JP2009533844A5 - - Google Patents
Download PDFInfo
- Publication number
- JP2009533844A5 JP2009533844A5 JP2009504308A JP2009504308A JP2009533844A5 JP 2009533844 A5 JP2009533844 A5 JP 2009533844A5 JP 2009504308 A JP2009504308 A JP 2009504308A JP 2009504308 A JP2009504308 A JP 2009504308A JP 2009533844 A5 JP2009533844 A5 JP 2009533844A5
- Authority
- JP
- Japan
- Prior art keywords
- processing chamber
- substrate
- forming
- chamber
- epitaxial layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US79006606P | 2006-04-07 | 2006-04-07 | |
| US60/790,066 | 2006-04-07 | ||
| PCT/US2007/008549 WO2007117583A2 (en) | 2006-04-07 | 2007-04-06 | Cluster tool for epitaxial film formation |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2012243584A Division JP5661083B2 (ja) | 2006-04-07 | 2012-11-05 | エピタキシャル膜を形成する方法、及び、エピタキシャル膜の形成に使用するためのクラスターツール |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2009533844A JP2009533844A (ja) | 2009-09-17 |
| JP2009533844A5 true JP2009533844A5 (enExample) | 2010-05-06 |
| JP5317956B2 JP5317956B2 (ja) | 2013-10-16 |
Family
ID=38581637
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2009504308A Active JP5317956B2 (ja) | 2006-04-07 | 2007-04-06 | エピタキシャル膜を形成する方法、及び、エピタキシャル膜の形成に使用するためのクラスターツール |
| JP2012243584A Active JP5661083B2 (ja) | 2006-04-07 | 2012-11-05 | エピタキシャル膜を形成する方法、及び、エピタキシャル膜の形成に使用するためのクラスターツール |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2012243584A Active JP5661083B2 (ja) | 2006-04-07 | 2012-11-05 | エピタキシャル膜を形成する方法、及び、エピタキシャル膜の形成に使用するためのクラスターツール |
Country Status (6)
| Country | Link |
|---|---|
| US (2) | US20070286956A1 (enExample) |
| JP (2) | JP5317956B2 (enExample) |
| KR (1) | KR101074186B1 (enExample) |
| CN (1) | CN101415865B (enExample) |
| TW (1) | TWI446409B (enExample) |
| WO (1) | WO2007117583A2 (enExample) |
Families Citing this family (24)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7682940B2 (en) | 2004-12-01 | 2010-03-23 | Applied Materials, Inc. | Use of Cl2 and/or HCl during silicon epitaxial film formation |
| EP1945836A4 (en) * | 2005-10-05 | 2009-12-02 | Applied Materials Inc | METHOD AND DEVICE FOR FORMING AN EPITACTIC FILM |
| WO2007112058A2 (en) * | 2006-03-24 | 2007-10-04 | Applied Materials, Inc. | Carbon precursors for use during silicon epitaxial firm formation |
| US7674337B2 (en) | 2006-04-07 | 2010-03-09 | Applied Materials, Inc. | Gas manifolds for use during epitaxial film formation |
| DE112007001813T5 (de) | 2006-07-31 | 2009-07-09 | Applied Materials, Inc., Santa Clara | Verfahren zum Steuern der Morphologie während der Bildung einer epitaktischen Schicht |
| US8029620B2 (en) | 2006-07-31 | 2011-10-04 | Applied Materials, Inc. | Methods of forming carbon-containing silicon epitaxial layers |
| EP2118334A1 (en) * | 2007-03-02 | 2009-11-18 | Oerlikon Trading AG, Trübbach | Vacuum coating apparatus |
| US20100096569A1 (en) * | 2008-10-21 | 2010-04-22 | Applied Materials, Inc. | Ultraviolet-transmitting microwave reflector comprising a micromesh screen |
| US7964858B2 (en) | 2008-10-21 | 2011-06-21 | Applied Materials, Inc. | Ultraviolet reflector with coolant gas holes and method |
| CN101760775A (zh) * | 2009-04-17 | 2010-06-30 | 南安市三晶阳光电力有限公司 | 一种连续液相外延法制备薄膜的方法和装置 |
| FR2973159B1 (fr) * | 2011-03-22 | 2013-04-19 | Soitec Silicon On Insulator | Procede de fabrication d'un substrat de base |
| KR101271248B1 (ko) * | 2011-08-02 | 2013-06-07 | 주식회사 유진테크 | 에피택셜 공정을 위한 반도체 제조설비 |
| KR101271246B1 (ko) * | 2011-08-02 | 2013-06-07 | 주식회사 유진테크 | 에피택셜 공정을 위한 반도체 제조설비 |
| KR101271247B1 (ko) * | 2011-08-02 | 2013-06-07 | 주식회사 유진테크 | 에피택셜 공정을 위한 반도체 제조설비 |
| KR101252742B1 (ko) * | 2011-08-02 | 2013-04-09 | 주식회사 유진테크 | 에피택셜 공정을 위한 반도체 제조설비 |
| WO2013147481A1 (ko) * | 2012-03-28 | 2013-10-03 | 국제엘렉트릭코리아 주식회사 | 선택적 에피택셜 성장을 위한 장치 및 클러스터 설비 |
| CN107574476A (zh) | 2013-08-09 | 2018-01-12 | 应用材料公司 | 于外延生长之前预清洁基板表面的方法和设备 |
| CN108369894B (zh) | 2015-12-04 | 2019-10-15 | 应用材料公司 | 用于清洁ingaas(或iii-v族)基板的方法和解决方案 |
| KR101960763B1 (ko) * | 2016-11-03 | 2019-03-21 | 주식회사 유진테크 | 저온 에피택셜층 형성방법 |
| US20180230624A1 (en) | 2017-02-10 | 2018-08-16 | Applied Materials, Inc. | Method and apparatus for low temperature selective epitaxy in a deep trench |
| CN111033680A (zh) * | 2017-08-30 | 2020-04-17 | 应用材料公司 | 集成式外延系统高温污染物去除 |
| US11081358B2 (en) * | 2018-07-05 | 2021-08-03 | Applied Materials, Inc. | Silicide film nucleation |
| US10861722B2 (en) * | 2018-11-13 | 2020-12-08 | Applied Materials, Inc. | Integrated semiconductor processing |
| US11605544B2 (en) | 2020-09-18 | 2023-03-14 | Applied Materials, Inc. | Methods and systems for cleaning high aspect ratio structures |
Family Cites Families (50)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH02225399A (ja) * | 1988-11-11 | 1990-09-07 | Fujitsu Ltd | エピタキシャル成長方法および成長装置 |
| US5236545A (en) * | 1992-10-05 | 1993-08-17 | The Board Of Governors Of Wayne State University | Method for heteroepitaxial diamond film development |
| JP3255469B2 (ja) * | 1992-11-30 | 2002-02-12 | 三菱電機株式会社 | レーザ薄膜形成装置 |
| US5495822A (en) * | 1993-08-10 | 1996-03-05 | Nippon Telegraph And Telephone Corporation | Method of selectively growing Si epitaxial film |
| KR960026261A (ko) * | 1994-12-14 | 1996-07-22 | 제임스 조셉 드롱 | 재 도입형 콘택 홀을 피복시키거나 또는 충진시키기 위한 방법 및 장치 |
| US5637518A (en) * | 1995-10-16 | 1997-06-10 | Micron Technology, Inc. | Method of making a field effect transistor having an elevated source and an elevated drain |
| US6055927A (en) * | 1997-01-14 | 2000-05-02 | Applied Komatsu Technology, Inc. | Apparatus and method for white powder reduction in silicon nitride deposition using remote plasma source cleaning technology |
| US5849092A (en) * | 1997-02-25 | 1998-12-15 | Applied Materials, Inc. | Process for chlorine trifluoride chamber cleaning |
| US5968279A (en) * | 1997-06-13 | 1999-10-19 | Mattson Technology, Inc. | Method of cleaning wafer substrates |
| JP3298467B2 (ja) * | 1997-07-18 | 2002-07-02 | 信越半導体株式会社 | エピタキシャルウェーハの製造方法 |
| IT1308606B1 (it) * | 1999-02-12 | 2002-01-08 | Lpe Spa | Dispositivo per maneggiare substrati mediante un istema autolivellante a depressione in reattori epistassiali ad induzione con suscettore |
| JP4556329B2 (ja) * | 1999-04-20 | 2010-10-06 | ソニー株式会社 | 薄膜形成装置 |
| JP2001156077A (ja) * | 1999-11-26 | 2001-06-08 | Nec Corp | 半導体装置の製造方法 |
| US20010013313A1 (en) * | 2000-02-10 | 2001-08-16 | Motorola, Inc. | Apparatus for fabricating semiconductor structures and method of forming the structures |
| EP1124252A2 (en) * | 2000-02-10 | 2001-08-16 | Applied Materials, Inc. | Apparatus and process for processing substrates |
| KR100373853B1 (ko) * | 2000-08-11 | 2003-02-26 | 삼성전자주식회사 | 반도체소자의 선택적 에피택시얼 성장 방법 |
| JP2002100762A (ja) * | 2000-09-22 | 2002-04-05 | Mitsubishi Electric Corp | 半導体装置およびその製造方法 |
| US6569257B1 (en) * | 2000-11-09 | 2003-05-27 | Applied Materials Inc. | Method for cleaning a process chamber |
| US6930041B2 (en) * | 2000-12-07 | 2005-08-16 | Micron Technology, Inc. | Photo-assisted method for semiconductor fabrication |
| FR2823010B1 (fr) * | 2001-04-02 | 2003-08-15 | St Microelectronics Sa | Procede de fabrication d'un transistor vertical a grille isolee a quadruple canal de conduction, et circuit integre comportant un tel transistor |
| US6576535B2 (en) * | 2001-04-11 | 2003-06-10 | Texas Instruments Incorporated | Carbon doped epitaxial layer for high speed CB-CMOS |
| KR20020083767A (ko) * | 2001-04-30 | 2002-11-04 | 주식회사 하이닉스반도체 | 선택적 에피택셜 성장 공정에서의 기판 세정 방법 |
| US20030066486A1 (en) * | 2001-08-30 | 2003-04-10 | Applied Materials, Inc. | Microwave heat shield for plasma chamber |
| JP3660897B2 (ja) * | 2001-09-03 | 2005-06-15 | 株式会社ルネサステクノロジ | 半導体装置の製造方法 |
| JP2003096511A (ja) * | 2001-09-20 | 2003-04-03 | Nkk Corp | 高炉操業方法 |
| US7049226B2 (en) * | 2001-09-26 | 2006-05-23 | Applied Materials, Inc. | Integration of ALD tantalum nitride for copper metallization |
| KR20030035152A (ko) * | 2001-10-30 | 2003-05-09 | 주식회사 하이닉스반도체 | 반도체웨이퍼 제조방법 |
| US6590344B2 (en) * | 2001-11-20 | 2003-07-08 | Taiwan Semiconductor Manufacturing Co., Ltd. | Selectively controllable gas feed zones for a plasma reactor |
| US6642151B2 (en) * | 2002-03-06 | 2003-11-04 | Applied Materials, Inc | Techniques for plasma etching silicon-germanium |
| US6716719B2 (en) * | 2002-05-29 | 2004-04-06 | Micron Technology, Inc. | Method of forming biasable isolation regions using epitaxially grown silicon between the isolation regions |
| US20040050326A1 (en) * | 2002-09-12 | 2004-03-18 | Thilderkvist Karin Anna Lena | Apparatus and method for automatically controlling gas flow in a substrate processing system |
| JP4308502B2 (ja) * | 2002-11-15 | 2009-08-05 | 浜松ホトニクス株式会社 | 窒化物薄膜の形成方法及び量子井戸デバイスの製造方法 |
| JP3872027B2 (ja) * | 2003-03-07 | 2007-01-24 | 株式会社東芝 | クリーニング方法及び半導体製造装置 |
| JP2004356298A (ja) * | 2003-05-28 | 2004-12-16 | Toshiba Mach Co Ltd | 気相成長装置 |
| US7166528B2 (en) * | 2003-10-10 | 2007-01-23 | Applied Materials, Inc. | Methods of selective deposition of heavily doped epitaxial SiGe |
| US7132338B2 (en) * | 2003-10-10 | 2006-11-07 | Applied Materials, Inc. | Methods to fabricate MOSFET devices using selective deposition process |
| US7037793B2 (en) * | 2004-02-09 | 2006-05-02 | United Microelectronics Corp. | Method of forming a transistor using selective epitaxial growth |
| JP2005243924A (ja) * | 2004-02-26 | 2005-09-08 | Hitachi Kokusai Electric Inc | 基板処理装置 |
| US7071117B2 (en) * | 2004-02-27 | 2006-07-04 | Micron Technology, Inc. | Semiconductor devices and methods for depositing a dielectric film |
| US7396743B2 (en) * | 2004-06-10 | 2008-07-08 | Singh Kaushal K | Low temperature epitaxial growth of silicon-containing films using UV radiation |
| JP4369824B2 (ja) * | 2004-08-11 | 2009-11-25 | エア・ウォーター株式会社 | 成膜方法および装置 |
| US7682940B2 (en) * | 2004-12-01 | 2010-03-23 | Applied Materials, Inc. | Use of Cl2 and/or HCl during silicon epitaxial film formation |
| US7312128B2 (en) * | 2004-12-01 | 2007-12-25 | Applied Materials, Inc. | Selective epitaxy process with alternating gas supply |
| US7235492B2 (en) * | 2005-01-31 | 2007-06-26 | Applied Materials, Inc. | Low temperature etchant for treatment of silicon-containing surfaces |
| US7438760B2 (en) * | 2005-02-04 | 2008-10-21 | Asm America, Inc. | Methods of making substitutionally carbon-doped crystalline Si-containing materials by chemical vapor deposition |
| US7678712B2 (en) * | 2005-03-22 | 2010-03-16 | Honeywell International, Inc. | Vapor phase treatment of dielectric materials |
| EP1945836A4 (en) * | 2005-10-05 | 2009-12-02 | Applied Materials Inc | METHOD AND DEVICE FOR FORMING AN EPITACTIC FILM |
| US20070181420A1 (en) * | 2006-02-07 | 2007-08-09 | Ming-Tung Wang | Wafer stage having an encapsulated central pedestal plate |
| US7674337B2 (en) * | 2006-04-07 | 2010-03-09 | Applied Materials, Inc. | Gas manifolds for use during epitaxial film formation |
| DE112007001813T5 (de) * | 2006-07-31 | 2009-07-09 | Applied Materials, Inc., Santa Clara | Verfahren zum Steuern der Morphologie während der Bildung einer epitaktischen Schicht |
-
2007
- 2007-04-06 KR KR1020087027246A patent/KR101074186B1/ko active Active
- 2007-04-06 WO PCT/US2007/008549 patent/WO2007117583A2/en not_active Ceased
- 2007-04-06 US US11/697,523 patent/US20070286956A1/en not_active Abandoned
- 2007-04-06 CN CN200780012517.0A patent/CN101415865B/zh not_active Expired - Fee Related
- 2007-04-06 JP JP2009504308A patent/JP5317956B2/ja active Active
- 2007-04-09 TW TW096112382A patent/TWI446409B/zh active
-
2011
- 2011-08-09 US US13/206,088 patent/US20110290176A1/en not_active Abandoned
-
2012
- 2012-11-05 JP JP2012243584A patent/JP5661083B2/ja active Active
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP2009533844A5 (enExample) | ||
| WO2007149945A3 (en) | Methods and apparatus for depositing a microcrystalline silicon film for photovoltaic device | |
| TW200741823A (en) | Semiconductor device manufacturing method and substrate processing apparatus | |
| WO2007117583A3 (en) | Cluster tool for epitaxial film formation | |
| JP2010527514A5 (enExample) | ||
| TW200729343A (en) | Method for fabricating controlled stress silicon nitride films | |
| TW200705551A (en) | Method for forming a high density dielectric film by chemical vapor deposition | |
| TW200710968A (en) | Method for depositing tungsten film, film deposition system, storage medium, and semiconductor device | |
| JP2012531045A5 (enExample) | ||
| WO2009059128A3 (en) | Crystalline-thin-film photovoltaic structures and methods for forming the same | |
| WO2005036593A3 (en) | Deposition of silicon-containing films from hexachlorodisilane | |
| WO2008042981A3 (en) | Ald of metal silicate films | |
| WO2011126612A3 (en) | Nitrogen doped amorphous carbon hardmask | |
| WO2011017339A3 (en) | Methods of selectively depositing an epitaxial layer | |
| TW200604093A (en) | Silicon nitride film with stress control | |
| TW200603275A (en) | Semiconductor device and fabrication method thereof | |
| WO2009060320A3 (en) | Method for integrating selective ruthenium deposition into manufacturing of a semiconductior device | |
| WO2006107532A3 (en) | Single wafer thermal cvd processes for hemispherical grained silicon and nano-crystalline grain-sized polysilicon | |
| WO2007149761A3 (en) | Methods to improve the in-film defectivity of pecvd amorphous carbon films | |
| WO2008127220A3 (en) | Methods for in-situ generation of reactive etch and growth specie in film formation processes | |
| TW200634976A (en) | Method for forming a multiple layer passivation film and a device incorporating the same | |
| JP2006524439A5 (enExample) | ||
| JP2009111350A5 (enExample) | ||
| TW200729303A (en) | Method for manufacturing semiconductor device | |
| WO2010102089A3 (en) | Methods for depositing layers having reduced interfacial contamination |