JP2010212367A5 - - Google Patents
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- JP2010212367A5 JP2010212367A5 JP2009055339A JP2009055339A JP2010212367A5 JP 2010212367 A5 JP2010212367 A5 JP 2010212367A5 JP 2009055339 A JP2009055339 A JP 2009055339A JP 2009055339 A JP2009055339 A JP 2009055339A JP 2010212367 A5 JP2010212367 A5 JP 2010212367A5
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- JP
- Japan
- Prior art keywords
- layer
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- Prior art date
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- 238000009792 diffusion process Methods 0.000 claims description 28
- 239000004065 semiconductor Substances 0.000 claims description 20
- 239000000758 substrate Substances 0.000 claims description 11
- 239000012535 impurity Substances 0.000 claims description 8
- 238000002955 isolation Methods 0.000 claims description 6
- 239000000463 material Substances 0.000 claims description 2
- BOTDANWDWHJENH-UHFFFAOYSA-N Tetraethyl orthosilicate Chemical compound CCO[Si](OCC)(OCC)OCC BOTDANWDWHJENH-UHFFFAOYSA-N 0.000 claims 2
- 239000011810 insulating material Substances 0.000 claims 2
- 229910021420 polycrystalline silicon Inorganic materials 0.000 claims 1
- 229920005591 polysilicon Polymers 0.000 claims 1
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2009055339A JP5570743B2 (ja) | 2009-03-09 | 2009-03-09 | 半導体装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2009055339A JP5570743B2 (ja) | 2009-03-09 | 2009-03-09 | 半導体装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2010212367A JP2010212367A (ja) | 2010-09-24 |
| JP2010212367A5 true JP2010212367A5 (enExample) | 2012-03-22 |
| JP5570743B2 JP5570743B2 (ja) | 2014-08-13 |
Family
ID=42972261
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2009055339A Active JP5570743B2 (ja) | 2009-03-09 | 2009-03-09 | 半導体装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP5570743B2 (enExample) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102309328B (zh) * | 2011-10-19 | 2012-11-14 | 中国科学院深圳先进技术研究院 | 弥散张量成像方法及系统 |
| CN105845729B (zh) * | 2015-01-15 | 2019-04-09 | 中芯国际集成电路制造(上海)有限公司 | 一种半导体器件及其制造方法和电子装置 |
| CN106449759B (zh) * | 2016-11-11 | 2019-08-02 | 电子科技大学 | 隔离型ldmos结构及其制造方法 |
| CN106409914B (zh) * | 2016-11-11 | 2019-08-23 | 电子科技大学 | 隔离型ldmos结构及其制造方法 |
| JP7771708B2 (ja) * | 2021-12-14 | 2025-11-18 | 富士電機株式会社 | 半導体装置 |
Family Cites Families (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6395665A (ja) * | 1986-10-13 | 1988-04-26 | Matsushita Electric Ind Co Ltd | 半導体装置およびその製造方法 |
| JPH01149464A (ja) * | 1987-12-04 | 1989-06-12 | Nec Corp | 半導体装置 |
| JPH05198754A (ja) * | 1992-01-22 | 1993-08-06 | Mitsubishi Electric Corp | 半導体装置の製造方法 |
| JPH10154755A (ja) * | 1996-11-25 | 1998-06-09 | Sony Corp | 半導体装置の製造方法 |
| JPH11251597A (ja) * | 1998-02-27 | 1999-09-17 | Denso Corp | 半導体装置 |
| SE519975C2 (sv) * | 1999-06-23 | 2003-05-06 | Ericsson Telefon Ab L M | Halvledarstruktur för högspänningshalvledarkomponenter |
| JP2001135719A (ja) * | 1999-11-01 | 2001-05-18 | Denso Corp | 半導体装置の素子分離構造 |
| JP2003297845A (ja) * | 2002-03-29 | 2003-10-17 | Sony Corp | 半導体装置およびその製造方法 |
| JP4326835B2 (ja) * | 2003-05-20 | 2009-09-09 | 三菱電機株式会社 | 半導体装置、半導体装置の製造方法及び半導体装置の製造プロセス評価方法 |
| US7737526B2 (en) * | 2007-03-28 | 2010-06-15 | Advanced Analogic Technologies, Inc. | Isolated trench MOSFET in epi-less semiconductor sustrate |
| JP2009164460A (ja) * | 2008-01-09 | 2009-07-23 | Renesas Technology Corp | 半導体装置 |
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2009
- 2009-03-09 JP JP2009055339A patent/JP5570743B2/ja active Active
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