JP5736744B2 - 熱センサーデバイス及び電子機器 - Google Patents

熱センサーデバイス及び電子機器 Download PDF

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Publication number
JP5736744B2
JP5736744B2 JP2010260002A JP2010260002A JP5736744B2 JP 5736744 B2 JP5736744 B2 JP 5736744B2 JP 2010260002 A JP2010260002 A JP 2010260002A JP 2010260002 A JP2010260002 A JP 2010260002A JP 5736744 B2 JP5736744 B2 JP 5736744B2
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Japan
Prior art keywords
discharge
charging
thermal sensor
circuit
detection
Prior art date
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Expired - Fee Related
Application number
JP2010260002A
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English (en)
Japanese (ja)
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JP2011174919A5 (enExample
JP2011174919A (ja
Inventor
圭 吉崎
圭 吉崎
山村 光宏
光宏 山村
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Seiko Epson Corp
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Seiko Epson Corp
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Filing date
Publication date
Application filed by Seiko Epson Corp filed Critical Seiko Epson Corp
Priority to JP2010260002A priority Critical patent/JP5736744B2/ja
Priority to EP11151980A priority patent/EP2357458A1/en
Priority to US13/013,064 priority patent/US20110182321A1/en
Priority to CN201110027474.1A priority patent/CN102192790B/zh
Publication of JP2011174919A publication Critical patent/JP2011174919A/ja
Publication of JP2011174919A5 publication Critical patent/JP2011174919A5/ja
Application granted granted Critical
Publication of JP5736744B2 publication Critical patent/JP5736744B2/ja
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/10Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
    • G01J5/34Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors using capacitors, e.g. pyroelectric capacitors
    • G01J5/35Electrical features thereof
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/10Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
    • G01J5/20Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors using resistors, thermistors or semiconductors sensitive to radiation, e.g. photoconductive devices
    • G01J5/22Electrical features thereof
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/10Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
    • G01J5/34Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors using capacitors, e.g. pyroelectric capacitors
    • G01J2005/345Arrays

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
JP2010260002A 2010-01-26 2010-11-22 熱センサーデバイス及び電子機器 Expired - Fee Related JP5736744B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2010260002A JP5736744B2 (ja) 2010-01-26 2010-11-22 熱センサーデバイス及び電子機器
EP11151980A EP2357458A1 (en) 2010-01-26 2011-01-25 Detection circuit for heat sensor, heat sensor device, and electronic device
US13/013,064 US20110182321A1 (en) 2010-01-26 2011-01-25 Detection circuit for heat sensor, heat sensor device, and electronic device
CN201110027474.1A CN102192790B (zh) 2010-01-26 2011-01-25 热传感器用检测电路、热传感器装置及电子设备

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2010014136 2010-01-26
JP2010014136 2010-01-26
JP2010260002A JP5736744B2 (ja) 2010-01-26 2010-11-22 熱センサーデバイス及び電子機器

Publications (3)

Publication Number Publication Date
JP2011174919A JP2011174919A (ja) 2011-09-08
JP2011174919A5 JP2011174919A5 (enExample) 2013-12-05
JP5736744B2 true JP5736744B2 (ja) 2015-06-17

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
JP2010260002A Expired - Fee Related JP5736744B2 (ja) 2010-01-26 2010-11-22 熱センサーデバイス及び電子機器

Country Status (4)

Country Link
US (1) US20110182321A1 (enExample)
EP (1) EP2357458A1 (enExample)
JP (1) JP5736744B2 (enExample)
CN (1) CN102192790B (enExample)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7771115B2 (en) * 2007-08-16 2010-08-10 Micron Technology, Inc. Temperature sensor circuit, device, system, and method
JP5962167B2 (ja) * 2012-04-19 2016-08-03 セイコーエプソン株式会社 検出回路、センサーデバイス及び電子機器
JP2013221906A (ja) * 2012-04-19 2013-10-28 Seiko Epson Corp センサーデバイス及び電子機器
JP6264525B2 (ja) * 2013-03-25 2018-01-24 セイコーエプソン株式会社 赤外線センサー、熱検知素子及びそれを用いた熱検知方法
CN103256987B (zh) * 2013-04-27 2015-07-22 电子科技大学 一种红外焦平面阵列读出电路中数字输出信号的传输电路
US9574951B2 (en) * 2013-09-09 2017-02-21 Semiconductor Components Industries, Llc Image sensor including temperature sensor and electronic shutter function
DE102014221270A1 (de) * 2014-10-21 2016-04-21 Robert Bosch Gmbh Verfahren und Vorrichtung zum Messen einer Temperatur
US9553527B1 (en) * 2014-12-01 2017-01-24 Amazon Technologies, Inc. Energy recovery layer in an electrowetting display
US11875662B2 (en) * 2021-10-28 2024-01-16 Joseph GAUL Device and system for vehicle proximity alert
CN120427113B (zh) * 2025-04-21 2025-10-14 中国电子产品可靠性与环境试验研究所((工业和信息化部电子第五研究所)(中国赛宝实验室)) 一种基于方差分析的成像光电探测器焦平面热点识别方法

Family Cites Families (46)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2927259A (en) * 1959-02-09 1960-03-01 Conrad L Neal Transistor time delay device
US3324352A (en) * 1963-06-03 1967-06-06 Tecumseh Products Co Temperature protection circuit
US3475600A (en) * 1966-02-28 1969-10-28 Infotronics Corp Base line control circuit means
DE2701575C2 (de) * 1977-01-15 1985-12-19 Mannesmann Kienzle GmbH, 7730 Villingen-Schwenningen Frequenzwandler für Geschwindigkeits- und Streckenzählgeräte
US4176556A (en) * 1977-06-17 1979-12-04 Omron Tateisi Electronics Co. Electronic thermometer
US4277975A (en) * 1979-11-13 1981-07-14 General Electric Company Digital thermometer
JPS59142427A (ja) 1983-02-02 1984-08-15 Matsushita Electric Ind Co Ltd 熱感知器
JPS60202321A (ja) * 1984-03-27 1985-10-12 Seiko Epson Corp 温度検知回路
JPS6149616A (ja) * 1984-08-10 1986-03-11 シーメンス、アクチエンゲゼルシヤフト 温度保護用回路装置
JPH0680414B2 (ja) * 1984-08-28 1994-10-12 セイコーエプソン株式会社 デジタル温度計
JPS6195604A (ja) * 1984-10-16 1986-05-14 Mitsubishi Electric Corp 電圧制御形発振器
AT382484B (de) * 1985-01-14 1987-02-25 Elin Union Ag Transistorschaltstufe mit einem leistungstransistor
US4907449A (en) * 1986-10-31 1990-03-13 A.I.R., Inc. Meteorological data encoder for measuring atmospheric conditions
US4910689A (en) * 1986-12-25 1990-03-20 Canon Kabushiki Kaisha Resistivity value measuring circuit
US4864513A (en) * 1987-07-07 1989-09-05 Honeywell Incorporated Potentiometer setting detection by measuring the ratio of RC time constants
US4841458A (en) * 1987-07-07 1989-06-20 Honeywell, Incorporated Analog to digital conversion by measuring the ratio of RC time constants
JPH01133566A (ja) * 1987-11-17 1989-05-25 Mitsubishi Electric Corp 電源装置
JPH02158168A (ja) * 1988-12-12 1990-06-18 Matsushita Electric Ind Co Ltd 焦電型赤外線固体撮像装置及びその駆動方法
JPH0833328B2 (ja) * 1989-08-19 1996-03-29 泰久 野村 温度検出装置
US5255975A (en) * 1991-11-26 1993-10-26 Honeywell Inc. Low cost calibration system for frequency varying temperature sensing means for a thermostat
US5324944A (en) * 1992-12-10 1994-06-28 Hughes Aircraft Company Infrared detection system and method with distributed signal amplification and sampling
JPH06201634A (ja) * 1992-12-25 1994-07-22 Mitsubishi Rayon Co Ltd 水分測定方法及び水分測定装置
CA2154261A1 (en) * 1993-01-19 1994-08-04 Michael Nolan Conditioning sensing system for controlling working fluids
JPH0773350B2 (ja) * 1993-01-28 1995-08-02 日本電気株式会社 電荷積分型二次元アレイ光検出器と信号読み出し回路およびその駆動方法
JPH06265411A (ja) 1993-03-16 1994-09-22 Fujitsu Ltd 赤外線撮像方法及び装置
US5414263A (en) * 1994-02-24 1995-05-09 Regent Lighting Corporation Infrared detection switching circuit
EP0701687B1 (en) * 1994-04-05 1999-07-28 Koninklijke Philips Electronics N.V. Resistance measuring circuit, and thermal appliance, electrical thermometer and cold-generating appliance including such a measuring circuit
JP3518181B2 (ja) * 1996-07-10 2004-04-12 株式会社ニコン 熱型赤外線イメージセンサ
JPH11101832A (ja) * 1997-09-26 1999-04-13 Nissin Electric Co Ltd 静電容量測定器
US6421626B1 (en) * 1998-11-06 2002-07-16 Stmicroelectronics, Inc.. Low voltage/low power temperature sensor
JP2000235075A (ja) * 1999-02-16 2000-08-29 Fuji Photo Film Co Ltd 放射線固体検出器の電荷読出方法および装置、並びに放射線固体検出器
US7098720B1 (en) * 2002-11-08 2006-08-29 National Semiconductor Corporation High impedance thermal shutdown circuit
US6922084B2 (en) * 2003-06-06 2005-07-26 Microchip Technology Incorporated Ultra-low power programmable timer and low voltage detection circuits
US7384113B2 (en) * 2004-04-19 2008-06-10 Hewlett-Packard Development Company, L.P. Fluid ejection device with address generator
US7896544B2 (en) * 2005-02-07 2011-03-01 Hochiki Corporation Heat detector and method of manufacturing heat detecting element
EP1708354B1 (de) * 2005-03-31 2009-10-14 Grundfos Management A/S Tauchmotor
US7333313B2 (en) * 2005-06-15 2008-02-19 Osram Sylvania Inc. Multiplexed temperature sensing circuit for HID lamp ballast
US7413343B2 (en) * 2005-09-16 2008-08-19 Kyocera Wireless Corp. Apparatus for determining a temperature sensing element
JP4366351B2 (ja) * 2005-10-07 2009-11-18 キヤノン株式会社 電源制御回路、電子機器及び記録装置
JP4207077B2 (ja) * 2006-10-02 2009-01-14 セイコーエプソン株式会社 強誘電体メモリ装置及びその駆動方法並びに電子機器
JP5192928B2 (ja) 2008-07-01 2013-05-08 三菱重工業株式会社 磁気軸受及びこのシステムを用いた回転機械
JP5215060B2 (ja) * 2008-07-02 2013-06-19 テルモ株式会社 電子体温計及び作動制御方法
JP4626832B2 (ja) * 2008-07-10 2011-02-09 セイコーエプソン株式会社 強誘電体記憶装置の駆動方法、強誘電体記憶装置および電子機器
KR101520358B1 (ko) * 2008-12-09 2015-05-14 삼성전자주식회사 온도변화에 따른 출력특성을 보상한 온도감지기 및 온도보상방법
US8116149B2 (en) 2009-04-14 2012-02-14 Taiwan Semiconductor Manufacturing Co., Ltd. Circuit and method for small swing memory signals
JP5201076B2 (ja) 2009-05-07 2013-06-05 株式会社リコー 粒子の製造方法及び粒子製造装置

Also Published As

Publication number Publication date
EP2357458A1 (en) 2011-08-17
US20110182321A1 (en) 2011-07-28
JP2011174919A (ja) 2011-09-08
CN102192790B (zh) 2015-05-13
CN102192790A (zh) 2011-09-21

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