JP2012523567A5 - - Google Patents

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Publication number
JP2012523567A5
JP2012523567A5 JP2012504837A JP2012504837A JP2012523567A5 JP 2012523567 A5 JP2012523567 A5 JP 2012523567A5 JP 2012504837 A JP2012504837 A JP 2012504837A JP 2012504837 A JP2012504837 A JP 2012504837A JP 2012523567 A5 JP2012523567 A5 JP 2012523567A5
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JP
Japan
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electromagnetic radiation
detector
sample
critical angle
angle
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Pending
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JP2012504837A
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English (en)
Japanese (ja)
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JP2012523567A (ja
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Priority claimed from PCT/US2010/030299 external-priority patent/WO2010118175A2/en
Publication of JP2012523567A publication Critical patent/JP2012523567A/ja
Publication of JP2012523567A5 publication Critical patent/JP2012523567A5/ja
Pending legal-status Critical Current

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JP2012504837A 2009-04-07 2010-04-07 近臨界反射分光測定デバイス、システム、及び方法 Pending JP2012523567A (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US16750509P 2009-04-07 2009-04-07
US61/167,505 2009-04-07
US22667709P 2009-07-17 2009-07-17
US61/226,677 2009-07-17
PCT/US2010/030299 WO2010118175A2 (en) 2009-04-07 2010-04-07 Peri-critical reflection spectroscopy devices, systems, and methods

Publications (2)

Publication Number Publication Date
JP2012523567A JP2012523567A (ja) 2012-10-04
JP2012523567A5 true JP2012523567A5 (enExample) 2013-05-30

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JP2012504837A Pending JP2012523567A (ja) 2009-04-07 2010-04-07 近臨界反射分光測定デバイス、システム、及び方法

Country Status (10)

Country Link
US (1) US9041923B2 (enExample)
EP (1) EP2417435A4 (enExample)
JP (1) JP2012523567A (enExample)
KR (2) KR20130042659A (enExample)
CN (1) CN102460120B (enExample)
AU (1) AU2010234465B2 (enExample)
CA (1) CA2758113A1 (enExample)
MX (1) MX2011010635A (enExample)
SG (1) SG175120A1 (enExample)
WO (1) WO2010118175A2 (enExample)

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