JP2009288030A5 - - Google Patents

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Publication number
JP2009288030A5
JP2009288030A5 JP2008140100A JP2008140100A JP2009288030A5 JP 2009288030 A5 JP2009288030 A5 JP 2009288030A5 JP 2008140100 A JP2008140100 A JP 2008140100A JP 2008140100 A JP2008140100 A JP 2008140100A JP 2009288030 A5 JP2009288030 A5 JP 2009288030A5
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JP
Japan
Prior art keywords
source
transistor
unipolar
drain
constant current
Prior art date
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Granted
Application number
JP2008140100A
Other languages
English (en)
Japanese (ja)
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JP5269482B2 (ja
JP2009288030A (ja
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Publication date
Application filed filed Critical
Priority to JP2008140100A priority Critical patent/JP5269482B2/ja
Priority claimed from JP2008140100A external-priority patent/JP5269482B2/ja
Priority to TW98108947A priority patent/TWI412759B/zh
Priority to KR1020090042366A priority patent/KR101065300B1/ko
Priority to CN2009101423318A priority patent/CN101592696B/zh
Publication of JP2009288030A publication Critical patent/JP2009288030A/ja
Publication of JP2009288030A5 publication Critical patent/JP2009288030A5/ja
Application granted granted Critical
Publication of JP5269482B2 publication Critical patent/JP5269482B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2008140100A 2008-05-28 2008-05-28 センサ基板及び検査装置 Expired - Fee Related JP5269482B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2008140100A JP5269482B2 (ja) 2008-05-28 2008-05-28 センサ基板及び検査装置
TW98108947A TWI412759B (zh) 2008-05-28 2009-03-19 感測器基板及檢查裝置
KR1020090042366A KR101065300B1 (ko) 2008-05-28 2009-05-15 센서기판 및 검사장치
CN2009101423318A CN101592696B (zh) 2008-05-28 2009-05-27 传感器基板以及检查装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2008140100A JP5269482B2 (ja) 2008-05-28 2008-05-28 センサ基板及び検査装置

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2013082281A Division JP5486715B2 (ja) 2013-04-10 2013-04-10 センサ基板及び検査装置

Publications (3)

Publication Number Publication Date
JP2009288030A JP2009288030A (ja) 2009-12-10
JP2009288030A5 true JP2009288030A5 (zh) 2011-03-31
JP5269482B2 JP5269482B2 (ja) 2013-08-21

Family

ID=41407461

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2008140100A Expired - Fee Related JP5269482B2 (ja) 2008-05-28 2008-05-28 センサ基板及び検査装置

Country Status (4)

Country Link
JP (1) JP5269482B2 (zh)
KR (1) KR101065300B1 (zh)
CN (1) CN101592696B (zh)
TW (1) TWI412759B (zh)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012010008A (ja) * 2010-06-23 2012-01-12 Sony Corp 撮像素子及び撮像装置
CN103308817B (zh) * 2013-06-20 2015-11-25 京东方科技集团股份有限公司 阵列基板线路检测装置及检测方法
US10024153B2 (en) * 2013-12-16 2018-07-17 Sondex Wireline Limited Wide temperature range peak hold circuit
CN107426514B (zh) * 2017-08-28 2019-09-27 电子科技大学 一种cmos图像传感器读出电路
JP7115630B2 (ja) * 2019-03-18 2022-08-09 三菱電機株式会社 移相器、移相器の製造方法
CN110497936B (zh) * 2019-08-30 2021-04-02 郑州铁路职业技术学院 一种道岔转辙机表示杆缺口信号处理电路
TWI830414B (zh) * 2022-09-30 2024-01-21 華邦電子股份有限公司 求值電路、半導體裝置以及求值方法

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0669140B2 (ja) * 1982-11-19 1994-08-31 株式会社東芝 レベルシフト回路
US5113147A (en) * 1990-09-26 1992-05-12 Minnesota Mining And Manufacturing Company Wide-band differential amplifier using gm-cancellation
JPH06132738A (ja) * 1992-10-20 1994-05-13 Fujitsu Ltd Ｆｅｔ増幅回路
JP3235253B2 (ja) * 1993-03-15 2001-12-04 松下電器産業株式会社 増幅器
JP3500544B2 (ja) * 1994-10-21 2004-02-23 富士通株式会社 増幅回路
JP2002156417A (ja) * 2000-11-17 2002-05-31 Oht Inc 回路基板の検査装置及び検査方法
JP2002156399A (ja) 2000-11-17 2002-05-31 Oht Inc 回路基板の検査装置及び検査方法
JP4586124B2 (ja) * 2003-07-10 2010-11-24 奇美電子股▲ふん▼有限公司 電気的接続部の非接触検査方法及び非接触検査装置
JP2006194786A (ja) * 2005-01-14 2006-07-27 Oht Inc センサ、検査装置および検査方法
JP5276774B2 (ja) * 2005-11-29 2013-08-28 株式会社日本マイクロニクス 検査方法及び装置
JP2007248202A (ja) * 2006-03-15 2007-09-27 Micronics Japan Co Ltd 表示用基板の検査に用いるセンサ基板及びこれを用いる表示用基板の検査方法

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