CN101511529B - 可去除智能探针、组合系统以及使用坐标测量机的方法 - Google Patents

可去除智能探针、组合系统以及使用坐标测量机的方法 Download PDF

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Publication number
CN101511529B
CN101511529B CN200780031867.1A CN200780031867A CN101511529B CN 101511529 B CN101511529 B CN 101511529B CN 200780031867 A CN200780031867 A CN 200780031867A CN 101511529 B CN101511529 B CN 101511529B
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probe
coordinate measuring
measuring machine
intelligent
data
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Chinese (zh)
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CN101511529A (zh
Inventor
克拉克·H·布里格斯
基思·乔治·麦克法兰
弗雷德里克·约翰·约克
马克·巴尔伯
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Faro Technologies Inc
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Faro Technologies Inc
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/004—Measuring arrangements characterised by the use of mechanical techniques for measuring coordinates of points
    • G01B5/008—Measuring arrangements characterised by the use of mechanical techniques for measuring coordinates of points using coordinate measuring machines
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/004—Measuring arrangements characterised by the use of mechanical techniques for measuring coordinates of points
    • G01B5/008—Measuring arrangements characterised by the use of mechanical techniques for measuring coordinates of points using coordinate measuring machines
    • G01B5/012—Contact-making feeler heads therefor

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Arrangements For Transmission Of Measured Signals (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
CN200780031867.1A 2006-08-31 2007-08-31 可去除智能探针、组合系统以及使用坐标测量机的方法 Expired - Fee Related CN101511529B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US84164806P 2006-08-31 2006-08-31
US60/841,648 2006-08-31
PCT/US2007/019279 WO2008027588A2 (en) 2006-08-31 2007-08-31 Smart probe

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CN101511529A CN101511529A (zh) 2009-08-19
CN101511529B true CN101511529B (zh) 2013-01-30

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US (3) US7735234B2 (enExample)
EP (1) EP2064027B1 (enExample)
JP (2) JP2010502953A (enExample)
CN (1) CN101511529B (enExample)
WO (1) WO2008027588A2 (enExample)

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EP2064027A2 (en) 2009-06-03
US20130118020A1 (en) 2013-05-16
JP2014032208A (ja) 2014-02-20
CN101511529A (zh) 2009-08-19
EP2064027B1 (en) 2013-08-28
US20100250175A1 (en) 2010-09-30
WO2008027588A3 (en) 2008-06-05
US20080052936A1 (en) 2008-03-06
JP2010502953A (ja) 2010-01-28
US7735234B2 (en) 2010-06-15
US8661700B2 (en) 2014-03-04
WO2008027588A2 (en) 2008-03-06

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