|
JPS57117238A
(en)
|
1981-01-14 |
1982-07-21 |
Nippon Kogaku Kk <Nikon> |
Exposing and baking device for manufacturing integrated circuit with illuminometer
|
|
US4780617A
(en)
|
1984-08-09 |
1988-10-25 |
Nippon Kogaku K.K. |
Method for successive alignment of chip patterns on a substrate
|
|
JPS6144429A
(ja)
|
1984-08-09 |
1986-03-04 |
Nippon Kogaku Kk <Nikon> |
位置合わせ方法、及び位置合せ装置
|
|
US5243195A
(en)
|
1991-04-25 |
1993-09-07 |
Nikon Corporation |
Projection exposure apparatus having an off-axis alignment system and method of alignment therefor
|
|
JP3200874B2
(ja)
|
1991-07-10 |
2001-08-20 |
株式会社ニコン |
投影露光装置
|
|
US5559582A
(en)
*
|
1992-08-28 |
1996-09-24 |
Nikon Corporation |
Exposure apparatus
|
|
JPH08313842A
(ja)
|
1995-05-15 |
1996-11-29 |
Nikon Corp |
照明光学系および該光学系を備えた露光装置
|
|
JP4029183B2
(ja)
|
1996-11-28 |
2008-01-09 |
株式会社ニコン |
投影露光装置及び投影露光方法
|
|
CN1244021C
(zh)
|
1996-11-28 |
2006-03-01 |
株式会社尼康 |
光刻装置和曝光方法
|
|
JP4029182B2
(ja)
|
1996-11-28 |
2008-01-09 |
株式会社ニコン |
露光方法
|
|
DE69735016T2
(de)
|
1996-12-24 |
2006-08-17 |
Asml Netherlands B.V. |
Lithographisches Gerät mit zwei Objekthaltern
|
|
JPH1116816A
(ja)
|
1997-06-25 |
1999-01-22 |
Nikon Corp |
投影露光装置、該装置を用いた露光方法、及び該装置を用いた回路デバイスの製造方法
|
|
JPH1123692A
(ja)
|
1997-06-30 |
1999-01-29 |
Sekisui Chem Co Ltd |
地中探査用アンテナ
|
|
JPH1128790A
(ja)
|
1997-07-09 |
1999-02-02 |
Asahi Chem Ind Co Ltd |
紫外線遮蔽用熱可塑性樹脂板
|
|
JP4210871B2
(ja)
|
1997-10-31 |
2009-01-21 |
株式会社ニコン |
露光装置
|
|
US6020964A
(en)
|
1997-12-02 |
2000-02-01 |
Asm Lithography B.V. |
Interferometer system and lithograph apparatus including an interferometer system
|
|
US6897963B1
(en)
|
1997-12-18 |
2005-05-24 |
Nikon Corporation |
Stage device and exposure apparatus
|
|
JP4264676B2
(ja)
|
1998-11-30 |
2009-05-20 |
株式会社ニコン |
露光装置及び露光方法
|
|
US6208407B1
(en)
|
1997-12-22 |
2001-03-27 |
Asm Lithography B.V. |
Method and apparatus for repetitively projecting a mask pattern on a substrate, using a time-saving height measurement
|
|
IL138374A
(en)
|
1998-03-11 |
2004-07-25 |
Nikon Corp |
An ultraviolet laser device and an exposure device that includes such a device
|
|
AU2747999A
(en)
|
1998-03-26 |
1999-10-18 |
Nikon Corporation |
Projection exposure method and system
|
|
KR100604120B1
(ko)
|
1998-05-19 |
2006-07-24 |
가부시키가이샤 니콘 |
수차측정장치와 측정방법 및 이 장치를 구비한투영노광장치와 이 방법을 이용한 디바이스 제조방법,노광방법
|
|
WO2001035168A1
(en)
|
1999-11-10 |
2001-05-17 |
Massachusetts Institute Of Technology |
Interference lithography utilizing phase-locked scanning beams
|
|
US20020041377A1
(en)
|
2000-04-25 |
2002-04-11 |
Nikon Corporation |
Aerial image measurement method and unit, optical properties measurement method and unit, adjustment method of projection optical system, exposure method and apparatus, making method of exposure apparatus, and device manufacturing method
|
|
JP2002014005A
(ja)
|
2000-04-25 |
2002-01-18 |
Nikon Corp |
空間像計測方法、結像特性計測方法、空間像計測装置及び露光装置
|
|
JP4714403B2
(ja)
|
2001-02-27 |
2011-06-29 |
エーエスエムエル ユーエス,インコーポレイテッド |
デュアルレチクルイメージを露光する方法および装置
|
|
TW529172B
(en)
|
2001-07-24 |
2003-04-21 |
Asml Netherlands Bv |
Imaging apparatus
|
|
WO2003025173A1
(en)
|
2001-09-17 |
2003-03-27 |
Takeshi Imanishi |
Novel antisense oligonucleotide derivatives to hepatitis c virus
|
|
WO2003040296A2
(en)
|
2001-11-08 |
2003-05-15 |
DeveloGen Aktiengesellschaft für entwicklungsbiologische Forschung |
Men protein, gst2, rab-rp1, csp, f-box protein lilina/fbl7, abc50, coronin, sec61 alpha, or vhappa1-1, or homologous proteins involved in the regulation of energy homeostasis
|
|
JP4214729B2
(ja)
|
2002-07-25 |
2009-01-28 |
コニカミノルタホールディングス株式会社 |
硬化性白インク組成物
|
|
US7362508B2
(en)
|
2002-08-23 |
2008-04-22 |
Nikon Corporation |
Projection optical system and method for photolithography and exposure apparatus and method using same
|
|
US6893629B2
(en)
|
2002-10-30 |
2005-05-17 |
Isp Investments Inc. |
Delivery system for a tooth whitener
|
|
EP2495613B1
(en)
|
2002-11-12 |
2013-07-31 |
ASML Netherlands B.V. |
Lithographic apparatus
|
|
SG121818A1
(en)
|
2002-11-12 |
2006-05-26 |
Asml Netherlands Bv |
Lithographic apparatus and device manufacturing method
|
|
KR101101737B1
(ko)
*
|
2002-12-10 |
2012-01-05 |
가부시키가이샤 니콘 |
노광장치 및 노광방법, 디바이스 제조방법
|
|
US7358507B2
(en)
|
2002-12-13 |
2008-04-15 |
Koninklijke Philips Electronics N.V. |
Liquid removal in a method and device for irradiating spots on a layer
|
|
WO2004057590A1
(en)
|
2002-12-19 |
2004-07-08 |
Koninklijke Philips Electronics N.V. |
Method and device for irradiating spots on a layer
|
|
AU2003295177A1
(en)
|
2002-12-19 |
2004-07-14 |
Koninklijke Philips Electronics N.V. |
Method and device for irradiating spots on a layer
|
|
EP2945016B1
(en)
|
2003-02-26 |
2017-09-06 |
Nikon Corporation |
Exposure apparatus, exposure method, and method for producing device
|
|
JP2004304135A
(ja)
|
2003-04-01 |
2004-10-28 |
Nikon Corp |
露光装置、露光方法及びマイクロデバイスの製造方法
|
|
EP2161621B1
(en)
|
2003-04-11 |
2018-10-24 |
Nikon Corporation |
Cleanup method for optics in an immersion lithography apparatus, and corresponding immersion lithography apparatus
|
|
JP2005277363A
(ja)
*
|
2003-05-23 |
2005-10-06 |
Nikon Corp |
露光装置及びデバイス製造方法
|
|
TWI616932B
(zh)
|
2003-05-23 |
2018-03-01 |
Nikon Corp |
Exposure device and component manufacturing method
|
|
EP2261741A3
(en)
|
2003-06-11 |
2011-05-25 |
ASML Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
KR101528089B1
(ko)
*
|
2003-06-13 |
2015-06-11 |
가부시키가이샤 니콘 |
노광 방법, 기판 스테이지, 노광 장치, 및 디바이스 제조 방법
|
|
US7370659B2
(en)
*
|
2003-08-06 |
2008-05-13 |
Micron Technology, Inc. |
Photolithographic stepper and/or scanner machines including cleaning devices and methods of cleaning photolithographic stepper and/or scanner machines
|
|
JP4305095B2
(ja)
*
|
2003-08-29 |
2009-07-29 |
株式会社ニコン |
光学部品の洗浄機構を搭載した液浸投影露光装置及び液浸光学部品洗浄方法
|
|
WO2005029559A1
(ja)
|
2003-09-19 |
2005-03-31 |
Nikon Corporation |
露光装置及びデバイス製造方法
|
|
WO2005036623A1
(ja)
|
2003-10-08 |
2005-04-21 |
Zao Nikon Co., Ltd. |
基板搬送装置及び基板搬送方法、露光装置及び露光方法、デバイス製造方法
|
|
US20050122218A1
(en)
|
2003-12-06 |
2005-06-09 |
Goggin Christopher M. |
Ranging and warning device using emitted and reflected wave energy
|
|
KR101200654B1
(ko)
|
2003-12-15 |
2012-11-12 |
칼 짜이스 에스엠티 게엠베하 |
고 개구율 및 평평한 단부면을 가진 투사 대물렌즈
|
|
JP5102492B2
(ja)
|
2003-12-19 |
2012-12-19 |
カール・ツァイス・エスエムティー・ゲーエムベーハー |
結晶素子を有するマイクロリソグラフィー投影用対物レンズ
|
|
US7589822B2
(en)
|
2004-02-02 |
2009-09-15 |
Nikon Corporation |
Stage drive method and stage unit, exposure apparatus, and device manufacturing method
|
|
EP1724815B1
(en)
*
|
2004-02-10 |
2012-06-13 |
Nikon Corporation |
Aligner, device manufacturing method, maintenance method and aligning method
|
|
US7898642B2
(en)
*
|
2004-04-14 |
2011-03-01 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US7616383B2
(en)
|
2004-05-18 |
2009-11-10 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
EP1768169B9
(en)
*
|
2004-06-04 |
2013-03-06 |
Nikon Corporation |
Exposure apparatus, exposure method, and device producing method
|
|
EP2966670B1
(en)
|
2004-06-09 |
2017-02-22 |
Nikon Corporation |
Exposure apparatus and device manufacturing method
|
|
KR101228244B1
(ko)
*
|
2004-06-21 |
2013-01-31 |
가부시키가이샤 니콘 |
노광 장치 및 그 부재의 세정 방법, 노광 장치의메인터넌스 방법, 메인터넌스 기기, 그리고 디바이스 제조방법
|
|
JP2006013806A
(ja)
|
2004-06-24 |
2006-01-12 |
Maspro Denkoh Corp |
信号処理装置及びcatv用ヘッドエンド装置
|
|
US7463330B2
(en)
|
2004-07-07 |
2008-12-09 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
JP2006032750A
(ja)
*
|
2004-07-20 |
2006-02-02 |
Canon Inc |
液浸型投影露光装置、及びデバイス製造方法
|
|
JP4534651B2
(ja)
*
|
2004-08-03 |
2010-09-01 |
株式会社ニコン |
露光装置、デバイス製造方法及び液体回収方法
|
|
DE602005021653D1
(de)
|
2004-08-03 |
2010-07-15 |
Nippon Kogaku Kk |
Belichtungsgeräte, belichtungsverfahren und bauelemente-herstellungsverfahren
|
|
US7224427B2
(en)
|
2004-08-03 |
2007-05-29 |
Taiwan Semiconductor Manufacturing Company, Ltd. |
Megasonic immersion lithography exposure apparatus and method
|
|
US7701550B2
(en)
*
|
2004-08-19 |
2010-04-20 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
JP4772306B2
(ja)
|
2004-09-06 |
2011-09-14 |
株式会社東芝 |
液浸光学装置及び洗浄方法
|
|
CN101052916B
(zh)
|
2004-09-30 |
2010-05-12 |
株式会社尼康 |
投影光学设备和曝光装置
|
|
CN101866113B
(zh)
*
|
2004-10-26 |
2013-04-24 |
株式会社尼康 |
衬底处理方法、曝光装置及器件制造方法
|
|
TWI416265B
(zh)
|
2004-11-01 |
2013-11-21 |
尼康股份有限公司 |
A method of manufacturing an exposure apparatus and an element
|
|
US7362412B2
(en)
|
2004-11-18 |
2008-04-22 |
International Business Machines Corporation |
Method and apparatus for cleaning a semiconductor substrate in an immersion lithography system
|
|
US7732123B2
(en)
|
2004-11-23 |
2010-06-08 |
Taiwan Semiconductor Manufacturing Company, Ltd. |
Immersion photolithography with megasonic rinse
|
|
US7804576B2
(en)
|
2004-12-06 |
2010-09-28 |
Nikon Corporation |
Maintenance method, maintenance device, exposure apparatus, and device manufacturing method
|
|
JP4752473B2
(ja)
*
|
2004-12-09 |
2011-08-17 |
株式会社ニコン |
露光装置、露光方法及びデバイス製造方法
|
|
US7880860B2
(en)
|
2004-12-20 |
2011-02-01 |
Asml Netherlands B.V. |
Lithographic apparatus and device manufacturing method
|
|
US20060250588A1
(en)
|
2005-05-03 |
2006-11-09 |
Stefan Brandl |
Immersion exposure tool cleaning system and method
|
|
WO2006122578A1
(en)
|
2005-05-17 |
2006-11-23 |
Freescale Semiconductor, Inc. |
Contaminant removal apparatus and method therefor
|
|
US7986395B2
(en)
|
2005-10-24 |
2011-07-26 |
Taiwan Semiconductor Manufacturing Company, Ltd. |
Immersion lithography apparatus and methods
|
|
US8125610B2
(en)
*
|
2005-12-02 |
2012-02-28 |
ASML Metherlands B.V. |
Method for preventing or reducing contamination of an immersion type projection apparatus and an immersion type lithographic apparatus
|
|
US7969548B2
(en)
|
2006-05-22 |
2011-06-28 |
Asml Netherlands B.V. |
Lithographic apparatus and lithographic apparatus cleaning method
|
|
US8564759B2
(en)
|
2006-06-29 |
2013-10-22 |
Taiwan Semiconductor Manufacturing Company, Ltd. |
Apparatus and method for immersion lithography
|