JP2009500812A5 - - Google Patents
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- Publication number
- JP2009500812A5 JP2009500812A5 JP2008517075A JP2008517075A JP2009500812A5 JP 2009500812 A5 JP2009500812 A5 JP 2009500812A5 JP 2008517075 A JP2008517075 A JP 2008517075A JP 2008517075 A JP2008517075 A JP 2008517075A JP 2009500812 A5 JP2009500812 A5 JP 2009500812A5
- Authority
- JP
- Japan
- Prior art keywords
- plasma
- plasma confinement
- ring
- confinement ring
- process chamber
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000000034 method Methods 0.000 claims 34
- 239000000463 material Substances 0.000 claims 24
- 239000000758 substrate Substances 0.000 claims 14
- 229920000642 polymer Polymers 0.000 claims 7
- 230000008021 deposition Effects 0.000 claims 6
- 239000004065 semiconductor Substances 0.000 claims 6
- 239000011248 coating agent Substances 0.000 claims 5
- 238000000576 coating method Methods 0.000 claims 5
- 239000007789 gas Substances 0.000 claims 5
- 238000005530 etching Methods 0.000 claims 4
- 229910052710 silicon Inorganic materials 0.000 claims 4
- 239000010703 silicon Substances 0.000 claims 4
- 239000012780 transparent material Substances 0.000 claims 4
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims 2
- 239000001301 oxygen Substances 0.000 claims 2
- 229910052760 oxygen Inorganic materials 0.000 claims 2
- 239000002243 precursor Substances 0.000 claims 2
- 239000003989 dielectric material Substances 0.000 claims 1
- 229920001971 elastomer Polymers 0.000 claims 1
- 239000000806 elastomer Substances 0.000 claims 1
- NBVXSUQYWXRMNV-UHFFFAOYSA-N fluoromethane Chemical compound FC NBVXSUQYWXRMNV-UHFFFAOYSA-N 0.000 claims 1
- 238000010438 heat treatment Methods 0.000 claims 1
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 claims 1
- 239000002184 metal Substances 0.000 claims 1
- 229910052751 metal Inorganic materials 0.000 claims 1
- 239000007769 metal material Substances 0.000 claims 1
- YUOWTJMRMWQJDA-UHFFFAOYSA-J tin(iv) fluoride Chemical compound [F-].[F-].[F-].[F-].[Sn+4] YUOWTJMRMWQJDA-UHFFFAOYSA-J 0.000 claims 1
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US11/155,493 | 2005-06-20 | ||
| US11/155,493 US7713379B2 (en) | 2005-06-20 | 2005-06-20 | Plasma confinement rings including RF absorbing material for reducing polymer deposition |
| PCT/US2006/023198 WO2007001865A2 (en) | 2005-06-20 | 2006-06-14 | Plasma confinement rings including rf absorbing material for reducing polymer deposition |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2011269370A Division JP5220178B2 (ja) | 2005-06-20 | 2011-12-08 | ポリマーの堆積を低減するためのrf吸収材料を含むプラズマ閉じ込めリング |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2009500812A JP2009500812A (ja) | 2009-01-08 |
| JP2009500812A5 true JP2009500812A5 (enExample) | 2009-07-09 |
| JP5492411B2 JP5492411B2 (ja) | 2014-05-14 |
Family
ID=37572195
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2008517075A Expired - Fee Related JP5492411B2 (ja) | 2005-06-20 | 2006-06-14 | ポリマーの堆積を低減するためのrf吸収材料を含むプラズマ閉じ込めリング |
| JP2011269370A Expired - Fee Related JP5220178B2 (ja) | 2005-06-20 | 2011-12-08 | ポリマーの堆積を低減するためのrf吸収材料を含むプラズマ閉じ込めリング |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2011269370A Expired - Fee Related JP5220178B2 (ja) | 2005-06-20 | 2011-12-08 | ポリマーの堆積を低減するためのrf吸収材料を含むプラズマ閉じ込めリング |
Country Status (7)
| Country | Link |
|---|---|
| US (3) | US7713379B2 (enExample) |
| JP (2) | JP5492411B2 (enExample) |
| KR (2) | KR20080025690A (enExample) |
| CN (1) | CN101553900B (enExample) |
| MY (1) | MY164564A (enExample) |
| TW (1) | TWI416996B (enExample) |
| WO (1) | WO2007001865A2 (enExample) |
Families Citing this family (33)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4550507B2 (ja) * | 2004-07-26 | 2010-09-22 | 株式会社日立ハイテクノロジーズ | プラズマ処理装置 |
| US7430986B2 (en) | 2005-03-18 | 2008-10-07 | Lam Research Corporation | Plasma confinement ring assemblies having reduced polymer deposition characteristics |
| US7713379B2 (en) | 2005-06-20 | 2010-05-11 | Lam Research Corporation | Plasma confinement rings including RF absorbing material for reducing polymer deposition |
| US8647484B2 (en) * | 2005-11-25 | 2014-02-11 | Applied Materials, Inc. | Target for sputtering chamber |
| US7740736B2 (en) * | 2006-06-08 | 2010-06-22 | Lam Research Corporation | Methods and apparatus for preventing plasma un-confinement events in a plasma processing chamber |
| US8313610B2 (en) | 2007-09-25 | 2012-11-20 | Lam Research Corporation | Temperature control modules for showerhead electrode assemblies for plasma processing apparatuses |
| US8161906B2 (en) | 2008-07-07 | 2012-04-24 | Lam Research Corporation | Clamped showerhead electrode assembly |
| US8206506B2 (en) | 2008-07-07 | 2012-06-26 | Lam Research Corporation | Showerhead electrode |
| US8221582B2 (en) | 2008-07-07 | 2012-07-17 | Lam Research Corporation | Clamped monolithic showerhead electrode |
| WO2010005932A2 (en) * | 2008-07-07 | 2010-01-14 | Lam Research Corporation | Plasma-facing probe arrangement including vacuum gap for use in a plasma processing chamber |
| US8869741B2 (en) * | 2008-12-19 | 2014-10-28 | Lam Research Corporation | Methods and apparatus for dual confinement and ultra-high pressure in an adjustable gap plasma chamber |
| US8540844B2 (en) * | 2008-12-19 | 2013-09-24 | Lam Research Corporation | Plasma confinement structures in plasma processing systems |
| US8402918B2 (en) | 2009-04-07 | 2013-03-26 | Lam Research Corporation | Showerhead electrode with centering feature |
| US8272346B2 (en) | 2009-04-10 | 2012-09-25 | Lam Research Corporation | Gasket with positioning feature for clamped monolithic showerhead electrode |
| KR20180049208A (ko) * | 2009-08-31 | 2018-05-10 | 램 리써치 코포레이션 | 무선 주파수 (rf) 접지 복귀 장치들 |
| US8419959B2 (en) | 2009-09-18 | 2013-04-16 | Lam Research Corporation | Clamped monolithic showerhead electrode |
| JP3160877U (ja) | 2009-10-13 | 2010-07-15 | ラム リサーチ コーポレーションLam Research Corporation | シャワーヘッド電極アセンブリの端部クランプ留めおよび機械固定される内側電極 |
| WO2011149615A2 (en) * | 2010-05-24 | 2011-12-01 | Applied Materials, Inc. | Hybrid hotwire chemical vapor deposition and plasma enhanced chemical vapor deposition method and apparatus |
| EP2602816A1 (en) * | 2010-08-06 | 2013-06-12 | Asahi Glass Company, Limited | Support substrate |
| US8573152B2 (en) | 2010-09-03 | 2013-11-05 | Lam Research Corporation | Showerhead electrode |
| US9076826B2 (en) | 2010-09-24 | 2015-07-07 | Lam Research Corporation | Plasma confinement ring assembly for plasma processing chambers |
| CN102394255A (zh) * | 2011-11-15 | 2012-03-28 | 苏州思博露光伏能源科技有限公司 | 在柔性薄膜光伏电池制造中喷淋电极同时沉积薄膜的技术 |
| KR102101192B1 (ko) * | 2012-07-27 | 2020-04-21 | 어플라이드 머티어리얼스, 인코포레이티드 | 조면화된 기판 지지부 |
| US10727092B2 (en) * | 2012-10-17 | 2020-07-28 | Applied Materials, Inc. | Heated substrate support ring |
| US11127619B2 (en) * | 2016-06-07 | 2021-09-21 | Applied Materials, Inc. | Workpiece carrier for high power with enhanced edge sealing |
| KR200491165Y1 (ko) | 2017-04-14 | 2020-05-15 | 주식회사 월덱스 | 플라즈마 에칭장치용 이체형 한정 링 |
| CN112713075B (zh) * | 2019-10-25 | 2024-03-12 | 中微半导体设备(上海)股份有限公司 | 等离子体隔离环、等离子体处理装置与基片处理方法 |
| CN112802729B (zh) * | 2019-11-13 | 2024-05-10 | 中微半导体设备(上海)股份有限公司 | 带温度维持装置的隔离环 |
| CN112928007B (zh) * | 2019-12-06 | 2023-09-12 | 中微半导体设备(上海)股份有限公司 | 等离子体处理设备及用于等离子体处理设备的下电极组件 |
| CN114830317A (zh) * | 2019-12-19 | 2022-07-29 | 朗姆研究公司 | 消耗性室部件中的封装式射频识别 |
| CN113745081B (zh) * | 2020-05-27 | 2024-03-12 | 中微半导体设备(上海)股份有限公司 | 一种隔离环组件、等离子体处理装置及处理方法 |
| CN114649178A (zh) * | 2020-12-18 | 2022-06-21 | 中微半导体设备(上海)股份有限公司 | 一种下电极组件及等离子体处理装置 |
| KR102326741B1 (ko) * | 2021-08-18 | 2021-11-16 | 주식회사 린텍 | 실리콘 파우더와 고주파 가열장치를 이용한 실리콘 부품의 접합 방법 |
Family Cites Families (42)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH03106734U (enExample) * | 1990-02-17 | 1991-11-05 | ||
| JP3175117B2 (ja) * | 1993-05-24 | 2001-06-11 | 東京エレクトロン株式会社 | ドライクリーニング方法 |
| US5865896A (en) * | 1993-08-27 | 1999-02-02 | Applied Materials, Inc. | High density plasma CVD reactor with combined inductive and capacitive coupling |
| JPH07254588A (ja) * | 1994-03-16 | 1995-10-03 | Toshiba Corp | プラズマ表面処理装置 |
| JPH08250488A (ja) * | 1995-01-13 | 1996-09-27 | Seiko Epson Corp | プラズマ処理装置及びその方法 |
| US5569356A (en) * | 1995-05-19 | 1996-10-29 | Lam Research Corporation | Electrode clamping assembly and method for assembly and use thereof |
| US5534751A (en) * | 1995-07-10 | 1996-07-09 | Lam Research Corporation | Plasma etching apparatus utilizing plasma confinement |
| US6902683B1 (en) * | 1996-03-01 | 2005-06-07 | Hitachi, Ltd. | Plasma processing apparatus and plasma processing method |
| TW335517B (en) * | 1996-03-01 | 1998-07-01 | Hitachi Ltd | Apparatus and method for processing plasma |
| US5904778A (en) * | 1996-07-26 | 1999-05-18 | Applied Materials, Inc. | Silicon carbide composite article particularly useful for plasma reactors |
| US6008130A (en) * | 1997-08-14 | 1999-12-28 | Vlsi Technology, Inc. | Polymer adhesive plasma confinement ring |
| US6090304A (en) | 1997-08-28 | 2000-07-18 | Lam Research Corporation | Methods for selective plasma etch |
| US6063234A (en) | 1997-09-10 | 2000-05-16 | Lam Research Corporation | Temperature sensing system for use in a radio frequency environment |
| US6039836A (en) * | 1997-12-19 | 2000-03-21 | Lam Research Corporation | Focus rings |
| KR100258984B1 (ko) | 1997-12-24 | 2000-08-01 | 윤종용 | 건식 식각 장치 |
| US6464843B1 (en) * | 1998-03-31 | 2002-10-15 | Lam Research Corporation | Contamination controlling method and apparatus for a plasma processing chamber |
| US6019060A (en) | 1998-06-24 | 2000-02-01 | Lam Research Corporation | Cam-based arrangement for positioning confinement rings in a plasma processing chamber |
| US5998932A (en) | 1998-06-26 | 1999-12-07 | Lam Research Corporation | Focus ring arrangement for substantially eliminating unconfined plasma in a plasma processing chamber |
| US6073577A (en) | 1998-06-30 | 2000-06-13 | Lam Research Corporation | Electrode for plasma processes and method for manufacture and use thereof |
| US6178919B1 (en) | 1998-12-28 | 2001-01-30 | Lam Research Corporation | Perforated plasma confinement ring in plasma reactors |
| US6451157B1 (en) | 1999-09-23 | 2002-09-17 | Lam Research Corporation | Gas distribution apparatus for semiconductor processing |
| US6227140B1 (en) * | 1999-09-23 | 2001-05-08 | Lam Research Corporation | Semiconductor processing equipment having radiant heated ceramic liner |
| TW492041B (en) | 2000-02-14 | 2002-06-21 | Tokyo Electron Ltd | Method and device for attenuating harmonics in semiconductor plasma processing systems |
| US6872281B1 (en) * | 2000-09-28 | 2005-03-29 | Lam Research Corporation | Chamber configuration for confining a plasma |
| US6391787B1 (en) | 2000-10-13 | 2002-05-21 | Lam Research Corporation | Stepped upper electrode for plasma processing uniformity |
| US20020127853A1 (en) * | 2000-12-29 | 2002-09-12 | Hubacek Jerome S. | Electrode for plasma processes and method for manufacture and use thereof |
| US6805952B2 (en) | 2000-12-29 | 2004-10-19 | Lam Research Corporation | Low contamination plasma chamber components and methods for making the same |
| US6602381B1 (en) * | 2001-04-30 | 2003-08-05 | Lam Research Corporation | Plasma confinement by use of preferred RF return path |
| US6527911B1 (en) | 2001-06-29 | 2003-03-04 | Lam Research Corporation | Configurable plasma volume etch chamber |
| US6984288B2 (en) * | 2001-08-08 | 2006-01-10 | Lam Research Corporation | Plasma processor in plasma confinement region within a vacuum chamber |
| US6706138B2 (en) * | 2001-08-16 | 2004-03-16 | Applied Materials Inc. | Adjustable dual frequency voltage dividing plasma reactor |
| JP2003224115A (ja) | 2001-11-05 | 2003-08-08 | Tokyo Electron Ltd | プラズマプロセスにおけるチャンバの共振を緩和する装置並びに方法 |
| AU2002366921A1 (en) * | 2001-12-13 | 2003-07-09 | Tokyo Electron Limited | Ring mechanism, and plasma processing device using the ring mechanism |
| US6744212B2 (en) * | 2002-02-14 | 2004-06-01 | Lam Research Corporation | Plasma processing apparatus and method for confining an RF plasma under very high gas flow and RF power density conditions |
| US6926803B2 (en) * | 2002-04-17 | 2005-08-09 | Lam Research Corporation | Confinement ring support assembly |
| US6841943B2 (en) * | 2002-06-27 | 2005-01-11 | Lam Research Corp. | Plasma processor with electrode simultaneously responsive to plural frequencies |
| US7405521B2 (en) * | 2003-08-22 | 2008-07-29 | Lam Research Corporation | Multiple frequency plasma processor method and apparatus |
| US7430986B2 (en) * | 2005-03-18 | 2008-10-07 | Lam Research Corporation | Plasma confinement ring assemblies having reduced polymer deposition characteristics |
| JP2006303309A (ja) | 2005-04-22 | 2006-11-02 | Hitachi High-Technologies Corp | プラズマ処理装置 |
| KR100621778B1 (ko) * | 2005-06-17 | 2006-09-11 | 삼성전자주식회사 | 플라즈마 처리 장치 |
| US7713379B2 (en) | 2005-06-20 | 2010-05-11 | Lam Research Corporation | Plasma confinement rings including RF absorbing material for reducing polymer deposition |
| US7718045B2 (en) * | 2006-06-27 | 2010-05-18 | Applied Materials, Inc. | Ground shield with reentrant feature |
-
2005
- 2005-06-20 US US11/155,493 patent/US7713379B2/en not_active Expired - Fee Related
-
2006
- 2006-06-14 CN CN2006800220626A patent/CN101553900B/zh not_active Expired - Fee Related
- 2006-06-14 KR KR1020077029805A patent/KR20080025690A/ko not_active Ceased
- 2006-06-14 WO PCT/US2006/023198 patent/WO2007001865A2/en not_active Ceased
- 2006-06-14 KR KR1020137001853A patent/KR101468340B1/ko not_active Expired - Fee Related
- 2006-06-14 JP JP2008517075A patent/JP5492411B2/ja not_active Expired - Fee Related
- 2006-06-19 MY MYPI20062899A patent/MY164564A/en unknown
- 2006-06-20 TW TW95122138A patent/TWI416996B/zh not_active IP Right Cessation
-
2010
- 2010-03-24 US US12/730,588 patent/US8337662B2/en not_active Expired - Fee Related
-
2011
- 2011-12-08 JP JP2011269370A patent/JP5220178B2/ja not_active Expired - Fee Related
-
2012
- 2012-12-06 US US13/706,640 patent/US9123650B2/en not_active Expired - Fee Related
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