JP6037340B2 - 表面の化学的性質の非接触測定装置および方法 - Google Patents
表面の化学的性質の非接触測定装置および方法 Download PDFInfo
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- JP6037340B2 JP6037340B2 JP2013533855A JP2013533855A JP6037340B2 JP 6037340 B2 JP6037340 B2 JP 6037340B2 JP 2013533855 A JP2013533855 A JP 2013533855A JP 2013533855 A JP2013533855 A JP 2013533855A JP 6037340 B2 JP6037340 B2 JP 6037340B2
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- infrared
- infrared spectrum
- tunable
- array
- contamination
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3563—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing solids; Preparation of samples therefor
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0289—Field-of-view determination; Aiming or pointing of a spectrometer; Adjusting alignment; Encoding angular position; Size of measurement area; Position tracking
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/10—Arrangements of light sources specially adapted for spectrometry or colorimetry
- G01J3/108—Arrangements of light sources specially adapted for spectrometry or colorimetry for measurement in the infrared range
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
- G01N21/274—Calibration, base line adjustment, drift correction
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/93—Detection standards; Calibrating baseline adjustment, drift correction
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/94—Investigating contamination, e.g. dust
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/8422—Investigating thin films, e.g. matrix isolation method
- G01N2021/8427—Coatings
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N2021/8472—Investigation of composite materials
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/39—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
- G01N21/474—Details of optical heads therefor, e.g. using optical fibres
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/02—Mechanical
- G01N2201/022—Casings
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/12—Circuits of general importance; Signal processing
- G01N2201/129—Using chemometrical methods
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- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Engineering & Computer Science (AREA)
- Mathematical Physics (AREA)
- Theoretical Computer Science (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US12/903,548 US8536529B2 (en) | 2010-10-13 | 2010-10-13 | Non-contact surface chemistry measurement apparatus and method |
| US12/903,548 | 2010-10-13 | ||
| PCT/US2011/049331 WO2012050669A1 (en) | 2010-10-13 | 2011-08-26 | Non-contact surface chemistry measurement apparatus and method |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2016160335A Division JP6309583B2 (ja) | 2010-10-13 | 2016-08-18 | 表面の化学的性質の非接触測定装置および方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2013539865A JP2013539865A (ja) | 2013-10-28 |
| JP2013539865A5 JP2013539865A5 (enExample) | 2014-07-17 |
| JP6037340B2 true JP6037340B2 (ja) | 2016-12-07 |
Family
ID=44681417
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2013533855A Active JP6037340B2 (ja) | 2010-10-13 | 2011-08-26 | 表面の化学的性質の非接触測定装置および方法 |
| JP2016160335A Active JP6309583B2 (ja) | 2010-10-13 | 2016-08-18 | 表面の化学的性質の非接触測定装置および方法 |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2016160335A Active JP6309583B2 (ja) | 2010-10-13 | 2016-08-18 | 表面の化学的性質の非接触測定装置および方法 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US8536529B2 (enExample) |
| EP (1) | EP2627989B1 (enExample) |
| JP (2) | JP6037340B2 (enExample) |
| CN (1) | CN103180715A (enExample) |
| WO (1) | WO2012050669A1 (enExample) |
Families Citing this family (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5736325B2 (ja) | 2012-02-21 | 2015-06-17 | 株式会社日立製作所 | 光学装置 |
| US8686364B1 (en) | 2012-09-17 | 2014-04-01 | Jp3 Measurement, Llc | Method and system for determining energy content and detecting contaminants in a fluid stream |
| FR3013118B1 (fr) * | 2013-11-12 | 2015-11-06 | Centre Nat Detudes Spatiales Cnes | Spectrophotometre hyperspectral large bande pour analyser un objet dans le domaine fluorescent |
| DE102015106635A1 (de) | 2015-04-29 | 2016-11-03 | Osram Opto Semiconductors Gmbh | Optoelektronische Anordnung |
| USD797587S1 (en) * | 2015-09-02 | 2017-09-19 | Mettler-Toledo Gmbh | Spectrophotometer |
| USD796979S1 (en) * | 2015-09-02 | 2017-09-12 | Mettler-Toledo Gmbh | Spectrophotometer |
| JP6692651B2 (ja) * | 2016-02-05 | 2020-05-13 | 株式会社ミツトヨ | クロマティック共焦点センサ |
| USD796359S1 (en) * | 2016-02-24 | 2017-09-05 | Ocean Optics, Inc. | Miniature spectrometer case |
| US9897484B1 (en) * | 2016-09-29 | 2018-02-20 | Intel Corporation | Measuring wideband spectrum information in mobile devices via an integrated optical system that uses multiple spectral sensors, multiple light sources and MEMS actuation |
| CN110678722A (zh) * | 2017-06-01 | 2020-01-10 | 柯尼卡美能达株式会社 | 分光光度计 |
| US12503611B2 (en) | 2022-05-12 | 2025-12-23 | University Of Rhode Island Board Of Trustees | Glass-ceramic thermal paint system and method using UV:VIS spectroscopy |
Family Cites Families (31)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH07117499B2 (ja) * | 1987-10-31 | 1995-12-18 | 石川島播磨重工業株式会社 | レーザ光線による塗膜劣化診断方法 |
| JP3124047B2 (ja) * | 1991-02-04 | 2001-01-15 | 日本たばこ産業株式会社 | 携帯型赤外線水分測定装置 |
| US6031233A (en) * | 1995-08-31 | 2000-02-29 | Infrared Fiber Systems, Inc. | Handheld infrared spectrometer |
| JP3181596B2 (ja) * | 1995-08-31 | 2001-07-03 | インフラレッド ファイバー システムス,インク. | ハンドヘルド赤外線分光装置 |
| US6157033A (en) * | 1998-05-18 | 2000-12-05 | Power Distribution Services, Inc. | Leak detection system |
| US6836325B2 (en) * | 1999-07-16 | 2004-12-28 | Textron Systems Corporation | Optical probes and methods for spectral analysis |
| JP4498564B2 (ja) * | 2000-08-10 | 2010-07-07 | 日本分光株式会社 | 試料識別方法およびその装置 |
| JP3930334B2 (ja) * | 2001-03-21 | 2007-06-13 | 株式会社資生堂 | 分光反射率測定装置 |
| JP2003254856A (ja) | 2002-02-28 | 2003-09-10 | Tokyo Gas Co Ltd | 光学式ガス漏洩検知器及びガス漏洩検知車両 |
| US6697155B2 (en) * | 2002-04-09 | 2004-02-24 | Itt Manufacturing Enterprises, Inc. | Multispectral active remote sensing without narrowband optical filters |
| US6784431B2 (en) | 2002-06-13 | 2004-08-31 | The Boeing Company | Method of measuring anodize coating amount using infrared absorbance |
| US6794651B2 (en) | 2002-06-13 | 2004-09-21 | The Boeing Company | Method of measuring chromated conversion coating amount using infrared absorbance |
| US6903339B2 (en) | 2002-11-26 | 2005-06-07 | The Boeing Company | Method of measuring thickness of an opaque coating using infrared absorbance |
| US6906327B2 (en) | 2002-11-26 | 2005-06-14 | The Boeing Company | Method of measuring amount of chemical cure and amount of surface contamination using infrared absorbance |
| US7174198B2 (en) | 2002-12-27 | 2007-02-06 | Igor Trofimov | Non-invasive detection of analytes in a complex matrix |
| JP2006528782A (ja) | 2003-02-25 | 2006-12-21 | セイックス・テクノロジーズ・インコーポレーテッド | 化学物質及び生物物質検知装置及び方法 |
| US7115869B2 (en) | 2003-09-30 | 2006-10-03 | The Boeing Company | Method for measurement of composite heat damage with infrared spectroscopy |
| WO2005038437A2 (en) | 2003-10-17 | 2005-04-28 | Axsun Technologies, Inc. | Multi channel raman spectroscopy system and method |
| US7236243B2 (en) * | 2004-04-12 | 2007-06-26 | Michael Thomas Beecroft | Hand-held spectrometer |
| US20050264804A1 (en) * | 2004-05-27 | 2005-12-01 | Eastman Kodak Company | Bi-modal control material for particle size analyzers |
| US20070194239A1 (en) * | 2006-01-31 | 2007-08-23 | Mcallister Abraham | Apparatus and method providing a hand-held spectrometer |
| US7796251B2 (en) * | 2006-03-22 | 2010-09-14 | Itt Manufacturing Enterprises, Inc. | Method, apparatus and system for rapid and sensitive standoff detection of surface contaminants |
| US8180419B2 (en) | 2006-09-27 | 2012-05-15 | Nellcor Puritan Bennett Llc | Tissue hydration estimation by spectral absorption bandwidth measurement |
| US7826509B2 (en) | 2006-12-15 | 2010-11-02 | President And Fellows Of Harvard College | Broadly tunable single-mode quantum cascade laser sources and sensors |
| JP4766697B2 (ja) * | 2007-03-22 | 2011-09-07 | アンリツ株式会社 | 小型ガス検知装置 |
| US8402819B2 (en) | 2007-05-15 | 2013-03-26 | Anasys Instruments, Inc. | High frequency deflection measurement of IR absorption |
| EA201000526A1 (ru) * | 2007-10-11 | 2010-12-30 | Басф Се | Спектрометр со светодиодной матрицей |
| JP2009282007A (ja) * | 2008-05-26 | 2009-12-03 | Ritsuo Hasumi | 携帯型スペクトル分析機のデータ処理方法 |
| JP2010117272A (ja) * | 2008-11-13 | 2010-05-27 | Mitsubishi Rayon Co Ltd | シリコーン異物の判別方法 |
| CN201331382Y (zh) * | 2009-01-19 | 2009-10-21 | 杭州电子科技大学 | 一种阵列式微型光谱仪 |
| CN101819063B (zh) * | 2009-12-29 | 2011-10-05 | 南京邮电大学 | 相位调制凹槽阵列微型光谱仪 |
-
2010
- 2010-10-13 US US12/903,548 patent/US8536529B2/en active Active
-
2011
- 2011-08-26 EP EP11761431.3A patent/EP2627989B1/en active Active
- 2011-08-26 JP JP2013533855A patent/JP6037340B2/ja active Active
- 2011-08-26 CN CN2011800491455A patent/CN103180715A/zh active Pending
- 2011-08-26 WO PCT/US2011/049331 patent/WO2012050669A1/en not_active Ceased
-
2016
- 2016-08-18 JP JP2016160335A patent/JP6309583B2/ja active Active
Also Published As
| Publication number | Publication date |
|---|---|
| JP2013539865A (ja) | 2013-10-28 |
| WO2012050669A1 (en) | 2012-04-19 |
| CN103180715A (zh) | 2013-06-26 |
| JP6309583B2 (ja) | 2018-04-11 |
| EP2627989B1 (en) | 2021-02-17 |
| US8536529B2 (en) | 2013-09-17 |
| EP2627989A1 (en) | 2013-08-21 |
| JP2016224063A (ja) | 2016-12-28 |
| US20120092665A1 (en) | 2012-04-19 |
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