JP2010032347A5 - - Google Patents

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Publication number
JP2010032347A5
JP2010032347A5 JP2008194487A JP2008194487A JP2010032347A5 JP 2010032347 A5 JP2010032347 A5 JP 2010032347A5 JP 2008194487 A JP2008194487 A JP 2008194487A JP 2008194487 A JP2008194487 A JP 2008194487A JP 2010032347 A5 JP2010032347 A5 JP 2010032347A5
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JP
Japan
Prior art keywords
error correction
signals
phase
coefficient
unit
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JP2008194487A
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English (en)
Japanese (ja)
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JP2010032347A (ja
JP5178374B2 (ja
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Priority claimed from JP2008194487A external-priority patent/JP5178374B2/ja
Priority to JP2008194487A priority Critical patent/JP5178374B2/ja
Priority to KR1020090067134A priority patent/KR100991401B1/ko
Priority to TW098125179A priority patent/TWI438408B/zh
Priority to US12/510,839 priority patent/US8307264B2/en
Priority to EP09166770.9A priority patent/EP2154487A3/en
Priority to CN2009101655372A priority patent/CN101639369B/zh
Publication of JP2010032347A publication Critical patent/JP2010032347A/ja
Publication of JP2010032347A5 publication Critical patent/JP2010032347A5/ja
Publication of JP5178374B2 publication Critical patent/JP5178374B2/ja
Application granted granted Critical
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2008194487A 2008-07-29 2008-07-29 検出装置 Expired - Fee Related JP5178374B2 (ja)

Priority Applications (6)

Application Number Priority Date Filing Date Title
JP2008194487A JP5178374B2 (ja) 2008-07-29 2008-07-29 検出装置
KR1020090067134A KR100991401B1 (ko) 2008-07-29 2009-07-23 검출장치
TW098125179A TWI438408B (zh) 2008-07-29 2009-07-27 偵測裝置
US12/510,839 US8307264B2 (en) 2008-07-29 2009-07-28 Detection apparatus
EP09166770.9A EP2154487A3 (en) 2008-07-29 2009-07-29 Detection apparatus
CN2009101655372A CN101639369B (zh) 2008-07-29 2009-07-29 检测装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2008194487A JP5178374B2 (ja) 2008-07-29 2008-07-29 検出装置

Publications (3)

Publication Number Publication Date
JP2010032347A JP2010032347A (ja) 2010-02-12
JP2010032347A5 true JP2010032347A5 (enExample) 2011-09-15
JP5178374B2 JP5178374B2 (ja) 2013-04-10

Family

ID=41319713

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2008194487A Expired - Fee Related JP5178374B2 (ja) 2008-07-29 2008-07-29 検出装置

Country Status (6)

Country Link
US (1) US8307264B2 (enExample)
EP (1) EP2154487A3 (enExample)
JP (1) JP5178374B2 (enExample)
KR (1) KR100991401B1 (enExample)
CN (1) CN101639369B (enExample)
TW (1) TWI438408B (enExample)

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JP5327656B2 (ja) * 2011-07-13 2013-10-30 株式会社デンソー 物理量検出装置、および物理量検出装置の検査方法
JP5932285B2 (ja) * 2011-10-14 2016-06-08 キヤノン株式会社 エンコーダおよびこれを備えた装置
EP2615424B1 (en) * 2012-01-13 2014-01-08 SICK STEGMANN GmbH Method for supervising the correct function of a periodically modulated sensor controlling the position of a rotating system and controller device for performing this method
JP6215527B2 (ja) * 2012-02-02 2017-10-18 旭化成エレクトロニクス株式会社 物理量計測装置及び物理量計測方法
EP2674729B1 (en) * 2012-06-15 2016-07-13 SICK STEGMANN GmbH Position encoder
KR101335162B1 (ko) * 2012-11-19 2013-12-02 한밭대학교 산학협력단 레졸버를 위한 위치 오차 보정 장치 및 보정 방법
CN102944258A (zh) * 2012-11-26 2013-02-27 中国科学院长春光学精密机械与物理研究所 高精度编码器光电信号细分误差的检测方法
JP5341267B1 (ja) * 2013-01-11 2013-11-13 捷利 壬生 変位量検出装置、およびその誤差・検出・評価方法
DE102015215510A1 (de) * 2014-08-14 2016-02-18 Continental Automotive Gmbh Verfahren zum Ermitteln eines Orthogonalitätsfehlers zwischen zwei Sensorsignalen
DE102017216536B4 (de) * 2017-09-19 2023-07-06 Vitesco Technologies GmbH Verfahren zur Kompensation von Störungen eines gemessenen Winkelsignals eines magnetischen Winkelsensors einer elektrischen Maschine und ein entsprechend ausgebildeter Mikrokontroller, eine elektrische Maschine, sowie ein Computerprogrammprodukt
SE542950C2 (en) * 2018-02-01 2020-09-22 Leine & Linde Ab Methods, computer programs, devices and encoders for signal error correction
CN110362365B (zh) * 2018-03-26 2024-02-13 吕纪竹 一种实时预测流数据变化趋势的方法
JP7246892B2 (ja) * 2018-10-29 2023-03-28 キヤノン株式会社 位置検出装置、レンズ装置、位置検出方法、および、プログラム
CN109855667B (zh) * 2018-12-21 2022-02-22 金卡智能集团股份有限公司 一种适用于不同表具的误差校准方法
CN110389745B (zh) * 2019-05-15 2023-10-13 广东工业大学 一种基于基尼回归的信号检测与估计电路及方法
CN110426071A (zh) * 2019-08-30 2019-11-08 新代科技(苏州)有限公司 旋转编码器精度估测装置及应用其的估测方法
JP2022179101A (ja) * 2021-05-21 2022-12-02 ミネベアミツミ株式会社 アブソリュートエンコーダ、アブソリュートエンコーダの角度誤差補正装置、及び、アブソリュートエンコーダの角度誤差補正方法

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JPH0643892B2 (ja) 1984-02-15 1994-06-08 旭光学工業株式会社 測角誤差の補正装置
JP2790863B2 (ja) * 1989-08-10 1998-08-27 三菱化学株式会社 信号校正装置
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JP4768248B2 (ja) * 2004-10-13 2011-09-07 株式会社ミツトヨ エンコーダ出力信号補正装置及び方法
JP4713123B2 (ja) * 2004-10-13 2011-06-29 株式会社ミツトヨ エンコーダ出力信号補正装置
KR20070054735A (ko) * 2004-10-20 2007-05-29 가부시키가이샤 야스카와덴키 인코더 신호 처리 장치 및 그 신호 처리 방법
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