CN102192790B - 热传感器用检测电路、热传感器装置及电子设备 - Google Patents

热传感器用检测电路、热传感器装置及电子设备 Download PDF

Info

Publication number
CN102192790B
CN102192790B CN201110027474.1A CN201110027474A CN102192790B CN 102192790 B CN102192790 B CN 102192790B CN 201110027474 A CN201110027474 A CN 201110027474A CN 102192790 B CN102192790 B CN 102192790B
Authority
CN
China
Prior art keywords
circuit
thermal sensor
node
transistor
detection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN201110027474.1A
Other languages
English (en)
Chinese (zh)
Other versions
CN102192790A (zh
Inventor
吉崎圭
山村光宏
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Epson Corp
Original Assignee
Seiko Epson Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Epson Corp filed Critical Seiko Epson Corp
Publication of CN102192790A publication Critical patent/CN102192790A/zh
Application granted granted Critical
Publication of CN102192790B publication Critical patent/CN102192790B/zh
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/10—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
    • G01J5/34—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors using capacitors, e.g. pyroelectric capacitors
    • G01J5/35—Electrical features thereof
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/10—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
    • G01J5/20—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors using resistors, thermistors or semiconductors sensitive to radiation, e.g. photoconductive devices
    • G01J5/22—Electrical features thereof
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/10—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
    • G01J5/34—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors using capacitors, e.g. pyroelectric capacitors
    • G01J2005/345—Arrays

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
CN201110027474.1A 2010-01-26 2011-01-25 热传感器用检测电路、热传感器装置及电子设备 Expired - Fee Related CN102192790B (zh)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP2010014136 2010-01-26
JP2010-014136 2010-01-26
JP2010-260002 2010-11-22
JP2010260002A JP5736744B2 (ja) 2010-01-26 2010-11-22 熱センサーデバイス及び電子機器

Publications (2)

Publication Number Publication Date
CN102192790A CN102192790A (zh) 2011-09-21
CN102192790B true CN102192790B (zh) 2015-05-13

Family

ID=43901268

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201110027474.1A Expired - Fee Related CN102192790B (zh) 2010-01-26 2011-01-25 热传感器用检测电路、热传感器装置及电子设备

Country Status (4)

Country Link
US (1) US20110182321A1 (enExample)
EP (1) EP2357458A1 (enExample)
JP (1) JP5736744B2 (enExample)
CN (1) CN102192790B (enExample)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7771115B2 (en) * 2007-08-16 2010-08-10 Micron Technology, Inc. Temperature sensor circuit, device, system, and method
JP5962167B2 (ja) * 2012-04-19 2016-08-03 セイコーエプソン株式会社 検出回路、センサーデバイス及び電子機器
JP2013221906A (ja) * 2012-04-19 2013-10-28 Seiko Epson Corp センサーデバイス及び電子機器
JP6264525B2 (ja) * 2013-03-25 2018-01-24 セイコーエプソン株式会社 赤外線センサー、熱検知素子及びそれを用いた熱検知方法
CN103256987B (zh) * 2013-04-27 2015-07-22 电子科技大学 一种红外焦平面阵列读出电路中数字输出信号的传输电路
US9574951B2 (en) * 2013-09-09 2017-02-21 Semiconductor Components Industries, Llc Image sensor including temperature sensor and electronic shutter function
DE102014221270A1 (de) * 2014-10-21 2016-04-21 Robert Bosch Gmbh Verfahren und Vorrichtung zum Messen einer Temperatur
US9553527B1 (en) * 2014-12-01 2017-01-24 Amazon Technologies, Inc. Energy recovery layer in an electrowetting display
US11875662B2 (en) * 2021-10-28 2024-01-16 Joseph GAUL Device and system for vehicle proximity alert
CN120427113B (zh) * 2025-04-21 2025-10-14 中国电子产品可靠性与环境试验研究所（（工业和信息化部电子第五研究所）（中国赛宝实验室）） 一种基于方差分析的成像光电探测器焦平面热点识别方法

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4910689A (en) * 1986-12-25 1990-03-20 Canon Kabushiki Kaisha Resistivity value measuring circuit
US7413343B2 (en) * 2005-09-16 2008-08-19 Kyocera Wireless Corp. Apparatus for determining a temperature sensing element

Family Cites Families (44)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2927259A (en) * 1959-02-09 1960-03-01 Conrad L Neal Transistor time delay device
US3324352A (en) * 1963-06-03 1967-06-06 Tecumseh Products Co Temperature protection circuit
US3475600A (en) * 1966-02-28 1969-10-28 Infotronics Corp Base line control circuit means
DE2701575C2 (de) * 1977-01-15 1985-12-19 Mannesmann Kienzle GmbH, 7730 Villingen-Schwenningen Frequenzwandler für Geschwindigkeits- und Streckenzählgeräte
US4176556A (en) * 1977-06-17 1979-12-04 Omron Tateisi Electronics Co. Electronic thermometer
US4277975A (en) * 1979-11-13 1981-07-14 General Electric Company Digital thermometer
JPS59142427A (ja) 1983-02-02 1984-08-15 Matsushita Electric Ind Co Ltd 熱感知器
JPS60202321A (ja) * 1984-03-27 1985-10-12 Seiko Epson Corp 温度検知回路
JPS6149616A (ja) * 1984-08-10 1986-03-11 シーメンス、アクチエンゲゼルシヤフト 温度保護用回路装置
JPH0680414B2 (ja) * 1984-08-28 1994-10-12 セイコーエプソン株式会社 デジタル温度計
JPS6195604A (ja) * 1984-10-16 1986-05-14 Mitsubishi Electric Corp 電圧制御形発振器
AT382484B (de) * 1985-01-14 1987-02-25 Elin Union Ag Transistorschaltstufe mit einem leistungstransistor
US4907449A (en) * 1986-10-31 1990-03-13 A.I.R., Inc. Meteorological data encoder for measuring atmospheric conditions
US4864513A (en) * 1987-07-07 1989-09-05 Honeywell Incorporated Potentiometer setting detection by measuring the ratio of RC time constants
US4841458A (en) * 1987-07-07 1989-06-20 Honeywell, Incorporated Analog to digital conversion by measuring the ratio of RC time constants
JPH01133566A (ja) * 1987-11-17 1989-05-25 Mitsubishi Electric Corp 電源装置
JPH02158168A (ja) * 1988-12-12 1990-06-18 Matsushita Electric Ind Co Ltd 焦電型赤外線固体撮像装置及びその駆動方法
JPH0833328B2 (ja) * 1989-08-19 1996-03-29 泰久 野村 温度検出装置
US5255975A (en) * 1991-11-26 1993-10-26 Honeywell Inc. Low cost calibration system for frequency varying temperature sensing means for a thermostat
US5324944A (en) * 1992-12-10 1994-06-28 Hughes Aircraft Company Infrared detection system and method with distributed signal amplification and sampling
JPH06201634A (ja) * 1992-12-25 1994-07-22 Mitsubishi Rayon Co Ltd 水分測定方法及び水分測定装置
CA2154261A1 (en) * 1993-01-19 1994-08-04 Michael Nolan Conditioning sensing system for controlling working fluids
JPH0773350B2 (ja) * 1993-01-28 1995-08-02 日本電気株式会社 電荷積分型二次元アレイ光検出器と信号読み出し回路およびその駆動方法
JPH06265411A (ja) 1993-03-16 1994-09-22 Fujitsu Ltd 赤外線撮像方法及び装置
US5414263A (en) * 1994-02-24 1995-05-09 Regent Lighting Corporation Infrared detection switching circuit
EP0701687B1 (en) * 1994-04-05 1999-07-28 Koninklijke Philips Electronics N.V. Resistance measuring circuit, and thermal appliance, electrical thermometer and cold-generating appliance including such a measuring circuit
JP3518181B2 (ja) * 1996-07-10 2004-04-12 株式会社ニコン 熱型赤外線イメージセンサ
JPH11101832A (ja) * 1997-09-26 1999-04-13 Nissin Electric Co Ltd 静電容量測定器
US6421626B1 (en) * 1998-11-06 2002-07-16 Stmicroelectronics, Inc.. Low voltage/low power temperature sensor
JP2000235075A (ja) * 1999-02-16 2000-08-29 Fuji Photo Film Co Ltd 放射線固体検出器の電荷読出方法および装置、並びに放射線固体検出器
US7098720B1 (en) * 2002-11-08 2006-08-29 National Semiconductor Corporation High impedance thermal shutdown circuit
US6922084B2 (en) * 2003-06-06 2005-07-26 Microchip Technology Incorporated Ultra-low power programmable timer and low voltage detection circuits
US7384113B2 (en) * 2004-04-19 2008-06-10 Hewlett-Packard Development Company, L.P. Fluid ejection device with address generator
US7896544B2 (en) * 2005-02-07 2011-03-01 Hochiki Corporation Heat detector and method of manufacturing heat detecting element
EP1708354B1 (de) * 2005-03-31 2009-10-14 Grundfos Management A/S Tauchmotor
US7333313B2 (en) * 2005-06-15 2008-02-19 Osram Sylvania Inc. Multiplexed temperature sensing circuit for HID lamp ballast
JP4366351B2 (ja) * 2005-10-07 2009-11-18 キヤノン株式会社 電源制御回路、電子機器及び記録装置
JP4207077B2 (ja) * 2006-10-02 2009-01-14 セイコーエプソン株式会社 強誘電体メモリ装置及びその駆動方法並びに電子機器
JP5192928B2 (ja) 2008-07-01 2013-05-08 三菱重工業株式会社 磁気軸受及びこのシステムを用いた回転機械
JP5215060B2 (ja) * 2008-07-02 2013-06-19 テルモ株式会社 電子体温計及び作動制御方法
JP4626832B2 (ja) * 2008-07-10 2011-02-09 セイコーエプソン株式会社 強誘電体記憶装置の駆動方法、強誘電体記憶装置および電子機器
KR101520358B1 (ko) * 2008-12-09 2015-05-14 삼성전자주식회사 온도변화에 따른 출력특성을 보상한 온도감지기 및 온도보상방법
US8116149B2 (en) 2009-04-14 2012-02-14 Taiwan Semiconductor Manufacturing Co., Ltd. Circuit and method for small swing memory signals
JP5201076B2 (ja) 2009-05-07 2013-06-05 株式会社リコー 粒子の製造方法及び粒子製造装置

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4910689A (en) * 1986-12-25 1990-03-20 Canon Kabushiki Kaisha Resistivity value measuring circuit
US7413343B2 (en) * 2005-09-16 2008-08-19 Kyocera Wireless Corp. Apparatus for determining a temperature sensing element

Also Published As

Publication number Publication date
EP2357458A1 (en) 2011-08-17
JP5736744B2 (ja) 2015-06-17
US20110182321A1 (en) 2011-07-28
JP2011174919A (ja) 2011-09-08
CN102192790A (zh) 2011-09-21

Similar Documents

Publication Publication Date Title
CN102192790B (zh) 热传感器用检测电路、热传感器装置及电子设备
TWI480526B (zh) 紅外線檢測電路、感測器裝置及電子機器
CN102141445B (zh) 检测电路、传感器装置及电子设备
RU2008123479A (ru) Устройство для регистрации инфракрасного излучения на основе болометрических детекторов
EP2642261A1 (en) Uncooled infrared imaging device
US8481940B2 (en) Detection device, sensor device, and electronic apparatus
US9222838B2 (en) Detection device, sensor device, and electronic device
WO2021068156A1 (zh) 光传感器、基于飞行时间的测距系统和电子装置
JP2008268155A (ja) 熱型赤外線固体撮像素子
US7145142B2 (en) Sensor device which detects a physical change amount or a chemical change amount
JP2009074898A (ja) ボロメータ型非冷却赤外線センサおよびその駆動方法
US8895927B2 (en) Detection device, sensor device and electronic apparatus
JP2013069201A (ja) 光センサーとその駆動方法、及び静脈センサー、指紋センサー
JP5321843B2 (ja) 赤外線固体撮像素子
JP2000019013A (ja) 赤外線検出装置
JP2012251776A (ja) 検出装置、センサーデバイス及び電子機器
CN116295861A (zh) 一种非制冷红外焦平面双通道列级读出电路及方法
JP2003057110A (ja) 赤外線センサ装置

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant
CF01 Termination of patent right due to non-payment of annual fee
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20150513

Termination date: 20180125