JP2009163069A5 - - Google Patents
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- Publication number
- JP2009163069A5 JP2009163069A5 JP2008001674A JP2008001674A JP2009163069A5 JP 2009163069 A5 JP2009163069 A5 JP 2009163069A5 JP 2008001674 A JP2008001674 A JP 2008001674A JP 2008001674 A JP2008001674 A JP 2008001674A JP 2009163069 A5 JP2009163069 A5 JP 2009163069A5
- Authority
- JP
- Japan
- Prior art keywords
- polarizing plate
- observation
- optical axis
- differential interference
- prism
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000003287 optical effect Effects 0.000 claims 21
- 238000005286 illumination Methods 0.000 claims 12
- 238000003384 imaging method Methods 0.000 claims 3
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2008001674A JP5065059B2 (ja) | 2008-01-08 | 2008-01-08 | 顕微鏡 |
| EP09000049.8A EP2078974B1 (en) | 2008-01-08 | 2009-01-05 | Microscope |
| US12/350,368 US8203783B2 (en) | 2008-01-08 | 2009-01-08 | Microscope with switchable condenser arrangement for different observation methods |
| US13/473,286 US20120224257A1 (en) | 2008-01-08 | 2012-05-16 | Microscope |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2008001674A JP5065059B2 (ja) | 2008-01-08 | 2008-01-08 | 顕微鏡 |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2012158419A Division JP5452675B2 (ja) | 2012-07-17 | 2012-07-17 | 顕微鏡 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2009163069A JP2009163069A (ja) | 2009-07-23 |
| JP2009163069A5 true JP2009163069A5 (enExample) | 2011-02-17 |
| JP5065059B2 JP5065059B2 (ja) | 2012-10-31 |
Family
ID=40548478
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2008001674A Expired - Fee Related JP5065059B2 (ja) | 2008-01-08 | 2008-01-08 | 顕微鏡 |
Country Status (3)
| Country | Link |
|---|---|
| US (2) | US8203783B2 (enExample) |
| EP (1) | EP2078974B1 (enExample) |
| JP (1) | JP5065059B2 (enExample) |
Families Citing this family (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5065059B2 (ja) * | 2008-01-08 | 2012-10-31 | オリンパス株式会社 | 顕微鏡 |
| CN101995649B (zh) * | 2010-12-22 | 2012-08-29 | 广州粤显光学仪器有限责任公司 | 落射式微分干涉相衬显微镜 |
| JPWO2012150689A1 (ja) * | 2011-05-02 | 2014-07-28 | オリンパス株式会社 | 顕微鏡、及び、顕微鏡を用いた顕微授精方法 |
| DE102011108553B4 (de) * | 2011-07-22 | 2021-05-06 | Carl Zeiss Microscopy Gmbh | Anordnung zur Einstellung von Beleuchtungseinrichtungen an Durchlichtmikroskopen |
| JP6531403B2 (ja) * | 2015-01-27 | 2019-06-19 | 株式会社ニコン | 顕微鏡 |
| JP2017009905A (ja) | 2015-06-25 | 2017-01-12 | オリンパス株式会社 | 顕微鏡用照明装置および顕微鏡 |
| KR101731498B1 (ko) | 2015-09-08 | 2017-04-28 | 한국과학기술연구원 | 표면 검사 장치 및 방법 |
| EP3458824A4 (en) * | 2016-05-19 | 2020-03-04 | 1323079 Alberta Ltd. | METHOD AND APPARATUS FOR MONITORING THE DYNAMIC TRAIL OF A FLUID |
| KR101873966B1 (ko) | 2016-11-10 | 2018-07-04 | 한양대학교 에리카산학협력단 | 타원해석기 |
| JP6839439B2 (ja) * | 2016-12-01 | 2021-03-10 | 国立大学法人山口大学 | 試料観察装置 |
| JP7137422B2 (ja) | 2018-09-28 | 2022-09-14 | シスメックス株式会社 | 顕微鏡装置 |
| JP6922955B2 (ja) * | 2019-09-03 | 2021-08-18 | 株式会社島津製作所 | 偏光顕微鏡 |
| EP4099078A1 (en) * | 2021-06-01 | 2022-12-07 | Leica Microsystems CMS GmbH | Microscope for transmitted light contrasting |
| KR102879287B1 (ko) * | 2023-06-27 | 2025-10-30 | 백수현 | 조립 모듈식 편광 현미경 장치 |
Family Cites Families (35)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3503662A (en) * | 1964-05-07 | 1970-03-31 | Jerzy Grzelak | Device for optical microscope transformation into a polarizing interferometer microscope |
| JPS5341587B2 (enExample) | 1973-09-20 | 1978-11-04 | ||
| JPS5129149A (ja) | 1974-09-06 | 1976-03-12 | Robert Hoffman | Isobutsutaikansatsuyokenbikyoshisutemu |
| US4255014A (en) * | 1977-07-20 | 1981-03-10 | Research Corporation | Edge enhancement of phase phenomena |
| DE2946927C2 (de) * | 1979-11-21 | 1983-07-07 | Fa. Carl Zeiss, 7920 Heidenheim | Automatische Durchlichtbeleuchtung für Mikroskope |
| US4407569A (en) | 1981-07-07 | 1983-10-04 | Carl Zeiss-Stiftung | Device for selectively available phase-contrast and relief observation in microscopes |
| AU564020B2 (en) * | 1981-09-24 | 1987-07-30 | Morris, J.R. | Microsurgical laser |
| US4756611A (en) * | 1984-08-31 | 1988-07-12 | Olympus Optical Co., Ltd. | Multiple-purpose microscope |
| JP2918938B2 (ja) | 1989-11-15 | 1999-07-12 | オリンパス光学工業株式会社 | 顕微鏡用ターレットコンデンサー |
| JP3042090B2 (ja) | 1991-10-31 | 2000-05-15 | 松下電器産業株式会社 | 薄膜コンデンサ |
| JPH05232384A (ja) * | 1992-02-18 | 1993-09-10 | Olympus Optical Co Ltd | 干渉顕微鏡 |
| JP3289941B2 (ja) * | 1992-03-13 | 2002-06-10 | オリンパス光学工業株式会社 | システム顕微鏡 |
| JP3293875B2 (ja) * | 1992-04-27 | 2002-06-17 | 富士通株式会社 | 微分干渉顕微鏡 |
| DE4231440A1 (de) * | 1992-09-19 | 1994-03-24 | Leica Mikroskopie & Syst | Universal-Klappkondensor für Mikroskope |
| IL104708A (en) * | 1993-02-12 | 1995-12-31 | Orbotech Ltd | Device and method for optical inspection of items |
| DE4404283A1 (de) * | 1994-02-11 | 1995-08-17 | Leica Mikroskopie & Syst | Kondensorsystem für Mikroskope |
| JPH08190054A (ja) * | 1995-01-11 | 1996-07-23 | Olympus Optical Co Ltd | 振幅変調コントラスト顕微鏡 |
| JP3537205B2 (ja) * | 1995-02-02 | 2004-06-14 | オリンパス株式会社 | 顕微鏡装置 |
| US20020195548A1 (en) * | 2001-06-06 | 2002-12-26 | Dowski Edward Raymond | Wavefront coding interference contrast imaging systems |
| US5706128A (en) * | 1995-09-11 | 1998-01-06 | Edge Scientific Instrument Company Llc | Stereo microscope condenser |
| JP3612833B2 (ja) * | 1995-12-06 | 2005-01-19 | 株式会社ニコン | 透過型微分干渉顕微鏡 |
| JP3708246B2 (ja) * | 1996-09-19 | 2005-10-19 | オリンパス株式会社 | 光制御部材を有する光学顕微鏡 |
| US6323995B1 (en) * | 1998-03-17 | 2001-11-27 | Olympus Optical Co., Ltd. | Optical element switching device and optical microscope loaded with the device |
| JP2000155266A (ja) * | 1998-11-20 | 2000-06-06 | Olympus Optical Co Ltd | 顕微鏡光学系 |
| US6741356B1 (en) * | 1999-09-20 | 2004-05-25 | Olympus Corporation | Method for detecting physical amount of object and optical apparatus using the same |
| JP4027546B2 (ja) * | 1999-10-21 | 2007-12-26 | オリンパス株式会社 | 顕微鏡システム |
| US6891671B1 (en) * | 2000-04-18 | 2005-05-10 | Gary Greenberg | Apparatus and methods for creating real-time 3-D images and constructing 3-D models of an object imaged in an optical system |
| JP2001264639A (ja) | 2000-03-21 | 2001-09-26 | Olympus Optical Co Ltd | 光学素子スライダー |
| US6437912B2 (en) * | 1999-12-08 | 2002-08-20 | Olympus Optical Co., Ltd. | Microscope, transillumination condenser therefor, and optical element slider |
| JP2003050353A (ja) * | 2001-08-08 | 2003-02-21 | Olympus Optical Co Ltd | 顕微鏡用コンデンサー |
| JP2004109919A (ja) * | 2002-09-20 | 2004-04-08 | Olympus Corp | 倒立顕微鏡 |
| DE10245974A1 (de) * | 2002-10-02 | 2004-04-15 | Leica Mikroskopie Und Systeme Gmbh | Phasenschiebungs-Verfahren und Vorrichtung zur Realisierung von Phasenkontrast- bzw. Modulationskontrast-Beobachtung an Mikroskopen |
| JP2007041510A (ja) * | 2005-06-28 | 2007-02-15 | Olympus Corp | 観察装置、及びそれを備えた観察システム |
| JP5028249B2 (ja) * | 2007-12-25 | 2012-09-19 | オリンパス株式会社 | 顕微鏡 |
| JP5065059B2 (ja) * | 2008-01-08 | 2012-10-31 | オリンパス株式会社 | 顕微鏡 |
-
2008
- 2008-01-08 JP JP2008001674A patent/JP5065059B2/ja not_active Expired - Fee Related
-
2009
- 2009-01-05 EP EP09000049.8A patent/EP2078974B1/en not_active Ceased
- 2009-01-08 US US12/350,368 patent/US8203783B2/en not_active Expired - Fee Related
-
2012
- 2012-05-16 US US13/473,286 patent/US20120224257A1/en not_active Abandoned
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