005-06-14 The Boeing Company Method of measuring amount of chemical cure and amount of surface contamination using infrared absorbance
US7174198B2 (en) 2002-12-27 2007-02-06 Igor Trofimov Non-invasive detection of analytes in a complex matrix
JP2006528782A (ja) 2003-02-25 2006-12-21 セイックス・テクノロジーズ・インコーポレーテッド 化学物質及び生物物質検知装置及び方法
US7115869B2 (en) 2003-09-30 2006-10-03 The Boeing Company Method for measurement of composite heat damage with infrared spectroscopy
US20050264804A1 (en) * 2004-05-27 2005-12-01 Eastman Kodak Company Bi-modal control material for particle size analyzers
US7796251B2 (en) * 2006-03-22 2010-09-14 Itt Manufacturing Enterprises, Inc. Method, apparatus and system for rapid and sensitive standoff detection of surface contaminants
US8180419B2 (en) 2006-09-27 2012-05-15 Nellcor Puritan Bennett Llc Tissue hydration estimation by spectral absorption bandwidth measurement
JP4766697B2 (ja) * 2007-03-22 2011-09-07 アンリツ株式会社 小型ガス検知装置
US8402819B2 (en) 2007-05-15 2013-03-26 Anasys Instruments, Inc. High frequency deflection measurement of IR absorption
EA201000526A1 (ru) * 2007-10-11 2010-12-30 Басф Се Спектрометр со светодиодной матрицей
JP2009282007A (ja) * 2008-05-26 2009-12-03 Ritsuo Hasumi 携帯型スペクトル分析機のデータ処理方法
JP2010117272A (ja) * 2008-11-13 2010-05-27 Mitsubishi Rayon Co Ltd シリコーン異物の判別方法

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6697155B2 (en) * 2002-04-09 2004-02-24 Itt Manufacturing Enterprises, Inc. Multispectral active remote sensing without narrowband optical filters
US20050264808A1 (en) * 2003-10-17 2005-12-01 Axsun Technologies, Inc. Multi channel Raman spectroscopy system and method
US7236243B2 (en) * 2004-04-12 2007-06-26 Michael Thomas Beecroft Hand-held spectrometer
US20070194239A1 (en) * 2006-01-31 2007-08-23 Mcallister Abraham Apparatus and method providing a hand-held spectrometer
US20080144677A1 (en) * 2006-12-15 2008-06-19 Belkin Mikhail A Broadly tunable single-mode quantum cascade laser sources and sensors
CN201331382Y (zh) * 2009-01-19 2009-10-21 杭州电子科技大学 一种阵列式微型光谱仪
CN101819063A (zh) * 2009-12-29 2010-09-01 南京邮电大学 相位调制凹槽阵列微型光谱仪

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107044822A (zh) * 2016-02-05 2017-08-15 株式会社三丰 光谱共焦传感器和测量方法
CN107044822B (zh) * 2016-02-05 2021-04-27 株式会社三丰 光谱共焦传感器

Also Published As

Publication number Publication date
JP2013539865A (ja) 2013-10-28
WO2012050669A1 (en) 2012-04-19
JP6309583B2 (ja) 2018-04-11
EP2627989B1 (en) 2021-02-17
US8536529B2 (en) 2013-09-17
EP2627989A1 (en) 2013-08-21
JP2016224063A (ja) 2016-12-28
US20120092665A1 (en) 2012-04-19
JP6037340B2 (ja) 2016-12-07

Similar Documents

Publication Publication Date Title
CN103180715A (zh) 非接触表面化学测量装置和方法
EP2138830B1 (en) IR spectroscopic method for determining UV degradation of a polymer composite material surface in a portion of an aircraft
Dorling et al. Highlighting attenuated total reflection Fourier transform infrared spectroscopy for rapid serum analysis
US20120056082A1 (en) Method for determining contamination of material using mid-ir spectroscopy
US9772227B2 (en) Laser spiderweb sensor used with portable handheld devices
EP2366101B1 (en) Determination of bond strength of a resin-fibre composite material based on moisture content measured using infared spectroscopy
US20100276578A1 (en) Method for determining degree of aging of a polymer resin material
Goto et al. Luminosity functions of local infrared galaxies with AKARI: implications for the cosmic star formation history and AGN evolution
US7800069B2 (en) Method for performing IR spectroscopy measurements to determine coating weight/amount for metal conversion coatings
Wei et al. Aerosol analysis using handheld Raman spectrometer: On-site quantification of trace crystalline silica in workplace atmospheres
US20120084016A1 (en) Portable laser-induced breakdown spectroscopy system with modularized reference data
Sánchez-Arriaga et al. A spectroscopic reflectance-based low-cost thickness measurement system for thin films: development and testing
Eibl et al. Prospects to separately estimate temperature and duration of a thermal pre-load on a polymer matrix composite
Yao et al. Separating the intrinsic alignment signal and the lensing signal using self-calibration in photo-z surveys with KiDS450 and KV450 Data
Ryland et al. Current Trends in Forensic Paint Examination.
Workman et al. Using reference materials, part II: photometric standards
Adibekyan et al. Emissivity measurements on reflective insulation materials
Gardner et al. Identification and confirmation algorithms for handheld spectrometers
Mao et al. Impactor collection efficiencies can modify the uncertainty of multiply charged particles in optical extinction measurements
Walton et al. Transmission‐function correction for XPS spectrum imaging
Worheide LIQUID COLOR MEASUREMENT: A New Approach for Color Testing.
Furstenberg et al. Inverse analysis of diffuse reflectance spectra for explosives monitoring
Mark et al. Using Reference Materials, Part I: Standards for Aligning the X-Axis
Mark et al. 2020 Review of New Spectroscopic Instrumentation
Luft et al. Efficient quality assurance of adhesives

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
RJ01 Rejection of invention patent application after publication
RJ01 Rejection of invention patent application after publication

Application publication date: 20130626