JP2013021044A5 - - Google Patents
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- Publication number
- JP2013021044A5 JP2013021044A5 JP2011151520A JP2011151520A JP2013021044A5 JP 2013021044 A5 JP2013021044 A5 JP 2013021044A5 JP 2011151520 A JP2011151520 A JP 2011151520A JP 2011151520 A JP2011151520 A JP 2011151520A JP 2013021044 A5 JP2013021044 A5 JP 2013021044A5
- Authority
- JP
- Japan
- Prior art keywords
- stage
- drawing apparatus
- substrate
- shield
- detector
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000758 substrate Substances 0.000 claims description 9
- 230000003287 optical effect Effects 0.000 claims description 8
- 239000002245 particle Substances 0.000 claims description 5
- 238000001514 detection method Methods 0.000 claims description 3
- 238000004519 manufacturing process Methods 0.000 claims 1
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2011151520A JP2013021044A (ja) | 2011-07-08 | 2011-07-08 | 荷電粒子線描画装置、および、物品の製造方法 |
| US13/534,044 US8476607B2 (en) | 2011-07-08 | 2012-06-27 | Charged particle beam drawing apparatus and article manufacturing method |
| TW101123886A TW201303953A (zh) | 2011-07-08 | 2012-07-03 | 帶電粒子束繪圖設備及物品製造方法 |
| KR1020120073645A KR20130006355A (ko) | 2011-07-08 | 2012-07-06 | 하전 입자 빔 묘화 장치 및 물품 제조 방법 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2011151520A JP2013021044A (ja) | 2011-07-08 | 2011-07-08 | 荷電粒子線描画装置、および、物品の製造方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2013021044A JP2013021044A (ja) | 2013-01-31 |
| JP2013021044A5 true JP2013021044A5 (enExample) | 2014-08-21 |
Family
ID=47438864
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2011151520A Pending JP2013021044A (ja) | 2011-07-08 | 2011-07-08 | 荷電粒子線描画装置、および、物品の製造方法 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US8476607B2 (enExample) |
| JP (1) | JP2013021044A (enExample) |
| KR (1) | KR20130006355A (enExample) |
| TW (1) | TW201303953A (enExample) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI661471B (zh) * | 2013-12-13 | 2019-06-01 | 日商荏原製作所股份有限公司 | 真空容器之基座的設置構造 |
| US9952255B2 (en) * | 2015-10-30 | 2018-04-24 | Texas Instruments Incorporated | Magnetically shielded probe card |
| CN106019854A (zh) * | 2016-07-18 | 2016-10-12 | 无锡宏纳科技有限公司 | 图形可变的电子束光刻机 |
| WO2019211123A1 (en) * | 2018-05-02 | 2019-11-07 | Asml Netherlands B.V. | E-beam apparatus |
| TWI886395B (zh) * | 2021-06-14 | 2025-06-11 | 日商紐富來科技股份有限公司 | 多帶電粒子束描繪裝置 |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW466542B (en) * | 1999-02-26 | 2001-12-01 | Nippon Kogaku Kk | A stage device and a method of manufacturing same, a position controlling method, an exposure device and a method of manufacturing same, and a device and a method of manufacturing same |
| JP2002184664A (ja) | 2000-12-12 | 2002-06-28 | Canon Inc | 荷電粒子線露光装置及び方法並びにステージ装置 |
| JP2004047170A (ja) * | 2002-07-09 | 2004-02-12 | Hitachi Ltd | 電子線描画装置 |
| JP2005268268A (ja) * | 2004-03-16 | 2005-09-29 | Canon Inc | 電子ビーム露光装置 |
-
2011
- 2011-07-08 JP JP2011151520A patent/JP2013021044A/ja active Pending
-
2012
- 2012-06-27 US US13/534,044 patent/US8476607B2/en not_active Expired - Fee Related
- 2012-07-03 TW TW101123886A patent/TW201303953A/zh unknown
- 2012-07-06 KR KR1020120073645A patent/KR20130006355A/ko not_active Ceased
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