JP2008545949A5 - - Google Patents

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Publication number
JP2008545949A5
JP2008545949A5 JP2008503043A JP2008503043A JP2008545949A5 JP 2008545949 A5 JP2008545949 A5 JP 2008545949A5 JP 2008503043 A JP2008503043 A JP 2008503043A JP 2008503043 A JP2008503043 A JP 2008503043A JP 2008545949 A5 JP2008545949 A5 JP 2008545949A5
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JP
Japan
Prior art keywords
probe
power
card assembly
electronic device
power terminal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2008503043A
Other languages
English (en)
Japanese (ja)
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JP2008545949A (ja
Filing date
Publication date
Priority claimed from US11/306,186 external-priority patent/US7609080B2/en
Application filed filed Critical
Publication of JP2008545949A publication Critical patent/JP2008545949A/ja
Publication of JP2008545949A5 publication Critical patent/JP2008545949A5/ja
Pending legal-status Critical Current

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JP2008503043A 2005-03-22 2006-03-16 電圧故障検出保護 Pending JP2008545949A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US59424805P 2005-03-22 2005-03-22
US11/306,186 US7609080B2 (en) 2005-03-22 2005-12-19 Voltage fault detection and protection
PCT/US2006/009575 WO2006102006A2 (en) 2005-03-22 2006-03-16 Voltage fault detection and protection

Publications (2)

Publication Number Publication Date
JP2008545949A JP2008545949A (ja) 2008-12-18
JP2008545949A5 true JP2008545949A5 (https=) 2009-04-30

Family

ID=37024398

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2008503043A Pending JP2008545949A (ja) 2005-03-22 2006-03-16 電圧故障検出保護

Country Status (6)

Country Link
US (2) US7609080B2 (https=)
EP (1) EP1869479A4 (https=)
JP (1) JP2008545949A (https=)
KR (1) KR101238529B1 (https=)
TW (1) TWI438451B (https=)
WO (1) WO2006102006A2 (https=)

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JP5351389B2 (ja) * 2007-06-06 2013-11-27 日本電子材料株式会社 プローブカード
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US8862426B2 (en) * 2007-12-20 2014-10-14 International Business Machines Corporation Method and test system for fast determination of parameter variation statistics
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US7868640B2 (en) * 2008-04-02 2011-01-11 International Business Machines Corporation Array-based early threshold voltage recovery characterization measurement
US8154315B2 (en) * 2008-04-08 2012-04-10 Formfactor, Inc. Self-referencing voltage regulator
US7924035B2 (en) * 2008-07-15 2011-04-12 Formfactor, Inc. Probe card assembly for electronic device testing with DC test resource sharing
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US20130159792A1 (en) * 2011-01-24 2013-06-20 Robert Brooks Fault detection
US9391447B2 (en) 2012-03-06 2016-07-12 Intel Corporation Interposer to regulate current for wafer test tooling
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US8937794B2 (en) * 2012-09-28 2015-01-20 Intel Corporation Sort probe over current protection mechanism
JP6044297B2 (ja) * 2012-11-21 2016-12-14 富士通株式会社 試験装置
AT515818B1 (de) * 2014-05-16 2016-08-15 Omicron Electronics Gmbh Verfahren und System zum Prüfen einer Schaltanlage für Energieübertragungsanlagen
TWI704352B (zh) * 2015-03-13 2020-09-11 義大利商探針科技公司 測試頭之接觸探針
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US9974452B2 (en) * 2015-12-29 2018-05-22 Synaptics Incorporated Inductive non-contact resistance measurement
PE20190077A1 (es) * 2016-05-13 2019-01-14 Weir Minerals Australia Ltd Componente que indica el desgaste y metodo de monitoreo del desgaste
US10255468B2 (en) * 2016-10-28 2019-04-09 Avery Dennison Retail Information Services, Llc Transmission RFID test systems
US10267833B2 (en) * 2016-11-02 2019-04-23 Equinix, Inc. Power monitoring probe for monitoring power distribution in an electrical system
US10317428B2 (en) * 2016-11-02 2019-06-11 Intel Corporation Probe connector for a probing pad structure around a thermal attach mounting hole
US10203363B2 (en) * 2016-12-14 2019-02-12 General Electric Company DC leakage current detector and method of operation thereof for leakage current detection in DC power circuits
KR102637795B1 (ko) * 2017-02-10 2024-02-19 에스케이하이닉스 주식회사 반도체 장치
JP2021039086A (ja) * 2019-08-29 2021-03-11 三菱電機株式会社 半導体試験装置、半導体試験方法および半導体装置の製造方法
CN115210582A (zh) * 2020-03-10 2022-10-18 维耶尔公司 用于微型器件检测的耦合探针
CN114167153B (zh) * 2020-09-10 2025-02-11 台湾积体电路制造股份有限公司 用于测量环境静电的装置及方法与环境静电监控系统
KR20240139442A (ko) 2023-03-14 2024-09-23 삼성전자주식회사 테스트 장치 및 이를 포함하는 테스트 방법

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US7557592B2 (en) * 2006-06-06 2009-07-07 Formfactor, Inc. Method of expanding tester drive and measurement capability

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