JP2009503495A - マイクロカラムを用いた微細パターンおよび形状検査装置 - Google Patents
マイクロカラムを用いた微細パターンおよび形状検査装置 Download PDFInfo
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- JP2009503495A JP2009503495A JP2008523810A JP2008523810A JP2009503495A JP 2009503495 A JP2009503495 A JP 2009503495A JP 2008523810 A JP2008523810 A JP 2008523810A JP 2008523810 A JP2008523810 A JP 2008523810A JP 2009503495 A JP2009503495 A JP 2009503495A
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- microcolumn
- inspection
- sample
- inspection apparatus
- repair
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1303—Apparatus specially adapted to the manufacture of LCDs
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
- H01J37/28—Electron or ion microscopes; Electron or ion diffraction tubes with scanning beams
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
- G02F1/136254—Checking; Testing
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F2203/00—Function characteristic
- G02F2203/69—Arrangements or methods for testing or calibrating a device
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
- G09G3/34—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source
- G09G3/36—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source using liquid crystals
- G09G3/3611—Control of matrices with row and column drivers
- G09G3/3648—Control of matrices with row and column drivers using an active matrix
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/26—Electron or ion microscopes
- H01J2237/28—Scanning microscopes
- H01J2237/2813—Scanning microscopes characterised by the application
- H01J2237/2817—Pattern inspection
Abstract
【解決手段】本発明に係るマイクロカラムを用いた検査装置は、従来の光学検査装備で解決できなかった小型回路の駆動方式を検査することができる。また、本発明は、大面積ディスプレイなどの検査を短時間内に行うことができる高速検査が可能であるうえ、精密検査および修理も可能である。本発明に係る検査装置は、複数のマイクロカラム、試料との移動方向に直角に前記マイクロカラムが結合する軸、および前記マイクロカラムからの電子ビームが試料に照射されたことを検出して試料の回路異常有無および形状を検査することが可能なデテクターを含む。
Description
10…駆動部 11…X方向軸 12…連結部 15…固定軸 15a、15b…軸
16、17…移動軸 20…支持部材 21…支持部材の軸 22…Y方向軸
30…試料
Claims (8)
- 複数のマイクロカラムと;
試料との移動方向に直角に前記マイクロカラムが結合する軸、および前記マイクロカラムからの電子ビームが試料に照射されることを検出して試料の回路異常有無を検討することが可能な電子検出手段を備え、試料の高速検査を行う少なくとも一つの1次検査部と;
X−Y方向に移動することが可能な移動軸、および前記移動軸に結合するマイクロカラムを備え、前記1次検査部の後ろで試料の異常部分を精密に検査する少なくとも一つの2次検査部と;を含むことを特徴とする、マイクロカラムを用いた検査装置。 - 前記2次検査部に結合するマイクロカラムで精密検査および修理を行うか、或いは修理用移動軸をさらに備えて異常部分の精密検査および修理を行うことを特徴とする、請求項1に記載のマイクロカラムを用いた検査装置。
- 前記マイクロカラムは、X−Y−Z軸方向の移動またはチルトが可能であることを特徴とする、請求項1または2に記載のマイクロカラムを用いた検査装置。
- 前記マイクロカラムは、マルチマイクロカラム、単純シングルマイクロカラムの組み合わせ、またはマルチマイクロカラムおよびシングルマイクロカラムの組み合わせであることを特徴とする、請求項1または2に記載のマイクロカラムを用いた検査装置。
- 前記電子検出手段それぞれは複数のマイクロカラムに対応して使用され、前記各電子検出手段は当該複数のマイクロカラムが順次作動して電子を検出することを特徴とする、請求項1〜4のいずれか1項に記載のマイクロカラムを用いた検査装置。
- 前記電子検出手段はサンプルカレント方式で検出を行うことを特徴とする、請求項1〜4のいずれか1項に記載のマイクロカラムを用いた検査装置。
- 前記マイクロカラムが試料に対して相対運動し、或いはマイクロカラムが移動しながら検査または修理を行うことを特徴とする、請求項1〜6のいずれか1項に記載のマイクロカラムを用いた検査装置。
- 前記マイクロカラムは、電子放出源、ソースレンズおよびデフレクターから構成され、または電子放出源およびデフレクター兼用ソースレンズから構成されることを特徴とする、請求項1〜7のいずれか1項に記載のマイクロカラムを用いた検査装置。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR20050070084 | 2005-07-30 | ||
KR10-2005-0070084 | 2005-07-30 | ||
PCT/KR2006/003010 WO2007015615A1 (en) | 2005-07-30 | 2006-07-31 | Inspection equipment for fine pattern and morphology using microcolumn |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2009503495A true JP2009503495A (ja) | 2009-01-29 |
JP5362355B2 JP5362355B2 (ja) | 2013-12-11 |
Family
ID=37708879
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2008523810A Expired - Fee Related JP5362355B2 (ja) | 2005-07-30 | 2006-07-31 | マイクロカラムを用いた微細パターンおよび形状検査装置 |
Country Status (6)
Country | Link |
---|---|
US (1) | US7935926B2 (ja) |
EP (1) | EP1910891B1 (ja) |
JP (1) | JP5362355B2 (ja) |
KR (2) | KR20080043768A (ja) |
CN (1) | CN101233444B (ja) |
WO (1) | WO2007015615A1 (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20180065609A (ko) * | 2016-12-08 | 2018-06-18 | 한국생산기술연구원 | 로봇을 이용한 가공상태 검사장치 및 이에 의한 검사방법 |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8399828B2 (en) * | 2009-12-31 | 2013-03-19 | Virgin Instruments Corporation | Merged ion beam tandem TOF-TOF mass spectrometer |
KR102119930B1 (ko) * | 2014-08-31 | 2020-06-08 | 케이엘에이 코포레이션 | 복수의 이동가능한 빔 칼럼을 갖는 이미징 장치 및 실질적으로 일치하도록 의도된 기판의 복수의 영역을 검사하는 방법 |
JP6604704B2 (ja) * | 2014-12-22 | 2019-11-13 | アプライド マテリアルズ インコーポレイテッド | 基板の検査装置、基板の検査方法、大面積基板検査装置、及びその操作方法 |
CN104965325B (zh) * | 2015-08-03 | 2018-10-30 | 合肥鑫晟光电科技有限公司 | 一种阵列基板、其修复方法、显示面板及显示装置 |
US9741532B1 (en) * | 2016-06-17 | 2017-08-22 | International Business Machines Corporation | Multi-beam electron microscope for electron channeling contrast imaging of semiconductor material |
CN109449092B (zh) * | 2018-10-16 | 2021-09-14 | 惠科股份有限公司 | 一种阵列基板的测试设备和测试方法 |
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JPS5637626A (en) * | 1979-09-05 | 1981-04-11 | Chiyou Lsi Gijutsu Kenkyu Kumiai | Inspection device for pattern |
JPH04276509A (ja) * | 1991-03-05 | 1992-10-01 | Nippon Denshi Tekunikusu Kk | 電子線による試料表面の状態測定装置 |
JPH05159735A (ja) * | 1991-12-03 | 1993-06-25 | Pioneer Electron Corp | 電子ビーム投射装置 |
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JPH11330186A (ja) * | 1998-05-11 | 1999-11-30 | Hitachi Ltd | ウエハ検査装置 |
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JP2003217499A (ja) * | 2002-01-17 | 2003-07-31 | Sony Corp | 検査・測定装置 |
WO2004059690A1 (en) * | 2002-12-30 | 2004-07-15 | Cebt Co., Ltd. | An extractor for an microcoloum, an alignment method for an extractor aperture to an electon emitter, and a measuring method and an alignment method using thereof |
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2006
- 2006-07-31 CN CN2006800280063A patent/CN101233444B/zh not_active Expired - Fee Related
- 2006-07-31 KR KR1020087002543A patent/KR20080043768A/ko not_active Application Discontinuation
- 2006-07-31 WO PCT/KR2006/003010 patent/WO2007015615A1/en active Application Filing
- 2006-07-31 EP EP06783468.9A patent/EP1910891B1/en not_active Not-in-force
- 2006-07-31 JP JP2008523810A patent/JP5362355B2/ja not_active Expired - Fee Related
- 2006-07-31 KR KR1020097018426A patent/KR101011242B1/ko active IP Right Grant
- 2006-07-31 US US11/997,316 patent/US7935926B2/en not_active Expired - Fee Related
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Publication number | Priority date | Publication date | Assignee | Title |
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JPS5637626A (en) * | 1979-09-05 | 1981-04-11 | Chiyou Lsi Gijutsu Kenkyu Kumiai | Inspection device for pattern |
JPH04276509A (ja) * | 1991-03-05 | 1992-10-01 | Nippon Denshi Tekunikusu Kk | 電子線による試料表面の状態測定装置 |
JPH05159735A (ja) * | 1991-12-03 | 1993-06-25 | Pioneer Electron Corp | 電子ビーム投射装置 |
JPH06111745A (ja) * | 1992-09-28 | 1994-04-22 | Toshiba Corp | 電子光学鏡筒および走査電子顕微鏡 |
JP2000514238A (ja) * | 1998-03-03 | 2000-10-24 | エテック システムズ インコーポレイテッド | 汎用走査型電子顕微鏡としての電子ビームマイクロカラム |
JPH11330186A (ja) * | 1998-05-11 | 1999-11-30 | Hitachi Ltd | ウエハ検査装置 |
JP2002543439A (ja) * | 1999-05-05 | 2002-12-17 | イーテック・システムズ・インコーポレイテッド | 一体型マイクロカラム・走査型プローブ顕微鏡アレイ |
JP2001056306A (ja) * | 1999-08-19 | 2001-02-27 | Jeol Ltd | 試料表面検査装置 |
JP2003217499A (ja) * | 2002-01-17 | 2003-07-31 | Sony Corp | 検査・測定装置 |
JP2005062148A (ja) * | 2002-11-01 | 2005-03-10 | Photon Dynamics Inc | 平坦なパターン形成済み媒体検査用の方法と装置 |
WO2004059690A1 (en) * | 2002-12-30 | 2004-07-15 | Cebt Co., Ltd. | An extractor for an microcoloum, an alignment method for an extractor aperture to an electon emitter, and a measuring method and an alignment method using thereof |
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Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20180065609A (ko) * | 2016-12-08 | 2018-06-18 | 한국생산기술연구원 | 로봇을 이용한 가공상태 검사장치 및 이에 의한 검사방법 |
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Also Published As
Publication number | Publication date |
---|---|
WO2007015615A1 (en) | 2007-02-08 |
CN101233444B (zh) | 2010-12-08 |
EP1910891A4 (en) | 2009-06-10 |
US20080272298A1 (en) | 2008-11-06 |
CN101233444A (zh) | 2008-07-30 |
EP1910891B1 (en) | 2014-07-16 |
KR101011242B1 (ko) | 2011-01-26 |
JP5362355B2 (ja) | 2013-12-11 |
KR20080043768A (ko) | 2008-05-19 |
US7935926B2 (en) | 2011-05-03 |
EP1910891A1 (en) | 2008-04-16 |
KR20090119763A (ko) | 2009-11-19 |
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