JP2012513675A5 - - Google Patents
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- Publication number
- JP2012513675A5 JP2012513675A5 JP2011542361A JP2011542361A JP2012513675A5 JP 2012513675 A5 JP2012513675 A5 JP 2012513675A5 JP 2011542361 A JP2011542361 A JP 2011542361A JP 2011542361 A JP2011542361 A JP 2011542361A JP 2012513675 A5 JP2012513675 A5 JP 2012513675A5
- Authority
- JP
- Japan
- Prior art keywords
- gan
- layer
- diamond layer
- diamond
- depositing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- JMASRVWKEDWRBT-UHFFFAOYSA-N Gallium nitride Chemical compound [Ga]#N JMASRVWKEDWRBT-UHFFFAOYSA-N 0.000 claims 50
- 229910002601 GaN Inorganic materials 0.000 claims 44
- 229910003460 diamond Inorganic materials 0.000 claims 39
- 239000010432 diamond Substances 0.000 claims 39
- 238000000034 method Methods 0.000 claims 17
- 238000000151 deposition Methods 0.000 claims 14
- 238000004519 manufacturing process Methods 0.000 claims 5
- 239000000463 material Substances 0.000 claims 3
- 239000000758 substrate Substances 0.000 claims 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims 2
- 238000005229 chemical vapour deposition Methods 0.000 claims 2
- 229910052710 silicon Inorganic materials 0.000 claims 2
- 239000010703 silicon Substances 0.000 claims 2
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims 1
- 239000011521 glass Substances 0.000 claims 1
- 239000002113 nanodiamond Substances 0.000 claims 1
- 229910052760 oxygen Inorganic materials 0.000 claims 1
- 239000001301 oxygen Substances 0.000 claims 1
- 239000002245 particle Substances 0.000 claims 1
- 229910052594 sapphire Inorganic materials 0.000 claims 1
- 239000010980 sapphire Substances 0.000 claims 1
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 claims 1
- 229910010271 silicon carbide Inorganic materials 0.000 claims 1
- 238000002604 ultrasonography Methods 0.000 claims 1
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US12/341,115 | 2008-12-22 | ||
| US12/341,115 US7989261B2 (en) | 2008-12-22 | 2008-12-22 | Fabricating a gallium nitride device with a diamond layer |
| PCT/US2009/068180 WO2010075125A1 (en) | 2008-12-22 | 2009-12-16 | Fabricating a gallium nitride device with a diamond layer |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2012513675A JP2012513675A (ja) | 2012-06-14 |
| JP2012513675A5 true JP2012513675A5 (enExample) | 2012-08-30 |
| JP5486610B2 JP5486610B2 (ja) | 2014-05-07 |
Family
ID=41697881
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2011542361A Active JP5486610B2 (ja) | 2008-12-22 | 2009-12-16 | ダイアモンド層を有する窒化ガリウム・デバイスの製造 |
Country Status (5)
| Country | Link |
|---|---|
| US (2) | US7989261B2 (enExample) |
| JP (1) | JP5486610B2 (enExample) |
| KR (1) | KR101227925B1 (enExample) |
| TW (1) | TWI488991B (enExample) |
| WO (1) | WO2010075125A1 (enExample) |
Families Citing this family (25)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8236386B2 (en) * | 2008-01-24 | 2012-08-07 | Wisys Technology Foundation | Nanowire and microwire fabrication technique and product |
| US7989261B2 (en) | 2008-12-22 | 2011-08-02 | Raytheon Company | Fabricating a gallium nitride device with a diamond layer |
| US7888171B2 (en) * | 2008-12-22 | 2011-02-15 | Raytheon Company | Fabricating a gallium nitride layer with diamond layers |
| US7892881B2 (en) * | 2009-02-23 | 2011-02-22 | Raytheon Company | Fabricating a device with a diamond layer |
| GB201121666D0 (en) * | 2011-12-16 | 2012-01-25 | Element Six Ltd | Synthetic diamond coated compound semiconductor substrates |
| GB201121655D0 (en) * | 2011-12-16 | 2012-01-25 | Element Six Ltd | Substrates for semiconductor devices |
| US8575657B2 (en) | 2012-03-20 | 2013-11-05 | Northrop Grumman Systems Corporation | Direct growth of diamond in backside vias for GaN HEMT devices |
| US9331163B2 (en) * | 2013-08-30 | 2016-05-03 | The United States Of America, As Represented By The Secretary Of The Navy | Transistor with diamond gate |
| EP2930754A1 (en) * | 2014-04-11 | 2015-10-14 | Nxp B.V. | Semiconductor device |
| US10695872B2 (en) * | 2015-03-11 | 2020-06-30 | Lockheed Martin Corporation | Heat spreaders fabricated from metal nanoparticles |
| JP6759885B2 (ja) * | 2016-09-06 | 2020-09-23 | 富士通株式会社 | 半導体装置及び半導体装置の製造方法 |
| US9780181B1 (en) | 2016-12-07 | 2017-10-03 | Mitsubishi Electric Research Laboratories, Inc. | Semiconductor device with multi-function P-type diamond gate |
| US10332820B2 (en) | 2017-03-20 | 2019-06-25 | Akash Systems, Inc. | Satellite communication transmitter with improved thermal management |
| US10374553B2 (en) * | 2017-06-15 | 2019-08-06 | Akash Systems, Inc. | Microwave transmitter with improved information throughput |
| US10128107B1 (en) * | 2017-08-31 | 2018-11-13 | Rfhic Corporation | Wafers having III-Nitride and diamond layers |
| CN107731903A (zh) * | 2017-09-14 | 2018-02-23 | 西安电子科技大学 | 基于SOI结构金刚石复合衬底的GaN高电子迁移率器件及制备方法 |
| CN108847392B (zh) * | 2018-06-26 | 2019-12-03 | 苏州汉骅半导体有限公司 | 金刚石基氮化镓器件制造方法 |
| JP7314257B2 (ja) * | 2018-09-19 | 2023-07-25 | アカーシュ・システムズ・インコーポレイテッド | 衛星通信のためのシステム及び方法 |
| WO2020242494A1 (en) | 2019-05-31 | 2020-12-03 | Texas State University | Incorporating semiconductors on a polycrystalline diamond substrate |
| CN110211880B (zh) * | 2019-07-05 | 2023-04-28 | 苏州汉骅半导体有限公司 | 金刚石基氮化镓hemt结构制造方法 |
| US11652146B2 (en) | 2020-02-07 | 2023-05-16 | Rfhic Corporation | Method of forming a semiconductor wafer containing a gallium-nitride layer and two diamond layers |
| CN112466943A (zh) * | 2020-12-01 | 2021-03-09 | 西安电子科技大学 | 基于p型掺杂金刚石散热层的GaN HEMT及制备方法 |
| EP4125113A1 (en) * | 2021-07-30 | 2023-02-01 | Imec VZW | Method for fabricating a gan based electronic device |
| JP2024142364A (ja) * | 2023-03-30 | 2024-10-11 | 国立研究開発法人産業技術総合研究所 | 窒化ガリウムとダイヤモンドを備える複合体とその製造方法 |
| CN117646275A (zh) * | 2024-01-30 | 2024-03-05 | 北京大学 | 一种大尺寸高热导率iii族氮化物外延材料的制备方法 |
Family Cites Families (30)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5284709A (en) * | 1987-03-30 | 1994-02-08 | Crystallume | Diamond materials with enhanced heat conductivity |
| JP2961812B2 (ja) * | 1990-05-17 | 1999-10-12 | 住友電気工業株式会社 | 半導体装置 |
| US5726463A (en) * | 1992-08-07 | 1998-03-10 | General Electric Company | Silicon carbide MOSFET having self-aligned gate structure |
| JPH07321317A (ja) * | 1994-05-25 | 1995-12-08 | Sony Corp | Mis型電界効果トランジスタ及びその作製方法 |
| JP3116731B2 (ja) * | 1994-07-25 | 2000-12-11 | 株式会社日立製作所 | 格子不整合系積層結晶構造およびそれを用いた半導体装置 |
| US6063187A (en) * | 1997-08-13 | 2000-05-16 | City University Of Hong Kong | Deposition method for heteroepitaxial diamond |
| US5962345A (en) * | 1998-07-13 | 1999-10-05 | Taiwan Semiconductor Manufacturing Company, Ltd. | Method to reduce contact resistance by means of in-situ ICP |
| US6255712B1 (en) * | 1999-08-14 | 2001-07-03 | International Business Machines Corporation | Semi-sacrificial diamond for air dielectric formation |
| JP2003086608A (ja) * | 2001-09-14 | 2003-03-20 | Toshiba Corp | 電界効果トランジスタ及びその製造方法 |
| JP2003261399A (ja) * | 2002-03-11 | 2003-09-16 | Shin Etsu Chem Co Ltd | ダイヤモンド製膜用基材およびダイヤモンド膜 |
| JP4381666B2 (ja) * | 2002-09-10 | 2009-12-09 | 新日本無線株式会社 | 半導体装置の製造方法 |
| US20060113546A1 (en) * | 2002-10-11 | 2006-06-01 | Chien-Min Sung | Diamond composite heat spreaders having low thermal mismatch stress and associated methods |
| US20070272929A1 (en) * | 2003-11-25 | 2007-11-29 | Akihiko Namba | Diamond N-Type Semiconductor, Method of Manufacturing the Same, Semiconductor Device, and Electron Emitting Device |
| US20050139838A1 (en) * | 2003-12-26 | 2005-06-30 | Matsushita Electric Industrial Co., Ltd. | Semiconductor device and method for manufacturing semiconductor device |
| JP2005210105A (ja) | 2003-12-26 | 2005-08-04 | Matsushita Electric Ind Co Ltd | 半導体装置及びその製造方法 |
| JP4547548B2 (ja) * | 2004-06-22 | 2010-09-22 | 学校法人慶應義塾 | マイクロダイヤモンド電極製造方法 |
| US7394103B2 (en) * | 2004-09-13 | 2008-07-01 | Uchicago Argonne, Llc | All diamond self-aligned thin film transistor |
| US7288803B2 (en) * | 2004-10-01 | 2007-10-30 | International Rectifier Corporation | III-nitride power semiconductor device with a current sense electrode |
| GB0505752D0 (en) * | 2005-03-21 | 2005-04-27 | Element Six Ltd | Diamond based substrate for gan devices |
| GB0508889D0 (en) | 2005-04-29 | 2005-06-08 | Element Six Ltd | Diamond transistor and method of manufacture thereof |
| JP2007157829A (ja) * | 2005-12-01 | 2007-06-21 | Matsushita Electric Ind Co Ltd | 半導体装置 |
| EP2016618A1 (en) | 2006-04-24 | 2009-01-21 | Sören Berg | Hybrid wafers |
| JP5273635B2 (ja) * | 2006-08-25 | 2013-08-28 | 独立行政法人産業技術総合研究所 | 高効率間接遷移型半導体紫外線発光素子 |
| US8154079B2 (en) | 2006-12-07 | 2012-04-10 | Kabushiki Kaisha Toshiba | Semiconductor device and fabrication method of the semiconductor device |
| US7565038B2 (en) * | 2007-01-31 | 2009-07-21 | Alcatel-Lucent Usa Inc. | Thermo-optic waveguide apparatus |
| US8455920B2 (en) | 2007-05-23 | 2013-06-04 | International Rectifier Corporation | III-nitride heterojunction device |
| US8039301B2 (en) * | 2007-12-07 | 2011-10-18 | The United States Of America As Represented By The Secretary Of The Navy | Gate after diamond transistor |
| US7888171B2 (en) * | 2008-12-22 | 2011-02-15 | Raytheon Company | Fabricating a gallium nitride layer with diamond layers |
| US7989261B2 (en) | 2008-12-22 | 2011-08-02 | Raytheon Company | Fabricating a gallium nitride device with a diamond layer |
| US7892881B2 (en) * | 2009-02-23 | 2011-02-22 | Raytheon Company | Fabricating a device with a diamond layer |
-
2008
- 2008-12-22 US US12/341,115 patent/US7989261B2/en active Active
-
2009
- 2009-12-16 WO PCT/US2009/068180 patent/WO2010075125A1/en not_active Ceased
- 2009-12-16 JP JP2011542361A patent/JP5486610B2/ja active Active
- 2009-12-16 KR KR1020117015678A patent/KR101227925B1/ko active Active
- 2009-12-17 TW TW098143373A patent/TWI488991B/zh active
-
2011
- 2011-06-10 US US13/157,653 patent/US8174024B2/en active Active
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