JP2010502953A - 知的プローブ - Google Patents

知的プローブ Download PDF

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Publication number
JP2010502953A
JP2010502953A JP2009526757A JP2009526757A JP2010502953A JP 2010502953 A JP2010502953 A JP 2010502953A JP 2009526757 A JP2009526757 A JP 2009526757A JP 2009526757 A JP2009526757 A JP 2009526757A JP 2010502953 A JP2010502953 A JP 2010502953A
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Japan
Prior art keywords
probe
intelligent
measuring machine
coordinate measuring
arm
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JP2009526757A
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Japanese (ja)
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JP2010502953A5 (enExample
Inventor
クラーク エイチ ブリッグス
キース ジョージ マクファーレイン
フレデリック ジョン ヨーク
マーク バーバー
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ファロ テクノロジーズ インコーポレーテッド
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Publication of JP2010502953A publication Critical patent/JP2010502953A/ja
Publication of JP2010502953A5 publication Critical patent/JP2010502953A5/ja
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/004—Measuring arrangements characterised by the use of mechanical techniques for measuring coordinates of points
    • G01B5/008—Measuring arrangements characterised by the use of mechanical techniques for measuring coordinates of points using coordinate measuring machines
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/004—Measuring arrangements characterised by the use of mechanical techniques for measuring coordinates of points
    • G01B5/008—Measuring arrangements characterised by the use of mechanical techniques for measuring coordinates of points using coordinate measuring machines
    • G01B5/012—Contact-making feeler heads therefor

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Arrangements For Transmission Of Measured Signals (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
JP2009526757A 2006-08-31 2007-08-31 知的プローブ Pending JP2010502953A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US84164806P 2006-08-31 2006-08-31
PCT/US2007/019279 WO2008027588A2 (en) 2006-08-31 2007-08-31 Smart probe

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2013208898A Division JP2014032208A (ja) 2006-08-31 2013-10-04 知的プローブ

Publications (2)

Publication Number Publication Date
JP2010502953A true JP2010502953A (ja) 2010-01-28
JP2010502953A5 JP2010502953A5 (enExample) 2010-10-14

Family

ID=39136651

Family Applications (2)

Application Number Title Priority Date Filing Date
JP2009526757A Pending JP2010502953A (ja) 2006-08-31 2007-08-31 知的プローブ
JP2013208898A Pending JP2014032208A (ja) 2006-08-31 2013-10-04 知的プローブ

Family Applications After (1)

Application Number Title Priority Date Filing Date
JP2013208898A Pending JP2014032208A (ja) 2006-08-31 2013-10-04 知的プローブ

Country Status (5)

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US (3) US7735234B2 (enExample)
EP (1) EP2064027B1 (enExample)
JP (2) JP2010502953A (enExample)
CN (1) CN101511529B (enExample)
WO (1) WO2008027588A2 (enExample)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011237425A (ja) * 2010-04-26 2011-11-24 Tesa Sa 測定システム
JP2013517508A (ja) * 2010-01-20 2013-05-16 ファロ テクノロジーズ インコーポレーテッド 多機能座標測定機
CN103424074A (zh) * 2012-05-25 2013-12-04 株式会社三丰 光谱测距传感器光学笔用的可更换型光学结构

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US9686532B2 (en) 2011-04-15 2017-06-20 Faro Technologies, Inc. System and method of acquiring three-dimensional coordinates using multiple coordinate measurement devices
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JP6727306B2 (ja) 2015-12-22 2020-07-22 株式会社ミツトヨ Ｃｍｍタッチプローブのためのセンサ信号オフセット補正システム
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JP2013246173A (ja) * 2012-05-25 2013-12-09 Mitsutoyo Corp クロマティックレンジセンサ光学ペン用の交換可能光学機構

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CN101511529A (zh) 2009-08-19
EP2064027B1 (en) 2013-08-28
US20100250175A1 (en) 2010-09-30
WO2008027588A3 (en) 2008-06-05
US20080052936A1 (en) 2008-03-06
US7735234B2 (en) 2010-06-15
US8661700B2 (en) 2014-03-04
CN101511529B (zh) 2013-01-30
WO2008027588A2 (en) 2008-03-06

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