JP2012523567A - 近臨界反射分光測定デバイス、システム、及び方法 - Google Patents

近臨界反射分光測定デバイス、システム、及び方法 Download PDF

Info

Publication number
JP2012523567A
JP2012523567A JP2012504837A JP2012504837A JP2012523567A JP 2012523567 A JP2012523567 A JP 2012523567A JP 2012504837 A JP2012504837 A JP 2012504837A JP 2012504837 A JP2012504837 A JP 2012504837A JP 2012523567 A JP2012523567 A JP 2012523567A
Authority
JP
Japan
Prior art keywords
electromagnetic radiation
sample
measurement
computer system
server computer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2012504837A
Other languages
English (en)
Japanese (ja)
Other versions
JP2012523567A5 (enExample
Inventor
ロバート ジー メッサーシュミット
Original Assignee
レア ライト インコーポレイテッド
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by レア ライト インコーポレイテッド filed Critical レア ライト インコーポレイテッド
Publication of JP2012523567A publication Critical patent/JP2012523567A/ja
Publication of JP2012523567A5 publication Critical patent/JP2012523567A5/ja
Pending legal-status Critical Current

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/552—Attenuated total reflection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0264—Electrical interface; User interface
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
    • G01J3/427—Dual wavelengths spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Human Computer Interaction (AREA)
  • Theoretical Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP2012504837A 2009-04-07 2010-04-07 近臨界反射分光測定デバイス、システム、及び方法 Pending JP2012523567A (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US16750509P 2009-04-07 2009-04-07
US61/167,505 2009-04-07
US22667709P 2009-07-17 2009-07-17
US61/226,677 2009-07-17
PCT/US2010/030299 WO2010118175A2 (en) 2009-04-07 2010-04-07 Peri-critical reflection spectroscopy devices, systems, and methods

Publications (2)

Publication Number Publication Date
JP2012523567A true JP2012523567A (ja) 2012-10-04
JP2012523567A5 JP2012523567A5 (enExample) 2013-05-30

Family

ID=42936864

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2012504837A Pending JP2012523567A (ja) 2009-04-07 2010-04-07 近臨界反射分光測定デバイス、システム、及び方法

Country Status (10)

Country Link
US (1) US9041923B2 (enExample)
EP (1) EP2417435A4 (enExample)
JP (1) JP2012523567A (enExample)
KR (2) KR20120000108A (enExample)
CN (1) CN102460120B (enExample)
AU (1) AU2010234465B2 (enExample)
CA (1) CA2758113A1 (enExample)
MX (1) MX2011010635A (enExample)
SG (1) SG175120A1 (enExample)
WO (1) WO2010118175A2 (enExample)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2021065652A (ja) * 2019-10-28 2021-04-30 株式会社リコー 生体情報測定装置、及び生体情報測定方法
JP2021067655A (ja) * 2019-10-28 2021-04-30 株式会社リコー 吸光度測定装置、及び生体情報測定装置
JP2021067654A (ja) * 2019-10-28 2021-04-30 株式会社リコー 導光装置、吸光度測定装置、生体情報測定装置、及び吸光度測定方法
JP2021067652A (ja) * 2019-10-28 2021-04-30 株式会社リコー 吸光度測定装置、生体情報測定装置、及び吸光度測定方法
JP2022503975A (ja) * 2018-09-30 2022-01-12 アジレント・テクノロジーズ・インク 減衰全反射分光測定のための較正システム
JP2023015889A (ja) * 2021-07-20 2023-02-01 株式会社リコー 測定装置

Families Citing this family (51)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB0613165D0 (en) * 2006-06-28 2006-08-09 Univ Warwick Real-time infrared measurement and imaging system
EP2240759A4 (en) 2008-02-01 2013-01-16 Rare Light Inc METHOD, DEVICE AND KITS FOR PERIKRITICAL REFLECTION SPECTROSCOPY
CN102460120B (zh) 2009-04-07 2014-07-30 莱尔照明公司 近临界反射谱装置、系统和方法
US9557268B2 (en) * 2011-03-01 2017-01-31 Gauge Scientific, Llc Analyte detector and method
US8970838B2 (en) 2011-04-29 2015-03-03 Avolonte Health LLC Method and apparatus for evaluating a sample through variable angle Raman spectroscopy
WO2013065035A1 (en) 2011-11-03 2013-05-10 Verifood Ltd. Low-cost spectrometry system for end-user food analysis
KR101988697B1 (ko) * 2012-11-13 2019-06-12 비아비 솔루션즈 아이엔씨. 휴대용 분광계
CN103048272B (zh) * 2013-01-08 2014-12-10 浙江大学 基于倏逝场照明的移频超分辨显微成像方法和装置
EP4006542B1 (en) 2013-08-02 2025-10-01 Verifood Ltd. Spectrometer comprising sample illuminator
US9036153B1 (en) 2013-08-30 2015-05-19 Google Inc. Instrument for reflectivity measurement
CN105794021B (zh) 2013-10-16 2020-05-19 洛克希德马丁能量有限公司 使用入口/出口电势测量瞬时荷电状态的方法和设备
DK3063820T3 (da) 2013-11-01 2020-12-14 Lockheed Martin Energy Llc Indretning og fremgangsmåde til bestemmelse af en ladningstilstand i et redox flow-batteri via grænsestrømme
EP3069403B1 (en) 2013-11-15 2020-06-17 Lockheed Martin Energy, LLC Methods for determining state of charge and calibrating reference electrodes in a redox flow battery
CN103645154B (zh) * 2013-11-26 2015-12-02 东莞理工学院 一种利用太赫兹光谱信号提取材料光学常数的方法
JP2017505901A (ja) * 2014-01-03 2017-02-23 ベリフード， リミテッドＶｅｒｉｆｏｏｄ， Ｌｔｄ． 分光システム、方法、および用途
US9470633B2 (en) 2014-02-14 2016-10-18 Google Inc. Method, apparatus and system for transmittance measurement
WO2015156777A1 (en) 2014-04-08 2015-10-15 Pandata Research Llc Optical measurement system having an integrated internal reflection element and array detector
WO2015156778A1 (en) 2014-04-08 2015-10-15 Pandata Research Llc Optical measurement system having an integrated internal reflection element and a plurality of array detectors
WO2015167417A1 (en) 2014-04-08 2015-11-05 Pandata Research Llc Optical measurement system having an integrated internal reflection element and array detector
WO2016063284A2 (en) 2014-10-23 2016-04-28 Verifood, Ltd. Accessories for handheld spectrometer
KR20170092633A (ko) 2014-12-08 2017-08-11 록히드 마틴 어드밴스드 에너지 스토리지, 엘엘씨 충전 상태의 인시츄 분광학적 결정 방법을 포함하는 전기화학 시스템
US9759651B2 (en) 2014-12-23 2017-09-12 Magellan Diagnostics, Inc. Combination optical hemoglobin and electrochemical lead assay
WO2016117520A1 (ja) 2015-01-21 2016-07-28 国立研究開発法人日本原子力研究開発機構 血中物質濃度測定装置及び血中物質濃度測定方法
WO2016125164A2 (en) 2015-02-05 2016-08-11 Verifood, Ltd. Spectrometry system applications
WO2016125165A2 (en) 2015-02-05 2016-08-11 Verifood, Ltd. Spectrometry system with visible aiming beam
KR101695418B1 (ko) * 2015-05-28 2017-01-11 박건 휴대용 IoT 아날로그 굴절계
US10066990B2 (en) 2015-07-09 2018-09-04 Verifood, Ltd. Spatially variable filter systems and methods
US10203246B2 (en) 2015-11-20 2019-02-12 Verifood, Ltd. Systems and methods for calibration of a handheld spectrometer
ITUA20161345A1 (it) * 2016-03-04 2017-09-04 Eltek Spa Dispositivo sensore per contenitori di sostanze liquide
WO2017165403A1 (en) 2016-03-21 2017-09-28 Nueon Inc. Porous mesh spectrometry methods and apparatus
EP3463063A4 (en) * 2016-07-05 2019-07-03 Pims Passive Imaging Medical Systems Ltd. APPARATUS AND METHOD FOR TISSUE DIAGNOSIS IN REAL TIME
EP3488204A4 (en) 2016-07-20 2020-07-22 Verifood Ltd. ACCESSORIES FOR HANDLABLE SPECTROMETERS
US10791933B2 (en) 2016-07-27 2020-10-06 Verifood, Ltd. Spectrometry systems, methods, and applications
US10352770B2 (en) 2016-10-21 2019-07-16 Ut-Battelle, Llc Optical spectroscopy system and method for monitoring liquid phase chemical reactions
US10903511B2 (en) 2016-11-29 2021-01-26 Lockheed Martin Energy, Llc Flow batteries having adjustable circulation rate capabilities and methods associated therewith
US10481084B2 (en) * 2017-07-14 2019-11-19 Thermo Electron Scientific Instruments Llc Advanced reference detector for infrared spectroscopy
US10524351B2 (en) * 2018-01-02 2019-12-31 Qualcomm Incorporated Printed circuit board (PCB) with stubs coupled to electromagnetic absorbing material
CN112041663B (zh) * 2018-03-02 2025-01-21 建新公司 用于生物制造的多元谱分析与监测
US10697893B2 (en) * 2018-03-09 2020-06-30 The Boeing Company Specular variable angle absolute reflectance method and reflectometer
CN109142272B (zh) * 2018-07-28 2020-06-09 华中科技大学 提高光电传感阵列测量折射率过程中数据处理精度的方法
CN109285132B (zh) * 2018-09-20 2022-05-17 南京大学 一种基于频域编码的光谱重建方法
EP3864384A4 (en) 2018-10-08 2022-06-29 Verifood Ltd. Accessories for optical spectrometers
JP7095648B2 (ja) * 2019-04-15 2022-07-05 横河電機株式会社 測定装置及び測定方法
CN110793919A (zh) * 2019-12-03 2020-02-14 南昌航空大学 一种用于农药残留检测的激光散斑成像系统
KR102878761B1 (ko) * 2020-05-18 2025-10-29 삼성전자주식회사 광학센서의 캘리브레이션 방법과, 광학센서 및 생체정보 추정 장치
WO2022061262A1 (en) * 2020-09-21 2022-03-24 PAVmed Inc. Systems and methods for non-invasive solute measurement
CN112817117B (zh) * 2020-12-28 2022-10-21 西南技术物理研究所 一种带自准直调节功能的抛物面反射镜辅助装置
JP7751286B2 (ja) * 2021-11-05 2025-10-08 日本分光株式会社 全反射測定装置
KR102628110B1 (ko) * 2022-01-19 2024-01-23 울산과학기술원 파장가변 양자폭포 레이저 기반의 비접촉식 액상 화학물질 탐지 방법 및 장치
CN115825001A (zh) * 2022-12-20 2023-03-21 北京环境特性研究所 一种可变角度的太赫兹频段衰减全反射材料参数测量系统
US20240426757A1 (en) * 2023-06-26 2024-12-26 Mariposa Technology, Inc. Spectroscopic Methods and Systems for the Qualitative and Quantitative Analysis of Samples

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06288902A (ja) * 1993-03-31 1994-10-18 Sony Corp 減衰全反射型薄膜評価装置
JP2000180353A (ja) * 1998-12-21 2000-06-30 Fuji Photo Film Co Ltd 表面プラズモンセンサー
JP2002174591A (ja) * 2000-12-07 2002-06-21 Jasco Corp 全反射測定装置
JP2006317349A (ja) * 2005-05-13 2006-11-24 Fujikura Ltd 光センシングシステム
JP2011511292A (ja) * 2008-02-01 2011-04-07 レア ライト インコーポレイテッド 近臨界反射分光測定のための方法、デバイス、及びキット

Family Cites Families (80)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3645631A (en) 1970-05-05 1972-02-29 Gte Sylvania Inc Apparatus and method for measuring the carrier concentration of semiconductor materials
US4692024A (en) 1985-05-10 1987-09-08 Electro-Tec Corporation Automatic refractometer
US4730882A (en) 1986-02-10 1988-03-15 Spectra-Tech, Inc. Multiple internal reflectance spectroscopy system
US5206699A (en) 1988-05-06 1993-04-27 Gersan Establishment Sensing a narrow frequency band of radiation and gemstones
GB2248497B (en) 1990-09-26 1994-05-25 Marconi Gec Ltd An optical sensor
US5251008A (en) 1991-01-11 1993-10-05 Jeol Ltd. Fourier transform spectroscopy and spectrometer
WO1992015008A1 (en) 1991-02-26 1992-09-03 Massachusetts Institute Of Technology Systems and methods of molecular spectroscopy to provide for the diagnosis of tissue
US5296702A (en) 1992-07-28 1994-03-22 Patchen California Structure and method for differentiating one object from another object
AU6559394A (en) 1993-04-15 1994-11-08 Board Of Regents, The University Of Texas System Raman spectrometer
US5444528A (en) 1994-07-27 1995-08-22 The Titan Corporation Tunable spectrometer with acousto-optical tunable filter
US6174424B1 (en) 1995-11-20 2001-01-16 Cirrex Corp. Couplers for optical fibers
US5784157A (en) 1995-11-21 1998-07-21 The Research Foundation Of State University Of New York Method and apparatus for identifying fluorophores
SE9602788L (sv) 1996-07-16 1998-01-17 Anders Hanning Förbättrad refraktometrisk metod
US5699157A (en) 1996-07-16 1997-12-16 Caliper Technologies Corp. Fourier detection of species migrating in a microchannel
US5946083A (en) 1997-10-01 1999-08-31 Texas Instruments Incorporated Fixed optic sensor system and distributed sensor network
JPH10115573A (ja) 1996-10-11 1998-05-06 Hitachi Ltd ３次非線形感受率測定方法及び装置
SE9700384D0 (sv) 1997-02-04 1997-02-04 Biacore Ab Analytical method and apparatus
US6141100A (en) 1997-08-15 2000-10-31 Bio-Rad Laboratories, Inc. Imaging ATR spectrometer
KR100273711B1 (ko) 1998-04-17 2001-03-02 서정쌍 라만 분광계의 신호 수집장치
US5943122A (en) 1998-07-10 1999-08-24 Nanometrics Incorporated Integrated optical measurement instruments
US6424851B1 (en) 1998-10-13 2002-07-23 Medoptix, Inc. Infrared ATR glucose measurement system (II)
CN1237338C (zh) 1998-11-13 2006-01-18 莱卡微系统公司 折射计和用于定性及定量测量的方法
DE19949953C2 (de) 1999-10-16 2001-08-16 Bruker Optik Gmbh ATR-Meßzelle für die FTiR-Spektroskopie
GB9928849D0 (en) 1999-12-07 2000-02-02 Secr Defence Brit Surface plasmon resonance
EP1287336B1 (en) 2000-03-14 2010-04-28 Spring Systems AB Improved imaging spr apparatus
DE10025789A1 (de) 2000-05-19 2001-11-22 Schmidt & Haensch Gmbh & Co Op Refraktometer
US7379179B2 (en) 2004-06-30 2008-05-27 Chem Image Corporation Raman spectroscopic methods for component particle analysis
JP3576093B2 (ja) 2000-11-22 2004-10-13 日本電信電話株式会社 光導波路型ｓｐｒ現象測定装置
US6992770B2 (en) 2001-01-25 2006-01-31 Fuji Photo Film Co., Ltd. Sensor utilizing attenuated total reflection
WO2002073171A1 (en) 2001-03-14 2002-09-19 Biacore Ab Apparatus and method for total internal reflection spectroscopy
CA2442445A1 (en) 2001-03-27 2002-10-03 Euro-Celtique S.A. Atr crystal device
US6748250B1 (en) 2001-04-27 2004-06-08 Medoptix, Inc. Method and system of monitoring a patient
JP3600867B2 (ja) 2001-07-26 2004-12-15 独立行政法人理化学研究所 波長可変レーザー及びラマン分光装置
MXPA04002498A (es) 2001-09-19 2005-04-11 Joule Microsystems Canada Inc Un espectrometro que incorpora filtrado ajustado de senal.
US6908773B2 (en) 2002-03-19 2005-06-21 Taiwan Semiconductor Manufacturing Co., Ltd. ATR-FTIR metal surface cleanliness monitoring
EP1493019B1 (de) 2002-04-03 2006-08-16 Johann Wolfgang Goethe-Universität Frankfurt am Main INFRAROTMESSVORRICHTUNG FÜR DIE SPEKTROMETRIE WäSSRIGER UND NICHT WäSSRIGER SYSTEME
JP2004117298A (ja) 2002-09-27 2004-04-15 Fuji Photo Film Co Ltd 全反射減衰を利用した測定方法および測定装置
JP2006507504A (ja) 2002-11-22 2006-03-02 ソルス バイオシステムズ インコーポレーテッド 並列振動分光法による高スループットのスクリーニング
US6906327B2 (en) 2002-11-26 2005-06-14 The Boeing Company Method of measuring amount of chemical cure and amount of surface contamination using infrared absorbance
KR20040067322A (ko) 2003-01-22 2004-07-30 (주)새론 시료의 물리적 특성 측정장치 및 방법
US7265844B2 (en) 2003-04-10 2007-09-04 Wisconsin Alumni Research Foundation Horizontal surface plasmon resonance instrument with improved light path
US7420682B2 (en) * 2003-09-30 2008-09-02 Arizona Board Of Regents On Behalf Of The University Of Arizona Sensor device for interference and plasmon-waveguide/interference spectroscopy
CN1629618A (zh) * 2003-12-16 2005-06-22 中国科学院化学研究所 多功能光激发表面等离子体共振成像仪
JP2005233928A (ja) 2004-01-23 2005-09-02 Horiba Ltd 基板検査装置
JP4934281B2 (ja) 2004-02-09 2012-05-16 オリンパス株式会社 全反射蛍光顕微鏡
JP2005241278A (ja) 2004-02-24 2005-09-08 Aisin Seiki Co Ltd ネットワークを用いた有害物質の計測及び対策方法並びに有害物質の計測方法
GB0405815D0 (en) 2004-03-15 2004-04-21 Evanesco Ltd Evanescent wave sensing apparatus and methods using surface
JP4224640B2 (ja) 2004-03-29 2009-02-18 オリンパス株式会社 蛍光分光分析装置
US7236243B2 (en) 2004-04-12 2007-06-26 Michael Thomas Beecroft Hand-held spectrometer
JP4496838B2 (ja) 2004-04-28 2010-07-07 日立化成工業株式会社 分光装置及び全反射ラマン分光装置
US7046359B2 (en) 2004-06-30 2006-05-16 Chemimage Corporation System and method for dynamic chemical imaging
US7709247B2 (en) 2004-08-04 2010-05-04 Intel Corporation Methods and systems for detecting biomolecular binding using terahertz radiation
GB0510497D0 (en) 2004-08-04 2005-06-29 Horiba Ltd Substrate examining device
KR100628877B1 (ko) 2004-08-30 2006-09-26 케이맥(주) 주사 방식 및 줌 방식을 채택하여 표면 플라즈몬 공명현상을 측정하는 장치 및 이를 이용한 측정방법
US7317519B2 (en) 2004-10-29 2008-01-08 Agilent Technologies, Inc. Swept-angle SPR measurement system
US7745143B2 (en) * 2004-11-19 2010-06-29 Plexera, Llc Plasmon resonance biosensor and method
EP3062086A1 (en) 2004-12-13 2016-08-31 Ascensia Diabetes Care Holdings AG Transmission spectroscopy system for use in the determination of analytes in body fluid
KR100668323B1 (ko) 2005-01-19 2007-01-12 삼성전자주식회사 표면 플라즈몬 공명을 이용한 휴대용 바이오칩 스캐너
JP4515927B2 (ja) * 2005-01-25 2010-08-04 日本分光株式会社 全反射測定装置
US20070081163A1 (en) * 2005-06-03 2007-04-12 Minhua Liang Method and apparatus for scanned beam microarray assay
CN1749735A (zh) 2005-09-29 2006-03-22 华中师范大学 塑料制造的非光栅型表面等离子激元共振光学耦合器
US20070098594A1 (en) 2005-11-03 2007-05-03 Roche Molecular Systems, Inc. Analytical multi-spectral optical detection system
US7564547B2 (en) 2005-11-07 2009-07-21 Wafermasters, Inc. Spectroscopy system
KR100784901B1 (ko) 2005-12-06 2007-12-11 한국표준과학연구원 제거형 가간섭성 반스토크스 라만 분광법을 이용한 광학장치
US7233396B1 (en) 2006-04-17 2007-06-19 Alphasniffer Llc Polarization based interferometric detector
CN100545631C (zh) 2006-05-18 2009-09-30 中国科学院化学研究所 基于表面等离子波的多功能光吸收、散射与发射光谱仪
EP2033047B1 (en) 2006-06-29 2020-02-19 Agency for Science, Technology and Research Shg quantification of matrix-related tissue dynamic and disease
US8101426B2 (en) 2007-03-02 2012-01-24 Icyt Mission Technology, Inc. System and method for the measurement of multiple fluorescence emissions in a flow cytometry system
EP1967846A1 (en) 2007-03-05 2008-09-10 National University of Ireland Galway En ensemble method and apparatus for classifying materials and quantifying the composition of mixtures
JP4911606B2 (ja) 2007-03-08 2012-04-04 倉敷紡績株式会社 全反射減衰型光学プローブおよびそれを用いた水溶液分光測定装置
US20110188030A1 (en) 2007-08-09 2011-08-04 Koninklijke Philips Electronics N.V. Microelectronic sensor device for optical examinations in a sample medium
CN100545633C (zh) 2007-10-25 2009-09-30 南京树声科技有限公司 激光气体遥测的方法和装置
ATE513200T1 (de) * 2007-10-25 2011-07-15 Koninkl Philips Electronics Nv Sensorvorrichtung für zielpartikel in einer probe
JP2008070391A (ja) 2007-12-05 2008-03-27 Fujifilm Corp 全反射光を利用した測定装置
US8130376B2 (en) 2008-06-05 2012-03-06 Avalon Instruments Ltd. Optical devices, spectroscopic systems and methods for detecting scattered light
JP5366536B2 (ja) 2008-12-26 2013-12-11 株式会社堀場製作所 ラマン散乱光測定装置
US20120019819A1 (en) 2009-01-21 2012-01-26 Rare Light, Inc. Raman spectroscopy using multiple discrete light sources
CN102460120B (zh) 2009-04-07 2014-07-30 莱尔照明公司 近临界反射谱装置、系统和方法
JP2009192544A (ja) 2009-06-01 2009-08-27 Hitachi Chem Co Ltd 分光装置及び全反射ラマン分光装置
US8970838B2 (en) 2011-04-29 2015-03-03 Avolonte Health LLC Method and apparatus for evaluating a sample through variable angle Raman spectroscopy

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06288902A (ja) * 1993-03-31 1994-10-18 Sony Corp 減衰全反射型薄膜評価装置
JP2000180353A (ja) * 1998-12-21 2000-06-30 Fuji Photo Film Co Ltd 表面プラズモンセンサー
JP2002174591A (ja) * 2000-12-07 2002-06-21 Jasco Corp 全反射測定装置
JP2006317349A (ja) * 2005-05-13 2006-11-24 Fujikura Ltd 光センシングシステム
JP2011511292A (ja) * 2008-02-01 2011-04-07 レア ライト インコーポレイテッド 近臨界反射分光測定のための方法、デバイス、及びキット

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2022503975A (ja) * 2018-09-30 2022-01-12 アジレント・テクノロジーズ・インク 減衰全反射分光測定のための較正システム
JP7407179B2 (ja) 2018-09-30 2023-12-28 アジレント・テクノロジーズ・インク 減衰全反射分光測定のための較正システム
JP2021065652A (ja) * 2019-10-28 2021-04-30 株式会社リコー 生体情報測定装置、及び生体情報測定方法
JP2021067655A (ja) * 2019-10-28 2021-04-30 株式会社リコー 吸光度測定装置、及び生体情報測定装置
JP2021067654A (ja) * 2019-10-28 2021-04-30 株式会社リコー 導光装置、吸光度測定装置、生体情報測定装置、及び吸光度測定方法
JP2021067652A (ja) * 2019-10-28 2021-04-30 株式会社リコー 吸光度測定装置、生体情報測定装置、及び吸光度測定方法
JP7363370B2 (ja) 2019-10-28 2023-10-18 株式会社リコー 吸光度測定装置、及び生体情報測定装置
JP7363369B2 (ja) 2019-10-28 2023-10-18 株式会社リコー 測定装置、吸光度測定装置、生体情報測定装置、及び測定方法
JP7439456B2 (ja) 2019-10-28 2024-02-28 株式会社リコー 生体情報測定装置、及び生体情報測定方法
JP2023015889A (ja) * 2021-07-20 2023-02-01 株式会社リコー 測定装置
JP7753703B2 (ja) 2021-07-20 2025-10-15 株式会社リコー 測定装置

Also Published As

Publication number Publication date
SG175120A1 (en) 2011-11-28
US9041923B2 (en) 2015-05-26
KR20130042659A (ko) 2013-04-26
WO2010118175A3 (en) 2011-03-31
AU2010234465B2 (en) 2013-11-07
CN102460120B (zh) 2014-07-30
MX2011010635A (es) 2012-04-02
EP2417435A4 (en) 2014-09-10
US20120088486A1 (en) 2012-04-12
CA2758113A1 (en) 2010-10-14
WO2010118175A2 (en) 2010-10-14
KR20120000108A (ko) 2012-01-03
EP2417435A2 (en) 2012-02-15
CN102460120A (zh) 2012-05-16
AU2010234465A1 (en) 2011-11-24

Similar Documents

Publication Publication Date Title
CN102460120B (zh) 近临界反射谱装置、系统和方法
KR101324029B1 (ko) 저비용 및 강인한 분광을 위한 상관 간섭 측정 방법, 장치 및 시스템
US8730468B2 (en) Methods, devices and kits for peri-critical reflectance spectroscopy
CN102369420B (zh) 使用多个离散光源的拉曼光谱设备、系统和方法
US9841321B2 (en) Visual indicator of scan workflow
Hudzikowski et al. Compact, spherical mirror-based dense astigmatic-like pattern multipass cell design aided by a genetic algorithm
Mohamed et al. Multipass cell based on confocal mirrors for sensitive broadband laser spectroscopy in the near infrared
AU2013242819B2 (en) Peri-critical reflection spectroscopy devices, systems, and methods
HK1168651A (en) Peri-critical reflection spectroscopy devices, systems, and methods
HK1168145B (en) Correlation interferometric methods, devices and systems for low cost and rugged spectroscopy
Grammatikaki et al. Portable FT-NIR spectroscopic sensor for detection of chemical precursors of explosives using advanced prediction algorithms
Benirschke Realization of a Low-Cost, Spectroscopic, Mid-Infrared Imaging Platform for Explosives Detection and Thermal Time-Harmonic Imaging
HK1167709B (en) Raman spectroscopy devices, systems and methods using multiple discrete light sources

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20130408

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20130408

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20131120

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20131204

A601 Written request for extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A601

Effective date: 20140304

A602 Written permission of extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A602

Effective date: 20140311

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20140604

A02 Decision of refusal

Free format text: JAPANESE INTERMEDIATE CODE: A02

Effective date: 20140804