JP2011174919A5 - - Google Patents
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- Publication number
- JP2011174919A5 JP2011174919A5 JP2010260002A JP2010260002A JP2011174919A5 JP 2011174919 A5 JP2011174919 A5 JP 2011174919A5 JP 2010260002 A JP2010260002 A JP 2010260002A JP 2010260002 A JP2010260002 A JP 2010260002A JP 2011174919 A5 JP2011174919 A5 JP 2011174919A5
- Authority
- JP
- Japan
- Prior art keywords
- charging
- circuit
- node
- transistor
- detection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000001514 detection method Methods 0.000 claims 18
- 238000007599 discharging Methods 0.000 claims 9
- 238000005259 measurement Methods 0.000 claims 3
- 238000009529 body temperature measurement Methods 0.000 claims 2
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2010260002A JP5736744B2 (ja) | 2010-01-26 | 2010-11-22 | 熱センサーデバイス及び電子機器 |
| EP11151980A EP2357458A1 (en) | 2010-01-26 | 2011-01-25 | Detection circuit for heat sensor, heat sensor device, and electronic device |
| US13/013,064 US20110182321A1 (en) | 2010-01-26 | 2011-01-25 | Detection circuit for heat sensor, heat sensor device, and electronic device |
| CN201110027474.1A CN102192790B (zh) | 2010-01-26 | 2011-01-25 | 热传感器用检测电路、热传感器装置及电子设备 |
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2010014136 | 2010-01-26 | ||
| JP2010014136 | 2010-01-26 | ||
| JP2010260002A JP5736744B2 (ja) | 2010-01-26 | 2010-11-22 | 熱センサーデバイス及び電子機器 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2011174919A JP2011174919A (ja) | 2011-09-08 |
| JP2011174919A5 true JP2011174919A5 (enExample) | 2013-12-05 |
| JP5736744B2 JP5736744B2 (ja) | 2015-06-17 |
Family
ID=43901268
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2010260002A Expired - Fee Related JP5736744B2 (ja) | 2010-01-26 | 2010-11-22 | 熱センサーデバイス及び電子機器 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US20110182321A1 (enExample) |
| EP (1) | EP2357458A1 (enExample) |
| JP (1) | JP5736744B2 (enExample) |
| CN (1) | CN102192790B (enExample) |
Families Citing this family (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7771115B2 (en) * | 2007-08-16 | 2010-08-10 | Micron Technology, Inc. | Temperature sensor circuit, device, system, and method |
| JP5962167B2 (ja) * | 2012-04-19 | 2016-08-03 | セイコーエプソン株式会社 | 検出回路、センサーデバイス及び電子機器 |
| JP2013221906A (ja) * | 2012-04-19 | 2013-10-28 | Seiko Epson Corp | センサーデバイス及び電子機器 |
| JP6264525B2 (ja) * | 2013-03-25 | 2018-01-24 | セイコーエプソン株式会社 | 赤外線センサー、熱検知素子及びそれを用いた熱検知方法 |
| CN103256987B (zh) * | 2013-04-27 | 2015-07-22 | 电子科技大学 | 一种红外焦平面阵列读出电路中数字输出信号的传输电路 |
| US9574951B2 (en) * | 2013-09-09 | 2017-02-21 | Semiconductor Components Industries, Llc | Image sensor including temperature sensor and electronic shutter function |
| DE102014221270A1 (de) * | 2014-10-21 | 2016-04-21 | Robert Bosch Gmbh | Verfahren und Vorrichtung zum Messen einer Temperatur |
| US9553527B1 (en) * | 2014-12-01 | 2017-01-24 | Amazon Technologies, Inc. | Energy recovery layer in an electrowetting display |
| US11875662B2 (en) * | 2021-10-28 | 2024-01-16 | Joseph GAUL | Device and system for vehicle proximity alert |
| CN120427113B (zh) * | 2025-04-21 | 2025-10-14 | 中国电子产品可靠性与环境试验研究所((工业和信息化部电子第五研究所)(中国赛宝实验室)) | 一种基于方差分析的成像光电探测器焦平面热点识别方法 |
Family Cites Families (46)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2927259A (en) * | 1959-02-09 | 1960-03-01 | Conrad L Neal | Transistor time delay device |
| US3324352A (en) * | 1963-06-03 | 1967-06-06 | Tecumseh Products Co | Temperature protection circuit |
| US3475600A (en) * | 1966-02-28 | 1969-10-28 | Infotronics Corp | Base line control circuit means |
| DE2701575C2 (de) * | 1977-01-15 | 1985-12-19 | Mannesmann Kienzle GmbH, 7730 Villingen-Schwenningen | Frequenzwandler für Geschwindigkeits- und Streckenzählgeräte |
| US4176556A (en) * | 1977-06-17 | 1979-12-04 | Omron Tateisi Electronics Co. | Electronic thermometer |
| US4277975A (en) * | 1979-11-13 | 1981-07-14 | General Electric Company | Digital thermometer |
| JPS59142427A (ja) | 1983-02-02 | 1984-08-15 | Matsushita Electric Ind Co Ltd | 熱感知器 |
| JPS60202321A (ja) * | 1984-03-27 | 1985-10-12 | Seiko Epson Corp | 温度検知回路 |
| JPS6149616A (ja) * | 1984-08-10 | 1986-03-11 | シーメンス、アクチエンゲゼルシヤフト | 温度保護用回路装置 |
| JPH0680414B2 (ja) * | 1984-08-28 | 1994-10-12 | セイコーエプソン株式会社 | デジタル温度計 |
| JPS6195604A (ja) * | 1984-10-16 | 1986-05-14 | Mitsubishi Electric Corp | 電圧制御形発振器 |
| AT382484B (de) * | 1985-01-14 | 1987-02-25 | Elin Union Ag | Transistorschaltstufe mit einem leistungstransistor |
| US4907449A (en) * | 1986-10-31 | 1990-03-13 | A.I.R., Inc. | Meteorological data encoder for measuring atmospheric conditions |
| US4910689A (en) * | 1986-12-25 | 1990-03-20 | Canon Kabushiki Kaisha | Resistivity value measuring circuit |
| US4864513A (en) * | 1987-07-07 | 1989-09-05 | Honeywell Incorporated | Potentiometer setting detection by measuring the ratio of RC time constants |
| US4841458A (en) * | 1987-07-07 | 1989-06-20 | Honeywell, Incorporated | Analog to digital conversion by measuring the ratio of RC time constants |
| JPH01133566A (ja) * | 1987-11-17 | 1989-05-25 | Mitsubishi Electric Corp | 電源装置 |
| JPH02158168A (ja) * | 1988-12-12 | 1990-06-18 | Matsushita Electric Ind Co Ltd | 焦電型赤外線固体撮像装置及びその駆動方法 |
| JPH0833328B2 (ja) * | 1989-08-19 | 1996-03-29 | 泰久 野村 | 温度検出装置 |
| US5255975A (en) * | 1991-11-26 | 1993-10-26 | Honeywell Inc. | Low cost calibration system for frequency varying temperature sensing means for a thermostat |
| US5324944A (en) * | 1992-12-10 | 1994-06-28 | Hughes Aircraft Company | Infrared detection system and method with distributed signal amplification and sampling |
| JPH06201634A (ja) * | 1992-12-25 | 1994-07-22 | Mitsubishi Rayon Co Ltd | 水分測定方法及び水分測定装置 |
| CA2154261A1 (en) * | 1993-01-19 | 1994-08-04 | Michael Nolan | Conditioning sensing system for controlling working fluids |
| JPH0773350B2 (ja) * | 1993-01-28 | 1995-08-02 | 日本電気株式会社 | 電荷積分型二次元アレイ光検出器と信号読み出し回路およびその駆動方法 |
| JPH06265411A (ja) | 1993-03-16 | 1994-09-22 | Fujitsu Ltd | 赤外線撮像方法及び装置 |
| US5414263A (en) * | 1994-02-24 | 1995-05-09 | Regent Lighting Corporation | Infrared detection switching circuit |
| EP0701687B1 (en) * | 1994-04-05 | 1999-07-28 | Koninklijke Philips Electronics N.V. | Resistance measuring circuit, and thermal appliance, electrical thermometer and cold-generating appliance including such a measuring circuit |
| JP3518181B2 (ja) * | 1996-07-10 | 2004-04-12 | 株式会社ニコン | 熱型赤外線イメージセンサ |
| JPH11101832A (ja) * | 1997-09-26 | 1999-04-13 | Nissin Electric Co Ltd | 静電容量測定器 |
| US6421626B1 (en) * | 1998-11-06 | 2002-07-16 | Stmicroelectronics, Inc.. | Low voltage/low power temperature sensor |
| JP2000235075A (ja) * | 1999-02-16 | 2000-08-29 | Fuji Photo Film Co Ltd | 放射線固体検出器の電荷読出方法および装置、並びに放射線固体検出器 |
| US7098720B1 (en) * | 2002-11-08 | 2006-08-29 | National Semiconductor Corporation | High impedance thermal shutdown circuit |
| US6922084B2 (en) * | 2003-06-06 | 2005-07-26 | Microchip Technology Incorporated | Ultra-low power programmable timer and low voltage detection circuits |
| US7384113B2 (en) * | 2004-04-19 | 2008-06-10 | Hewlett-Packard Development Company, L.P. | Fluid ejection device with address generator |
| US7896544B2 (en) * | 2005-02-07 | 2011-03-01 | Hochiki Corporation | Heat detector and method of manufacturing heat detecting element |
| EP1708354B1 (de) * | 2005-03-31 | 2009-10-14 | Grundfos Management A/S | Tauchmotor |
| US7333313B2 (en) * | 2005-06-15 | 2008-02-19 | Osram Sylvania Inc. | Multiplexed temperature sensing circuit for HID lamp ballast |
| US7413343B2 (en) * | 2005-09-16 | 2008-08-19 | Kyocera Wireless Corp. | Apparatus for determining a temperature sensing element |
| JP4366351B2 (ja) * | 2005-10-07 | 2009-11-18 | キヤノン株式会社 | 電源制御回路、電子機器及び記録装置 |
| JP4207077B2 (ja) * | 2006-10-02 | 2009-01-14 | セイコーエプソン株式会社 | 強誘電体メモリ装置及びその駆動方法並びに電子機器 |
| JP5192928B2 (ja) | 2008-07-01 | 2013-05-08 | 三菱重工業株式会社 | 磁気軸受及びこのシステムを用いた回転機械 |
| JP5215060B2 (ja) * | 2008-07-02 | 2013-06-19 | テルモ株式会社 | 電子体温計及び作動制御方法 |
| JP4626832B2 (ja) * | 2008-07-10 | 2011-02-09 | セイコーエプソン株式会社 | 強誘電体記憶装置の駆動方法、強誘電体記憶装置および電子機器 |
| KR101520358B1 (ko) * | 2008-12-09 | 2015-05-14 | 삼성전자주식회사 | 온도변화에 따른 출력특성을 보상한 온도감지기 및 온도보상방법 |
| US8116149B2 (en) | 2009-04-14 | 2012-02-14 | Taiwan Semiconductor Manufacturing Co., Ltd. | Circuit and method for small swing memory signals |
| JP5201076B2 (ja) | 2009-05-07 | 2013-06-05 | 株式会社リコー | 粒子の製造方法及び粒子製造装置 |
-
2010
- 2010-11-22 JP JP2010260002A patent/JP5736744B2/ja not_active Expired - Fee Related
-
2011
- 2011-01-25 EP EP11151980A patent/EP2357458A1/en not_active Withdrawn
- 2011-01-25 CN CN201110027474.1A patent/CN102192790B/zh not_active Expired - Fee Related
- 2011-01-25 US US13/013,064 patent/US20110182321A1/en not_active Abandoned
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