JP2013224858A5 - - Google Patents

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Publication number
JP2013224858A5
JP2013224858A5 JP2012096837A JP2012096837A JP2013224858A5 JP 2013224858 A5 JP2013224858 A5 JP 2013224858A5 JP 2012096837 A JP2012096837 A JP 2012096837A JP 2012096837 A JP2012096837 A JP 2012096837A JP 2013224858 A5 JP2013224858 A5 JP 2013224858A5
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JP
Japan
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mass
charge ratio
measurement
range
product ion
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JP2012096837A
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English (en)
Japanese (ja)
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JP2013224858A (ja
JP5821767B2 (ja
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Priority to JP2012096837A priority Critical patent/JP5821767B2/ja
Priority claimed from JP2012096837A external-priority patent/JP5821767B2/ja
Priority to US13/866,654 priority patent/US8916818B2/en
Priority to CN201310138953.XA priority patent/CN103376301B/zh
Publication of JP2013224858A publication Critical patent/JP2013224858A/ja
Publication of JP2013224858A5 publication Critical patent/JP2013224858A5/ja
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Publication of JP5821767B2 publication Critical patent/JP5821767B2/ja
Expired - Fee Related legal-status Critical Current
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JP2012096837A 2012-04-20 2012-04-20 クロマトグラフタンデム四重極型質量分析装置 Expired - Fee Related JP5821767B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2012096837A JP5821767B2 (ja) 2012-04-20 2012-04-20 クロマトグラフタンデム四重極型質量分析装置
US13/866,654 US8916818B2 (en) 2012-04-20 2013-04-19 Chromatograph tandem quadrupole mass spectrometer
CN201310138953.XA CN103376301B (zh) 2012-04-20 2013-04-19 色谱串联四极型质谱仪

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2012096837A JP5821767B2 (ja) 2012-04-20 2012-04-20 クロマトグラフタンデム四重極型質量分析装置

Publications (3)

Publication Number Publication Date
JP2013224858A JP2013224858A (ja) 2013-10-31
JP2013224858A5 true JP2013224858A5 (OSRAM) 2014-08-21
JP5821767B2 JP5821767B2 (ja) 2015-11-24

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JP2012096837A Expired - Fee Related JP5821767B2 (ja) 2012-04-20 2012-04-20 クロマトグラフタンデム四重極型質量分析装置

Country Status (3)

Country Link
US (1) US8916818B2 (OSRAM)
JP (1) JP5821767B2 (OSRAM)
CN (1) CN103376301B (OSRAM)

Families Citing this family (33)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5811023B2 (ja) * 2012-05-07 2015-11-11 株式会社島津製作所 クロマトグラフ質量分析用データ処理装置
US10041915B2 (en) * 2013-03-15 2018-08-07 Smiths Detection Inc. Mass spectrometry (MS) identification algorithm
US9799499B2 (en) * 2013-11-28 2017-10-24 Shimadzu Corporation Mass spectrometric method, mass spectrometer, and mass spectrometric data processing program
WO2015104844A1 (ja) * 2014-01-10 2015-07-16 株式会社島津製作所 質量分析データ処理方法及び質量分析データ処理装置
JP6260351B2 (ja) * 2014-03-04 2018-01-17 株式会社島津製作所 クロマトグラフ用データ処理装置及びデータ処理方法
CA2976165A1 (en) * 2015-02-05 2016-08-11 Dh Technologies Development Pte. Ltd. Detecting mass spectrometry based similarity via curve subtraction
WO2017017787A1 (ja) * 2015-07-28 2017-02-02 株式会社島津製作所 タンデム型質量分析装置
CN108604525B (zh) * 2015-12-01 2020-08-07 Dh科技发展私人贸易有限公司 用于靶向ms方法中的自适应保留时间的前哨信号
WO2017149603A1 (ja) * 2016-02-29 2017-09-08 株式会社島津製作所 質量分析装置
JP6508414B2 (ja) * 2016-03-01 2019-05-08 株式会社島津製作所 クロマトグラフ装置
JP6528896B2 (ja) * 2016-03-16 2019-06-12 株式会社島津製作所 質量分析装置
TWI613445B (zh) * 2016-04-01 2018-02-01 行政院農業委員會農業藥物毒物試驗所 搭配質譜影像分析檢驗農藥殘留之方法及其系統
US10139379B2 (en) * 2016-06-22 2018-11-27 Thermo Finnigan Llc Methods for optimizing mass spectrometer parameters
US10274440B2 (en) * 2016-06-22 2019-04-30 International Business Machines Corporation Method to facilitate investigation of chemical constituents in chemical analysis data
US10950423B2 (en) * 2016-08-26 2021-03-16 Shimadzu Corporation Imaging mass spectrometry data processing device and imaging mass spectrometry data processing method
EP3557241A4 (en) 2016-12-15 2019-12-18 Shimadzu Corporation MASS DEVICE
JP6834582B2 (ja) * 2017-02-23 2021-02-24 株式会社島津製作所 質量分析装置
CN110506205B (zh) * 2017-03-23 2022-05-17 株式会社岛津制作所 质谱分析装置和色谱质谱联用仪
GB2561378B (en) 2017-04-12 2022-10-12 Micromass Ltd Optimised targeted analysis
US11264230B2 (en) * 2017-06-29 2022-03-01 Shimadzu Corporation Quadrupole mass spectrometer
JP6791078B2 (ja) * 2017-09-21 2020-11-25 株式会社島津製作所 分析条件データ変換装置、データ処理システムおよび分析システム
JP6376262B2 (ja) * 2017-10-04 2018-08-22 株式会社島津製作所 クロマトグラフ質量分析装置用データ処理装置
JP6868592B2 (ja) 2018-06-04 2021-05-12 日本電子株式会社 クロマトグラフ質量分析システム及び測定条件表示方法
CN112969965A (zh) 2018-07-19 2021-06-15 林特弗德有限公司 噻吨酮衍生物、包含其的组合物和包含所述组合物的图案形成方法
WO2020059144A1 (ja) * 2018-09-21 2020-03-26 株式会社島津製作所 質量分析装置及び質量分析方法
JP7176570B2 (ja) * 2018-10-25 2022-11-22 株式会社島津製作所 質量分析装置およびプログラム
WO2020100182A1 (ja) * 2018-11-12 2020-05-22 株式会社島津製作所 クロマトグラフ装置
JP7201089B2 (ja) * 2019-07-04 2023-01-10 株式会社島津製作所 クロマトグラフ質量分析装置
US12112934B2 (en) * 2019-08-30 2024-10-08 Dh Technologies Development Pte. Ltd. Method for mass spectrometry
CN115605749B (zh) * 2020-05-25 2024-11-05 株式会社岛津制作所 色谱质量分析数据处理方法、色谱质量分析装置及色谱质量分析数据处理用程序
JP2023133783A (ja) * 2022-03-14 2023-09-27 株式会社島津製作所 分析装置
JPWO2024147191A1 (OSRAM) * 2023-01-06 2024-07-11
WO2024161566A1 (ja) * 2023-02-01 2024-08-08 株式会社島津製作所 分析制御装置

Family Cites Families (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5313061A (en) * 1989-06-06 1994-05-17 Viking Instrument Miniaturized mass spectrometer system
US7257987B2 (en) * 2000-01-25 2007-08-21 State Of Oregon Acting By And Through The State Board Of Higher Education On Behalf Of Portland State University Method and apparatus for sample analysis
US6865926B2 (en) * 2000-01-25 2005-03-15 State Of Oregon Acting By And Through The State Board Of Higher Education On Behalf Of Portland State University Method and apparatus for sample analysis
EA006272B1 (ru) * 2000-06-19 2005-10-27 Коррелоджик Системз, Инк. Эвристический способ классификации
EP1586104A2 (en) * 2003-01-24 2005-10-19 Thermo Finnigan LLC Controlling ion populations in a mass analyzer
US7071464B2 (en) * 2003-03-21 2006-07-04 Dana-Farber Cancer Institute, Inc. Mass spectroscopy system
US7473892B2 (en) * 2003-08-13 2009-01-06 Hitachi High-Technologies Corporation Mass spectrometer system
JP4596010B2 (ja) * 2005-11-22 2010-12-08 株式会社島津製作所 質量分析装置
US7548818B2 (en) * 2005-12-07 2009-06-16 Mds Analytical Technologies Automated analysis of complex matrices using mass spectrometer
US8168942B2 (en) * 2006-03-07 2012-05-01 Shimadzu Corporation Chromatograph mass spectrometer
JP4985153B2 (ja) * 2007-07-03 2012-07-25 株式会社島津製作所 クロマトグラフ質量分析装置
US7919745B2 (en) * 2007-09-10 2011-04-05 Dh Technologies Development Pte. Ltd. Methods and systems for background correction in tandem mass spectrometry based quantitation
CA2707166C (en) * 2007-12-04 2016-04-12 Dh Technologies Development Pte. Ltd. Systems and methods for analyzing substances using a mass spectrometer
US7884318B2 (en) * 2008-01-16 2011-02-08 Metabolon, Inc. Systems, methods, and computer-readable medium for determining composition of chemical constituents in a complex mixture
JP5083160B2 (ja) * 2008-10-06 2012-11-28 株式会社島津製作所 四重極型質量分析装置
US8153961B2 (en) * 2009-08-31 2012-04-10 Thermo Finnigan Llc Methods for acquisition and deductive analysis of mixed fragment peptide mass spectra
JP5568994B2 (ja) * 2010-01-08 2014-08-13 株式会社島津製作所 分析装置制御システム及び該システム用プログラム
JP5327138B2 (ja) 2010-05-26 2013-10-30 株式会社島津製作所 タンデム四重極型質量分析装置
JP5561016B2 (ja) * 2010-08-19 2014-07-30 株式会社島津製作所 クロマトグラフ質量分析装置
US8507844B2 (en) * 2010-08-31 2013-08-13 Waters Technologies Corporation Techniques for sample analysis
WO2012063108A2 (en) * 2010-11-08 2012-05-18 Dh Technologies Development Pte. Ltd. Systems and methods for rapidly screening samples by mass spectrometry
JP5757270B2 (ja) * 2012-04-26 2015-07-29 株式会社島津製作所 クロマトグラフ質量分析用データ処理装置

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