JP2009543267A5 - - Google Patents
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- Publication number
- JP2009543267A5 JP2009543267A5 JP2009518412A JP2009518412A JP2009543267A5 JP 2009543267 A5 JP2009543267 A5 JP 2009543267A5 JP 2009518412 A JP2009518412 A JP 2009518412A JP 2009518412 A JP2009518412 A JP 2009518412A JP 2009543267 A5 JP2009543267 A5 JP 2009543267A5
- Authority
- JP
- Japan
- Prior art keywords
- power supply
- supply voltage
- memory cells
- node
- coupled
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000000034 method Methods 0.000 claims 4
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US11/427,610 | 2006-06-29 | ||
| US11/427,610 US7292495B1 (en) | 2006-06-29 | 2006-06-29 | Integrated circuit having a memory with low voltage read/write operation |
| PCT/US2007/066908 WO2008002713A2 (en) | 2006-06-29 | 2007-04-19 | Integrated circuit having a memory with low voltage read/write operation |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2012274485A Division JP5598876B2 (ja) | 2006-06-29 | 2012-12-17 | 低電圧で読出/書込動作を行うメモリを有する集積回路 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2009543267A JP2009543267A (ja) | 2009-12-03 |
| JP2009543267A5 true JP2009543267A5 (enExample) | 2010-06-03 |
| JP5164276B2 JP5164276B2 (ja) | 2013-03-21 |
Family
ID=38653441
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2009518412A Active JP5164276B2 (ja) | 2006-06-29 | 2007-04-19 | 低電圧で読出/書込動作を行うメモリを有する集積回路 |
| JP2012274485A Active JP5598876B2 (ja) | 2006-06-29 | 2012-12-17 | 低電圧で読出/書込動作を行うメモリを有する集積回路 |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2012274485A Active JP5598876B2 (ja) | 2006-06-29 | 2012-12-17 | 低電圧で読出/書込動作を行うメモリを有する集積回路 |
Country Status (5)
| Country | Link |
|---|---|
| US (2) | US7292495B1 (enExample) |
| JP (2) | JP5164276B2 (enExample) |
| CN (2) | CN101479803B (enExample) |
| TW (1) | TW200809870A (enExample) |
| WO (1) | WO2008002713A2 (enExample) |
Families Citing this family (37)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7436696B2 (en) * | 2006-04-28 | 2008-10-14 | Taiwan Semiconductor Manufacturing Company, Ltd. | Read-preferred SRAM cell design |
| US7793172B2 (en) * | 2006-09-28 | 2010-09-07 | Freescale Semiconductor, Inc. | Controlled reliability in an integrated circuit |
| US7688656B2 (en) * | 2007-10-22 | 2010-03-30 | Freescale Semiconductor, Inc. | Integrated circuit memory having dynamically adjustable read margin and method therefor |
| US7760576B2 (en) * | 2007-11-08 | 2010-07-20 | Qualcomm Incorporated | Systems and methods for low power, high yield memory |
| US8264896B2 (en) * | 2008-07-31 | 2012-09-11 | Freescale Semiconductor, Inc. | Integrated circuit having an array supply voltage control circuit |
| US7859919B2 (en) * | 2008-08-27 | 2010-12-28 | Freescale Semiconductor, Inc. | Memory device and method thereof |
| US7903483B2 (en) * | 2008-11-21 | 2011-03-08 | Freescale Semiconductor, Inc. | Integrated circuit having memory with configurable read/write operations and method therefor |
| US8134874B2 (en) | 2009-01-16 | 2012-03-13 | Apple Inc. | Dynamic leakage control for memory arrays |
| JP5575405B2 (ja) * | 2009-01-22 | 2014-08-20 | ピーエスフォー ルクスコ エスエイアールエル | 半導体装置 |
| US20100283445A1 (en) * | 2009-02-18 | 2010-11-11 | Freescale Semiconductor, Inc. | Integrated circuit having low power mode voltage regulator |
| US8319548B2 (en) * | 2009-02-18 | 2012-11-27 | Freescale Semiconductor, Inc. | Integrated circuit having low power mode voltage regulator |
| US7864617B2 (en) * | 2009-02-19 | 2011-01-04 | Freescale Semiconductor, Inc. | Memory with reduced power supply voltage for a write operation |
| JP2010225208A (ja) * | 2009-03-19 | 2010-10-07 | Toshiba Corp | 半導体集積回路 |
| US8315117B2 (en) * | 2009-03-31 | 2012-11-20 | Freescale Semiconductor, Inc. | Integrated circuit memory having assisted access and method therefor |
| US8379466B2 (en) | 2009-03-31 | 2013-02-19 | Freescale Semiconductor, Inc. | Integrated circuit having an embedded memory and method for testing the memory |
| US7817490B1 (en) * | 2009-04-14 | 2010-10-19 | Texas Instruments Incorporated | Low-power operation of static memory in a read-only mode |
| US8634263B2 (en) * | 2009-04-30 | 2014-01-21 | Freescale Semiconductor, Inc. | Integrated circuit having memory repair information storage and method therefor |
| US8059482B2 (en) * | 2009-06-19 | 2011-11-15 | Freescale Semiconductor, Inc. | Memory using multiple supply voltages |
| US8045402B2 (en) * | 2009-06-29 | 2011-10-25 | Arm Limited | Assisting write operations to data storage cells |
| US8400819B2 (en) * | 2010-02-26 | 2013-03-19 | Freescale Semiconductor, Inc. | Integrated circuit having variable memory array power supply voltage |
| US9875788B2 (en) * | 2010-03-25 | 2018-01-23 | Qualcomm Incorporated | Low-power 5T SRAM with improved stability and reduced bitcell size |
| US8514611B2 (en) * | 2010-08-04 | 2013-08-20 | Freescale Semiconductor, Inc. | Memory with low voltage mode operation |
| US8345469B2 (en) | 2010-09-16 | 2013-01-01 | Freescale Semiconductor, Inc. | Static random access memory (SRAM) having bit cells accessible by separate read and write paths |
| US20120119824A1 (en) * | 2010-11-16 | 2012-05-17 | Texas Instruments Incorporated | Bias voltage source |
| US9035629B2 (en) | 2011-04-29 | 2015-05-19 | Freescale Semiconductor, Inc. | Voltage regulator with different inverting gain stages |
| US9299395B2 (en) * | 2012-03-26 | 2016-03-29 | Intel Corporation | Methods and systems to selectively boost an operating voltage of, and controls to an 8T bit-cell array and/or other logic blocks |
| US9460778B2 (en) * | 2013-08-15 | 2016-10-04 | Samsung Electronics Co., Ltd. | Static random access memory with bitline boost |
| US9286971B1 (en) * | 2014-09-10 | 2016-03-15 | Apple Inc. | Method and circuits for low latency initialization of static random access memory |
| US9990022B2 (en) | 2016-06-30 | 2018-06-05 | Qualcomm Incorporated | Adaptive power multiplexing with a power distribution network |
| US9940996B1 (en) * | 2017-03-01 | 2018-04-10 | Nxp Usa, Inc. | Memory circuit having increased write margin and method therefor |
| US9934846B1 (en) | 2017-03-01 | 2018-04-03 | Nxp Usa, Inc. | Memory circuit and method for increased write margin |
| US10691195B2 (en) * | 2018-02-28 | 2020-06-23 | Qualcomm Incorporated | Selective coupling of memory to voltage rails based on operating mode of processor |
| US11069424B2 (en) * | 2018-11-07 | 2021-07-20 | Arm Limited | Sensor for performance variation of memory read and write characteristics |
| US11488658B2 (en) | 2020-04-29 | 2022-11-01 | Qualcomm Incorporated | Write assist scheme with bitline |
| TWI768939B (zh) * | 2021-05-31 | 2022-06-21 | 力晶積成電子製造股份有限公司 | 記憶體裝置 |
| US12354644B2 (en) * | 2021-07-09 | 2025-07-08 | Stmicroelectronics International N.V. | Adaptive word line underdrive control for an in-memory compute operation where simultaneous access is made to plural rows of a static random access memory (SRAM) |
| US20230013651A1 (en) * | 2021-07-16 | 2023-01-19 | Taiwan Semiconductor Manufacturing Co., Ltd. | Static random access memory cell power supply |
Family Cites Families (40)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5564686A (en) * | 1978-11-08 | 1980-05-15 | Nec Corp | Memory unit |
| JPS58211391A (ja) * | 1982-05-31 | 1983-12-08 | Toshiba Corp | 半導体記憶装置 |
| US5657332A (en) * | 1992-05-20 | 1997-08-12 | Sandisk Corporation | Soft errors handling in EEPROM devices |
| US5436513A (en) * | 1992-12-09 | 1995-07-25 | Texas Instruments Incorporated | Method and apparatus for providing energy to an information handling system |
| US5420798A (en) * | 1993-09-30 | 1995-05-30 | Macronix International Co., Ltd. | Supply voltage detection circuit |
| US5396469A (en) * | 1994-03-31 | 1995-03-07 | Hewlett-Packard Company | SRAM memory requiring reduced voltage swing during write |
| TW318932B (enExample) * | 1995-12-28 | 1997-11-01 | Hitachi Ltd | |
| US6628552B1 (en) * | 1997-04-11 | 2003-09-30 | Intel Corporation | Self-configuring input buffer on flash memories |
| US6370057B1 (en) * | 1999-02-24 | 2002-04-09 | Kabushiki Kaisha Toshiba | Semiconductor memory device having plate lines and precharge circuits |
| JP2000164813A (ja) * | 1998-11-30 | 2000-06-16 | Matsushita Electric Ind Co Ltd | 半導体集積回路 |
| US6275058B1 (en) * | 1999-01-26 | 2001-08-14 | Micron Technology, Inc. | Method and apparatus for properly disabling high current parts in a parallel test environment |
| US6687175B1 (en) * | 2000-02-04 | 2004-02-03 | Renesas Technology Corporation | Semiconductor device |
| JP3874234B2 (ja) * | 2000-04-06 | 2007-01-31 | 株式会社ルネサステクノロジ | 半導体集積回路装置 |
| JP2002197867A (ja) * | 2000-12-28 | 2002-07-12 | Nec Corp | 半導体装置 |
| US6580653B2 (en) * | 2001-02-19 | 2003-06-17 | Ricoh Company Ltd. | Current saving semiconductor memory and method |
| US6563736B2 (en) * | 2001-05-18 | 2003-05-13 | Ibm Corporation | Flash memory structure having double celled elements and method for fabricating the same |
| JP4353393B2 (ja) * | 2001-06-05 | 2009-10-28 | 株式会社ルネサステクノロジ | 半導体集積回路装置 |
| JP2002368135A (ja) | 2001-06-12 | 2002-12-20 | Hitachi Ltd | 半導体記憶装置 |
| JP3818873B2 (ja) * | 2001-06-26 | 2006-09-06 | シャープ株式会社 | 不揮発性半導体記憶装置 |
| JP4895439B2 (ja) * | 2001-06-28 | 2012-03-14 | ルネサスエレクトロニクス株式会社 | スタティック型メモリ |
| US6549453B2 (en) * | 2001-06-29 | 2003-04-15 | International Business Machines Corporation | Method and apparatus for writing operation in SRAM cells employing PFETS pass gates |
| US6597620B1 (en) | 2001-07-18 | 2003-07-22 | Advanced Micro Devices, Inc. | Storage circuit with data retention during power down |
| JP2003059273A (ja) * | 2001-08-09 | 2003-02-28 | Hitachi Ltd | 半導体記憶装置 |
| JP2003123479A (ja) * | 2001-10-12 | 2003-04-25 | Matsushita Electric Ind Co Ltd | 半導体記憶装置 |
| US6809538B1 (en) * | 2001-10-31 | 2004-10-26 | Intel Corporation | Active cooling to reduce leakage power |
| JP2003157689A (ja) * | 2001-11-20 | 2003-05-30 | Hitachi Ltd | 半導体装置及びデータプロセッサ |
| US6650589B2 (en) * | 2001-11-29 | 2003-11-18 | Intel Corporation | Low voltage operation of static random access memory |
| KR100423894B1 (ko) * | 2002-05-09 | 2004-03-22 | 삼성전자주식회사 | 저전압 반도체 메모리 장치 |
| JP4439167B2 (ja) * | 2002-08-30 | 2010-03-24 | 株式会社ルネサステクノロジ | 半導体記憶装置 |
| US6791864B2 (en) | 2003-01-06 | 2004-09-14 | Texas Instruments Incorporated | Column voltage control for write |
| JP2004241021A (ja) * | 2003-02-04 | 2004-08-26 | Fujitsu Ltd | 記憶装置およびリーク電流低減方法 |
| JP3906166B2 (ja) * | 2003-02-25 | 2007-04-18 | 株式会社東芝 | 半導体記憶装置 |
| US6839281B2 (en) * | 2003-04-14 | 2005-01-04 | Jian Chen | Read and erase verify methods and circuits suitable for low voltage non-volatile memories |
| JP2005025907A (ja) * | 2003-07-03 | 2005-01-27 | Hitachi Ltd | 半導体集積回路装置 |
| US7594135B2 (en) * | 2003-12-31 | 2009-09-22 | Sandisk Corporation | Flash memory system startup operation |
| US7280334B2 (en) * | 2004-06-29 | 2007-10-09 | Intel Corporation | Integrated processor/motherboard short detect and safeguard mechanism |
| US7110298B2 (en) * | 2004-07-20 | 2006-09-19 | Sandisk Corporation | Non-volatile system with program time control |
| JP4553185B2 (ja) * | 2004-09-15 | 2010-09-29 | ルネサスエレクトロニクス株式会社 | 半導体集積回路装置 |
| KR100622892B1 (ko) * | 2004-12-09 | 2006-09-19 | 엘지전자 주식회사 | 저 전력소비형 이동통신 단말기 |
| JP4917767B2 (ja) * | 2005-07-01 | 2012-04-18 | パナソニック株式会社 | 半導体記憶装置 |
-
2006
- 2006-06-29 US US11/427,610 patent/US7292495B1/en active Active
-
2007
- 2007-04-19 CN CN200780024544XA patent/CN101479803B/zh active Active
- 2007-04-19 WO PCT/US2007/066908 patent/WO2008002713A2/en not_active Ceased
- 2007-04-19 CN CN201110328909.6A patent/CN102394100B/zh active Active
- 2007-04-19 JP JP2009518412A patent/JP5164276B2/ja active Active
- 2007-04-23 TW TW096114177A patent/TW200809870A/zh unknown
- 2007-09-28 US US11/863,961 patent/US7542369B2/en active Active
-
2012
- 2012-12-17 JP JP2012274485A patent/JP5598876B2/ja active Active
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