JP2012207987A5 - - Google Patents

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Publication number
JP2012207987A5
JP2012207987A5 JP2011073001A JP2011073001A JP2012207987A5 JP 2012207987 A5 JP2012207987 A5 JP 2012207987A5 JP 2011073001 A JP2011073001 A JP 2011073001A JP 2011073001 A JP2011073001 A JP 2011073001A JP 2012207987 A5 JP2012207987 A5 JP 2012207987A5
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JP
Japan
Prior art keywords
ray
discharge
transport
supply
transport mechanism
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JP2011073001A
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English (en)
Japanese (ja)
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JP2012207987A (ja
JP5740608B2 (ja
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Priority to JP2011073001A priority Critical patent/JP5740608B2/ja
Priority claimed from JP2011073001A external-priority patent/JP5740608B2/ja
Publication of JP2012207987A publication Critical patent/JP2012207987A/ja
Publication of JP2012207987A5 publication Critical patent/JP2012207987A5/ja
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Publication of JP5740608B2 publication Critical patent/JP5740608B2/ja
Expired - Fee Related legal-status Critical Current
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JP2011073001A 2011-03-29 2011-03-29 Ｘ線検査装置 Expired - Fee Related JP5740608B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2011073001A JP5740608B2 (ja) 2011-03-29 2011-03-29 Ｘ線検査装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2011073001A JP5740608B2 (ja) 2011-03-29 2011-03-29 Ｘ線検査装置

Publications (3)

Publication Number Publication Date
JP2012207987A JP2012207987A (ja) 2012-10-25
JP2012207987A5 true JP2012207987A5 (https=) 2014-05-08
JP5740608B2 JP5740608B2 (ja) 2015-06-24

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ID=47187860

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2011073001A Expired - Fee Related JP5740608B2 (ja) 2011-03-29 2011-03-29 Ｘ線検査装置

Country Status (1)

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JP (1) JP5740608B2 (https=)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6214029B2 (ja) * 2013-05-08 2017-10-18 株式会社 システムスクエア Ｘ線検査装置
CN104458769B (zh) * 2014-12-29 2017-02-01 丹东奥龙射线仪器集团有限公司 在线ct无损检测装置
KR102000944B1 (ko) * 2016-01-29 2019-07-17 (주)자비스 교체 방식 모듈 구조의 엑스레이 검사 장치
JP2017215163A (ja) * 2016-05-30 2017-12-07 株式会社 システムスクエア Ｘ線検査装置
JP7016160B2 (ja) * 2017-09-20 2022-02-04 株式会社 システムスクエア Ｘ線検査装置
US10768337B2 (en) * 2017-11-02 2020-09-08 Photo Diagnostic Systems, Inc. Computed tomography (CT) security inspection system with enhanced X-ray shielding
JP6588148B1 (ja) * 2018-12-29 2019-10-09 日本信号株式会社 検査システム
JP7328802B2 (ja) * 2019-06-18 2023-08-17 日本信号株式会社 検査装置
JP7332433B2 (ja) * 2019-10-31 2023-08-23 日本信号株式会社 Ｘ線検査システム
CN118002509A (zh) * 2024-04-08 2024-05-10 福建武夷烟叶有限公司 一种基于x光透视成像的非烟物质剔除装置

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002318207A (ja) * 2001-04-24 2002-10-31 Shimadzu Corp 放射線検査装置
JP3946609B2 (ja) * 2002-10-03 2007-07-18 株式会社イシダ Ｘ線検査装置
JP3946612B2 (ja) * 2002-10-09 2007-07-18 株式会社イシダ Ｘ線検査装置

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