JP2012505406A5 - - Google Patents

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JP2012505406A5
JP2012505406A5 JP2011531085A JP2011531085A JP2012505406A5 JP 2012505406 A5 JP2012505406 A5 JP 2012505406A5 JP 2011531085 A JP2011531085 A JP 2011531085A JP 2011531085 A JP2011531085 A JP 2011531085A JP 2012505406 A5 JP2012505406 A5 JP 2012505406A5
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point
concurrent
signal
events
event
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JP2011531085A
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JP2012505406A (ja
JP5557842B2 (ja
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Priority claimed from US12/249,473 external-priority patent/US8154273B2/en
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JP2011531085A 2008-10-10 2009-10-02 粒子分析における同時発生の検出および処理 Active JP5557842B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US12/249,473 US8154273B2 (en) 2008-10-10 2008-10-10 Detecting and handling coincidence in particle analysis
US12/249,473 2008-10-10
PCT/US2009/059363 WO2010042401A1 (en) 2008-10-10 2009-10-02 Detecting and handling coincidence in particle analysis

Publications (3)

Publication Number Publication Date
JP2012505406A JP2012505406A (ja) 2012-03-01
JP2012505406A5 true JP2012505406A5 (cg-RX-API-DMAC7.html) 2012-09-20
JP5557842B2 JP5557842B2 (ja) 2014-07-23

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JP2011531085A Active JP5557842B2 (ja) 2008-10-10 2009-10-02 粒子分析における同時発生の検出および処理

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US (1) US8154273B2 (cg-RX-API-DMAC7.html)
EP (1) EP2350611B1 (cg-RX-API-DMAC7.html)
JP (1) JP5557842B2 (cg-RX-API-DMAC7.html)
CN (1) CN102177427B (cg-RX-API-DMAC7.html)
ES (1) ES2717843T3 (cg-RX-API-DMAC7.html)
TR (1) TR201904506T4 (cg-RX-API-DMAC7.html)
WO (1) WO2010042401A1 (cg-RX-API-DMAC7.html)

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CN112154317B (zh) * 2018-04-26 2024-11-08 贝克顿·迪金森公司 颗粒分析仪的表征和分选
KR102094373B1 (ko) * 2018-09-05 2020-03-27 주식회사 마하테크 미세플라스틱 검출장치
JP7437393B2 (ja) 2018-10-17 2024-02-22 ベクトン・ディキンソン・アンド・カンパニー 粒子分析器のための適応ソーティング
CN109323975B (zh) * 2018-11-07 2021-05-25 中国科学院合肥物质科学研究院 一种基于回波阈值比较的opc计数校正方法
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CN111751864B (zh) * 2020-06-30 2022-07-05 北京卫星环境工程研究所 粒子探测器指令处理方法和系统
CN112730408B (zh) * 2020-12-24 2024-07-09 贝克曼库尔特生物科技（苏州）有限公司 液流检测系统和液流检测方法以及分选装置
JP2025508860A (ja) * 2022-02-24 2025-04-10 ベクトン・ディキンソン・アンド・カンパニー フローサイトメータデータを同時発生事象の有無について評価するための方法及びシステム

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