JP2010114112A5 - - Google Patents
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- Publication number
- JP2010114112A5 JP2010114112A5 JP2008282794A JP2008282794A JP2010114112A5 JP 2010114112 A5 JP2010114112 A5 JP 2010114112A5 JP 2008282794 A JP2008282794 A JP 2008282794A JP 2008282794 A JP2008282794 A JP 2008282794A JP 2010114112 A5 JP2010114112 A5 JP 2010114112A5
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- layer
- compound semiconductor
- gallium nitride
- nitride compound
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
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- 239000000758 substrate Substances 0.000 claims 52
- 229910002601 GaN Inorganic materials 0.000 claims 22
- 239000004065 semiconductor Substances 0.000 claims 21
- -1 gallium nitride compound Chemical class 0.000 claims 19
- 238000000034 method Methods 0.000 claims 14
- 238000000926 separation method Methods 0.000 claims 12
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims 4
- 229910052751 metal Inorganic materials 0.000 claims 4
- 239000002184 metal Substances 0.000 claims 4
- 229910052710 silicon Inorganic materials 0.000 claims 4
- 239000010703 silicon Substances 0.000 claims 4
- JMASRVWKEDWRBT-UHFFFAOYSA-N Gallium nitride Chemical compound [Ga]#N JMASRVWKEDWRBT-UHFFFAOYSA-N 0.000 claims 3
- 230000015572 biosynthetic process Effects 0.000 claims 3
- 150000001875 compounds Chemical class 0.000 claims 3
- 239000013078 crystal Substances 0.000 claims 3
- 238000005530 etching Methods 0.000 claims 3
- 238000004581 coalescence Methods 0.000 claims 2
- 238000000354 decomposition reaction Methods 0.000 claims 2
- 239000000463 material Substances 0.000 claims 2
- 230000007704 transition Effects 0.000 claims 2
- 229910002704 AlGaN Inorganic materials 0.000 claims 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims 1
- 238000005452 bending Methods 0.000 claims 1
- 238000001816 cooling Methods 0.000 claims 1
- 238000000151 deposition Methods 0.000 claims 1
- 238000001704 evaporation Methods 0.000 claims 1
- 238000010438 heat treatment Methods 0.000 claims 1
- 229910052594 sapphire Inorganic materials 0.000 claims 1
- 239000010980 sapphire Substances 0.000 claims 1
- 229910052814 silicon oxide Inorganic materials 0.000 claims 1
Images
Priority Applications (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2008282794A JP5132524B2 (ja) | 2008-11-04 | 2008-11-04 | 窒化ガリウム系化合物半導体層の移設方法、及び窒化ガリウム系化合物半導体層が接合された基板 |
| EP09013630A EP2182547A2 (en) | 2008-11-04 | 2009-10-29 | Forming method of gallium nitride system compound semiconductor layer, transfer method of the same, and substrate structure with the same bonded thereto |
| KR1020090104802A KR101200804B1 (ko) | 2008-11-04 | 2009-11-02 | 질화 갈륨계 화합물 반도체층의 형성방법, 이설방법, 및 질화 갈륨계 화합물 반도체층이 접합된 기판 구조체 |
| US12/611,791 US8053335B2 (en) | 2008-11-04 | 2009-11-03 | Forming method of gallium nitride system compound semiconductor layer, transfer method of the same, and substrate structure with the same bonded thereto |
| CN200910211516XA CN101740697B (zh) | 2008-11-04 | 2009-11-04 | 氮化镓系化合物半导体层的形成和转移方法及基板结构 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2008282794A JP5132524B2 (ja) | 2008-11-04 | 2008-11-04 | 窒化ガリウム系化合物半導体層の移設方法、及び窒化ガリウム系化合物半導体層が接合された基板 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2010114112A JP2010114112A (ja) | 2010-05-20 |
| JP2010114112A5 true JP2010114112A5 (enExample) | 2011-12-22 |
| JP5132524B2 JP5132524B2 (ja) | 2013-01-30 |
Family
ID=41479123
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2008282794A Expired - Fee Related JP5132524B2 (ja) | 2008-11-04 | 2008-11-04 | 窒化ガリウム系化合物半導体層の移設方法、及び窒化ガリウム系化合物半導体層が接合された基板 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US8053335B2 (enExample) |
| EP (1) | EP2182547A2 (enExample) |
| JP (1) | JP5132524B2 (enExample) |
| KR (1) | KR101200804B1 (enExample) |
| CN (1) | CN101740697B (enExample) |
Families Citing this family (24)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8860183B2 (en) | 2009-06-10 | 2014-10-14 | Seoul Viosys Co., Ltd. | Semiconductor substrate, semiconductor device, and manufacturing methods thereof |
| US8481411B2 (en) * | 2009-06-10 | 2013-07-09 | Seoul Opto Device Co., Ltd. | Method of manufacturing a semiconductor substrate having a cavity |
| EP2579338B1 (en) * | 2010-05-31 | 2019-08-07 | Nichia Corporation | Light-emitting device and manufacturing method therefor |
| KR101702943B1 (ko) * | 2010-10-29 | 2017-02-22 | 엘지이노텍 주식회사 | 발광소자의 제조방법 |
| CN102468318B (zh) * | 2010-11-04 | 2014-12-24 | 上海蓝光科技有限公司 | 一种高压直流发光二极管芯片结构及其制造方法 |
| US8841207B2 (en) | 2011-04-08 | 2014-09-23 | Lux Material Co., Ltd. | Reusable substrates for electronic device fabrication and methods thereof |
| US9306117B2 (en) | 2011-07-25 | 2016-04-05 | Industrial Technology Research Institute | Transfer-bonding method for light emitting devices |
| CN103378236B (zh) * | 2012-04-25 | 2017-04-05 | 清华大学 | 具有微构造的外延结构体 |
| US9196606B2 (en) | 2013-01-09 | 2015-11-24 | Nthdegree Technologies Worldwide Inc. | Bonding transistor wafer to LED wafer to form active LED modules |
| KR101766704B1 (ko) * | 2013-06-26 | 2017-08-09 | 에피스타 코포레이션 | 발광소자 및 그 제조방법 |
| US10032911B2 (en) | 2013-12-23 | 2018-07-24 | Intel Corporation | Wide band gap transistor on non-native semiconductor substrate |
| WO2015099688A1 (en) * | 2013-12-23 | 2015-07-02 | Intel Corporation | Wide band gap transistors on non-native semiconductor substrates and methods of manufacture thereof |
| KR101574267B1 (ko) | 2013-12-23 | 2015-12-04 | 주식회사 글로벌식스 | 반도체 발광소자용 지지 기판 및 이를 이용하는 반도체 발광소자를 제조하는 방법 |
| KR102139681B1 (ko) | 2014-01-29 | 2020-07-30 | 휴렛-팩커드 디벨롭먼트 컴퍼니, 엘.피. | 발광소자 어레이 모듈 및 발광소자 어레이 칩들을 제어하는 방법 |
| US9508545B2 (en) | 2015-02-09 | 2016-11-29 | Applied Materials, Inc. | Selectively lateral growth of silicon oxide thin film |
| CN108368640A (zh) * | 2015-05-21 | 2018-08-03 | Ev 集团 E·索尔纳有限责任公司 | 用于将过生长层施加至晶种层上的方法 |
| KR101787435B1 (ko) * | 2016-02-29 | 2017-10-19 | 피에스아이 주식회사 | 나노 로드 제조방법 |
| US10797027B2 (en) * | 2017-12-05 | 2020-10-06 | Seoul Semiconductor Co., Ltd. | Displaying apparatus having light emitting device, method of manufacturing the same and method of transferring light emitting device |
| US11749790B2 (en) * | 2017-12-20 | 2023-09-05 | Lumileds Llc | Segmented LED with embedded transistors |
| WO2020076452A1 (en) | 2018-10-10 | 2020-04-16 | Glo Ab | Vertical stacks of light emitting diodes and control transistors and method of making thereof |
| JP7276221B2 (ja) * | 2020-03-25 | 2023-05-18 | 信越半導体株式会社 | 接合ウェーハの製造方法及び接合ウェーハ |
| US11552710B2 (en) * | 2020-08-17 | 2023-01-10 | Acacia Communications, Inc. | Resistivity engineered substrate for RF common-mode suppression |
| JP7699925B2 (ja) * | 2020-12-18 | 2025-06-30 | キヤノン株式会社 | 画像形成装置 |
| JP7508697B2 (ja) * | 2021-03-31 | 2024-07-01 | 株式会社ジャパンディスプレイ | 表示装置 |
Family Cites Families (19)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5334277A (en) | 1990-10-25 | 1994-08-02 | Nichia Kagaky Kogyo K.K. | Method of vapor-growing semiconductor crystal and apparatus for vapor-growing the same |
| US5433169A (en) | 1990-10-25 | 1995-07-18 | Nichia Chemical Industries, Ltd. | Method of depositing a gallium nitride-based III-V group compound semiconductor crystal layer |
| JP2628404B2 (ja) | 1990-10-25 | 1997-07-09 | 日亜化学工業株式会社 | 半導体結晶膜の成長方法 |
| US6071795A (en) | 1998-01-23 | 2000-06-06 | The Regents Of The University Of California | Separation of thin films from transparent substrates by selective optical processing |
| JP3510479B2 (ja) * | 1998-04-27 | 2004-03-29 | シャープ株式会社 | 光入出力素子アレイ装置の製造法 |
| JP2002270516A (ja) * | 2001-03-07 | 2002-09-20 | Nec Corp | Iii族窒化物半導体の成長方法、iii族窒化物半導体膜およびそれを用いた半導体素子 |
| JP2003077940A (ja) * | 2001-09-06 | 2003-03-14 | Sony Corp | 素子の転写方法及びこれを用いた素子の配列方法、画像表示装置の製造方法 |
| US7498608B2 (en) * | 2001-10-29 | 2009-03-03 | Sharp Kabushiki Kaisha | Nitride-composite semiconductor laser element, its manufacturing method, and semiconductor optical device |
| CN1242091C (zh) * | 2002-12-20 | 2006-02-15 | 上海北大蓝光科技有限公司 | Mocvd生长氮化物发光二极管结构外延片的方法 |
| JP4056481B2 (ja) * | 2003-02-07 | 2008-03-05 | 三洋電機株式会社 | 半導体素子およびその製造方法 |
| TWI328837B (en) * | 2003-02-28 | 2010-08-11 | Semiconductor Energy Lab | Semiconductor device and method of manufacturing the same |
| US6986693B2 (en) * | 2003-03-26 | 2006-01-17 | Lucent Technologies Inc. | Group III-nitride layers with patterned surfaces |
| WO2005076358A1 (en) * | 2004-02-06 | 2005-08-18 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing thin film integrated circuit, and element substrate |
| JP2006156802A (ja) * | 2004-11-30 | 2006-06-15 | Showa Denko Kk | Iii族窒化物半導体素子 |
| JP4848638B2 (ja) * | 2005-01-13 | 2011-12-28 | ソニー株式会社 | 半導体素子の形成方法および半導体素子のマウント方法 |
| JP2006222402A (ja) | 2005-02-14 | 2006-08-24 | Toshiba Ceramics Co Ltd | 窒化ガリウム系化合物半導体および製造方法 |
| JP4462249B2 (ja) * | 2005-09-22 | 2010-05-12 | ソニー株式会社 | 発光ダイオードの製造方法、集積型発光ダイオードの製造方法および窒化物系iii−v族化合物半導体の成長方法 |
| JP4910608B2 (ja) * | 2006-10-02 | 2012-04-04 | ソニー株式会社 | 発光ダイオードの製造方法および電子装置の製造方法 |
| JP5171016B2 (ja) * | 2006-10-27 | 2013-03-27 | キヤノン株式会社 | 半導体部材、半導体物品の製造方法、その製造方法を用いたledアレイ |
-
2008
- 2008-11-04 JP JP2008282794A patent/JP5132524B2/ja not_active Expired - Fee Related
-
2009
- 2009-10-29 EP EP09013630A patent/EP2182547A2/en not_active Withdrawn
- 2009-11-02 KR KR1020090104802A patent/KR101200804B1/ko not_active Expired - Fee Related
- 2009-11-03 US US12/611,791 patent/US8053335B2/en not_active Expired - Fee Related
- 2009-11-04 CN CN200910211516XA patent/CN101740697B/zh not_active Expired - Fee Related
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